Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 17126594 | Silicon-Germanium Fins and Methods of Processing the Same in Field-Effect Transistors | December 2020 | June 2024 | Allow | 42 | 2 | 1 | No | No |
| 17124017 | Embedded Stressors in Epitaxy Source/Drain Regions | December 2020 | November 2024 | Allow | 47 | 4 | 1 | No | No |
| 17107448 | SEMICONDUCTOR DEVICE | November 2020 | July 2025 | Allow | 55 | 8 | 0 | Yes | No |
| 17047023 | ANNEALING DEVICES INCLUDING THERMAL HEATERS | October 2020 | June 2024 | Abandon | 44 | 4 | 0 | No | No |
| 17025917 | INTEGRATED CIRCUIT LAYOUT AND METHOD THEREOF | September 2020 | October 2024 | Allow | 49 | 3 | 1 | Yes | No |
| 17008251 | High Voltage Device | August 2020 | September 2024 | Allow | 49 | 4 | 2 | Yes | No |
| 16942514 | High Voltage Devices | July 2020 | June 2024 | Allow | 46 | 6 | 1 | Yes | No |
| 16929556 | Semiconductor Device and Method of Forming Thereof | July 2020 | June 2025 | Allow | 59 | 6 | 1 | Yes | No |
| 16621904 | PIXEL ARRANGEMENT STRUCTURE, DISPLAY SUBSTRATE, AND DISPLAY DEVICE | December 2019 | March 2025 | Allow | 60 | 7 | 0 | Yes | No |
| 16537564 | 3D SEMICONDUCTOR MEMORY DEVICE AND STRUCTURE | August 2019 | March 2024 | Abandon | 55 | 5 | 1 | No | No |
| 16141016 | SPACER AND CHANNEL LAYER OF THIN-FILM TRANSISTORS | September 2018 | January 2025 | Abandon | 60 | 6 | 1 | No | No |
| 16006693 | Trench-Gated Heterostructure and Double-Heterostructure Active Devices | June 2018 | September 2020 | Abandon | 27 | 3 | 0 | Yes | No |
| 15567786 | Array Substrate and Manufacturing Method Thereof | October 2017 | March 2019 | Allow | 17 | 1 | 0 | No | No |
| 15553442 | ARRAY SUBSTRATE AND MANUFACTURING METHOD THEREOF, AND DISPLAY DEVICE | August 2017 | September 2019 | Allow | 24 | 4 | 0 | No | No |
| 15551637 | THIN FILM TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME | August 2017 | July 2019 | Allow | 23 | 1 | 0 | No | No |
| 15324702 | Thin Film Transistor And Method For Manufacturing The Same | June 2017 | July 2019 | Allow | 30 | 1 | 0 | No | No |
| 15618227 | EXTENDED CONTACT AREA USING UNDERCUT SILICIDE EXTENSIONS | June 2017 | February 2019 | Allow | 20 | 2 | 0 | Yes | No |
| 15491982 | MANUFACTURING METHOD OF PACKAGE STRUCTURE | April 2017 | October 2017 | Allow | 5 | 0 | 0 | No | No |
| 15470508 | PROCESSES FOR UNIFORM METAL SEMICONDUCTOR ALLOY FORMATION FOR FRONT SIDE CONTACT METALLIZATION AND PHOTOVOLTAIC DEVICE FORMED THEREFROM | March 2017 | September 2018 | Allow | 18 | 1 | 0 | No | No |
| 15460230 | 3D SEMICONDUCTOR MEMORY DEVICE AND STRUCTURE | March 2017 | July 2019 | Allow | 28 | 1 | 1 | Yes | No |
| 15353315 | Lateral Plasma/Radical Source | November 2016 | June 2018 | Allow | 19 | 1 | 1 | No | No |
| 15341240 | FINFET SPACER FORMATION ON GATE SIDEWALLS, BETWEEN THE CHANNEL AND SOURCE/DRAIN REGIONS | November 2016 | September 2017 | Allow | 10 | 0 | 1 | No | No |
| 15219193 | QUANTUM WELL MOSFET CHANNELS HAVING LATTICE MISMATCH WITH METAL SOURCE/DRAINS, AND CONFORMAL REGROWTH SOURCE/DRAINS | July 2016 | May 2018 | Allow | 22 | 2 | 0 | No | No |
| 15180499 | CHANNEL REPLACEMENT AND BIMODAL DOPING SCHEME FOR BULK FINFET THRESHOLD VOLTAGE MODULATION WITH REDUCED PERFORMANCE PENALTY | June 2016 | March 2018 | Allow | 21 | 2 | 0 | No | No |
