Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18888284 | Device Structure for Inducing Layout Dependent Threshold Voltage Shift | September 2024 | March 2025 | Allow | 6 | 0 | 0 | No | No |
| 18610267 | REDUCED PITCH MEMORY SUBSYSTEM FOR MEMORY DEVICE | March 2024 | March 2025 | Allow | 12 | 1 | 0 | No | No |
| 18606413 | IMAGE SENSORS WITH LIGHT CHANNELING REFLECTIVE LAYERS THEREIN | March 2024 | February 2025 | Allow | 11 | 1 | 0 | No | No |
| 18393838 | LIGHT-EMITTING DEVICE AND METHOD FOR MANUFACTURING THE SAME | December 2023 | April 2025 | Allow | 16 | 1 | 0 | No | No |
| 18517275 | FLEXIBLE MERGE SCHEME FOR SOURCE/DRAIN EPITAXY REGIONS | November 2023 | April 2025 | Allow | 17 | 1 | 0 | No | No |
| 18508766 | INTEGRATED CIRCUIT WITH GUARD RING | November 2023 | January 2025 | Allow | 15 | 1 | 0 | No | No |
| 18477004 | SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, AND ELECTRONIC DEVICE INCLUDING THE DEVICE | September 2023 | June 2025 | Abandon | 20 | 2 | 0 | No | No |
| 18471718 | STACKED VERTICAL TRANSPORT FIELD-EFFECT TRANSISTOR LOGIC GATE STRUCTURES WITH SHARED EPITAXIAL LAYERS | September 2023 | March 2025 | Allow | 17 | 1 | 1 | Yes | No |
| 18468038 | IMAGE SENSORS WITH LIGHT CHANNELING REFLECTIVE LAYERS THEREIN | September 2023 | January 2025 | Abandon | 16 | 1 | 0 | Yes | No |
| 18466301 | WORK FUNCTION METAL PATTERNING FOR NANOSHEET CFETS | September 2023 | June 2025 | Allow | 21 | 1 | 0 | No | No |
| 18239677 | SEMICONDUCTOR DEVICES | August 2023 | December 2024 | Allow | 16 | 1 | 0 | No | No |
| 18448014 | ATOM PROBE TOMOGRAPHY SPECIMEN PREPARATION | August 2023 | June 2025 | Allow | 23 | 1 | 1 | No | No |
| 18359206 | MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION | July 2023 | May 2025 | Allow | 22 | 1 | 0 | Yes | No |
| 18356545 | STACKED SEMICONDUCTOR DEVICE HAVING MIRROR-SYMMETRIC PATTERN | July 2023 | March 2024 | Allow | 8 | 0 | 0 | No | No |
| 18349943 | DISPLAY DEVICE AND METHOD FOR MANUFACTURING THE SAME | July 2023 | September 2024 | Allow | 14 | 1 | 0 | No | No |
| 18200244 | TRAINED NEURAL NETWORK IN IN-SITU MONITORING DURING POLISHING AND POLISHING SYSTEM | May 2023 | March 2024 | Allow | 10 | 0 | 0 | No | No |
| 18305639 | System And Method Of Forming A Porous Low-K Structure | April 2023 | January 2025 | Allow | 21 | 2 | 0 | Yes | No |
| 18132333 | AIR GAP SPACER FORMATION FOR NANO-SCALE SEMICONDUCTOR DEVICES | April 2023 | September 2024 | Allow | 18 | 1 | 0 | No | No |
| 18166521 | INTEGRATED CIRCUIT DEVICES INCLUDING A VERTICAL FIELD-EFFECT TRANSISTOR AND METHODS OF FORMING THE SAME | February 2023 | June 2025 | Allow | 28 | 1 | 0 | Yes | No |
| 18093932 | CMOS TOP SOURCE/DRAIN REGION DOPING AND EPITAXIAL GROWTH FOR A VERTICAL FIELD EFFECT TRANSISTOR | January 2023 | February 2025 | Allow | 25 | 2 | 0 | No | No |
| 18092141 | DISPLAY PANEL AND DISPLAY DEVICE | December 2022 | June 2025 | Allow | 30 | 0 | 0 | No | No |
| 18083445 | REDUCED PITCH MEMORY SUBSYSTEM FOR MEMORY DEVICE | December 2022 | December 2023 | Allow | 12 | 0 | 0 | No | No |
