USPTO Examiner STARK JARRETT J - Art Unit 2898

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18758239METHOD FOR TRANSPORTING WAFERSJune 2024March 2026Allow2110NoNo
18755727HIGH ELECTRON MOBILITY TRANSISTOR STRUCTURE AND METHOD OF FABRICATING THE SAMEJune 2024June 2025Allow1200NoNo
18751695SEMICONDUCTOR DEVICE STRUCTURE WITH MOVABLE MEMBRANEJune 2024September 2025Allow1510YesNo
18679537PIEZOELECTRIC BIOSENSOR AND RELATED METHOD OF FORMATIONMay 2024March 2025Allow1010NoNo
18624721SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEApril 2024July 2025Allow1520YesNo
18605154INK DROPLET VOLUME MEASURING APPARATUS AND INK DROPLET VOLUME MEASURING METHOD USING THE SAME, AND THIN FILM LAYER FORMING APPARATUS USING THE MEASURING APPARATUS, AND MANUFACTURING METHOD OF DISPLAY APPARATUS USING THE THIN FILM LAYER FORMING APPARATUSMarch 2024December 2024Allow900NoNo
18598672SEMICONDUCTOR DEVICEMarch 2024November 2024Allow800NoNo
18596076Asic Package With Photonics And Vertical Power DeliveryMarch 2024February 2025Allow1110NoNo
18591560DETECTION DEVICEFebruary 2024February 2025Allow1210NoNo
18444742PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOFFebruary 2024May 2025Allow1521NoNo
18435461SOLID-STATE IMAGING ELEMENT AND ELECTRONIC APPARATUSFebruary 2024July 2025Allow1721NoNo
18419696Semiconductor Devices and Methods of ManufacturingJanuary 2024March 2025Allow1410NoNo
18415438ISOLATORJanuary 2024September 2025Allow2021YesNo
18412612APPARATUS AND METHOD FOR AUTOMATED WAFER CARRIER HANDLINGJanuary 2024February 2025Allow1310YesNo
18498453SEMICONDUCTOR DEVICEOctober 2023March 2025Allow1610NoNo
18483162IMAGING ELEMENT, STACKED IMAGING ELEMENT, AND SOLID-STATE IMAGING DEVICEOctober 2023October 2024Allow1310NoNo
18457453INTEGRATED CIRCUIT STRUCTURES INCLUDING BACKSIDE VIASAugust 2023January 2025Allow1601NoNo
18457339LIGHT EMITTING DEVICEAugust 2023August 2024Allow1210NoNo
18450509SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING SAMEAugust 2023November 2025Allow2700NoNo
18448111INTEGRATED CIRCUIT WITH FEOL RESISTORAugust 2023August 2024Allow1210YesNo
18230829Method of Forming Semiconductor Packages Having Through Package ViasAugust 2023May 2024Allow1010NoNo
18363565DISPLAY APPARATUSAugust 2023March 2026Allow3110NoNo
18354842INTEGRATED CHIP INDUCTOR STRUCTUREJuly 2023October 2025Allow2700NoNo
18219048FLEXIBLE DISPLAY DEVICEJuly 2023August 2024Allow1310NoNo
18345148Semiconductor Device and MethodJune 2023October 2024Allow1510NoNo
18216668SUBSTRATE-FLOATATION-TYPE LASER PROCESSING APPARATUS AND METHOD FOR MEASURING FLOATING HEIGHTJune 2023May 2024Allow1010NoNo
18335171FULL WELL CAPACITY FOR IMAGE SENSORJune 2023April 2025Allow2211NoNo
18328080SEAL METHOD TO INTEGRATE NON-VOLATILE MEMORY (NVM) INTO LOGIC OR BIPOLAR CMOS DMOS (BCD) TECHNOLOGYJune 2023July 2024Allow1310NoNo
18326319SEMICONDUCTOR DEVICEMay 2023December 2025Allow3010YesNo
18321529PIEZOELECTRIC ACOUSTIC RESONATOR MANUFACTURED WITH PIEZOELECTRIC THIN FILM TRANSFER PROCESSMay 2023July 2024Allow1400NoNo
18199516SEMICONDUCTOR DEVICEMay 2023February 2026Allow3311YesNo
18318907BACKSIDE CONTACT FOR THERMAL DISPLACEMENT IN A MULTI-WAFER STACKED INTEGRATED CIRCUITMay 2023January 2025Allow2021NoNo
18197515IMAGING DEVICEMay 2023September 2025Allow2850NoNo
18195309SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREFORMay 2023January 2026Allow3321NoNo
18313417SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREOFMay 2023August 2025Allow2701NoNo
