USPTO Examiner DIALLO MAMADOU L - Art Unit 2897

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19301777THIN FILM SEMICONDUCTOR SWITCHING DEVICEAugust 2025February 2026Allow610NoNo
19062566HIGH BANDWIDTH MEMORY STACK WITH SIDE EDGE INTERCONNECTION AND 3D IC STRUCTURE WITH THE SAMEFebruary 2025August 2025Allow610NoNo
19060198THIN FILM SEMICONDUCTOR SWITCHING DEVICEFebruary 2025June 2025Allow410NoNo
190041603D MEMORY SEMICONDUCTOR DEVICES AND STRUCTURES WITH MEMORY CELLSDecember 2024November 2025Allow1110NoNo
189636303D MEMORY DEVICES AND STRUCTURES WITH MEMORY ARRAYS AND METAL LAYERSNovember 2024June 2025Allow700NoNo
18900415DOUBLE-SIDED INTEGRATED CIRCUIT DIE AND INTEGRATED CIRCUIT PACKAGE INCLUDING THE SAMESeptember 2024March 2025Allow510NoNo
18787506EMBEDDED COOLING SYSTEMS FOR ADVANCED DEVICE PACKAGING AND METHODS OF MANUFACTURING THE SAMEJuly 2024March 2025Allow720NoNo
18767750DEVICE WITH EMBEDDED HIGH-BANDWIDTH, HIGH-CAPACITY MEMORY USING WAFER BONDINGJuly 2024April 2025Allow900NoNo
187313403D MEMORY DEVICES AND STRUCTURES WITH MEMORY ARRAYS AND METAL LAYERSJune 2024October 2024Allow500NoNo
18662749Vertically Stacked Semiconductor Device Including a Hybrid Bond Contact Junction Circuit and Methods for Forming the SameMay 2024February 2026Allow2110NoNo
18650225SEMICONDUCTOR PACKAGES WITH STACKED DIES AND METHODS OF FORMING THE SAMEApril 2024February 2026Allow2110YesNo
186437534CPP SRAM CELL AND ARRAYApril 2024September 2025Allow1610NoNo
18617013DISPLAY SUBSTRATE AND RELATED DEVICES WITH IMPROVED RESOLUTIONMarch 2024July 2025Allow1610NoNo
18615528SEMICONDUCTOR CHIP INCLUDING THROUGH ELECTRODE, AND SEMICONDUCTOR PACKAGE INCLUDING THE SAMEMarch 2024July 2025Allow1510NoNo
18610263SEMICONDUCTOR INTERCONNECT STRUCTURES WITH VERTICALLY OFFSET BONDING SURFACES, AND ASSOCIATED SYSTEMS AND METHODSMarch 2024July 2025Allow1610NoNo
18607339MEMORY DEVICES WITH BACKSIDE BOND PADS UNDER A MEMORY ARRAYMarch 2024March 2025Allow1210NoNo
18604542BONDED WAFER DEVICE STRUCTURE AND METHODS FOR MAKING THE SAMEMarch 2024May 2025Allow1410NoNo
18604627DEVICE INTEGRATION SCHEMES LEVERAGING A BULK SEMICONDUCTOR SUBSTRATE HAVING A <111> CRYSTAL ORIENTATIONMarch 2024June 2025Allow1510NoNo
18594703DEVICE FOR CONTROLLING TRAPPED IONSMarch 2024April 2025Allow1310NoNo
18440623SEMICONDUCTOR MEMORY HAVING MEMORY CELL REGIONS AND OTHER REGIONS ALTERNATELY ARRANGED ALONG A BIT LINE DIRECTIONFebruary 2024May 2025Allow1510NoNo
184311773D MEMORY DEVICES AND STRUCTURES WITH MEMORY ARRAYS AND METAL LAYERSFebruary 2024May 2024Allow300NoNo
18429477SEMICONDUCTOR STRUCTURE FOR WAFER LEVEL BONDING AND BONDED SEMICONDUCTOR STRUCTUREFebruary 2024February 2025Allow1210NoNo
18418964STACKED-CHIP PACKAGESJanuary 2024December 2024Allow1110NoNo
18406018INTERCONNECT ARCHITECTURE WITH SILICON INTERPOSER AND EMIBJanuary 2024March 2025Allow1410NoNo
18400497SEMICONDUCTOR PACKAGEDecember 2023October 2024Allow900NoNo
18390395STANDALONE ISOLATION CAPACITORDecember 2023March 2025Allow1410NoNo
18536332SEMICONDUCTOR PACKAGESDecember 2023February 2025Allow1410NoNo
18536254ELECTRONIC DEVICE INCLUDING CONDUCTIVE ELEMENT ON SIDE SURFACE OF SUBSTRATEDecember 2023January 2025Allow1310NoNo
