USPTO Examiner HAGAN SEAN P - Art Unit 2828

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18799404METHOD FOR PRODUCING OPTOELECTRONIC DEVICESAugust 2024March 2026Allow1920YesNo
18401307SEMICONDUCTOR LASERSDecember 2023November 2025Abandon2320NoNo
18468135EMITTER ARRAY WITH SHARED VIA TO AN OHMIC METAL SHARED BETWEEN ADJACENT EMITTERSSeptember 2023June 2025Allow2120YesNo
18224926HCG TUNABLE VCSEL WITH OPTICAL CONFINEMENT VIA STEP INDEX AND REGROWTHJuly 2023February 2026Abandon3120YesNo
18224867HCG TUNABLE VCSEL WITH FULLY OXIDIZED BOTTOM DBR (GAAS BASED VCSEL)July 2023December 2025Abandon2910NoNo
18259078A laser with two longitudinal modes at different wavelengths with orthogonal polarizationsJuly 2023May 2024Abandon1010NoNo
18215200VCSEL WITH TUNABLE GRATINGJune 2023February 2026Abandon3220YesNo
18207864OPTOELECTRONIC DEVICE WITH VCSEL PROVIDING A GRID PATTERNJune 2023August 2024Abandon1520YesNo
18191966Cleaved Coupled Cavity AMQ Diode Configuration for Wide-Range Tunable LasersMarch 2023April 2025Abandon2540NoNo
17905831Intracavity harmonic generation with layered nonlinear opticFebruary 2023March 2025Abandon3030YesNo
18151577SEMICONDUCTOR OPTICAL AMPLIFIER INTEGRATED LASERJanuary 2023September 2024Allow2110YesNo
18061593OPTIMIZING A LAYOUT OF AN EMITTER ARRAYDecember 2022December 2024Allow2400NoNo
17854921SEMICONDUCTOR DEVICEJune 2022May 2025Abandon3440YesYes
17842031VCSEL WITH SELF-ALIGNED MICROLENS TO IMPROVE BEAM DIVERGENCEJune 2022January 2026Allow4330NoNo
17834037VERTICAL CAVITY SURFACE EMITTING LASER AND METHOD OF MANUFACTURING VERTICAL CAVITY SURFACE EMITTING LASERJune 2022March 2026Abandon4520YesNo
17825587HIGH-POWER EDGE-EMITTING SEMICONDUCTOR LASER WITH ASYMMETRIC STRUCTUREMay 2022January 2026Abandon4420NoNo
17724570OPTICAL SEMICONDUCTOR DEVICE AND SEMICONDUCTOR LASER DEVICEApril 2022November 2025Allow4320YesNo
17702454INTEGRATED LIGHT SOURCE USING A LASER DIODEMarch 2022April 2025Abandon3720YesNo
17696349BASE MEMBER OR LIGHT-EMITTING DEVICEMarch 2022February 2026Allow4720YesNo
17641968SEMICONDUCTOR LASER DEVICE STRUCTURES AND METHODS OF FABRICATION THEREOFMarch 2022October 2025Abandon4310NoNo
17689079VERTICAL CAVITY SURFACE EMITTING LASER DEVICE AND METHOD FOR MANUFACTURING THE SAMEMarch 2022April 2025Allow3710NoNo
17653366SURFACE-EMITTING SEMICONDUCTOR LIGHT-EMITTING DEVICEMarch 2022January 2026Allow4611YesNo
17652657OPTICAL MODULATOR AND METHOD FOR MANUFACTURING THE SAMEFebruary 2022April 2025Abandon3810NoNo
17678293LIGHT-EMITTING DEVICE AND DRIVING DEVICEFebruary 2022July 2025Allow4110NoNo
17677462HIGH-LUMINOUS FLUX LASER-BASED WHITE LIGHT SOURCEFebruary 2022September 2024Allow3110NoNo
17675512BROADBAND ARBITRARY WAVELENGTH MULTICHANNEL LASER SOURCEFebruary 2022March 2025Allow3710YesNo
17673867LASER OSCILLATION DEVICEFebruary 2022April 2025Abandon3810NoNo
17631524DISC LASERJanuary 2022June 2025Allow4110YesNo
17579106VCSEL Including A Self-Aligned, Deep Hole Evaporated Metal ContactJanuary 2022September 2024Abandon3210NoNo
17644831LASER COMPRISING A DISTRIBUTED BRAGG MIRROR AND PRODUCTION METHODDecember 2021November 2025Allow4720NoNo
