Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 17135758 | METHOD FOR FABRICATING A SEMICONDUCTOR DEVICE | December 2020 | November 2022 | Allow | 23 | 2 | 0 | No | No |
| 17123873 | DRAIN SIDE RECESS FOR BACK-SIDE POWER RAIL DEVICE | December 2020 | January 2023 | Allow | 25 | 1 | 1 | No | No |
| 17113836 | Semiconductor Device and Method of Manufacture | December 2020 | November 2023 | Allow | 35 | 1 | 1 | No | No |
| 17111956 | TRANSISTORS COMPRISING AT LEAST ONE OF GAP, GAN, AND GAAS | December 2020 | August 2022 | Allow | 20 | 1 | 0 | No | No |
| 17112782 | COMMON RAIL CONTACT | December 2020 | January 2023 | Allow | 25 | 2 | 0 | Yes | No |
| 17104760 | Interconnect Structure | November 2020 | January 2023 | Allow | 26 | 2 | 1 | Yes | No |
| 17104218 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME | November 2020 | September 2022 | Allow | 22 | 1 | 1 | Yes | No |
| 16949953 | INTERCONNECT STRUCTURES | November 2020 | June 2022 | Allow | 19 | 1 | 1 | No | No |
| 16952526 | THREE-DIMENSIONAL MEMORY DEVICE CONTAINING OXIDATION-RESISTANT CONTACT STRUCTURES AND METHODS OF MAKING THE SAME | November 2020 | March 2022 | Allow | 16 | 1 | 0 | Yes | No |
| 16952503 | Composite Work Function Layer Formation Using Same Work Function Material | November 2020 | July 2022 | Allow | 19 | 1 | 1 | Yes | No |
| 17098014 | SEMICONDUCTOR CIRCUIT FOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME | November 2020 | February 2023 | Allow | 27 | 3 | 0 | Yes | No |
| 17095981 | Transistor Device Structure | November 2020 | March 2023 | Abandon | 28 | 2 | 0 | No | No |
| 16969771 | MAGNETORESISTIVE EFFECT ELEMENT AND MAGNETIC MEMORY | November 2020 | January 2023 | Allow | 29 | 3 | 0 | Yes | No |
| 17093345 | Semiconductor Device and Method of Forming Thereof | November 2020 | September 2022 | Allow | 22 | 1 | 1 | No | No |
| 17081738 | BARRIER LAYER FOR CONTACT STRUCTURES OF SEMICONDUCTOR DEVICES | October 2020 | December 2022 | Allow | 26 | 2 | 1 | Yes | No |
| 17077556 | Methods for Reducing Dual Damascene Distortion | October 2020 | June 2022 | Allow | 20 | 1 | 0 | No | No |
| 17076193 | MANUFACTURING METHOD OF A SEMICONDUCTOR DEVICE | October 2020 | May 2022 | Allow | 19 | 1 | 0 | No | No |
| 17073413 | SEMICONDUCTOR STRUCTURE AND FABRICATION METHOD THEREOF | October 2020 | March 2023 | Abandon | 29 | 2 | 1 | No | No |
| 17061141 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | October 2020 | July 2022 | Allow | 22 | 1 | 0 | Yes | No |
| 17061185 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME | October 2020 | May 2022 | Allow | 19 | 0 | 1 | No | No |
| 17036312 | ELECTRONIC DEVICE WITH SHORT CIRCUIT PROTECTION ELEMENT, FABRICATION METHOD AND DESIGN METHOD | September 2020 | May 2022 | Allow | 20 | 1 | 0 | Yes | No |
| 17027344 | SEMICONDUCTOR DEVICES WITH BACKSIDE POWER RAIL AND METHODS OF FABRICATION THEREOF | September 2020 | July 2022 | Allow | 22 | 1 | 1 | Yes | No |
| 17018838 | SEMICONDUCTOR MEMORY DEVICE | September 2020 | November 2023 | Allow | 39 | 5 | 1 | Yes | No |