| 14974537 | CHANNEL REPLACEMENT AND BIMODAL DOPING SCHEME FOR BULK FINFET THRESHOLD VOLTAGE MODULATION WITH REDUCED PERFORMANCE PENALTY | December 2015 | April 2017 | Allow | 16 | 2 | 1 | No | No |
| 14609029 | PROCESSES FOR UNIFORM METAL SEMICONDUCTOR ALLOY FORMATION FOR FRONT SIDE CONTACT METALLIZATION AND PHOTOVOLTAIC DEVICE FORMED THEREFROM | January 2015 | November 2016 | Allow | 22 | 0 | 1 | No | No |
| 14551606 | INTEGRATED CIRCUITS INCLUDING FINFET DEVICES WITH LOWER CONTACT RESISTANCE AND REDUCED PARASITIC CAPACITANCE AND METHODS FOR FABRICATING THE SAME | November 2014 | April 2016 | Allow | 17 | 3 | 0 | No | No |
| 14389083 | ORGANIC ELECTRONIC DEVICE MANUFACTURING METHOD AND ORGANIC EL DEVICE MANUFACTURING METHOD | September 2014 | February 2015 | Allow | 5 | 0 | 0 | No | No |
| 14449194 | EXTENDED CONTACT AREA USING UNDERCUT SILICIDE EXTENSIONS | August 2014 | March 2017 | Allow | 31 | 1 | 1 | No | No |
| 14313751 | METHOD OF DEPOSITING COPPER USING PHYSICAL VAPOR DEPOSITION | June 2014 | September 2016 | Allow | 27 | 5 | 0 | Yes | No |
| 14247653 | MEMORY DEVICES AND FORMATION METHODS | April 2014 | July 2015 | Allow | 16 | 2 | 0 | No | No |
| 14150118 | METHOD OF FORMING PRINTED PATTERNS | January 2014 | August 2015 | Allow | 19 | 0 | 0 | No | No |
| 14146138 | ENHANCING EFFICIENCY IN SOLAR CELLS BY ADJUSTING DEPOSITION POWER | January 2014 | March 2015 | Allow | 15 | 2 | 1 | No | No |
| 14122028 | CVD APPARATUS AND METHOD FOR FORMING CVD FILM | December 2013 | July 2017 | Allow | 44 | 2 | 1 | No | No |
| 14129684 | METHOD FOR PRODUCING SEMICONDUCTOR LAYER, METHOD FOR PRODUCING PHOTOELECTRIC CONVERSION DEVICE, AND SEMICONDUCTOR STARTING MATERIAL | December 2013 | November 2015 | Allow | 23 | 1 | 0 | No | No |
| 14142124 | METHOD OF ETCHING A POROUS DIELECTRIC MATERIAL | December 2013 | December 2017 | Allow | 48 | 4 | 0 | Yes | No |
| 14140731 | METHOD OF MANUFACTURING INTERCONNECTION AND SEMICONDUCTOR DEVICE | December 2013 | September 2014 | Allow | 9 | 0 | 0 | Yes | No |
| 14140807 | Electrode for Low-Leakage Devices | December 2013 | October 2015 | Allow | 22 | 1 | 1 | No | No |
| 13946821 | METHODS FOR REOXIDIZING AN OXIDE AND FOR FABRICATING SEMICONDUCTOR DEVICES | July 2013 | March 2014 | Allow | 8 | 2 | 0 | Yes | No |
| 13914362 | FinFETs and the Methods for Forming the Same | June 2013 | January 2015 | Allow | 19 | 1 | 0 | No | No |
| 13863269 | METHOD OF MAKING A MEMS GYROSCOPE HAVING A MAGNETIC SOURCE AND A MAGNETIC SENSING MECHANISM | April 2013 | March 2015 | Abandon | 23 | 1 | 0 | No | No |
| 13876199 | DICING DIE BOND FILM AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | March 2013 | May 2015 | Allow | 25 | 1 | 0 | No | No |
| 13795006 | METHOD OF MANUFACTURING ORGANIC-LIGHT-EMITTING-DIODE FLAT-PANEL LIGHT-SOURCE APPARATUS | March 2013 | July 2014 | Allow | 16 | 2 | 0 | No | No |
| 13797464 | Varied STI Liners for Isolation Structures in Image Sensing Devices | March 2013 | December 2014 | Allow | 21 | 1 | 1 | No | No |
| 13759648 | TWO-STEP HYDROGEN ANNEALING PROCESS FOR CREATING UNIFORM NON-PLANAR SEMICONDUCTOR DEVICES AT AGGRESSIVE PITCH | February 2013 | July 2013 | Allow | 5 | 0 | 0 | No | No |
| 13757286 | METHODS FOR OPTICAL PROXIMITY CORRECTION IN THE DESIGN AND FABRICATION OF INTEGRATED CIRCUITS | February 2013 | November 2014 | Allow | 21 | 0 | 0 | No | No |
