USPTO Examiner NGUYEN KHIEM D - Art Unit 2892

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18923340SEMICONDUCTOR DEVICEOctober 2024February 2025Allow400NoNo
18735194PACKAGE STRUCTURE WITH BRIDGE DIE AND METHOD OF FORMING THE PACKAGE STRUCTUREJune 2024January 2026Allow1920NoNo
18672001METHOD OF FABRICATING PACKAGE STRUCTURE INCLUDING A PLURALITY OF ANTENNA PATTERNSMay 2024May 2025Allow1210NoNo
18663697SEMICONDUCTOR PACKAGE INCLUDING AN INTEGRATED CIRCUIT DIE AND AN INDUCTOR OR A TRANSFORMERMay 2024November 2025Allow1811NoNo
18652779PACKAGE STRUCTURE INCLUDING A DIE HAVING A TAPER-SHAPED DIE CONNECTORMay 2024July 2025Allow1410NoNo
18650143PACKAGE STRUCTURE HAVING A DEVICE INSIDE A MOLDING MEMBER AND METHOD OF FORMING THE PACKAGE STRUCTUREApril 2024August 2025Allow1520NoNo
18643322SEMICONDUCTOR DEVICE INCLUDING A MEMORY STACK AND A CONTACT STRUCTURE IN A SPACER STRUCTUREApril 2024September 2025Allow1730YesNo
18635613Power Routing for 2.5D or 3D Integrated Circuits Including a Buried Power Rail and Interposer with Power Delivery NetworkApril 2024November 2025Allow1920YesNo
18630530SUPERCONDUCTING DEVICE INDLUDING SET OF CIRCUITS HAVING DIFFERENT OPERATIONAL TEMPERATURE REQUIREMENTS WITH MULTIPLE THERMAL SINKS AND MULTIPLE GROUND PLANESApril 2024January 2025Allow900NoNo
18443338SEMICONDUCTOR PACKAGE INCLUDING A SEMICONDUCTOR DIE DISPOSED IN A CAVITY AND METHOD FOR MANUFACTURING THEREOFFebruary 2024June 2025Allow1610NoNo
18438638SEMICONDUCTOR PACKAGE WITH ROUTING PATCH AND METHOD OF FABRICATING THE SEMICONDUCTOR PACKAGEFebruary 2024June 2025Allow1620NoNo
18423463SEMICONDUCTOR CHIP AND SEMICONDUCTOR DEVICE INCLUDING A COPPER PILLAR AND AN INTERMEDIATE LAYERJanuary 2024February 2025Allow1310NoNo
18417474LIGHT-EMITTING DISPLAY DEVICE AND ELECTRONIC DEVICE INCLUDING A FIRST PIXEL AND A SECOND PIXEL AND AN OXIDE SEMICONDUCTOR REGION OVERLAPPING A LIGHT-EMITTING REGIONJanuary 2024November 2024Allow1000NoNo
18403686SEMICONDUCTOR DEVICE HAVING FIRST HEAT SPREADER AND SECOND HEAT SPREADER AND MANUFACTURING METHOD THEREOFJanuary 2024December 2025Allow2330YesNo
18400335ELECTRONIC DEVICE HAVING A SUBSTRATE-TO-SUBSTRATE INTERCONNECTION STRUCTURE AND MANUFACTURING METHOD THEREOFDecember 2023April 2025Allow1620NoNo
18528545TRANSISTOR STRUCTURES WITH A METAL OXIDE CONTACT BUFFER AND A METHOD OF FABRICATING THE TRANSISTOR STRUCTURESDecember 2023March 2025Allow1520NoNo
18514716METHOD OF FABRICATING A SEMICONDUCTOR MEMORY DEVICE INCLUDING AN EXTENSION GATE CUTTING REGIONNovember 2023September 2024Allow1010NoNo
18511711EPITAXIAL FIN STRUCTURES OF FINFET HAVING AN EPITAXIAL BUFFER REGION AND AN EPITAXIAL CAPPING REGIONNovember 2023September 2025Allow2230YesNo
18499964SEMICONDUCTOR PACKAGE HAVING AN ENCAPULANT COMPRISING CONDUCTIVE FILLERS AND METHOD OF MANUFACTURENovember 2023November 2024Allow1310NoNo
18499242METHOD OF FABRICATING SEMICONDUCTOR STRUCTURE INCLUDING A BARRIER STRUCTURE IN BETWEEN A PLURALITY OF SURFACE MOUNT COMPONENTS AND A WAFERNovember 2023December 2024Allow1310NoNo
