Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18671580 | Air Gap Seal for Interconnect Air Gap and Method of Fabricating Thereof | May 2024 | January 2026 | Allow | 20 | 1 | 1 | No | No |
| 18510906 | DIODE INCLUDING A TRENCH ELECTRODE SUBDIVIDED INTO AT LEAST FIRST AND SECOND PARTS | November 2023 | December 2025 | Allow | 25 | 1 | 1 | No | No |
| 18446827 | VERTICAL SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE VERTICAL SEMICONDUCTOR DEVICE | August 2023 | February 2025 | Allow | 19 | 0 | 0 | Yes | No |
| 18359900 | METHOD FOR MANUFACTURING SEMICONDUCTOR STRUCTURE | July 2023 | November 2025 | Allow | 28 | 1 | 1 | No | No |
| 18334368 | PHOTOELECTRIC CONVERSION ELEMENT, IMAGING ELEMENT, OPTICAL SENSOR, AND COMPOUND | June 2023 | August 2025 | Allow | 27 | 0 | 0 | No | No |
| 18200019 | Self-Erasable And Rewritable Optoexcitonic Platform For Anti-Tamper Hardware | May 2023 | May 2025 | Allow | 24 | 1 | 1 | No | No |
| 18132806 | LIGHT EMITTING DEVICE WITH LIGHT ABSORBERS AND DISPLAY APPARATUS INCLUDING THE SAME | April 2023 | September 2024 | Allow | 17 | 1 | 1 | Yes | No |
| 18132835 | LIGHT EMITTING DEVICE INCLUDING LIGHT ABSORBERS AND DISPLAY APPARATUS INCLUDING THE SAME | April 2023 | September 2024 | Allow | 17 | 1 | 1 | Yes | No |
| 18193653 | METHOD OF MANUFACTURING CAPACITOR STRUCTURE | March 2023 | August 2024 | Allow | 16 | 1 | 0 | No | No |
| 18118993 | LIGHT EMITTING DEVICE, DISPLAY APPARATUS, AND MANUFACTURING METHOD THEREOF | March 2023 | February 2026 | Allow | 36 | 1 | 1 | Yes | No |
| 18109125 | SYSTEMS AND METHODS OF LIDAR SENSOR SYSTEMS HAVING INTEGRATED SEMICONDUCTOR DEVICES | February 2023 | February 2025 | Allow | 24 | 3 | 0 | Yes | No |
| 17890762 | Memory Device With Jogged Backside Metal Lines | August 2022 | October 2025 | Allow | 38 | 1 | 1 | No | No |
| 17815428 | GATE STRUCTURE FOR SEMICONDUCTOR DEVICE | July 2022 | November 2025 | Allow | 40 | 3 | 1 | Yes | No |
| 17872885 | MEMORY DEVICES AND METHODS OF MANUFACTURING THEREOF | July 2022 | April 2025 | Allow | 32 | 2 | 1 | No | No |
| 17872511 | MEMORY ARRAY HAVING CONNECTIONS GOING THROUGH CONTROL GATES | July 2022 | March 2025 | Allow | 32 | 2 | 1 | Yes | No |
| 17792440 | A METHOD OF CONNECTING CIRCUIT ELEMENTS | July 2022 | February 2026 | Abandon | 43 | 2 | 0 | No | No |
| 17810684 | METHOD OF FABRICATING A SEMICONDUCTOR DEVICE HAVING CAPACITOR MATERIAL | July 2022 | July 2024 | Allow | 24 | 1 | 1 | No | No |
| 17857608 | SEMICONDUCTOR DEVICE HAVING SPACER BETWEEN CONTRACT PATTERNS | July 2022 | December 2024 | Allow | 30 | 2 | 1 | Yes | No |
| 17850377 | DISPLAY DEVICE WITH ENCAPSULATED QUANTUM DOT LIGHT-EMITTING DIODE AND MANUFACTURING METHOD THEREOF | June 2022 | November 2025 | Allow | 41 | 1 | 1 | No | No |
| 17808641 | SEMICONDUCTOR DEVICE AND METHOD FOR FABRICATING THE SAME | June 2022 | April 2025 | Allow | 34 | 2 | 1 | Yes | No |
| 17847122 | PASSIVATION COVERED LIGHT EMITTING UNIT STACK | June 2022 | October 2025 | Allow | 40 | 3 | 1 | No | No |
| 17831597 | RC IGBT and Method of Producing an RC IGBT | June 2022 | February 2026 | Allow | 45 | 2 | 1 | No | Yes |
| 17782316 | DISPLAY DEVICE USING LIGHT EMITTING ELEMENTS HAVING ADHESIVE LAYERS AND MANUFACTURING METHOD THEREFOR | June 2022 | November 2025 | Allow | 41 | 2 | 1 | No | No |