| 13754537 | TILTING ACTUATOR WITH CLOSE-GAP ELECTRODES | January 2013 | June 2014 | Allow | 17 | 1 | 0 | No | No |
| 13580491 | METHOD FOR PRODUCING A PLURALITY OF OPTOELECTRONIC SEMICONDUCTOR CHIPS | October 2012 | November 2014 | Allow | 26 | 1 | 1 | No | No |
| 13523767 | THIN FILM TRANSISTOR ARRAY PANEL AND MANUFACTURING METHOD THEREOF | June 2012 | April 2013 | Allow | 10 | 1 | 1 | No | No |
| 13511117 | ELASTOMER ADHESIONS | May 2012 | November 2014 | Allow | 30 | 1 | 0 | No | No |
| 13456058 | PASSIVATING GLUE LAYER TO IMPROVE AMORPHOUS CARBON TO METAL ADHESION | April 2012 | July 2013 | Allow | 15 | 2 | 1 | No | No |
| 13454141 | METHOD FOR MAKING SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR APPARATUS OBTAINED BY THE METHOD, METHOD FOR MAKING THIN FILM TRANSISTOR SUBSTRATE AND THIN FILM TRANSISTOR SUBSTRATE OBTAINED BY THE METHOD, AND METHOD FOR MAKING DISPLAY APPARATUS AND DISPLAY APPARATUS O | April 2012 | February 2013 | Allow | 10 | 1 | 0 | No | No |
| 13437036 | N-TYPE CARRIER ENHANCEMENT IN SEMICONDUCTORS | April 2012 | September 2013 | Allow | 18 | 1 | 0 | No | No |
| 13436850 | N-TYPE CARRIER ENHANCEMENT IN SEMICONDUCTORS | March 2012 | February 2013 | Allow | 11 | 1 | 0 | No | No |
| 13389833 | METHOD AND APPARATUS FOR MAKING A SOLAR PANEL THAT IS PARTIALLY TRANSPARENT | March 2012 | March 2015 | Allow | 37 | 2 | 0 | Yes | No |
| 13421272 | IMPRINT METHOD, IMPRINT APPARATUS, AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | March 2012 | September 2014 | Allow | 30 | 0 | 1 | No | No |
| 13417787 | METHODS OF MANUFACTURING SEMICONDUCTOR DEVICES | March 2012 | June 2014 | Allow | 27 | 2 | 0 | No | No |
| 13416344 | SEMICONDUCTOR DEVICE PRODUCTION PROCESS | March 2012 | November 2013 | Allow | 20 | 1 | 0 | No | No |
| 13416844 | III-NITRIDE SEMICONDUCTOR LASER DEVICE, AND METHOD OF FABRICATING THE III- NITRIDE SEMICONDUCTOR LASER DEVICE | March 2012 | June 2013 | Allow | 16 | 2 | 0 | No | No |
| 13414744 | TWO-STEP HYDROGEN ANNEALING PROCESS FOR CREATING UNIFORM NON-PLANAR SEMICONDUCTOR DEVICES AT AGGRESSIVE PITCH | March 2012 | June 2013 | Allow | 16 | 0 | 0 | No | No |
| 13386597 | COMPLETE RECRYSTALLIZATION OF SEMICONDUCTOR WAFERS | March 2012 | November 2014 | Allow | 34 | 4 | 0 | No | No |
| 13414015 | SIDEWALL AND CHAMFER PROTECTION DURING HARD MASK REMOVAL FOR INTERCONNECT PATTERNING | March 2012 | June 2013 | Allow | 16 | 0 | 0 | No | No |
| 13412099 | THIN CAPPED CHANNEL LAYERS OF SEMICONDUCTOR DEVICES AND METHODS OF FORMING THE SAME | March 2012 | July 2014 | Allow | 28 | 3 | 0 | Yes | No |
| 13393218 | POLYMERIC SEMICONDUCTORS, DEVICES, AND RELATED METHODS | February 2012 | November 2013 | Allow | 20 | 1 | 1 | No | No |
| 13357656 | N-TYPE CARRIER ENHANCEMENT IN SEMICONDUCTORS | January 2012 | August 2012 | Allow | 7 | 2 | 0 | Yes | No |
| 13353013 | GATE ETCH OPTIMIZATION THROUGH SILICON DOPANT PROFILE CHANGE | January 2012 | November 2012 | Allow | 10 | 1 | 0 | No | No |
| 13347081 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | January 2012 | January 2013 | Allow | 12 | 0 | 1 | No | No |
| 13341512 | CMOS IMAGER WITH INTEGRATED CIRCUITRY | December 2011 | October 2012 | Allow | 10 | 0 | 0 | No | No |
