Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18680896 | USING SPECTROSCOPIC MEASUREMENTS FOR SUBSTRATE TEMPERATURE MONITORING | May 2024 | January 2025 | Allow | 7 | 0 | 0 | No | No |
| 18505083 | RESISTIVE RANDOM-ACCESS MEMORY DEVICE AND FORMING METHOD THEREOF | November 2023 | March 2025 | Allow | 16 | 0 | 0 | No | No |
| 18496889 | OLED DISPLAY PANEL AND PREPARATION METHOD THEREOF | October 2023 | March 2026 | Allow | 28 | 0 | 0 | No | No |
| 18379423 | INTEGRATED CIRCUIT, METHOD FOR MANUFACTURING AN INTEGRATED CIRCUIT, WAFER AND METHOD FOR MANUFACTURING A WAFER | October 2023 | December 2024 | Allow | 14 | 0 | 0 | No | No |
| 18239104 | MEMORY DEVICE | August 2023 | December 2024 | Allow | 15 | 0 | 0 | No | No |
| 18239108 | MANUFACTURING METHOD OF MEMORY DEVICE | August 2023 | October 2024 | Allow | 13 | 0 | 0 | No | No |
| 18361373 | INTEGRATED CIRCUIT | July 2023 | January 2025 | Allow | 18 | 2 | 0 | No | No |
| 18224054 | RRAM AND FABRICATING METHOD OF THE SAME | July 2023 | October 2025 | Allow | 27 | 0 | 0 | No | No |
| 18353498 | Semiconductor Device and Method of Forming the Same | July 2023 | October 2024 | Allow | 15 | 1 | 1 | No | No |
| 18348146 | WAFER PROCESSING TOOLS AND METHODS THEREOF | July 2023 | June 2024 | Allow | 11 | 0 | 1 | No | No |
| 18338707 | VARIABLE RESISTANCE MEMORY DEVICE | June 2023 | May 2025 | Allow | 23 | 0 | 0 | No | No |
| 18335940 | STRAINED TRANSISTORS AND PHASE CHANGE MEMORY | June 2023 | July 2024 | Allow | 13 | 0 | 0 | No | No |
| 18332261 | METHOD OF SUPPLYING CHEMICAL LIQUID | June 2023 | June 2025 | Allow | 24 | 1 | 2 | No | No |
| 18205208 | ANTENNA ASSISTED RERAM FORMATION | June 2023 | March 2025 | Allow | 21 | 0 | 0 | No | No |
| 18254981 | RESISTIVE RANDOM ACCESS MEMORY AND METHOD OF PREPARING THE SAME | May 2023 | February 2026 | Allow | 32 | 1 | 0 | No | No |
| 18253422 | SEMICONDUCTOR DEVICE | May 2023 | February 2026 | Allow | 33 | 1 | 0 | No | No |
| 18196891 | REPLACEMENT GATE FORMATION IN MEMORY | May 2023 | July 2024 | Allow | 15 | 0 | 0 | No | No |
| 18196044 | Resistive Change Elements Using Nanotube Fabrics Employing Break-Type Switching Sites | May 2023 | October 2025 | Allow | 29 | 0 | 0 | No | No |
| 18310361 | RRAM DEVICE STRUCTURE AND MANUFACTURING METHOD | May 2023 | June 2025 | Allow | 26 | 0 | 0 | No | No |
| 18309564 | Semiconductor Device and Method of Manufacture | April 2023 | July 2024 | Allow | 15 | 0 | 0 | No | No |
| 18140677 | RESISTIVE RANDOM-ACCESS MEMORY ELEMENTS WITH LATERAL SIDEWALL SWITCHING | April 2023 | September 2025 | Allow | 28 | 0 | 0 | No | No |
| 18305537 | NAND FLASH MEMORY WITH VERTICAL CELL STACK STRUCTURE AND METHOD FOR MANUFACTURING SAME | April 2023 | June 2024 | Allow | 14 | 0 | 0 | No | No |
| 18134048 | RESISTIVE RANDOM ACCESS MEMORY STRUCTURE AND FABRICATING METHOD OF THE SAME | April 2023 | July 2025 | Allow | 27 | 0 | 0 | No | No |
| 18298132 | HIGH-FREQUENCY, LOW-VOLTAGE SWITCH DEVICES AND METHODS OF MANUFACTURING THEREOF | April 2023 | October 2025 | Allow | 30 | 0 | 0 | No | No |