| 17017596 | INTERCONNECT STRUCTURE IN SEMICONDUCTOR DEVICE AND METHOD OF FORMING THE SAME | September 2020 | July 2022 | Allow | 22 | 1 | 1 | No | No |
| 17004902 | SEMICONDUCTOR DEVICE WITH INTERVENING LAYER AND METHOD FOR FABRICATING THE SAME | August 2020 | October 2022 | Allow | 26 | 3 | 1 | No | No |
| 17000934 | SEMICONDUCTOR DEVICE INCLUDING HAVING METAL ORGANIC FRAMEWORK INTERLAYER DIELECTRIC LAYER BETWEEN METAL LINES AND METHODS OF FORMING THE SAME | August 2020 | April 2022 | Allow | 20 | 1 | 0 | No | No |
| 17001247 | Bottom Lateral Expansion of Contact Plugs Through Implantation | August 2020 | July 2022 | Allow | 23 | 2 | 1 | Yes | No |
| 16997616 | ION IMPLANT PROCESS FOR DEFECT ELIMINATION IN METAL LAYER PLANARIZATION | August 2020 | May 2022 | Allow | 21 | 2 | 0 | Yes | No |
| 16994274 | Leakage Reduction in Gate-All-Around Devices | August 2020 | February 2022 | Allow | 18 | 0 | 1 | No | No |
| 16990940 | CONNECTING STRUCTURE AND METHOD FOR FORMING THE SAME | August 2020 | October 2022 | Allow | 26 | 2 | 1 | Yes | No |
| 16984468 | STRUCTURES AND SRAM BIT CELLS INTEGRATING COMPLEMENTARY FIELD-EFFECT TRANSISTORS | August 2020 | January 2022 | Allow | 17 | 1 | 0 | No | No |
| 16984962 | NAND FLASH BLOCK ARCHITECTURE ENHANCEMENT TO PREVENT BLOCK LIFTING | August 2020 | August 2023 | Allow | 36 | 4 | 1 | Yes | No |
| 16984075 | METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE AND A SEMICONDUCTOR DEVICE | August 2020 | May 2022 | Allow | 21 | 1 | 1 | Yes | No |
| 16936656 | SEMICONDUCTOR MEMORY DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE | July 2020 | November 2022 | Abandon | 28 | 2 | 1 | No | No |
| 16935686 | Source/Drain Contact Structure | July 2020 | March 2022 | Allow | 19 | 1 | 1 | Yes | No |
| 16922334 | INTERCONNECTION STRUCTURE OF INTEGRATED CIRCUIT SEMICONDUCTOR DEVICE | July 2020 | March 2022 | Allow | 20 | 1 | 0 | Yes | No |
| 16920589 | INTEGRATED CIRCUIT DEVICE AND METHOD OF MANUFACTURING THE SAME | July 2020 | January 2022 | Allow | 19 | 1 | 0 | Yes | No |
| 16901572 | DUMBBELL SHAPED SELF-ALIGNED CAPPING LAYER OVER SOURCE/DRAIN CONTACTS AND METHOD THEREOF | June 2020 | December 2021 | Allow | 18 | 0 | 1 | Yes | No |
| 16884908 | SEMICONDUCTOR DEVICE AND FORMATION METHOD THEREOF | May 2020 | March 2022 | Allow | 22 | 1 | 1 | No | No |
| 16879983 | SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE MANUFACTURING METHOD | May 2020 | February 2022 | Allow | 21 | 1 | 0 | Yes | No |
| 16878215 | LIGHT-EMITTING DEVICE AND DISPLAY DEVICE USING THE SAME | May 2020 | December 2021 | Allow | 19 | 0 | 1 | Yes | No |
| 16876276 | INTEGRATED DIPOLE FLOW FOR TRANSISTOR | May 2020 | November 2021 | Allow | 18 | 1 | 0 | No | No |
| 16866628 | SEMICONDUCTOR DEVICE INCLUDING ACTIVE REGION AND GATE STRUCTURE | May 2020 | December 2021 | Allow | 19 | 0 | 1 | No | No |
| 16862255 | MULTI-DEPOSITION PROCESS FOR HIGH QUALITY GALLIUM NITRIDE DEVICE MANUFACTURING | April 2020 | January 2022 | Allow | 21 | 1 | 0 | No | No |
| 16857288 | SEMICONDUCTOR DEVICE, LAYOUT DESIGN METHOD FOR THE SAME AND METHOD FOR FABRICATING THE SAME | April 2020 | February 2022 | Allow | 21 | 1 | 1 | Yes | No |