| 13335560 | GROUP-III NITRIDE SEMICONDUCTOR LASER DEVICE, AND METHOD FOR FABRICATING GROUP-III NITRIDE SEMICONDUCTOR LASER DEVICE | December 2011 | April 2013 | Allow | 16 | 0 | 0 | No | No |
| 13333493 | CONFORMAL METALLIZATION PROCESS FOR THE FABRICATION OF SEMICONDUCTOR LASER DEVICES | December 2011 | November 2013 | Allow | 23 | 1 | 1 | No | No |
| 13306754 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD FOR THE SAME | November 2011 | November 2012 | Allow | 12 | 1 | 0 | No | No |
| 13289507 | GROUP-III NITRIDE SEMICONDUCTOR LASER DEVICE, AND METHOD OF FABRICATING GROUP-III NITRIDE SEMICONDUCTOR LASER DEVICE | November 2011 | March 2014 | Allow | 28 | 2 | 0 | No | No |
| 13317075 | SUBSTRATE STRUCTURES FOR INTEGRATED SERIES CONNECTED PHOTOVOLTAIC ARRAYS AND PROCESS OF MANUFACTURE OF SUCH ARRAYS | October 2011 | March 2012 | Allow | 5 | 2 | 0 | No | No |
| 13200398 | METHOD OF MANUFACTURING FLEXIBLE DISPLAY DEVICE | September 2011 | February 2013 | Allow | 16 | 0 | 0 | Yes | No |
| 13242787 | SOLAR CELL AND METHOD OF FABRICATING THE SAME | September 2011 | September 2013 | Allow | 24 | 0 | 1 | No | No |
| 13227750 | CMOS STRUCTURE HAVING MULTIPLE THRESHOLD VOLTAGE DEVICES | September 2011 | January 2013 | Allow | 16 | 1 | 1 | No | No |
| 13067723 | MANUFACTURING METHOD FOR ELECTRONIC DEVICES | June 2011 | June 2012 | Allow | 11 | 1 | 0 | No | No |
| 13154503 | FILM FORMATION APPARATUS, METHOD FOR FORMING FILM, AND METHOD FOR MANUFACTURING PHOTOELECTRIC CONVERSION DEVICE | June 2011 | January 2012 | Allow | 8 | 1 | 0 | No | No |
| 13118066 | CMOS IMAGER WITH INTEGRATED CIRCUITRY | May 2011 | August 2011 | Allow | 3 | 0 | 0 | No | No |
| 13067141 | NONVOLATILE SEMICONDUCTOR MEMORY AND METHOD OF MANUFACTURING THE SAME | May 2011 | October 2011 | Allow | 5 | 0 | 0 | Yes | No |
| 13099406 | ASYMMETRIC SOURCE AND DRAIN STRESSOR REGIONS | May 2011 | January 2012 | Allow | 9 | 0 | 1 | No | No |
| 13094381 | METHOD FOR MAKING SEMICONDUCTOR APPARATUS AND SEMICONDUCTOR APPARATUS OBTAINED BY THE METHOD, METHOD FOR MAKING THIN FILM TRANSISTOR SUBSTRATE AND THIN FILM TRANSISTOR SUBSTRATE OBTAINED BY THE METHOD, AND METHOD FOR MAKING DISPLAY APPARATUS AND DISPLAY APPARATUS O | April 2011 | March 2012 | Allow | 11 | 1 | 0 | No | No |
| 13064344 | NONVOLATILE MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME | March 2011 | September 2012 | Allow | 18 | 1 | 0 | No | No |
| 12943052 | MANUFACTURING METHOD OF AIRTIGHT CONTAINER, MANUFACTURING METHOD OF IMAGE DISPLAY DEVICE, AND BONDING METHOD | November 2010 | July 2011 | Allow | 8 | 1 | 0 | No | No |
| 12909066 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | October 2010 | July 2011 | Allow | 8 | 0 | 1 | No | No |
| 12860917 | METHOD OF MANUFACTURING LED MODULE | August 2010 | June 2012 | Allow | 22 | 1 | 0 | No | No |
| 12855877 | REDUCED PATTERN LOADING USING BIS(DIETHYLAMINO)SILANE (C8H22N2SI) AS SILICON PRECURSOR | August 2010 | May 2012 | Allow | 21 | 0 | 0 | No | No |
| 12855637 | PLASMA DEPOSITION OF AMORPHOUS SEMICONDUCTORS AT MICROWAVE FREQUENCIES | August 2010 | March 2012 | Allow | 19 | 1 | 0 | No | No |
| 12849018 | METHOD OF MAKING A SEMICONDUCTOR CHIP ASSEMBLY WITH A CERAMIC/METAL SUBSTRATE | August 2010 | September 2012 | Allow | 26 | 0 | 0 | No | No |
| 12805048 | MANUFACTURING METHOD FOR ELECTRONIC DEVICES | July 2010 | March 2011 | Allow | 8 | 1 | 0 | No | No |