18308393SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEApril 2023September 2025Allow2910YesNo
18033048LIGHT-EMITTING SUBSTRATE AND DISPLAY DEVICEApril 2023October 2025Allow3010NoNo
17910272IMAGING APPARATUS AND ELECTRONIC DEVICEApril 2023February 2026Allow4110NoNo
18192554COMBINED DOLAN BRIDGE AND QUANTUM DOT JOSEPHSON JUNCTION IN SERIESMarch 2023May 2024Allow1310NoNo
18122718Image sensor and manufacturing method thereofMarch 2023November 2025Allow3201NoNo
18183227IMAGING DEVICEMarch 2023December 2025Allow3320NoNo
18110843CMOS IMAGE SENSORFebruary 2023May 2025Allow2700NoNo
18106724SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THEREOFFebruary 2023August 2025Allow3011NoNo
18104992PROBE CARD FOR CONNECTING TO CONTACT PADS CONFIGURED TO ACT AS PROBE PADS OF A SEMICONDUCTOR WAFERFebruary 2023February 2026Allow3611NoNo
18162468SYSTEMS AND METHODS FOR ACTIVE AND PASSIVE COOLING OF ELECTRICAL COMPONENTSJanuary 2023November 2025Allow3441YesNo
18097717METHOD OF INSPECTING DISPLAY PANEL AND MANUFACTURING METHOD OF DISPLAY PANELJanuary 2023February 2026Allow3711NoNo
18155704DISPLAY DEVICE INCLUDING AN ANISOTROPIC CONDUCTIVE FILMJanuary 2023October 2025Abandon3350NoNo
18097135DISPLAY DEVICEJanuary 2023January 2026Allow3620NoNo
18095922MEMORY DEVICE AND MANUFACTURING METHOD OF THE MEMORY DEVICEJanuary 2023January 2026Allow3611NoNo
18093951POLYSILICON RESISTOR IMPLANT FOR REDUCED RESISTANCE TEMPERATURE COEFFICIENT VARIABILITYJanuary 2023July 2025Allow3131NoNo
18093930SEMICONDUCTOR STRUCTURE AND MANUFACTURING METHOD THEREFORJanuary 2023December 2025Allow3521YesNo
17788653VERTICAL FIN FIELD EFFECT TRANSISTOR, VERTICAL FIN FIELD EFFECT TRANSISTOR ARRANGEMENT, AND METHOD FOR FORMING A VERTICAL FIN FIELD EFFECT TRANSISTORJanuary 2023May 2025Allow3500NoNo
18063722SUPERCONDUCTING QUBIT CAPACITANCE AND FREQUENCY OF OPERATION TUNINGDecember 2022October 2024Allow2330YesNo
18075119SEMICONDUCTOR DEVICE AND A METHOD FOR FABRICATING THE SAMEDecember 2022September 2024Allow2130NoNo
18060561TEMPERATURE ADJUSTMENT APPARATUS FOR HIGH TEMPERATURE OVENNovember 2022October 2024Allow2210NoNo
18057220SEMICONDUCTOR STRUCTURE AND ASSOCIATED FABRICATING METHODNovember 2022September 2024Allow2230NoNo
18055655SUPERCONDUCTING QUBIT AND RESONATOR SYSTEM BASED ON THE JOSEPHSON RING MODULATORNovember 2022April 2024Allow1710YesNo
17974710IMAGING DEVICE AND ELECTRONIC DEVICEOctober 2022September 2025Abandon3540YesNo
17963015FLARE-BLOCKING IMAGE SENSOROctober 2022July 2024Allow2120YesNo
17940361OPTOELECTRONIC DEVICESeptember 2022November 2025Allow3811NoNo
17902731INTEGRATING CIRCUIT ELEMENTS IN A STACKED QUANTUM COMPUTING DEVICESeptember 2022March 2024Allow1810NoNo
17902695INTEGRATING CIRCUIT ELEMENTS IN A STACKED QUANTUM COMPUTING DEVICESeptember 2022September 2024Allow2521NoNo
17929144WAFER DE-CHUCKING DETECTION AND ARCING PREVENTIONSeptember 2022January 2024Allow1710YesNo
17908493Semiconductor Device and Method for Manufacturing the SameAugust 2022November 2025Abandon3901NoNo
17895785SEMICONDUCTOR INTEGRATED CIRCUIT DEVICEAugust 2022September 2025Allow3720YesNo
17890489SEMICONDUCTOR DEVICEAugust 2022September 2025Allow3710NoNo
17819036WAFER-LEVEL STACKED DIE STRUCTURES AND ASSOCIATED SYSTEMS AND METHODSAugust 2022June 2024Allow2230NoNo
17883120MICRO LIGHT-EMITTING DIODE AND MICRO LIGHT-EMITTING DIODE ARRAYAugust 2022August 2025Allow3710NoNo