17619721Variable Wavelength Laser and Control Method ThereforDecember 2021June 2025Abandon4220NoNo
17616044Optical DeviceDecember 2021September 2025Abandon4520NoNo
17540440LIGHT EMITTING SILICON DEVICEDecember 2021November 2024Allow3500NoNo
17533578VERTICAL-CAVITY SURFACE-EMITTING LASER, MANUFACTURING METHOD, DISTANCE MEASURING DEVICE AND ELECTRONIC DEVICENovember 2021August 2025Abandon4520NoNo
17609721SEMICONDUCTOR LASER DEVICE AND EXTERNAL RESONANCE-TYPE LASER DEVICENovember 2021June 2025Abandon4420NoNo
17609024SINGLE-MODE HYBRID III-V ON SILICON LASER OF SIMPLIFIED CONSTRUCTIONNovember 2021December 2024Allow3700YesNo
17594399SEMICONDUCTOR LASER AND MATERIAL MACHINING METHOD USING A SEMICONDUCTOR LASEROctober 2021March 2026Abandon5340YesNo
17499847LIGHT EMITTING DEVICE AND PROJECTOROctober 2021December 2023Allow2600NoNo
17602630COMPOUND SEMICONDUCTOR LAYER STACK, METHOD OF FORMING THE SAME, AND LIGHT-EMITTING DEVICEOctober 2021August 2025Abandon4620NoNo
17493325MEASUREMENT METHOD, MANUFACTURING METHOD, MEASUREMENT APPARATUS OF SURFACE-EMITTING LASER, AND NON-TRANSITORY STORAGE MEDIUM STORING MEASUREMENT PROGRAM OF SURFACE-EMITTING LASEROctober 2021February 2025Abandon4110NoNo
17491650DIFFUSOR LENS, LIGHT SOURCE, METHOD OF FABRICATING A LIGHT SOURCE AND METHOD OF ILLUMINATING A SCENEOctober 2021February 2025Allow4110NoNo
17441681SEMICONDUCTOR LASER DEVICESeptember 2021January 2025Abandon4010NoNo
17447941SEMICONDUCTOR OPTICAL DEVICE AND OPTICAL TRANSCEIVER MODULESeptember 2021July 2024Allow3310YesNo
17464765SURFACE LIGHT-EMISSION TYPE SEMICONDUCTOR LIGHT-EMITTING DEVICESeptember 2021September 2025Allow4820YesNo
17460185VCSEL EQUALIZATION TECHNIQUES FOR HIGH SPEED OPTICAL TRANSMISSIONAugust 2021July 2025Allow4711NoNo
17432470VERTICAL CAVITY SURFACE EMITTING DEVICEAugust 2021February 2026Abandon5440NoNo
17445019WAVELENGTH-TUNABLE LIGHT SOURCE DEVICE AND WAVELENGTH-TUNABLE LASER ELEMENT CONTROL METHODAugust 2021December 2025Abandon5230NoNo
17429366SEMICONDUCTOR LASER DEVICEAugust 2021September 2024Abandon3810NoNo
17428873DIRECT MODULATION LASER WITH HIGH POWERAugust 2021September 2025Abandon5030NoNo
17428059Optical TransmitterAugust 2021June 2025Allow4730NoNo
17393067LASER DIE PACKAGING FOR AN RGB LIGHT SOURCEAugust 2021June 2025Abandon4720YesNo
17426463HIGH-POWER SEMICONDUCTOR CHIP AND PREPARATION METHOD THEREFORJuly 2021February 2024Abandon3120YesNo
17425065SUBSTRATE-TRANSFER VERTICAL CAVITY SURFACE EMITTING LASER AND METHOD FOR MANUFACTURE THEREOFJuly 2021March 2025Abandon4420NoNo
17376943SURFACE-EMITTING SEMICONDUCTOR LASERJuly 2021November 2024Abandon4010NoNo
17423209METHOD FOR OBTAINING ELECTRONIC DEVICES AND ELECTRONIC DEVICESJuly 2021November 2025Abandon5230NoNo
17305778EMITTER WITH VARIABLE LIGHT REFLECTIVITYJuly 2021December 2025Abandon5340YesNo
17421467Tunable LaserJuly 2021September 2025Abandon5040YesNo
17305140VERTICAL-CAVITY SURFACE-EMITTING LASER ARRAY WITH INTEGRATED CAPACITORJune 2021November 2024Allow4120YesNo
17357938MULTIPLE METAL LAYERS WITHIN A PHOTONICS INTEGRATED CIRCUIT FOR THERMAL TRANSFERJune 2021November 2025Abandon5320NoNo