| 18191885 | MEMORY ARRAY, SEMICONDUCTOR CHIP AND MANUFACTURING METHOD OF MEMORY ARRAY | March 2023 | July 2024 | Allow | 16 | 0 | 0 | No | No |
| 18186229 | STACKED RESISTIVE RANDOM-ACCESS MEMORY CROSS-POINT CELL | March 2023 | February 2026 | Allow | 35 | 0 | 0 | No | No |
| 18168038 | SEMICONDUCTOR DEVICE | February 2023 | May 2025 | Allow | 27 | 0 | 0 | No | No |
| 18166479 | SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME | February 2023 | February 2026 | Allow | 36 | 0 | 0 | No | No |
| 18158958 | DISPLAY DEVICE AND TILED DISPLAY DEVICE | January 2023 | March 2026 | Allow | 37 | 0 | 0 | No | No |
| 18068155 | STACKED VERTICAL TRANSPORT FIELD EFFECT TRANSISTOR WITH ANCHORS | December 2022 | October 2025 | Allow | 34 | 0 | 0 | No | No |
| 18082155 | METHOD OF DETECTING A POSSIBLE THINNING OF A SUBSTRATE OF AN INTEGRATED CIRCUIT VIA THE REAR FACE THEREOF, AND ASSOCIATED DEVICE | December 2022 | July 2024 | Allow | 19 | 0 | 0 | No | No |
| 18076726 | BUFFER LAYER IN MEMORY CELL TO PREVENT METAL REDEPOSITION | December 2022 | January 2025 | Allow | 25 | 1 | 1 | No | No |
| 17989085 | VARIABLE RESISTANCE MEMORY DEVICE | November 2022 | April 2025 | Allow | 29 | 0 | 0 | No | No |
| 17977164 | SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD THEREOF | October 2022 | March 2024 | Allow | 17 | 0 | 0 | No | No |
| 17937094 | DEVICES INCLUDING A PASSIVE MATERIAL BETWEEN MEMORY CELLS AND CONDUCTIVE ACCESS LINES, AND RELATED ELECTRONIC DEVICES | September 2022 | February 2025 | Allow | 28 | 1 | 0 | No | No |
| 17952838 | Impedance Controlled Electrical Interconnection Employing Meta-Materials | September 2022 | February 2024 | Allow | 17 | 0 | 0 | No | No |
| 17874861 | SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREFOR | July 2022 | June 2025 | Allow | 35 | 0 | 0 | No | No |
| 17874448 | MEMORY ARRAY WITH ASYMMETRIC BIT-LINE ARCHITECTURE | July 2022 | December 2023 | Allow | 17 | 0 | 0 | No | No |
| 17865994 | Fine Pitch BVA Using Reconstituted Wafer With Area Array Accessible For Testing | July 2022 | December 2023 | Allow | 17 | 0 | 0 | No | No |
| 17810590 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME | July 2022 | February 2026 | Allow | 43 | 1 | 0 | No | No |
| 17807645 | FINFET CHANNEL ON OXIDE STRUCTURES AND RELATED METHODS | June 2022 | December 2023 | Allow | 18 | 0 | 0 | No | No |
| 17776259 | TUNABLE INDUCTOR DEVICE | May 2022 | August 2025 | Allow | 39 | 0 | 0 | No | No |
| 17738366 | THREE-DIMENSIONAL MEMORY DEVICE INCLUDING A VARIABLE RESISTANCE MEMORY | May 2022 | April 2025 | Allow | 35 | 0 | 0 | No | No |
| 17738007 | MEMORY DEVICE AND METHOD OF FORMING THE SAME AND INTEGRATED CIRCUIT | May 2022 | February 2026 | Allow | 46 | 1 | 0 | No | No |
| 17735529 | TECHNOLOGIES FOR SEMICONDUCTOR DEVICES INCLUDING AMORPHOUS SILICON | May 2022 | February 2026 | Allow | 46 | 1 | 1 | No | No |
| 17729258 | PAD STRUCTURE FOR FRONT SIDE ILLUMINATED IMAGE SENSOR | April 2022 | January 2024 | Allow | 21 | 0 | 0 | No | No |