18286268DISPLAY SUBSTRATE AND DISPLAY DEVICEOctober 2023February 2026Allow2800NoNo
18242919METHOD OF FABRICATING TRANSISTORS WITH IMPLANTING DOPANTS AT FIRST AND SECOND DOSAGES IN THE COLLECTOR REGION TO FORM THE BASE REGIONSeptember 2023June 2025Allow2220NoNo
18450146SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE HAVING A STANDARD CELL WHICH INCLUDES A FIN AND A DUMMY TRANSISTORAugust 2023July 2024Allow1110NoNo
18447560PACKAGED DEVICE INCLUDING AN OPTICAL PATH STRUCTURE ALIGNED TO AN OPTICAL FEATUREAugust 2023November 2024Allow1510NoNo
18446571AN INTEGRATED CHIP INCLUDING AN UPPER CONDUCTIVE STRUCTURE HAVING MULTILAYER STACK TO DECREASE FABRICATION COSTS AND INCREASE PERFORMANCEAugust 2023May 2025Allow2230NoNo
18365243STRUCTURE OF MEMORY DEVICE HAVING FLOATING GATE WITH PROTRUDING STRUCTUREAugust 2023October 2024Allow1420NoNo
18363742MANUFACTURING METHOD OF SEMICONDUCTOR PACKAGE INCLUDING FORMING CAVITY IN CIRCUIT SUBSTRATE WITHOUT EXPOSING FLOOR PLATEAugust 2023September 2024Allow1310NoNo
18226119METHOD AND STRUCTURE TO CONTROL THE SOLDER THICKNESS FOR DOUBLE SIDED COOLING POWER MODULEJuly 2023December 2024Allow1720NoNo
18358657LIGHT EMITTING DEVICE INCLUDING FIRST REFLECTING LAYER AND SECOND REFLECTING LAYERJuly 2023August 2024Allow1210NoNo
18358594SEMICONDUCTOR DEVICES HAVING FINS AND MULTIPLE ISOLATION REGIONSJuly 2023January 2025Allow1820NoNo
18357987STACKED VIA STRUCTURE DISPOSED ON A CONDUCTIVE PILLAR OF A SEMICONDUCTOR DIEJuly 2023August 2024Allow1310YesNo
18356721SEMICONDUCTOR PACKAGES HAVING A COUPLING MEMBER INCLUDING A VERTICAL WIRE AND A METAL PORTION EXTENDING AROUND THE VERTICAL WIREJuly 2023March 2026Allow3211YesNo
18352271SEMICONDUCTOR STRUCTURE HAVING AN ANTI-ARCING PATTERN DISPOSED ON A PASSIVATION LAYERJuly 2023August 2024Allow1310NoNo
18349696SEMICONDUCTOR STRUCTURE HAVING A CONDUCTIVE FEATURE COMPRISING AN ADHESION LAYER AND A METAL REGION OVER AND CONTACTING THE ADHESION LAYERJuly 2023April 2025Allow2130NoNo
18210958SEMICONDUCTOR PACKAGEJune 2023October 2025Allow2800NoNo
18334280INTEGRATED CIRCUIT AND ELECTRONIC DEVICE COMPRISING A PLURALITY OF INTEGRATED CIRCUITS ELECTRICALLY COUPLED THROUGH A SYNCHRONIZATION SIGNALJune 2023May 2025Allow2430YesNo
18329128Semiconductor Device Having a Metal Pad and a Protective Layer for Corrosion Prevention Due to Exposure to HalogenJune 2023August 2024Allow1520NoNo
18203668STACKED PACKAGE STRUCTURE INCLUDING A CHIP DISPOSED ON A REDISTRIBUTION LAYER AND A MOLDING LAYER COMPRISES A RECESSMay 2023January 2026Allow3211NoNo
18201466SEMICONDUCTOR PACKAGE INCLUDING A PLURALITY OF HEAT DISSIPATION REINFORCEMENTS AND METHOD FOR FABRICATING SAMEMay 2023January 2026Allow3210YesNo
18200130FLIP CHIP SELF-ALIGNMENT FEATURES FOR SUBSTRATE AND LEADFRAME APPLICATIONS AND METHOD OF MANUFACTURING THE FLIP CHIP SELF-ALIGNMENT FEATURESMay 2023June 2025Allow2530NoNo
18319765METHOD OF MANUFACTURING A THREE DIMENSIONAL INTEGRATED SEMICONDUCTOR ARCHITECTURE HAVING ALIGNMENT MARKS PROVIDED IN A CARRIER SUBSTRATEMay 2023April 2024Allow1110YesNo