18518591SEMICONDUCTOR PACKAGE UTILIZING A HYBRID BONDING PROCESS AND METHOD OF MANUFACTURING THE SAMENovember 2023January 2025Allow1400NoNo
18517774CHIPLETS 3D SOIC SYSTEM INTEGRATION AND FABRICATION METHODSNovember 2023January 2025Allow1400NoNo
183888403D MEMORY DEVICES AND STRUCTURES WITH METAL LAYERSNovember 2023January 2024Allow200NoNo
18381911SEMICONDUCTOR PACKAGE STRUCTURE HAVING MULTIPLE BONDING PADSOctober 2023October 2024Allow1210NoNo
18489016SEMICONDUCTOR STRUCTURE INCLUDING THERMAL ENHANCED BONDING STRUCTUREOctober 2023November 2024Allow1310NoNo
18489557SEMICONDUCTOR CHIP INCLUDING THROUGH ELECTRODE, AND SEMICONDUCTOR PACKAGE INCLUDING THE SAMEOctober 2023April 2025Allow1810NoNo
18488741FIELD-EFFECT TRANSISTOR, AND METHODS FOR PRODUCTIONOctober 2023February 2026Allow2800NoNo
18380863SYSTEMS AND METHODS FOR DIRECT BONDING IN SEMICONDUCTOR DIE MANUFACTURINGOctober 2023October 2024Allow1210NoNo
18487247SEMICONDUCTOR PACKAGES AND METHODS OF MANUFACTURING THE SEMICONDUCTOR PACKAGESOctober 2023January 2025Allow1500NoNo
18485318SEMICONDUCTOR PACKAGE WITH PLURALITY OF LEADS AND SEALING RESINOctober 2023May 2025Allow1910NoNo
18377530SEMICONDUCTOR DEVICES INCLUDING A THICK METAL LAYER AND A BUMPOctober 2023May 2024Allow700NoNo
18469637DISPLAY DEVICESeptember 2023February 2026Allow2900NoNo
18469910THREE DIMENSIONAL CIRCUIT IMPLEMENTING MACHINE TRAINED NETWORKSeptember 2023November 2024Allow1410NoNo
18243726SEMICONDUCTOR DEVICESSeptember 2023February 2026Allow2900NoNo
18460203SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR MEMORY DEVICESeptember 2023January 2026Allow2900NoNo
18459628PACKAGE SUBSTRATE AND SEMICONDUCTOR PACKAGE INCLUDING THE SAMESeptember 2023August 2024Allow1200NoNo
18459440HIGH FREQUENCY MODULE AND COMMUNICATION APPARATUSSeptember 2023January 2026Allow2800NoNo
18239368Backside Integrated Voltage Regulator For Integrated CircuitsAugust 2023April 2025Allow2010NoNo
182391173D MEMORY DEVICES AND STRUCTURES WITH CONTROL CIRCUITSAugust 2023October 2023Allow200NoNo
18455960HIGH-SPEED DIE CONNECTIONS USING A CONDUCTIVE INSERTAugust 2023October 2024Allow1410NoNo
18454189DISPLAY MODULE AND AN ELECTRONIC DEVICE INCLUDING THE SAMEAugust 2023December 2025Allow2800NoNo
18236858CHIP PACKAGE AND METHOD OF FORMING A CHIP PACKAGEAugust 2023March 2024Allow700NoNo
18228139GATE-ALL-AROUND INTEGRATED CIRCUIT STRUCTURES HAVING NANOWIRES WITH TIGHT VERTICAL SPACINGJuly 2023September 2024Allow1310NoNo
18358186BACKSIDE CONTACT TO IMPROVE THERMAL DISSIPATION AWAY FROM SEMICONDUCTOR DEVICESJuly 2023October 2024Allow1510NoNo
18357818BONDING STRUCTURE AND METHOD OF FORMING SAMEJuly 2023September 2024Allow1410NoNo
18357350BOND PAD WITH ENHANCED RELIABILITYJuly 2023August 2024Allow1310NoNo
18356289SEMICONDUCTOR PACKAGEJuly 2023November 2025Allow2800NoNo
18356808Deep Partition Power Delivery with Deep Trench CapacitorJuly 2023April 2024Allow800NoNo
18356224PACKAGE HAVING DIFFERENT METAL DENSITIES IN DIFFERENT REGIONS AND MANUFACTURING METHOD THEREOFJuly 2023July 2024Allow1210NoNo
18353167SEMICONDUCTOR PACKAGE INCLUDING PADSJuly 2023November 2025Allow2800NoNo
18348170STACKED LAYERS WITH FILLING STRUCTURESJuly 2023March 2026Allow3210NoNo