| 17705537 | Field Effect Transistor Contact with Reduced Contact Resistance | March 2022 | July 2024 | Allow | 27 | 0 | 1 | No | No |
| 17701144 | VERTICAL 1T1R STRUCTURE FOR EMBEDDED MEMORY | March 2022 | August 2025 | Allow | 41 | 0 | 1 | No | No |
| 17697974 | PROGRAMMABLE INTERPOSER USING RRAM PLATFORM | March 2022 | January 2025 | Allow | 34 | 0 | 0 | No | No |
| 17654911 | RESISTIVE SWITCHING MEMORY CELL | March 2022 | June 2025 | Allow | 39 | 0 | 0 | No | No |
| 17693340 | SOLID-STATE SWITCH | March 2022 | October 2025 | Allow | 43 | 0 | 1 | No | No |
| 17689604 | SEMICONDUCTOR DEVICE AND METHOD OF FORMING A SEMICONDUCTOR DEVICE | March 2022 | October 2024 | Allow | 31 | 0 | 0 | No | No |
| 17687968 | MEMRISTOR DEVICES EMBEDDED IN DIELECTRICS | March 2022 | September 2024 | Allow | 30 | 0 | 0 | No | No |
| 17683318 | REPAIR TECHNIQUES FOR MICRO-LED DEVICES AND ARRAYS | February 2022 | March 2024 | Allow | 25 | 0 | 0 | No | No |
| 17636833 | A Resistive Memory Device Structure Based on Stacked Layers Of Nanocrystalline TMDCs | February 2022 | October 2024 | Allow | 32 | 1 | 0 | No | No |
| 17671731 | SEMICONDUCTOR STRUCTURE AND METHOD OF MANUFACTURE | February 2022 | July 2024 | Allow | 29 | 0 | 0 | No | No |
| 17647006 | SEMICONDUCTOR MEMORY DEVICES HAVING AN ELECTRODE WITH AN EXTENSION | January 2022 | June 2024 | Allow | 29 | 0 | 0 | No | No |
| 17546772 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | December 2021 | February 2024 | Allow | 26 | 0 | 0 | No | No |
| 17545635 | STACKED CROSS-POINT PHASE CHANGE MEMORY | December 2021 | April 2025 | Allow | 40 | 0 | 0 | No | No |
| 17457930 | CROSSBAR MEMORY ARRAY IN BACK END OF LINE WITH CRYSTALLIZATION FRONT | December 2021 | March 2025 | Allow | 39 | 0 | 0 | No | No |
| 17457928 | CROSSBAR MEMORY ARRAY IN BACK END OF LINE | December 2021 | March 2025 | Allow | 40 | 0 | 1 | No | No |
| 17543957 | PHASE CHANGE MEMORY PROGRAMMING CURRENT LEAKAGE REDUCTION | December 2021 | March 2025 | Allow | 40 | 0 | 0 | No | No |
| 17536927 | FOLDED ACCESS LINE FOR MEMORY CELL ACCESS IN A MEMORY DEVICE | November 2021 | September 2024 | Allow | 34 | 0 | 1 | No | No |
| 17537071 | NEUROMORPHIC MEMRISTOR DEVICE BASED ON VERTICALLY-ORIENTED HALIDE PEROVSKITE NANOSTRUCTURE AND METHOD OF MANUFACTURING THE SAME | November 2021 | February 2025 | Allow | 39 | 2 | 0 | No | No |
| 17527648 | RESISTANCE RANDOM ACCESS MEMORY DEVICE AND METHOD FOR MANUFACTURING SAME | November 2021 | September 2024 | Allow | 34 | 1 | 0 | No | No |
| 17453346 | MEMORY CELL WITH COMB-SHAPED ELECTRODES | November 2021 | March 2025 | Allow | 41 | 0 | 1 | No | No |
| 17511706 | ELECTROLUMINESCENT DEVICE, MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE COMPRISING THE SAME | October 2021 | June 2024 | Allow | 32 | 2 | 0 | No | No |
| 17499709 | TECHNIQUES FOR MANUFACTURING A DOUBLE ELECTRODE MEMORY ARRAY | October 2021 | July 2023 | Allow | 21 | 0 | 0 | No | No |