18308883SEMICONDUCTOR STRUCTURE HAVING DIELECTRIC PLUGS PENETRATING THROUGH A POLYMER LAYERApril 2023July 2025Allow2630NoNo
18140206METHOD FOR MANUFACTURING COMPOSITE STRUCTURE AND METHOD FOR FABRICATING SEMICONDUCTOR DEVICEApril 2023March 2026Abandon3510NoNo
18121429SEMICONDUCTOR PACKAGE INCLUDING A SEMICONDUCTOR CHIP ON A REDISTRIBUTION SUBSTRATE AND CONDUCTIVE STRUCTURE SPACED APART FROM THE SEMICONDUCTOR CHIPMarch 2023January 2026Allow3410YesNo
18182369METHOD FOR FORMING CONDUCTIVE BUMPS BY PERFORMING A REFLOW PROCESSMarch 2023March 2026Allow3611YesNo
18119909METHOD OF BONDING SUBSTRATES UTILIZING A SUBSTRATE HOLDER WITH HOLDING FINGERSMarch 2023March 2024Allow1310YesNo
18173883ELECTRONIC PACKAGE INCLUDING AN INTERPOSER STACKED ON AN ELECTRONIC ELEMENT AND MANUFACTURING METHOD THEREOFFebruary 2023September 2025Allow3110NoNo
18173418METHOD FOR PACKAGING AN INTEGRATED CIRCUIT (IC) PACKAGE WITH EMBEDDED HEAT SPREADER IN A REDISTRIBUTION LAYER (RDL)February 2023November 2023Allow910NoNo
18171020THERMAL MANAGEMENT DEVICE FOR HIGH HEAT FLUX APPLICATIONS INCLUDING A MICROCHANNEL HEAT SINK ASSEMBLY AND METHOD FOR MANUFACTURING THE SAMEFebruary 2023April 2024Allow1420NoNo
18169337METHOD OF FORMING A SEMICONDUCTOR STRUCTURE INCLUDING BONDING A PLURALITY OF FIRST SEMICONDUCTOR DIES TO A PLURALITY OF SECOND SEMICONDUCTOR DIESFebruary 2023January 2026Allow3511NoNo
18162071SEMICONDUCTOR DEVICE HAVING AN INDUCTOR DISPOSED WITHIN A FIRST BONDING LAYER AND A SECOND BONDING LAYERJanuary 2023February 2026Allow3611NoNo
18104278SEMICONDUCTOR PACKAGE SUBSTRATE WITH A SMOOTH GROOVE STRADDLING TOPSIDE AND SIDEWALLJanuary 2023August 2025Allow3001NoNo
18096341Integrated Structures Comprising Vertical Channel Material and Having Conductively-Doped Semiconductor Material Directly Against Lower Sidewalls of the Channel MaterialJanuary 2023February 2024Allow1310YesNo
18154033SELF-DENSIFYING INTERCONNECTION BETWEEN A HIGH-TEMPERATURE SEMICONDUCTOR DEVICE SELECTED FROM GaN OR SiC AND A SUBSTRATEJanuary 2023February 2026Allow3711NoNo
18090918SEMICONDUCTOR PACKAGE HAVING A SEMICONDUCTOR ELEMENT AND A WIRING STRUCTUREDecember 2022April 2024Allow1510NoNo
18087705BONDED STRUCTURE INCLUDING AN OBSTRUCTIVE ELEMENT DIRECTLY BONDED TO A SEMICONDUCTOR ELEMENT WITHOUT AN ADHESIVEDecember 2022March 2025Allow2730NoNo
18087377FLIP CHIP BONDING FOR SEMICONDUCTOR PACKAGES USING METAL STRIPDecember 2022October 2025Allow3410NoNo
18069485A BONDED STRUCTURE INCLUDING A FIRST MICROELECTRONIC DEVICE DIRECT HYBRID BONDED TO A SECOND MICROELECTRONIC DEVICEDecember 2022January 2026Allow3730YesNo
18083339SEMICONDUCTOR DEVICES HAVING A CONDUCTIVE LAYER STACKING WITH AN INSULATING LAYER AND A SPACER STRUCTURE THROUGH THE CONDUCTIVE LAYERDecember 2022July 2024Allow1920NoNo
18079039INTEGRATED CHIP INCLUDING A TUNNEL DIELECTRIC LAYER WHICH HAS DIFFERENT THICKNESSES OVER A PROTRUSION REGION OF A SUBSTRATEDecember 2022June 2024Allow1820NoNo
