Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18410961 | TARGET FOR USE IN A LASER DESORPTION MASS SPECTROMETER | January 2024 | March 2026 | Allow | 26 | 0 | 0 | No | No |
| 18331168 | ULTRAVIOLET LIGHT STERILIZATION SYSTEMS | June 2023 | February 2026 | Abandon | 32 | 1 | 0 | No | No |
| 18039589 | ION SOURCE ASSEMBLY WITH MULTIPLE ELLIPTICAL FILAMENTS | May 2023 | October 2025 | Allow | 29 | 0 | 0 | No | No |
| 18027501 | Analysis System | March 2023 | February 2026 | Allow | 35 | 1 | 1 | No | No |
| 18167919 | CHARGED PARTICLE BEAM WRITING METHOD, CHARGED PARTICLE BEAM WRITING APPARATUS, AND COMPUTER-READABLE RECORDING MEDIUM | February 2023 | July 2025 | Allow | 29 | 0 | 0 | Yes | No |
| 18006168 | Method and System for Reducing the Amplitude of an Oscillating Electric Field at the Equilibrium Position of a Trapped Ion | January 2023 | May 2025 | Allow | 27 | 0 | 0 | No | No |
| 18004864 | METHOD FOR MANUFACTURING A HEAD FOR IRRADIATING A TARGET WITH A BEAM OF CHARGED PARTICLES | January 2023 | May 2025 | Allow | 28 | 0 | 0 | No | No |
| 18150932 | Method for Preparing TEM Sample | January 2023 | February 2026 | Allow | 37 | 2 | 0 | No | No |
| 18011287 | DETECTOR PROTECTION METHOD FOR PROTECTING FLAT DETECTORS FOR ELECTROMAGNETIC RADIATION AND/OR PARTICLE RADIATION, AND DETECTOR PROTECTION ASSEMBLY | December 2022 | December 2025 | Abandon | 36 | 1 | 0 | No | No |
| 18010088 | ELECTRON MICROSCOPE ANALYSIS SYSTEM | December 2022 | July 2025 | Allow | 31 | 1 | 0 | No | No |
| 18079074 | GAS RESERVOIR, GAS FEED DEVICE HAVING A GAS RESERVOIR, AND PARTICLE BEAM APPARATUS HAVING A GAS FEED DEVICE | December 2022 | February 2025 | Allow | 26 | 0 | 0 | No | No |
| 18059107 | Inductively coupled plasma source mass spectrometry for silicon measurement | November 2022 | July 2025 | Abandon | 32 | 1 | 0 | No | No |
| 17992510 | COMPUTER IMPLEMENTED METHOD FOR CALIBRATING A CUSTOMER MASS SPECTROMETRY INSTRUMENT FOR QUANTIFIER-QUALIFIER-RATIO CHECK | November 2022 | August 2025 | Allow | 43 | 1 | 0 | No | No |
| 17999463 | ION SOURCE BAFFLE, ION ETCHING MACHINE, AND USAGE METHOD THEREFOR | November 2022 | October 2025 | Allow | 35 | 2 | 0 | No | No |
| 17987991 | TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHOD THEREFOR | November 2022 | February 2026 | Allow | 49 | 2 | 0 | No | No |
| 18053135 | CHARGED PARTICLE BEAM WRITING METHOD AND CHARGED PARTICLE BEAM WRITING APPARATUS | November 2022 | March 2026 | Allow | 50 | 3 | 0 | No | No |
| 17922093 | ELECTRODE STRUCTURE FOR GUIDING A CHARGED PARTICLE BEAM | October 2022 | May 2025 | Allow | 30 | 1 | 0 | No | No |
| 17918655 | MASS SPECTROMETER | October 2022 | July 2025 | Allow | 33 | 1 | 0 | No | No |
| 17954296 | ANALYSIS METHOD, STORAGE MEDIUM, AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE | September 2022 | December 2025 | Allow | 38 | 1 | 0 | Yes | No |
| 17913815 | ELECTRON GUN CHAMBER FOR SCANNING ELECTRON MICROSCOPE, ELECTRON GUN CONTAINING SAME, AND SCANNING ELECTRON MICROSCOPE | September 2022 | January 2026 | Allow | 39 | 3 | 0 | No | No |
| 17913225 | INTEGRATED QJET AND Q0 RODSETS SHARING THE SAME ROD DIAMETERS AND RF POTENTIAL | September 2022 | April 2025 | Allow | 31 | 1 | 0 | No | No |
| 17911058 | TRANSMISSION ELECTRON MICROSCOPE IN-SITU CHIP AND PREPARATION METHOD THEREOF | September 2022 | February 2026 | Abandon | 41 | 2 | 0 | No | No |
| 17942295 | METHOD FOR ESTIMATING CATHODE LIFETIME OF ELECTRON GUN, AND ELECTRON BEAM WRITING APPARATUS | September 2022 | March 2026 | Allow | 42 | 3 | 0 | Yes | No |
| 17901659 | PROTECTIVE MEMBER AND ARTICLE PROCESSING DEVICE | September 2022 | May 2025 | Abandon | 32 | 1 | 0 | No | No |
| 17908105 | SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD | August 2022 | May 2025 | Abandon | 33 | 1 | 0 | No | No |
| 17908001 | SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD | August 2022 | January 2026 | Abandon | 40 | 3 | 0 | No | No |
| 17893023 | RAY TRANSCEIVING SYSTEM OF UNDERWATER FLOWMETER AND DEDUCTION METERING METHOD | August 2022 | August 2025 | Allow | 35 | 2 | 0 | Yes | No |