| 17826706 | ELECTRONIC DEVICE COMPRISING TRANSISTORS | May 2022 | August 2025 | Allow | 39 | 1 | 1 | No | No |
| 17746482 | SEMICONDUCTOR DEVICE INCLUDING AN RC-IGBT | May 2022 | January 2026 | Abandon | 44 | 4 | 2 | No | Yes |
| 17739826 | Air Gap Seal for Interconnect Air Gap and Method of Fabricating Thereof | May 2022 | January 2024 | Allow | 21 | 1 | 1 | No | No |
| 17721932 | THREE-DIMENSIONAL SEMICONDUCTOR DEVICE | April 2022 | March 2024 | Allow | 23 | 1 | 1 | No | No |
| 17703934 | SEMICONDUCTOR DEVICE PROVIDED WITH AT LEAST IGBT | March 2022 | October 2025 | Allow | 43 | 3 | 1 | Yes | No |
| 17652167 | SEMICONDUCTOR DEVICE IN WHICH CURRENT COLLAPSE AND LEAKAGE CURRENT BETWEEN SOURCE AND DRAIN REGIONS ARE SUPPRESSED | February 2022 | July 2025 | Allow | 41 | 2 | 1 | Yes | No |
| 17667728 | DISPLAY DEVICE | February 2022 | February 2026 | Allow | 48 | 5 | 1 | Yes | No |
| 17650381 | SEMICONDUCTOR STRUCTURE WITH AN AIR GAP, METHOD FOR FORMING SAME, AND STACKED STRUCTURE | February 2022 | May 2025 | Allow | 40 | 1 | 1 | No | No |
| 17588860 | DISPLAY PANEL, PREPARATION METHOD THEREOF AND DISPLAY DEVICE | January 2022 | October 2024 | Abandon | 32 | 2 | 1 | Yes | No |
| 17628912 | OPTOELECTRONIC SEMICONDUCTOR CHIP AND METHOD FOR PRODUCING AN OPTOELECTRONIC SEMICONDUCTOR CHIP | January 2022 | April 2025 | Allow | 38 | 1 | 0 | No | No |
| 17629135 | DISPLAY SUBSTRATE AND METHOD FOR MANUFACTURING THE SAME, AND DISPLAY DEVICE | January 2022 | October 2024 | Allow | 33 | 0 | 1 | No | No |
| 17528053 | SEMICONDUCTOR DEVICE | November 2021 | July 2024 | Abandon | 32 | 2 | 1 | No | No |
| 17526309 | TRANSPARENT DISPLAY APPARATUS | November 2021 | February 2024 | Allow | 27 | 2 | 1 | No | No |
| 17454168 | METHOD OF MANUFACTURING A SUPER JUNCTION STRUCTURE AND SUPER JUNCTION STRUCTURE | November 2021 | March 2024 | Allow | 28 | 3 | 1 | No | No |
| 17517920 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | November 2021 | May 2025 | Allow | 43 | 2 | 1 | No | No |
| 17600387 | DISPLAY PANEL AND DISPLAY DEVICE | September 2021 | March 2026 | Allow | 53 | 4 | 1 | Yes | No |
| 17412365 | MEMORY CHIPLET HAVING MULTIPLE ARRAYS OF MEMORY DEVICES AND METHODS OF FORMING THE SAME | August 2021 | June 2025 | Allow | 46 | 4 | 1 | Yes | No |
| 17410499 | HYBRID HIGH BANDWIDTH MEMORIES | August 2021 | November 2025 | Allow | 51 | 5 | 1 | Yes | No |
| 17409053 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | August 2021 | April 2024 | Allow | 32 | 2 | 1 | Yes | Yes |
| 17350852 | SEMICONDUCTOR DEVICE AND SEMICONDUCTOR STORAGE DEVICE | June 2021 | November 2024 | Allow | 41 | 4 | 1 | Yes | No |
| 17330870 | THERMAL INTERFACE STRUCTURE FOR INTEGRATED CIRCUIT DEVICE ASSEMBLIES | May 2021 | November 2025 | Abandon | 54 | 2 | 0 | No | No |
| 17295869 | SEMICONDUCTOR DEVICE STRUCTURES AND METHODS OF MANUFACTURING THE SAME | May 2021 | May 2025 | Abandon | 47 | 1 | 1 | No | No |
| 17323425 | THREE-DIMENSIONAL MONOLITHICALLY INTEGRATED NANORIBBON-BASED MEMORY AND COMPUTE | May 2021 | September 2025 | Abandon | 52 | 2 | 1 | Yes | No |
| 17267925 | METHOD FOR PRODUCING FERROELECTRIC POLYMER ELEMENT, FERROELECTRIC POLYMER ELEMENT AND PIEZOELECTRIC SENSOR | February 2021 | March 2025 | Abandon | 49 | 3 | 0 | No | No |
| 17151383 | SEMICONDUCTOR DEVICE | January 2021 | March 2025 | Abandon | 50 | 4 | 1 | Yes | No |