| 12820633 | PROCESS FOR PRODUCING ZIRCONIUM OXIDE THIN FILMS | June 2010 | April 2011 | Allow | 10 | 1 | 0 | No | No |
| 12778456 | PACKAGING STRUCTURE OF SIP AND A MANUFACTURING METHOD THEREOF | May 2010 | February 2011 | Allow | 9 | 1 | 0 | No | No |
| 12799863 | SUBSTRATE STRUCTURES FOR INTEGRATED SERIES CONNECTED PHOTOVOLTAIC ARRAYS AND PROCESS OF MANUFACTURE OF SUCH ARRAYS | May 2010 | January 2011 | Allow | 8 | 2 | 0 | Yes | No |
| 12799885 | SUBSTRATE STRUCTURES FOR INTEGRATED SERIES CONNECTED PHOTOVOLTAIC ARRAYS AND PROCESS OF MANUFACTURE OF SUCH ARRAYS | May 2010 | January 2011 | Allow | 8 | 2 | 0 | Yes | No |
| 12763146 | HIGH-THROUGHPUT PRINTING OF SEMICONDUCTOR PRECURSOR LAYER FROM NANOFLAKE PARTICLES | April 2010 | September 2013 | Allow | 41 | 2 | 0 | No | No |
| 12725483 | SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | March 2010 | July 2011 | Allow | 16 | 0 | 0 | No | No |
| 12717087 | LED LIGHT MODULE FOR STREET LAMP AND METHOD OF MANUFACTURING SAME | March 2010 | August 2012 | Allow | 29 | 0 | 1 | No | No |
| 12706237 | MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | February 2010 | October 2011 | Allow | 20 | 1 | 0 | No | No |
| 12700217 | METHOD OF MANUFACTURING LAYERED CHIP PACKAGE | February 2010 | June 2011 | Allow | 17 | 0 | 0 | No | No |
| 12700297 | METHOD OF MANUFACTURING LAYERED CHIP PACKAGE | February 2010 | August 2012 | Allow | 30 | 1 | 0 | Yes | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner WILCZEWSKI, MARY A.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 66.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner WILCZEWSKI, MARY A works in Art Unit 2898 and has examined 300 patent applications in our dataset. With an allowance rate of 97.7%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 26 months.
Examiner WILCZEWSKI, MARY A's allowance rate of 97.7% places them in the 88% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by WILCZEWSKI, MARY A receive 1.62 office actions before reaching final disposition. This places the examiner in the 29% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by WILCZEWSKI, MARY A is 26 months. This places the examiner in the 76% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +0.5% benefit to allowance rate for applications examined by WILCZEWSKI, MARY A. This interview benefit is in the 19% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 28.9% of applications are subsequently allowed. This success rate is in the 56% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 50.5% of cases where such amendments are filed. This entry rate is in the 77% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
When applicants request a pre-appeal conference (PAC) with this examiner, 200.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 97% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 95% percentile among all examiners. Of these withdrawals, 53.8% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 48.5% are granted (fully or in part). This grant rate is in the 42% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 16.7% of allowed cases (in the 97% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.7% of allowed cases (in the 59% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.