| 17483868 | RESISTIVE SWITCHING DEVICE HAVING A PROTECTIVE ELECTRODE RING | September 2021 | October 2024 | Allow | 36 | 1 | 0 | No | No |
| 17477119 | MEMRISTOR AND PREPARATION METHOD THEREOF | September 2021 | July 2024 | Allow | 34 | 1 | 0 | No | No |
| 17474103 | TRANSFORMER DESIGN WITH BALANCED INTERWINDING CAPACITANCE FOR IMPROVED EMI PERFORMANCE | September 2021 | March 2024 | Allow | 30 | 0 | 0 | No | No |
| 17399194 | VARIABLE RESISTANCE MEMORY DEVICE | August 2021 | April 2024 | Allow | 32 | 0 | 0 | Yes | No |
| 17444840 | BACK END OF LINE EMBEDDED RRAM STRUCTURE WITH GRAIN GROWTH ENHANCEMENT | August 2021 | September 2024 | Allow | 37 | 2 | 0 | No | No |
| 17444841 | BACK END OF LINE EMBEDDED RRAM STRUCTURE WITH LOW FORMING VOLTAGE | August 2021 | September 2024 | Allow | 37 | 2 | 1 | No | No |
| 17362075 | CHALCOGEN COMPOUND AND SEMICONDUCTOR DEVICE INCLUDING THE SAME | June 2021 | March 2024 | Allow | 33 | 1 | 1 | No | No |
| 17358293 | PHASE CHANGE MEMORY WITH GRADED HEATER | June 2021 | March 2025 | Allow | 44 | 3 | 0 | Yes | No |
| 17350152 | DIE COUPLING USING A SUBSTRATE WITH A GLASS CORE | June 2021 | February 2025 | Allow | 44 | 0 | 1 | No | No |
| 17349777 | DIE TO DIE HIGH-SPEED COMMUNICATION WITHOUT DISCRETE AMPLIFIERS BETWEEN A MIXER AND TRANSMISSION LINE | June 2021 | September 2024 | Allow | 39 | 0 | 0 | No | No |
| 17203172 | NONVOLATILE SEMICONDUCTOR MEMORY DEVICE AND FABRICATION METHOD OF THE NONVOLATILE SEMICONDUCTOR MEMORY DEVICE | March 2021 | December 2023 | Allow | 33 | 1 | 0 | No | No |
| 17178086 | REACTOR TO FORM FILMS ON SIDEWALLS OF MEMORY CELLS | February 2021 | May 2025 | Allow | 51 | 5 | 1 | No | No |
| 17000457 | Deposition Of Metal-Organic Oxide Films | August 2020 | July 2024 | Abandon | 47 | 3 | 1 | No | No |
| 16128711 | FLEXIBLE DISPLAY DEVICE MANUFACTURING METHOD AND MANUFACTURING APPARATUS | September 2018 | October 2019 | Allow | 13 | 0 | 0 | No | No |
| 15825231 | REDUCING TIP-TO-TIP DISTANCE BETWEEN END PORTIONS OF METAL LINES FORMED IN AN INTERCONNECT LAYER OF AN INTEGRATED CIRCUIT (IC) | November 2017 | December 2018 | Allow | 13 | 0 | 1 | Yes | No |
| 15824559 | SYSTEMS AND METHODS FOR TEMPERATURE SENSOR ACCESS IN DIE STACKS | November 2017 | July 2024 | Abandon | 60 | 7 | 1 | No | Yes |
| 15689473 | STACKED COMPLEMENTARY JUNCTION FETS FOR ANALOG ELECTRONIC CIRCUITS | August 2017 | March 2019 | Allow | 19 | 0 | 2 | Yes | No |
| 15471733 | SELF ALIGNED GATE SHAPE PREVENTING VOID FORMATION | March 2017 | May 2017 | Allow | 2 | 0 | 0 | No | No |
| 15339402 | GATE HEIGHT AND SPACER UNIFORMITY | October 2016 | March 2017 | Allow | 4 | 0 | 1 | No | No |
| 15279840 | SEMICONDUCTOR DEVICE | September 2016 | January 2018 | Allow | 16 | 1 | 0 | No | No |
| 15236603 | PLASMA CURING OF PECVD HMDSO FILM FOR OLED APPLICATIONS | August 2016 | October 2016 | Allow | 2 | 0 | 0 | No | No |
| 15219738 | SEMICONDUCTOR MEMORY DEVICE | July 2016 | January 2018 | Allow | 18 | 1 | 0 | No | No |
| 15175595 | Semiconductor Device | June 2016 | October 2016 | Allow | 5 | 0 | 0 | No | No |