| 17883488 | Simple Spherical Aberration Corrector for SEM | August 2022 | June 2025 | Allow | 34 | 2 | 0 | No | No |
| 17880232 | ION EXTRACTION AND FOCUSING FROM A FIELD-FREE REGION TO AN ION MOBILITY SPECTROMETER AT ATMOSPHERIC PRESSURE | August 2022 | November 2025 | Allow | 39 | 3 | 0 | Yes | No |
| 17878830 | DEVICES AND METHODS FOR GENERATING RESONANCE EXCITATION FOR AN ION MANIPULATION APPARATUS | August 2022 | April 2025 | Abandon | 32 | 1 | 0 | No | No |
| 17795278 | CHARGED PARTICLE BEAM SYSTEM | July 2022 | September 2025 | Allow | 38 | 3 | 0 | No | No |
| 17873726 | MULTI-FUNCTION SANITIZING LAMP ASSEMBLY | July 2022 | April 2025 | Abandon | 32 | 0 | 1 | No | No |
| 17872046 | CHARGED PARTICLE BEAM SCANNING MODULE, CHARGED PARTICLE BEAM DEVICE, AND COMPUTER | July 2022 | July 2025 | Allow | 35 | 1 | 1 | No | No |
| 17868356 | Footwear, Feet and Animal Paw Disinfecting Doormat | July 2022 | September 2025 | Abandon | 37 | 2 | 0 | No | No |
| 17853447 | INTERFACE FOR ELECTROSPRAY IONIZATION (ESI) IN CAPILLARY ELECTROPHORESIS WITH MASS SPECTROMETRY | June 2022 | September 2024 | Allow | 27 | 0 | 0 | No | No |
| 17843043 | CHARGED-PARTICLE MEASUREMENT APPARATUS AND CONTROL METHOD OF CHARGED-PARTICLE MEASUREMENT APPARATUS | June 2022 | January 2025 | Allow | 31 | 1 | 0 | No | No |
| 17717047 | PHOTOCATALYTIC STRUCTURE CAPABLE OF UNIFORMIZING ULTRAVIOLET LIGHT | April 2022 | April 2025 | Abandon | 36 | 1 | 0 | No | No |
| 17716338 | PARTICLE THERAPY SYSTEM, PARTICLE THERAPY METHOD, AND RECORDING MEDIUM | April 2022 | April 2025 | Abandon | 36 | 1 | 0 | No | No |
| 17766495 | FACILITATING CONTROLLED MOLECULAR ASSEMBLY OF NANOSCALE STRUCTURES VIA DYNAMIC CONFINEMENT OF SOLVENT | April 2022 | April 2025 | Allow | 37 | 2 | 0 | Yes | No |
| 17700048 | FAST BEAM CALIBRATION PROCEDURE FOR BEAMLINE ION IMPLANTER | March 2022 | August 2025 | Allow | 41 | 1 | 0 | Yes | No |
| 17761864 | ELECTRON GUN CATHODE TECHNOLOGY | March 2022 | March 2026 | Abandon | 48 | 2 | 1 | No | No |
| 17570775 | Transport Device and Charged Particle Beam System | January 2022 | May 2025 | Allow | 40 | 3 | 0 | Yes | No |
| 17610068 | CATHODOLUMINESCENCE ELECTRON MICROSCOPE | November 2021 | August 2025 | Allow | 45 | 1 | 0 | No | No |
| 17217747 | WIDE FIELD-OF-VIEW CHARGED PARTICLE FILTER | March 2021 | October 2025 | Abandon | 55 | 1 | 0 | No | No |
No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.
Examiner TANDY, LAURA ELOISE works in Art Unit 2881 and has examined 2 patent applications in our dataset. With an allowance rate of 50.0%, this examiner allows applications at a lower rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 55 months.
Examiner TANDY, LAURA ELOISE's allowance rate of 50.0% places them in the 12% percentile among all USPTO examiners. This examiner is less likely to allow applications than most examiners at the USPTO.
On average, applications examined by TANDY, LAURA ELOISE receive 1.00 office actions before reaching final disposition. This places the examiner in the 9% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by TANDY, LAURA ELOISE is 55 months. This places the examiner in the 2% percentile for prosecution speed. Applications take longer to reach final disposition with this examiner compared to most others.
When applicants file petitions regarding this examiner's actions, 200.0% are granted (fully or in part). This grant rate is in the 99% percentile among all examiners. Strategic Note: Petitions are frequently granted regarding this examiner's actions compared to other examiners. Per MPEP § 1002.02(c), various examiner actions are petitionable to the Technology Center Director, including prematureness of final rejection, refusal to enter amendments, and requirement for information. If you believe an examiner action is improper, consider filing a petition.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 27% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 33% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.