18346396WAFER-LEVEL BONDING OF OBSTRUCTIVE ELEMENTSJuly 2023August 2024Allow1310NoNo
18346550SEMICONDUCTOR PACKAGES AND METHODS OF FORMING THE SAMEJuly 2023January 2024Allow700NoNo
18213952BIDIRECTIONAL SWITCHING DEVICES, ITS TERMINAL STRUCTURES, AND ELECTRONIC DEVICESJune 2023September 2025Allow2700NoNo
18211561A DEVICE STRUCTURE WITH A REDISTRIBUTION LAYER AND A BUFFER LAYERJune 2023June 2024Allow1210NoNo
18335578COPPER-BONDED MEMORY STACKS WITH COPPER-BONDED INTERCONNECTION MEMORY SYSTEMSJune 2023July 2024Allow1410NoNo
18207378MULTI-DIE PHYSICALLY UNCLONABLE FUNCTION ENTROPY SOURCEJune 2023October 2025Allow2800NoNo
182060403D DRAM MEMORY DEVICES AND STRUCTURES WITH CONTROL CIRCUITSJune 2023August 2023Allow200NoNo
18205329SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEJune 2023August 2025Allow2700NoNo
18320791BONDING LAYER AND PROCESSMay 2023December 2025Allow3110NoNo
18198163DISPLAY APPARATUS THAT INCLUDES CONCAVO-CONVEX STRUCTURE ON UPPER SURFACE OF PIXEL DEFINING LAYER AND METHOD OF MANUFACTURING THE SAMEMay 2023April 2024Allow1110NoNo
18197607Flip-Chip Packaged Power Transistor Module Having Built-in Gate DriverMay 2023August 2025Allow2700NoNo
18252891SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOFMay 2023February 2026Allow3310NoNo
18195096CHIP PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOFMay 2023June 2024Allow1320NoNo
18144744DISPLAY DEVICEMay 2023February 2026Allow3310NoNo
18311712STRUCTURE INCLUDING PASSIVE COMPONENT TRAVERSING MULTIPLE SEMICONDUCTOR CHIPS, WITH RELATED METHODS AND SYSTEMSMay 2023March 2026Allow3410NoNo
18309678SEMICONDUCTOR DEVICES WITH HYBRID BONDING LAYERS AND PROCESS OF MAKING THE SAMEApril 2023February 2026Allow3410YesNo
18307165CAP LAYER FOR PAD OXIDATION PREVENTIONApril 2023March 2026Allow3410NoNo
18138270DEVICE WITH EMBEDDED HIGH-BANDWIDTH, HIGH-CAPACITY MEMORY USING WAFER BONDINGApril 2023April 2024Allow1210NoNo
18304834ONE-TIME PROGRAMMABLE MEMORY DEVICE INCLUDING ANTI-FUSE ELEMENT AND TRANSISTOR CONNECTED IN SERIESApril 2023December 2023Allow800NoNo
18304591SEMICONDUCTOR DEVICE INCLUDING MOLDED DIE STACK AND METHODS OF FORMING THE SAMEApril 2023February 2026Allow3410NoNo
18302106INTERCONNECT STRUCTURES FOR IMPROVED LIGHT-EMITTING DIODE CHIP PERFORMANCEApril 2023January 2026Allow3310NoNo
18297012SEMICONDUCTOR DEVICE INCLUDING TWO OR MORE SEMICONDUCTOR STRUCTURES THAT ARE STACKED ONE ON ANOTHER AND METHOD FOR FABRICATING THE SAMEApril 2023February 2026Allow3510NoNo
18297266SEMICONDUCTOR DEVICES AND DATA STORAGE SYSTEMS INCLUDING THE SAMEApril 2023February 2026Allow3410YesNo
18126893STACKABLE FULLY MOLDED SEMICONDUCTOR STRUCTURE WITH THROUGH SILICON VIA (TSV) VERTICAL INTERCONNECTS AND METHOD OF MAKING THE SAMEMarch 2023March 2024Allow1210NoNo
18126761SRAM DEVICE AND 3D SEMICONDUCTOR INTEGRATED CIRCUIT THEREOFMarch 2023July 2025Allow2800NoNo
18124771BONDED WAFER DEVICE STRUCTURE AND METHODS FOR MAKING THE SAMEMarch 2023December 2023Allow900NoNo
18181731SEMICONDUCTOR DEVICE INCLUDING DUMMY PADMarch 2023December 2025Allow3310YesNo
18112810DISPLAY DEVICE AND METHOD FOR MANUFACTURING SAMEFebruary 2023November 2025Allow3310YesNo