18064241SEMICONDUCTOR PACKAGE INCLUDING A BARRIER STRUCTURE COVERING CONNECTION PADS AND CONTACTING A PROTRUDING PORTION OF AN ADHESIVE LAYERDecember 2022October 2025Allow3410YesNo
18075288WIRE BOND DAMAGE DETECTOR INCLUDING A DETECTION BOND PAD OVER A FIRST AND A SECOND CONNECTED STRUCTURESDecember 2022July 2024Allow2020NoNo
18059165MICROELECTRONIC DEVICES HAVING A MEMORY ARRAY REGION, A CONTROL LOGIC REGION, AND SIGNAL ROUTING STRUCTURESNovember 2022April 2024Allow1620NoNo
18058795MEMORY DEVICE HAVING VERTICAL STRUCTURE INCLUDING A FIRST WAFER AND A SECOND WAFER STACKED ON THE FIRST WAFERNovember 2022December 2023Allow1210NoNo
18054229SEMICONDUCTOR DEVICE PACKAGE ASSEMBLIES HAVING A PRE-APPLIED THERMALLY CONDUCTIVE ADHESIVENovember 2022February 2026Allow3920YesNo
17979713PACKAGE STRUCTURE HAVING AT LEAST ONE DIE WITH A PLURALITY OF TAPER-SHAPED DIE CONNECTORSNovember 2022January 2024Allow1410NoNo
17977167SEMICONDUCTOR PACKAGE INCLUDING UNDER-BUMP PROTECTION PATTERNS AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGEOctober 2022October 2025Allow3610YesNo
17960767PACKAGE STRUCTURE WITH BRIDGE DIE LATERALLY WRAPPED BY INSULATING ENCAPSULANT AND SURROUNDED BY THROUGH VIAS AND METHOD OF FORMING THE PACKAGE STRUCTUREOctober 2022February 2024Allow1710NoNo
17959580PACKAGE STRUCTURE INCLUDING A SIDE HEAT DISSIPATOR AND METHOD FOR MANUFACTURING THE PACKAGE STRUCTUREOctober 2022September 2025Allow3510YesNo
17957060SYSTEM-ON-CHIP INTEGRATED PACKAGING STRUCTURE, HAVING A CHIP EMBEDDED IN A RECESS, MANUFACTURING METHOD THEREFOR AND THREE-DIMENSIONAL STACKED DEVICESeptember 2022August 2025Allow3510NoNo
17953941ORGANIC LIGHT-EMITTING DIODE DISPLAY SUBSTRATE, DISPLAY PANEL AND DISPLAY DEVICE HAVING AN ANODE LAYER COMPRISES A COMMON POWER LINE PROVIDED WITH VENT HOLESSeptember 2022May 2024Allow2010NoNo
17953272PACKAGE STRUCTURE INCLUDING A FIRST NON-CONDUCTIVE LAYER HAVING A GREATER MELT VISCOSITY THAN A SECOND NON-CONDUCTIVE LAYER AND METHOD FOR FABRICATING THE PACKAGE STRUCTURESeptember 2022August 2025Allow3510NoNo
17946605METHOD FOR ESTABLISHING A BUILDING AUTOMATION SYSTEM INCLUDING INSTALLING A PLURALITY OF CONTROLLABLE DEVICES IN A PLURALITY OF ROOMS IN A BUILDINGSeptember 2022January 2025Allow2820NoNo
17930942MEMORY MODULE HAVING FIRST CONNECTION BUMPS AND SECOND CONNECTION BUMPSSeptember 2022October 2025Allow3820YesNo
17892788FLIP CHIP LED WITH SIDE REFLECTORS ENCASING SIDE SURFACES OF A SEMICONDUCTOR STRUCTURE AND PHOSPHORAugust 2022February 2024Allow1820NoNo
17886872SEMICONDUCTOR PACKAGE INCLUDING A REDISTRIBUTION SUBSTRATE AND A PAIR OF SIGNAL PATTERNSAugust 2022October 2025Allow3910YesNo
17818742Packages Including Multiple Encapsulated Substrate Blocks and Overlapping Redistribution StructuresAugust 2022February 2024Allow1910YesNo
17759808DISPLAY PANEL AND DISPLAY DEVICE INCLUDING A CATHODE LAYER HAVING A PLURALITY OF CATHODE UNITSJuly 2022October 2025Allow3820NoNo
17874400ELECTRODE STRUCTURE INCLUDING METAL AND HEAT DISSIPATION LAYER AND SEMICONDUCTOR INCLUDING THE ELECTRODE STRUCTUREJuly 2022August 2025Allow3710YesNo