| 18076763 | METHOD AND APPARATUS FOR PRODUCING AT LEAST ONE MODIFICATION IN A SOLID BODY | December 2022 | May 2024 | Allow | 18 | 1 | 1 | No | No |
| 18074525 | METHOD FOR MANUFACTURING AN ELECTRONIC DEVICE | December 2022 | September 2024 | Allow | 21 | 2 | 0 | No | No |
| 18070635 | CORE SHELL QUANTUM DOT, PRODUCTION METHOD THEREOF, AND ELECTRONIC DEVICE INCLUDING THE SAME | November 2022 | March 2024 | Allow | 15 | 1 | 0 | No | No |
| 17990960 | Semiconductor Power Module with Crack Sensing | November 2022 | June 2025 | Allow | 31 | 0 | 0 | No | No |
| 17923471 | IMPROVED TARGETS FOR DIFFRACTION-BASED OVERLAY ERROR METROLOGY | November 2022 | April 2024 | Allow | 18 | 0 | 0 | No | No |
| 17966653 | DISPLAY DEVICE | October 2022 | March 2025 | Allow | 29 | 0 | 0 | No | No |
| 17958301 | DISPLAY DEVICE | September 2022 | March 2024 | Allow | 18 | 1 | 0 | No | No |
| 17899894 | DISPLAY PANEL AND DISPLAY DEVICE | August 2022 | March 2025 | Allow | 31 | 0 | 0 | No | No |
| 17900699 | METHOD FOR MANAGING CHIP MANUFACTURING EQUIPMENT, APPARATUS, ELECTRONIC DEVICE AND STORAGE MEDIUM | August 2022 | March 2025 | Allow | 31 | 0 | 0 | No | No |
| 17878414 | METHOD OF INSPECTING TIP OF ATOMIC FORCE MICROSCOPE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | August 2022 | June 2025 | Allow | 34 | 0 | 1 | No | No |
| 17815902 | METHOD AND SYSTEM FOR DETECTING SEMICONDUCTOR DEVICE | July 2022 | March 2025 | Allow | 32 | 0 | 0 | No | No |
| 17874670 | Semiconductor Device and Method | July 2022 | March 2024 | Allow | 20 | 1 | 0 | No | No |
| 17874421 | Crown Bulk for FinFET Device | July 2022 | April 2025 | Allow | 33 | 1 | 0 | No | No |
| 17815085 | Semiconductor Device With Tunable Epitaxy Structures And Method Of Forming The Same | July 2022 | June 2024 | Allow | 22 | 1 | 0 | No | No |
| 17814876 | DISPLAY DEVICE INCLUDING A SENSING LAYER FOR SENSING AN EXTERNAL INPUT DEVICE AND METHOD OF DRVING THE SAME | July 2022 | April 2025 | Allow | 33 | 0 | 1 | No | No |
| 17869594 | Vacuum Systems in Semiconductor Fabrication Facilities | July 2022 | March 2025 | Allow | 32 | 2 | 1 | No | No |
| 17865328 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICES AND SEMICONDUCTOR DEVICES | July 2022 | February 2025 | Allow | 31 | 1 | 0 | No | No |
| 17810799 | NOVEL GATE STRUCTURES FOR TUNING THRESHOLD VOLTAGE | July 2022 | September 2024 | Allow | 26 | 2 | 0 | Yes | No |
| 17842450 | SEMICONDUCTOR NANOWIRE DEVICE HAVING (111)-PLANE CHANNEL SIDEWALLS | June 2022 | January 2024 | Allow | 19 | 1 | 0 | No | No |
| 17840060 | METHOD OF FABRICATING A SEMICONDUCTOR DEVICE | June 2022 | May 2024 | Allow | 23 | 2 | 0 | No | No |
| 17834412 | METHOD OF MEASURING CONCENTRATION OF FE IN P-TYPE SILICON WAFER AND SPV MEASUREMENT APPARATUS | June 2022 | July 2024 | Allow | 26 | 2 | 0 | No | No |
| 17824263 | METHOD FOR FORMING SEMICONDUCTOR STRUCTURE | May 2022 | January 2025 | Allow | 31 | 0 | 0 | No | No |
| 17749140 | OVERLAY MARK | May 2022 | March 2025 | Allow | 34 | 1 | 0 | No | No |
| 17778060 | A SEMICONDUCTOR DEVICE | May 2022 | May 2025 | Allow | 36 | 1 | 0 | No | No |
| 17663863 | PROCESS OF FORMING AN ELECTRONIC DEVICE INCLUDING A POLYMER SUPPORT LAYER | May 2022 | January 2024 | Allow | 20 | 1 | 0 | No | No |