| 17148525 | SEMICONDUCTOR DEVICE INCLUDING AN IGBT WITH REDUCED VARIATION IN THRESHOLD VOLTAGE | January 2021 | January 2024 | Allow | 36 | 3 | 1 | Yes | No |
| 17259084 | DISPLAY DEVICE USING SEMICONDUCTOR LIGHT-EMITTING ELEMENTS | January 2021 | August 2025 | Allow | 55 | 4 | 1 | Yes | No |
| 17256565 | MICROMECHANICAL COMPONENT AND METHOD FOR PRODUCING SAME | December 2020 | June 2025 | Allow | 54 | 2 | 1 | Yes | No |
| 17124817 | SEMICONDUCTOR DEVICE | December 2020 | April 2024 | Allow | 40 | 3 | 1 | Yes | No |
| 17252787 | SOLID-STATE IMAGE SENSOR WITH IMAGING DEVICE BLOCKS THAT EACH INCLUDE IMAGING DEVICES | December 2020 | January 2024 | Allow | 37 | 0 | 1 | No | No |
| 17252810 | SOLID-STATE IMAGING APPARATUS AND ELECTRONIC APPARATUS | December 2020 | March 2026 | Abandon | 60 | 5 | 0 | No | No |
| 17042835 | DISPLAY DEVICE, MASK, AND METHOD FOR MANUFACTURING DISPLAY DEVICE | September 2020 | August 2024 | Allow | 46 | 2 | 1 | No | No |
| 17042870 | DISPLAY SUBSTRATE, METHOD OF MANUFACTURING DISPLAY SUBSTRATE, AND DISPLAY DEVICE | September 2020 | November 2024 | Abandon | 50 | 5 | 1 | Yes | No |
| 16905883 | STATIC RANDOM ACCESS MEMORY | June 2020 | March 2025 | Allow | 57 | 5 | 1 | Yes | No |
| 16904913 | DISPLAY DEVICE INCLUDING FINGERPRINT RECOGNITION FUNCTION | June 2020 | November 2023 | Allow | 41 | 3 | 1 | No | No |
| 16859637 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | April 2020 | January 2026 | Abandon | 60 | 6 | 1 | Yes | Yes |
| 16794208 | SEMICONDUCTOR DEVICE | February 2020 | February 2025 | Allow | 60 | 5 | 1 | No | Yes |
| 16596009 | GATE STRUCTURE FOR SEMICONDUCTOR DEVICE | October 2019 | August 2025 | Allow | 60 | 6 | 1 | Yes | No |
| 16572926 | Memory Circuitry Comprising A Vertical String Of Memory Cells And A Conductive Via And Method Used In Forming A Vertical String Of Memory Cells And A Conductive Via | September 2019 | March 2024 | Allow | 54 | 6 | 1 | Yes | No |
| 16337528 | DISPLAY PANEL AND MANUFACTURING METHOD THEREFOR, AND DISPLAY APPARATUS | March 2019 | March 2026 | Abandon | 60 | 8 | 1 | No | No |
| 16225106 | LOW COST RELIABLE FAN-OUT CHIP SCALE PACKAGES | December 2018 | February 2025 | Abandon | 60 | 6 | 1 | No | Yes |
| 15859415 | PITCH-DIVIDED INTERCONNECTS FOR ADVANCED INTEGRATED CIRCUIT STRUCTURE FABRICATION | December 2017 | May 2019 | Allow | 17 | 11 | 0 | No | No |
| 15652162 | ENHANCEMENT OF ISO-VIA RELIABILITY | July 2017 | June 2019 | Allow | 23 | 0 | 1 | No | No |
| 14581472 | FINFET BASED ZRAM WITH CONVEX CHANNEL REGION | December 2014 | April 2019 | Allow | 52 | 6 | 1 | Yes | No |
| 14042991 | METHOD FOR PRODUCING A MICRO-LED MATRIX, MICRO-LED MATRIX AND USE OF A MICRO-LED MATRIX | October 2013 | December 2018 | Allow | 60 | 3 | 1 | No | No |
| 13360245 | PHOTOELECTRIC CONVERSION ELEMENT, METHOD FOR MANUFACTURING PHOTOELECTRIC CONVERSION ELEMENT, AND ELECTRONIC APPARATUS | January 2012 | May 2013 | Allow | 15 | 2 | 1 | Yes | No |
| 13192608 | DOUBLE-SIDED INTEGRATED CIRCUIT CHIPS | July 2011 | February 2013 | Allow | 19 | 1 | 1 | Yes | No |
| 12253753 | METHOD AND SYSTEM FOR CREATING THREE-DIMENSIONAL SPATIAL AUDIO | October 2008 | October 2012 | Allow | 48 | 1 | 1 | No | No |
| 11640065 | PHASE CHANGE RANDOM ACCESS MEMORY DEVICE WITH TRANSISTOR, AND METHOD FOR FABRICATING A MEMORY DEVICE | December 2006 | January 2012 | Allow | 60 | 5 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner MIYOSHI, JESSE Y.