| 16854839 | NANOSTRUCTURE BARRIER FOR COPPER WIRE BONDING | April 2020 | May 2021 | Allow | 13 | 0 | 0 | No | No |
| 16854063 | ORGANIC LIGHT-EMITTING DISPLAY DEVICE AND METHOD OF MANUFACTURING THE SAME | April 2020 | April 2022 | Allow | 24 | 2 | 0 | Yes | No |
| 16853839 | 3D NAND MEMORY DEVICE AND METHOD OF FORMING THE SAME | April 2020 | January 2022 | Allow | 21 | 1 | 1 | Yes | No |
| 16851476 | SEMICONDUCTOR DEVICE | April 2020 | February 2022 | Allow | 22 | 1 | 1 | Yes | No |
| 16850267 | Butted Contacts and Methods of Fabricating the Same in Semiconductor Devices | April 2020 | October 2022 | Allow | 30 | 3 | 1 | No | No |
| 16849101 | BOTTOM SOURCE/DRAIN FOR FIN FIELD EFFECT TRANSISTORS | April 2020 | January 2022 | Allow | 21 | 1 | 1 | Yes | No |
| 16848575 | PUNCH THROUGH STOPPER IN BULK FINFET DEVICE | April 2020 | March 2022 | Allow | 23 | 2 | 0 | Yes | No |
| 16847693 | TRANSISTOR STRUCTURE WITH REDUCED LEAKAGE CURRENT AND ADJUSTABLE ON/OFF CURRENT | April 2020 | November 2022 | Allow | 31 | 3 | 1 | Yes | No |
| 16841994 | SUBTRACTIVE BACK-END-OF-LINE VIAS | April 2020 | April 2022 | Allow | 24 | 1 | 0 | Yes | No |
| 16839942 | FLUX-BIASING SUPERCONDUCTING QUANTUM PROCESSORS | April 2020 | August 2021 | Allow | 16 | 1 | 0 | Yes | No |
| 16836665 | SEMICONDUCTOR PACKAGE HAVING MULTI-TIER BONDING WIRES AND COMPONENTS DIRECTLY MOUNTED ON THE MULTI-TIER BONDING WIRES | March 2020 | October 2021 | Allow | 19 | 1 | 0 | Yes | No |
| 16836428 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | March 2020 | February 2022 | Allow | 23 | 2 | 1 | Yes | No |
| 16834121 | LIGHT DETECTION DEVICE | March 2020 | February 2022 | Allow | 22 | 1 | 1 | No | No |
| 16834460 | DISPLAY DEVICE | March 2020 | November 2022 | Allow | 31 | 4 | 1 | Yes | No |
| 16830859 | ELECTRONIC DEVICE | March 2020 | August 2021 | Allow | 17 | 1 | 0 | No | No |
| 16830215 | DISPLAY APPARATUS AND METHOD OF MANUFACTURING THE SAME | March 2020 | November 2021 | Allow | 20 | 2 | 0 | Yes | No |
| 16817692 | NANOSHEET SEMICONDUCTOR DEVICES WITH SIGMA SHAPED INNER SPACER | March 2020 | March 2022 | Allow | 24 | 2 | 1 | Yes | No |
| 16818321 | SEMICONDUCTOR STRUCTURE AND METHOD FORMATION METHOD THEREOF | March 2020 | July 2021 | Allow | 16 | 1 | 0 | Yes | No |
| 16646905 | THIN FILM CIRCUIT SUBSTRATE AND MANUFACTURING METHOD THEREOF | March 2020 | November 2022 | Allow | 32 | 1 | 1 | Yes | No |
| 16802275 | Transistors with Different Threshold Voltages | February 2020 | June 2021 | Allow | 15 | 0 | 1 | No | No |
| 16797020 | WRAP AROUND CONTACT PROCESS MARGIN IMPROVEMENT WITH EARLY CONTACT CUT | February 2020 | October 2021 | Allow | 20 | 2 | 1 | Yes | No |
| 16779143 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | January 2020 | May 2022 | Allow | 27 | 3 | 1 | Yes | No |
| 16778346 | METHODS FOR FABRICATING MICROELECTRONIC DEVICES WITH CONTACTS TO CONDUCTIVE STAIRCASE STEPS, AND RELATED DEVICES AND SYSTEMS | January 2020 | June 2021 | Allow | 17 | 0 | 1 | Yes | No |