| 17742962 | SYSTEMS AND METHODS FOR IMPROVING WITHIN DIE CO-PLANARITY UNIFORMITY | May 2022 | March 2024 | Allow | 22 | 2 | 0 | No | No |
| 17769572 | METHOD FOR EVALUATING SEMICONDUCTOR WAFER, METHOD FOR SELECTING SEMICONDUCTOR WAFER AND METHOD FOR FABRICATING DEVICE | April 2022 | January 2025 | Allow | 33 | 0 | 0 | No | No |
| 17721533 | SEMICONDUCTOR DEVICE AND DATA STORAGE SYSTEM INCLUDING THE SAME | April 2022 | April 2025 | Allow | 36 | 1 | 0 | No | No |
| 17721124 | FORMATION OF HIGH DENSITY 3D CIRCUITS WITH ENHANCED 3D CONDUCTIVITY | April 2022 | August 2024 | Allow | 29 | 0 | 1 | No | No |
| 17658743 | METHOD OF MANUFACTURING LED DISPLAY PANEL | April 2022 | April 2025 | Allow | 36 | 1 | 0 | Yes | No |
| 17713549 | DISPLAY DEVICE | April 2022 | September 2023 | Allow | 18 | 1 | 0 | No | No |
| 17702259 | SEMICONDUCTOR PACKAGE | March 2022 | January 2025 | Allow | 34 | 1 | 0 | Yes | No |
| 17691840 | 3D DEVICE WITH A PLURALITY OF CORE WIRING LAYOUT ARCHITECTURE | March 2022 | March 2025 | Allow | 36 | 3 | 0 | No | No |
| 17687451 | DISPLAY PANEL AND ELECTRONIC DEVICE INCLUDING THE SAME | March 2022 | November 2024 | Allow | 32 | 0 | 0 | No | No |
| 17592032 | PLURALITY OF DEVICES IN ADJACENT 3D STACKS IN DIFFERENT CIRCUIT LOCATIONS | February 2022 | March 2025 | Allow | 37 | 1 | 1 | No | No |
| 17648821 | Integrated Circuits and Methods for Forming Thin Film Crystal Layers | January 2022 | September 2024 | Allow | 32 | 1 | 1 | No | No |
| 17580116 | METHOD FOR THRESHOLD VOLTAGE TUNING THROUGH SELECTIVE DEPOSITION OF HIGH-K METAL GATE (HKMG) FILM STACKS | January 2022 | February 2024 | Allow | 25 | 2 | 0 | Yes | No |
| 17579088 | FABRICATION METHOD OF METAL-FREE SOI WAFER | January 2022 | March 2024 | Allow | 26 | 1 | 1 | No | No |
| 17647871 | SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOF | January 2022 | January 2025 | Allow | 36 | 1 | 1 | No | No |
| 17647672 | Semiconductor Device and Method for Manufacturing Semiconductor Device | January 2022 | July 2024 | Allow | 30 | 1 | 0 | No | No |
| 17571949 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | January 2022 | June 2024 | Allow | 30 | 1 | 0 | Yes | No |
| 17647296 | METHOD FOR GRINDING WAFER AND WAFER FAILURE ANALYSIS METHOD | January 2022 | June 2024 | Allow | 30 | 0 | 0 | No | No |
| 17549784 | SEMICONDUCTOR DEVICE PACKAGE AND METHOD OF MANUFACTURING THE SAME | December 2021 | January 2024 | Allow | 25 | 1 | 0 | No | No |
| 17545132 | LIGHT-EMITTING DEVICE AND METHOD FOR MANUFACTURING THE SAME | December 2021 | April 2024 | Abandon | 28 | 2 | 0 | No | No |
| 17530481 | SHIFT CONTROL METHOD IN MANUFACTURE OF SEMICONDUCTOR DEVICE | November 2021 | July 2024 | Allow | 31 | 1 | 0 | No | No |
| 17452338 | HYBRID CELL-BASED DEVICE, LAYOUT, AND METHOD | October 2021 | November 2024 | Allow | 37 | 2 | 1 | No | No |
| 17508965 | SEMICONDUCTOR DEVICE WITH FUSE COMPONENT | October 2021 | June 2024 | Allow | 32 | 2 | 0 | No | No |
| 17505771 | VERTICAL TRANSPORT FIELD EFFECT TRANSISTORS HAVING DIFFERENT THRESHOLD VOLTAGES ALONG THE CHANNEL | October 2021 | June 2025 | Allow | 44 | 1 | 1 | Yes | No |