17874898ELECTRONIC COMPONENT APPARATUS HAVING A FIRST LEAD FRAME AND A SECOND LEAD FRAME AND AN ELECTRONIC COMPONENT PROVIDED BETWEEN THE FIRST LEAD FRAME AND THE SECOND LEAD FRAMEJuly 2022January 2024Allow1820YesNo
17874741Semiconductor Device and Method having a Through Substrate Via and an Interconnect StructureJuly 2022July 2024Allow2420NoNo
17870798SEMICONDUCTOR DEVICE INCLUDING A SEMICONDUCTOR DIE AND A PLURALITY OF ANTENNA PATTERNSJuly 2022February 2024Allow1920NoNo
17869196Method of Manufacturing a Semiconductor Device Including a Plurality of Circuit Components and Array of Conductive ContactsJuly 2022September 2024Allow2600NoNo
17864617METHOD FOR INDUCED QUANTUM DOTS FOR MATERIAL CHARACTERIZATION, QUBITS, AND QUANTUM COMPUTERSJuly 2022August 2023Allow1410NoNo
17860291SEMICONDUCTOR CHIP AND SEMICONDUCTOR DEVICE INCLUDING A COPPER PILLAR AND AN INTERMEDIATE LAYER AND A CONCAVE PORTION FORMED AT ONE END SURFACE OF THE COPPER PILLARJuly 2022October 2023Allow1510NoNo
17857035SEMICONDUCTOR STRUCTURE INCLUDING A SEMICONDUCTOR WAFER AND A SURFACE MOUNT COMPONENT OVERHANGING A PERIPHERY OF THE SEMICONDUCTOR WAFERJuly 2022August 2023Allow1310NoNo
17850857SEMICONDUCTOR DEVICE INCLUDING A SEMICONDUCTOR FIN COMPRISING A SILICON GERMANIUM PORTION AND AN ISOLATION STRUCTURE AT A SIDEWALL OF THE SILICON GERMANIUM PORTIONJune 2022January 2024Allow1820YesNo
17850867METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING ANNEALING A GERMANIUM LAYER TO DIFFUSE GERMANIUM ATOMS INTO A SILICON SUBSTRATEJune 2022January 2024Allow1920YesNo
17850221METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE INCLUDING CUTTING A MOLDING MEMBER AND A REDISTRIBUTION WIRING LAYER AND A CUTTING REGION OF A BASE SUBSTRATEJune 2022September 2023Allow1510YesNo
17845929ELECTRONIC DEVICE INCLUDING AN UNDERFILL LAYER AND A PROTECTIVE STRUCTURE ADJACENT TO THE UNDERFILL LAYERJune 2022January 2026Allow4211NoNo
17843835METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE INCLUDING FORMING A SIDEWALL SPACER ON A SIDEWALL OF A CHANNEL STRUCTUREJune 2022July 2025Allow3711NoNo
17842726COLOR CONVERSION SUBSTRATE INCLUDING FIRST BANK STRUCTURE SURROUNDING SECOND BANK STRUCTURE AND DISPLAY DEVICE INCLUDING THE SAMEJune 2022March 2025Allow3310NoNo
17757218LIGHT-EMITTING DIODE INCLUDING AN ACTIVE LAYER DISPOSED BETWEEN A FIRST SEMICONDUCTOR LAYER AND A SECOND SEMICONDUCTOR LAYER AND DISPLAY DEVICE COMPRISING SAMEJune 2022January 2026Allow4320NoNo
17833223METHOD OF MANUFACTURING AN INTERCONNECTION STRUCTURE FOR A SEMICONDUCTOR DEVICE HAVING A SPACER SEPARATING FIRST AND SECOND CONDUCTIVE LINESJune 2022May 2025Allow3510NoNo
17826756METHOD OF MANUFACTURING A SEMICONDUCTOR DEVICE INCLUDING BONDING LAYER AND ADSORPTION LAYERMay 2022July 2023Allow1410YesNo
17824952METHOD FOR FABRICATING AN IMAGE SENSING DEVICE HAVING A PRIMARY GRID AND A SECOND GRID SURROUNDING THE PRIMARY GRIDMay 2022September 2023Allow1610NoNo
17780151DISPLAY DEVICE HAVING SEMICONDUCTOR LIGHT EMITTING DIODES SEATED IN A PLURALITY OF CELLS, AND METHOD FOR MANUFACTURING THE DISPLAY DEVICEMay 2022July 2025Allow3820NoNo