18111287SEMICONDUCTOR DIE STACKS AND ASSOCIATED SYSTEMS AND METHODSFebruary 2023January 2026Allow3510NoNo
18108935SEMICONDUCTOR INTERCONNECT STRUCTURES WITH VERTICALLY OFFSET BONDING SURFACES, AND ASSOCIATED SYSTEMS AND METHODSFebruary 2023November 2023Allow910NoNo
18103346SEMICONDUCTOR CHIP INCLUDING THROUGH ELECTRODE, AND SEMICONDUCTOR PACKAGE INCLUDING THE SAMEJanuary 2023July 2023Allow600NoNo
18157335ORGANIC LIGHT-EMITTING DEVICE INCLUDING A FIRST EXCIPLEX AND A SECOND EXCIPLEX IN AN EMISSION LAYERJanuary 2023March 2024Allow1410NoNo
18098726INTERCONNECTION STRUCTURE OF SYSTEM ON WAFER AND PCB BASE ON TSV PROCESS AND METHOD FOR MANUFACTURING THE SAMEJanuary 2023April 2023Allow300NoNo
18156022NANOGAP STRUCTURE AND METHOD OF MANUFACTURING NANOGAP STRUCTURE THROUGH UNDERCUTJanuary 2023May 2025Allow2800NoNo
18015669THREE-DIMENSIONAL FLASH MEMORY WITH HIGH DEGREE OF INTEGRATIONJanuary 2023December 2025Allow3510NoNo
18015427LED DISPLAY MODULE AND LED DISPLAY DEVICEJanuary 2023October 2025Allow3310NoNo
18152740SEMICONDUCTOR STRUCTURE WITH VERTICAL CONNECTION STRUCTURE AND MANUFACTURING METHOD THEREOFJanuary 2023February 2026Allow3710YesNo
18093880SEMICONDUCTOR DEVICES INCLUDING A THICK METAL LAYER AND A BUMPJanuary 2023July 2023Allow600NoNo
18014009WAFER BONDING STRUCTURE, WAFER BONDING METHOD AND CHIP BONDING STRUCTUREDecember 2022October 2025Allow3310NoNo
18087384HETEROGENEOUS INTEGRATION STRUCTURE WITH VOLTAGE REGULATIONDecember 2022December 2025Allow3510NoNo
18086172MULTI SENSOR RADIO FREQUENCY DETECTIONDecember 2022July 2023Allow700NoNo

Appeals Overview

No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.

Examiner DIALLO, MAMADOU L - Prosecution Strategy Guide

Executive Summary

Examiner DIALLO, MAMADOU L works in Art Unit 2897 and has examined 163 patent applications in our dataset. With an allowance rate of 98.2%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 27 months.

Allowance Patterns

Examiner DIALLO, MAMADOU L's allowance rate of 98.2% places them in the 91% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by DIALLO, MAMADOU L receive 0.99 office actions before reaching final disposition. This places the examiner in the 8% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by DIALLO, MAMADOU L is 27 months. This places the examiner in the 73% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +2.1% benefit to allowance rate for applications examined by DIALLO, MAMADOU L. This interview benefit is in the 22% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 38.1% of applications are subsequently allowed. This success rate is in the 87% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 76.9% of cases where such amendments are filed. This entry rate is in the 95% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Petition Practice

When applicants file petitions regarding this examiner's actions, 62.5% are granted (fully or in part). This grant rate is in the 67% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 8.6% of allowed cases (in the 92% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 2.5% of allowed cases (in the 71% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.