With a 50.0% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 50.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner MIYOSHI, JESSE Y works in Art Unit 2898 and has examined 38 patent applications in our dataset. With an allowance rate of 71.1%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 50 months.
Examiner MIYOSHI, JESSE Y's allowance rate of 71.1% places them in the 34% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.
On average, applications examined by MIYOSHI, JESSE Y receive 3.63 office actions before reaching final disposition. This places the examiner in the 95% percentile for office actions issued. This examiner issues more office actions than most examiners, which may indicate thorough examination or difficulty in reaching agreement with applicants.
The median time to disposition (half-life) for applications examined by MIYOSHI, JESSE Y is 50 months. This places the examiner in the 5% percentile for prosecution speed. Applications take longer to reach final disposition with this examiner compared to most others.
Conducting an examiner interview provides a +15.8% benefit to allowance rate for applications examined by MIYOSHI, JESSE Y. This interview benefit is in the 56% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 15.7% of applications are subsequently allowed. This success rate is in the 12% percentile among all examiners. Strategic Insight: RCEs show lower effectiveness with this examiner compared to others. Consider whether a continuation application might be more strategic, especially if you need to add new matter or significantly broaden claims.
This examiner enters after-final amendments leading to allowance in 21.1% of cases where such amendments are filed. This entry rate is in the 26% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 0.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 15% percentile among all examiners. Note: Pre-appeal conferences show limited success with this examiner compared to others. While still worth considering, be prepared to proceed with a full appeal brief if the PAC does not result in favorable action.
This examiner withdraws rejections or reopens prosecution in 50.0% of appeals filed. This is in the 18% percentile among all examiners. Strategic Insight: This examiner rarely withdraws rejections during the appeal process compared to other examiners. If you file an appeal, be prepared to fully prosecute it to a PTAB decision. Per MPEP § 1207, the examiner will prepare an Examiner's Answer maintaining the rejections.
When applicants file petitions regarding this examiner's actions, 100.0% are granted (fully or in part). This grant rate is in the 92% percentile among all examiners. Strategic Note: Petitions are frequently granted regarding this examiner's actions compared to other examiners. Per MPEP § 1002.02(c), various examiner actions are petitionable to the Technology Center Director, including prematureness of final rejection, refusal to enter amendments, and requirement for information. If you believe an examiner action is improper, consider filing a petition.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 28% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 34% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.