| 16773337 | NANOSHEET DEVICE INTEGRATED WITH A FINFET TRANSISTOR | January 2020 | July 2021 | Allow | 17 | 0 | 1 | No | No |
| 16773848 | SEMICONDUCTOR DEVICE, METHOD OF MAKING A SEMICONDUCTOR DEVICE, AND PROCESSING SYSTEM | January 2020 | June 2021 | Allow | 17 | 0 | 1 | Yes | No |
| 16750624 | ORGANIC ELECTROLUMINESCENT DISPLAY DEVICE | January 2020 | July 2021 | Allow | 18 | 1 | 0 | No | No |
| 16751168 | SEMICONDUCTOR DEVICE WITH POROUS DIELECTRIC STRUCTURE AND METHOD FOR FABRICATING THE SAME | January 2020 | January 2022 | Allow | 24 | 3 | 1 | No | No |
| 16750009 | ORGANIC EL DISPLAY PANEL AND METHOD OF MANUFACTURING ORGANIC EL DISPLAY PANEL | January 2020 | December 2021 | Allow | 22 | 1 | 1 | Yes | No |
| 16749171 | TRANSISTOR HAVING CONFINED SOURCE/DRAIN REGIONS WITH WRAP-AROUND SOURCE/DRAIN CONTACTS | January 2020 | April 2022 | Allow | 26 | 3 | 1 | No | No |
| 16748077 | DISPLAY DEVICE | January 2020 | March 2021 | Allow | 14 | 0 | 0 | No | No |
| 16746618 | SEMICONDUCTOR DEVICE HAVING CONTACT FEATURE AND METHOD OF FABRICATING THE SAME | January 2020 | December 2021 | Allow | 23 | 2 | 1 | No | No |
| 16745716 | Butted Contacts and Methods of Fabricating the Same in Semiconductor Devices | January 2020 | September 2021 | Allow | 20 | 1 | 1 | No | No |
| 16744459 | SEMICONDUCTOR STRUCTURE AND METHOD FOR FORMING THE SAME | January 2020 | June 2021 | Allow | 17 | 0 | 1 | No | No |
| 16744480 | FIN FIELD EFFECT TRANSISTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAME | January 2020 | June 2022 | Allow | 29 | 4 | 1 | Yes | No |
| 16631059 | SEMICONDUCTOR DEVICES WITH METAL CONTACTS INCLUDING CRYSTALLINE ALLOYS | January 2020 | March 2021 | Allow | 14 | 1 | 0 | No | No |
| 16733832 | Forming Bottom Source and Drain Extension on Vertical Transport FET (VTFET) | January 2020 | March 2021 | Allow | 14 | 0 | 0 | No | No |
| 16733427 | HALF BURIED nFET/pFET EPITAXY SOURCE/DRAIN STRAP | January 2020 | April 2021 | Allow | 16 | 0 | 1 | Yes | No |
| 16729239 | DISPLAY PANEL AND DISPLAY DEVICE | December 2019 | February 2021 | Allow | 14 | 0 | 0 | No | No |
| 16718205 | APPARATUS RELATED TO CONFORMAL COATING IMPLEMENTED WITH SURFACE MOUNT DEVICES | December 2019 | December 2020 | Allow | 12 | 1 | 0 | Yes | No |
| 16717052 | Methods For Growing Light Emitting Devices Under Ultra-Violet Illumination | December 2019 | April 2021 | Allow | 16 | 1 | 1 | No | No |
| 16717600 | CONTACT AND VIA STRUCTURES FOR SEMICONDUCTOR DEVICES | December 2019 | March 2022 | Allow | 27 | 1 | 1 | Yes | No |
| 16710572 | THREE-DIMENSIONAL MEMORY DEVICE CONTAINING PLURAL WORK FUNCTION WORD LINES AND METHODS OF FORMING THE SAME | December 2019 | April 2021 | Allow | 16 | 1 | 0 | No | No |
| 16707958 | METHODS OF FORMING ELECTRONIC DEVICES | December 2019 | October 2021 | Allow | 22 | 2 | 1 | No | No |
| 16704796 | Semiconductor Device with Integrated Clamp Diode | December 2019 | May 2021 | Allow | 18 | 1 | 0 | No | No |
| 16705138 | NANOTWINNED STRUCTURE | December 2019 | July 2022 | Allow | 31 | 1 | 0 | No | No |