17880773PIEZOELECTRIC BIOSENSOR AND RELATED METHOD OF FORMATIONAugust 2022March 2024Allow1911NoNo
17876377DISPLAY PANEL MANUFACTURING APPARATUS AND DISPLAY PANEL MANUFACTURING METHOD USING THE SAMEJuly 2022July 2025Allow3601NoNo
17874169COLOR CONVERSION PANEL AND DISPLAY DEVICE INCLUDING THE SAMEJuly 2022August 2025Allow3610NoNo
17814651SOLID-STATE IMAGING DEVICE AND ELECTRONIC APPARATUSJuly 2022April 2024Allow2111YesNo
17793988Electronic DeviceJuly 2022July 2025Allow3610NoNo
17869297WAFER BONDING METHOD AND SEMICONDUCTOR STRUCTURE OBTAINED BY THE SAMEJuly 2022August 2025Allow3721NoNo
17793151SYSTEMS AND METHODS FOR FABRICATING SUPERCONDUCTING INTEGRATED CIRCUITSJuly 2022December 2025Allow4121NoNo
17856140IMAGE SENSORJuly 2022April 2025Allow3310YesNo
17854228METHOD FOR FORMING SEMICONDUCTOR STRUCTURE AND SEMICONDUCTOR STRUCTUREJune 2022March 2025Allow3201NoNo
17851775ORGANIC PHOTODIODE, SENSOR, CAMERA, AND ELECTRONIC DEVICEJune 2022April 2025Allow3310YesNo
17830994SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAMEJune 2022April 2024Allow2220YesNo
17748932METHOD FOR TRANSPORTING WAFERSMay 2022April 2024Allow2311NoNo
17736098DISPLAY DEVICE AND MANUFACTURING METHOD OF THE DISPLAY DEVICEMay 2022February 2025Allow3411NoNo
17729549THREE-DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND ELECTRONIC SYSTEM INCLUDING THE SAMEApril 2022December 2024Allow3100NoNo
17770700SEMICONDUCTOR DEVICEApril 2022June 2025Allow3830YesNo
17725837POLISHING COMPOSITION, POLISHING METHOD, AND METHOD FOR PRODUCING POLISHED SUBSTRATEApril 2022January 2026Allow4431YesNo
17770639HEAT DISSIPATION FILM FOR DISPLAY MODULE, AND PREPARATION METHOD OF DISPLAY DEVICEApril 2022December 2024Allow3200YesNo
17770288METHOD FOR FORMING ELECTRODEApril 2022October 2025Allow4230NoNo
17770117RED LED CHIP COMPONENT, RED LED CHIP, DISPLAY PANEL AND MANUFACTURING METHODApril 2022May 2025Abandon3701NoNo
17720010IMAGE SENSORApril 2022September 2024Allow2900NoNo
17717892SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAMEApril 2022January 2025Allow3411NoNo
17716331Contact Structures for Semiconductor DevicesApril 2022January 2025Allow3411NoNo
17713955Memory Arrays Comprising Strings Of Memory Cells And Methods Used In Forming A Memory Array Comprising Strings Of Memory CellsApril 2022March 2025Allow3521NoNo
17754534HYBRID BONDING BASED INTEGRATED CIRCUIT DEVICE AND METHOD OF MANUFACTURING THE SAMEApril 2022October 2025Abandon4221NoNo
17711204SEMICONDUCTOR DEVICE STRUCTURE WITH MOVABLE MEMBRANEApril 2022March 2024Allow2311NoNo
17657266SEMICONDUCTOR DEVICEMarch 2022August 2025Allow4110NoNo
17704003Lighting-emitting Diode Chip and Manufacturing Method, Display DeviceMarch 2022January 2025Abandon3401NoNo
17696291DETECTION DEVICEMarch 2022September 2024Allow3010YesNo
17696828INSPECTION APPARATUS, MANUFACTURING METHOD OF INTEGRATED CIRCUIT, AND INSPECTION METHODMarch 2022March 2025Allow3601NoNo
17760855DISPLAY PANEL, METHOD FOR MANUFACTURING SAME, AND DISPLAY DEVICEMarch 2022September 2025Abandon4221NoNo
17691089FABRICATION OF MICRO-LED DISPLAYS WITH REWORK OR TRANSFER LINEMarch 2022August 2025Abandon4211NoNo
17687085SEMICONDUCTOR MEMORY DEVICE AND MANUFACTURING METHOD THEREOFMarch 2022April 2025Allow3821YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner STARK, JARRETT J.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
6
Examiner Affirmed
1
(16.7%)
Examiner Reversed
5
(83.3%)
Reversal Percentile
90.8%
Higher than average