| 14974589 | SELF ALIGNED GATE SHAPE PREVENTING VOID FORMATION | December 2015 | December 2016 | Allow | 12 | 0 | 1 | No | No |
| 14876023 | FORMING INTERCONNECT FEATURES WITH REDUCED SIDEWALL TAPERING | October 2015 | February 2016 | Allow | 4 | 0 | 0 | No | No |
| 14874623 | AMORPHIZATION INDUCED METAL-SILICON CONTACT FORMATION | October 2015 | June 2018 | Allow | 33 | 1 | 1 | No | No |
| 14617499 | Resistive Memory Cell Array With Top Electrode Bit Line | February 2015 | July 2015 | Allow | 5 | 0 | 0 | No | No |
| 14607955 | ONE TRANSISTOR AND ONE RESISTIVE (1T1R) RANDOM ACCESS MEMORY (RAM) STRUCTURE WITH DUAL SPACERS | January 2015 | March 2015 | Allow | 1 | 0 | 0 | No | No |
| 14312628 | Method for Reducing Forming Voltage in Resistive Random Access Memory | June 2014 | July 2017 | Allow | 37 | 2 | 0 | No | No |
| 14190604 | Lighting Device, Backlight Module And Illumination Module | February 2014 | February 2018 | Allow | 47 | 2 | 0 | Yes | No |
| 14190874 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | February 2014 | August 2017 | Allow | 42 | 1 | 1 | No | No |
| 14180098 | INTEGRATED CLUSTER TO ENABLE NEXT GENERATION INTERCONNECT | February 2014 | July 2015 | Allow | 17 | 1 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner PAYEN, MARVIN.
With a 50.0% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 33.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner PAYEN, MARVIN works in Art Unit 2899 and has examined 74 patent applications in our dataset. With an allowance rate of 97.3%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 32 months.
Examiner PAYEN, MARVIN's allowance rate of 97.3% places them in the 88% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by PAYEN, MARVIN receive 1.07 office actions before reaching final disposition. This places the examiner in the 11% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by PAYEN, MARVIN is 32 months. This places the examiner in the 52% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +3.0% benefit to allowance rate for applications examined by PAYEN, MARVIN. This interview benefit is in the 24% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 35.1% of applications are subsequently allowed. This success rate is in the 79% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 31.2% of cases where such amendments are filed. This entry rate is in the 45% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 100.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 75% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 60.0% of appeals filed. This is in the 36% percentile among all examiners. Of these withdrawals, 33.3% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 33.3% are granted (fully or in part). This grant rate is in the 21% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 4.1% of allowed cases (in the 83% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 34% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.