| 16699496 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | November 2019 | March 2021 | Allow | 16 | 0 | 1 | No | No |
| 16692571 | Novel Structure for Metal Gate Electrode and Method of Fabrication | November 2019 | October 2021 | Allow | 23 | 1 | 1 | Yes | No |
| 16688500 | PROTUBERANT CONTACTS FOR RESISTIVE SWITCHING DEVICES | November 2019 | April 2021 | Allow | 17 | 1 | 0 | No | No |
| 16686830 | MICROELECTRONIC DEVICES INCLUDING STAIR STEP STRUCTURES, AND RELATED ELECTRONIC DEVICES AND METHODS | November 2019 | September 2021 | Allow | 22 | 2 | 1 | Yes | No |
| 16686682 | Method for Reducing Metal Plug Corrosion and Device | November 2019 | May 2021 | Allow | 17 | 0 | 1 | Yes | No |
| 16683894 | GATE-ALL-AROUND TRANSISTOR STRUCTURE | November 2019 | May 2021 | Allow | 18 | 1 | 1 | Yes | No |
| 16681225 | FIELD-EFFECT TRANSISTOR STRUCTURE AND FABRICATION METHOD | November 2019 | August 2021 | Allow | 21 | 2 | 1 | Yes | No |
| 16677798 | Method of Forming a Source/Drain | November 2019 | August 2021 | Allow | 22 | 1 | 1 | Yes | No |
| 16676291 | SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING THE SAME | November 2019 | January 2021 | Allow | 15 | 1 | 0 | No | No |
| 16610120 | FIXING OF LED STRIPS | November 2019 | February 2021 | Allow | 16 | 2 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner LU, FARUN.
With a 50.0% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 40.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner LU, FARUN works in Art Unit 2898 and has examined 534 patent applications in our dataset. With an allowance rate of 92.1%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 18 months.
Examiner LU, FARUN's allowance rate of 92.1% places them in the 78% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by LU, FARUN receive 1.54 office actions before reaching final disposition. This places the examiner in the 25% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by LU, FARUN is 18 months. This places the examiner in the 96% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +7.6% benefit to allowance rate for applications examined by LU, FARUN. This interview benefit is in the 37% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 35.8% of applications are subsequently allowed. This success rate is in the 81% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 41.3% of cases where such amendments are filed. This entry rate is in the 64% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 80.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 65% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 66.7% of appeals filed. This is in the 51% percentile among all examiners. Of these withdrawals, 75.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.
When applicants file petitions regarding this examiner's actions, 30.3% are granted (fully or in part). This grant rate is in the 16% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 28% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.1% of allowed cases (in the 80% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.