17751758LIGHT-EMITTING DISPLAY DEVICE HAVING A FIRST PIXEL AND A SECOND PIXEL AND AN OXIDE SEMICONDUCTOR LAYER HAVING A REGION OVERLAPPING A LIGHT-EMITTING REGION OF THE SECOND PIXELMay 2022September 2023Allow1610NoNo
17664863IMAGE SENSOR HAVING INCREASED INTEGRATION INCLUDING ACTIVE PATTERNS OVERLAPPING A PORTION OF A PIXEL ISOLATION STRUCTUREMay 2022June 2025Allow3720YesNo
17779385FLEXIBLE DISPLAY PANEL HAVING A BENDING AREA LOCATED BETWEEN A DISPLAY AREA AND A BONDING AREA AND MANUFACTURING METHOD THEREFOR, AND DISPLAY DEVICEMay 2022March 2025Allow3410NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner NGUYEN, KHIEM D.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
3
Examiner Affirmed
1
(33.3%)
Examiner Reversed
2
(66.7%)
Reversal Percentile
87.0%
Higher than average

What This Means

With a 66.7% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.

Strategic Value of Filing an Appeal

Total Appeal Filings
26
Allowed After Appeal Filing
14
(53.8%)
Not Allowed After Appeal Filing
12
(46.2%)
Filing Benefit Percentile
85.7%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 53.8% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Strategic Recommendations

Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner NGUYEN, KHIEM D - Prosecution Strategy Guide

Executive Summary

Examiner NGUYEN, KHIEM D works in Art Unit 2892 and has examined 507 patent applications in our dataset. With an allowance rate of 92.7%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 25 months.

Allowance Patterns

Examiner NGUYEN, KHIEM D's allowance rate of 92.7% places them in the 79% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by NGUYEN, KHIEM D receive 2.20 office actions before reaching final disposition. This places the examiner in the 60% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by NGUYEN, KHIEM D is 25 months. This places the examiner in the 80% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +7.4% benefit to allowance rate for applications examined by NGUYEN, KHIEM D. This interview benefit is in the 36% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 32.1% of applications are subsequently allowed. This success rate is in the 67% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 44.8% of cases where such amendments are filed. This entry rate is in the 68% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 133.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 86% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 88.9% of appeals filed. This is in the 82% percentile among all examiners. Of these withdrawals, 37.5% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 46.4% are granted (fully or in part). This grant rate is in the 41% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 6.7% of allowed cases (in the 89% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 10.6% of allowed cases (in the 89% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.