| 17500276 | METHOD OF MANUFACTURING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTURE | October 2021 | June 2025 | Allow | 44 | 1 | 2 | No | No |
| 17498645 | METHOD OF FABRICATING A SEMICONDUCTOR DEVICE | October 2021 | January 2025 | Allow | 39 | 3 | 0 | No | No |
| 17491856 | Structures for Three-Dimensional CMOS Integrated Circuit Formation | October 2021 | June 2025 | Abandon | 44 | 3 | 1 | No | No |
| 17491408 | SOURCE/DRAIN CONTACT POSITIONING UNDER POWER RAIL | September 2021 | July 2024 | Allow | 34 | 2 | 1 | Yes | No |
| 17599535 | ARRANGEMENT APPARATUS AND ARRANGEMENT METHOD | September 2021 | June 2024 | Allow | 33 | 0 | 0 | No | No |
| 17479145 | VERTICAL FET REPLACEMENT GATE FORMATION WITH VARIABLE FIN PITCH | September 2021 | December 2024 | Allow | 39 | 4 | 1 | Yes | No |
| 17435098 | MOTHERBOARD AND MANUFACTURING METHOD FOR MOTHERBOARD | August 2021 | August 2024 | Allow | 36 | 1 | 0 | No | No |
| 17461428 | ARCHITECTURE WITH STACKED N AND P TRANSISTORS WITH A CHANNEL STRUCTURE FORMED OF NANOWIRES | August 2021 | November 2024 | Allow | 38 | 3 | 1 | No | No |
| 17404014 | SELF-ALIGNED BLOCK FOR VERTICAL FETS | August 2021 | March 2024 | Allow | 31 | 2 | 1 | Yes | No |
| 17394701 | COMPLEMENTARY FIELD EFFECT TRANSISTOR DEVICES | August 2021 | June 2024 | Allow | 35 | 4 | 1 | Yes | No |
| 17361381 | INTEGRATED CIRCUIT DEVICES INCLUDING STACKED GATE STRUCTURES WITH DIFFERENT DIMENSIONS | June 2021 | March 2024 | Allow | 33 | 3 | 1 | No | No |
| 17347066 | Method for Forming Source/Drain Contacts | June 2021 | February 2024 | Allow | 32 | 2 | 0 | No | No |
| 17323557 | Reducing Metal Gate Overhang By Forming A Top-Wide Bottom-Narrow Dummy Gate Electrode | May 2021 | July 2024 | Allow | 38 | 4 | 0 | Yes | No |
| 17234136 | Methods for Forming Contact Plugs with Reduced Corrosion | April 2021 | April 2024 | Allow | 36 | 3 | 0 | No | No |
| 17199879 | MANUFACTURING PROCESS WITH ATOMIC LEVEL INSPECTION | March 2021 | July 2024 | Allow | 40 | 2 | 1 | Yes | No |
| 17249542 | SEMICONDUCTOR STRUCTURE AND FORMATION METHOD THEREOF | March 2021 | August 2024 | Abandon | 42 | 4 | 1 | No | No |
| 17250770 | SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREOF, AND ELECTRONIC DEVICE INCLUDING THE DEVICE | March 2021 | April 2024 | Abandon | 37 | 3 | 1 | No | No |
| 17189039 | Thin-Sheet FinFET Device | March 2021 | February 2024 | Allow | 35 | 3 | 0 | No | No |
| 17135102 | PHASE CHANGE MEMORY CELL WITH CONSTRICTION STRUCTURE | December 2020 | December 2024 | Abandon | 48 | 5 | 0 | No | No |
| 17106933 | SEMICONDUCTOR DEVICE AND METHOD OF FORMING VERTICAL STRUCTURE | November 2020 | April 2024 | Allow | 40 | 3 | 0 | No | No |
| 17084628 | Method of manufacturing semiconductor devices | October 2020 | March 2024 | Allow | 41 | 3 | 1 | No | No |
| 16980095 | ARRAY SUBSTRATE AND OLED DISPLAY PANEL | September 2020 | January 2024 | Allow | 40 | 1 | 0 | No | No |
| 15947852 | THREE-DIMENSIONAL VERTICAL ONE-TIME-PROGRAMMABLE MEMORY COMPRISING SCHOTTKY DIODES | April 2018 | October 2019 | Allow | 18 | 1 | 0 | No | No |