What This Means

With a 83.3% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.

Strategic Value of Filing an Appeal

Total Appeal Filings
19
Allowed After Appeal Filing
7
(36.8%)
Not Allowed After Appeal Filing
12
(63.2%)
Filing Benefit Percentile
60.6%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 36.8% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner STARK, JARRETT J - Prosecution Strategy Guide

Executive Summary

Examiner STARK, JARRETT J works in Art Unit 2898 and has examined 147 patent applications in our dataset. With an allowance rate of 89.1%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 34 months.

Allowance Patterns

Examiner STARK, JARRETT J's allowance rate of 89.1% places them in the 71% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by STARK, JARRETT J receive 2.50 office actions before reaching final disposition. This places the examiner in the 73% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by STARK, JARRETT J is 34 months. This places the examiner in the 44% percentile for prosecution speed. Prosecution timelines are slightly slower than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +8.8% benefit to allowance rate for applications examined by STARK, JARRETT J. This interview benefit is in the 40% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 25.3% of applications are subsequently allowed. This success rate is in the 40% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 16.9% of cases where such amendments are filed. This entry rate is in the 19% percentile among all examiners. Strategic Recommendation: This examiner rarely enters after-final amendments compared to other examiners. You should generally plan to file an RCE or appeal rather than relying on after-final amendment entry. Per MPEP § 714.12, primary examiners have discretion in entering after-final amendments, and this examiner exercises that discretion conservatively.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 66.7% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 56% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 70.0% of appeals filed. This is in the 57% percentile among all examiners. Of these withdrawals, 35.7% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.

Petition Practice

When applicants file petitions regarding this examiner's actions, 61.5% are granted (fully or in part). This grant rate is in the 66% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 7.5% of allowed cases (in the 90% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 6.1% of allowed cases (in the 83% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Plan for RCE after final rejection: This examiner rarely enters after-final amendments. Budget for an RCE in your prosecution strategy if you receive a final rejection.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.