| 15919381 | THREE-DIMENSIONAL VERTICAL ONE-TIME-PROGRAMMABLE MEMORY COMPRISING MULTIPLE ANTIFUSE SUB-LAYERS | March 2018 | October 2019 | Allow | 19 | 1 | 0 | No | No |
| 15867121 | PHOTODETECTOR HAVING A TUNABLE JUNCTION REGION DOPING PROFILE CONFIGURED TO IMPROVE CONTACT RESISTANCE PERFORMANCE | January 2018 | September 2019 | Allow | 20 | 1 | 0 | No | No |
| 15859557 | GATE TOP SPACER FOR FINFET | December 2017 | July 2018 | Allow | 6 | 0 | 0 | No | No |
| 15581510 | METHODS FOR PROVIDING VARIABLE FEATURE WIDTHS IN A SELF-ALIGNED SPACER-MASK PATTERNING PROCESS | April 2017 | October 2017 | Allow | 6 | 0 | 0 | No | No |
| 15492253 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | April 2017 | October 2017 | Allow | 6 | 0 | 0 | No | No |
| 15492428 | METHOD FOR PECVD OVERLAY IMPROVEMENT | April 2017 | November 2017 | Allow | 7 | 0 | 0 | No | No |
| 15519324 | Method for Forming Mask Pattern, Thin Film Transistor and Method for Forming the Same, and Display Device | April 2017 | December 2018 | Allow | 20 | 0 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner TRINH, MICHAEL MANH.
With a 100.0% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 46.2% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner TRINH, MICHAEL MANH works in Art Unit 2898 and has examined 415 patent applications in our dataset. With an allowance rate of 98.1%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 26 months.
Examiner TRINH, MICHAEL MANH's allowance rate of 98.1% places them in the 94% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by TRINH, MICHAEL MANH receive 1.51 office actions before reaching final disposition. This places the examiner in the 37% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by TRINH, MICHAEL MANH is 26 months. This places the examiner in the 63% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a -0.8% benefit to allowance rate for applications examined by TRINH, MICHAEL MANH. This interview benefit is in the 8% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 35.0% of applications are subsequently allowed. This success rate is in the 73% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 37.1% of cases where such amendments are filed. This entry rate is in the 49% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 0.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 14% percentile among all examiners. Note: Pre-appeal conferences show limited success with this examiner compared to others. While still worth considering, be prepared to proceed with a full appeal brief if the PAC does not result in favorable action.
This examiner withdraws rejections or reopens prosecution in 84.6% of appeals filed. This is in the 75% percentile among all examiners. Of these withdrawals, 45.5% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 40.7% are granted (fully or in part). This grant rate is in the 41% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 9.4% of allowed cases (in the 95% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 2.0% of allowed cases (in the 65% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.