17417278SEMICONDUCTOR LASER ELEMENTJune 2021March 2025Abandon4520NoNo
17337982BEAM PROJECTOR MODULE FOR PERFORMING EYE-SAFETY FUNCTION USING TEMPERATURE, AND CONTROL METHOD THEREOFJune 2021June 2024Allow3610YesNo
17240620Semiconductor Device and MethodApril 2021March 2025Allow4730YesNo
17302099SELECTIVE-AREA GROWTH OF III-V MATERIALS FOR INTEGRATION WITH SILICON PHOTONICSApril 2021March 2026Abandon5840YesNo
17221856Emitter array with uniform brightnessApril 2021January 2025Abandon4520NoNo
17218820STRAIN-BALANCED SEMICONDUCTOR STRUCTUREMarch 2021March 2025Abandon4720NoNo
17214580OPTICAL SEMICONDUCTOR DEVICE AND SEMICONDUCTOR LIGHT-EMITTING DEVICEMarch 2021June 2024Allow3910YesNo
17214084QUANTUM CASCADE LASERMarch 2021October 2024Allow4320NoNo
17301050RESONANT CAVITY AND A METHOD OF MANUFACTURING THE SAMEMarch 2021January 2024Allow3400NoNo
17198485POWER AND SPECTRAL MONITORING IN WAVELENGTH BEAM COMBINING LASER SYSTEMSMarch 2021September 2024Abandon4220NoNo
17198111LIGHT EMITTING DEVICEMarch 2021March 2025Allow4830YesNo
17269086VCSELS INCLUDING A SUB-WAVELENGTH GRATING FOR WAVELENGTH LOCKINGFebruary 2021May 2025Abandon5120NoNo
17170834RADIATION EMITTERFebruary 2021July 2024Allow4211YesNo
17163903SPECIALIZED INTEGRATED LIGHT SOURCE USING A LASER DIODEFebruary 2021October 2024Abandon4520YesNo
17139230LASER DIODE PACKAGING STRUCTURE AND LIGHT SOURCE MODULE INCLUDING THE SAMEDecember 2020November 2025Abandon5840NoNo
17256879OPTICAL FIBER MICROWAVE FREQUENCY TRANSMISSION METHOD BASED ON LASER FREQUENCY OFFSET-LOCKINGDecember 2020February 2025Allow5020NoNo
17247737BOTTOM-EMITTING VERTICAL CAVITY SURFACE EMITTING LASER ARRAY WITH INTEGRATED DIRECTED BEAM DIFFUSERDecember 2020June 2024Allow4220YesNo
17122306SEMICONDUCTOR LASER DEVICEDecember 2020September 2023Abandon3320NoNo
17103587INTEGRATED WHITE LIGHT SOURCE USING A LASER DIODE AND A PHOSPHOR IN A SURFACE MOUNT DEVICE PACKAGENovember 2020December 2023Allow3710NoNo
17049520Semiconductor Optical ElementOctober 2020August 2024Abandon4620YesNo
17049212OPTICAL SEMICONDUCTOR ELEMENT AND METHOD OF MANUFACTURING THE SAME AND OPTICAL INTEGRATED SEMICONDUCTOR ELEMENT AND METHOD OF MANUFACTURING THE SAMEOctober 2020January 2024Abandon3910NoNo
16949213VARIABLE TRACE WIDTH FOR INDIVIDUAL VERTICAL CAVITY SURFACE EMITTING LASER CHANNELS FOR TIME OF FLIGHT ILLUMINATORSOctober 2020November 2023Allow3610YesNo
17060607Metalens Array and Vertical Cavity Surface Emitting Laser Systems and MethodsOctober 2020September 2024Abandon4730NoNo
17039763DIRECTLY MODULATED LASERSeptember 2020June 2023Allow3210YesNo
17039744ISOLATOR-FREE LASERSeptember 2020November 2023Abandon3820YesNo
17029177HIGH-POWER VERTICAL CAVITY SURFACE EMITTING LASER DIODE (VCSEL)September 2020November 2023Abandon3820NoNo
17025439Folded Slab LaserSeptember 2020January 2024Allow4020YesNo
16981503SURFACE-EMITTING LASER ARRAY, DETECTION DEVICE, AND LASER DEVICESeptember 2020September 2024Abandon4840YesNo
17015001THERMAL MANAGEMENT FOR HYBRID LASERSSeptember 2020September 2023Allow3620NoNo
17010610Semiconductor Device and Method to Minimize Stress on Stack ViaSeptember 2020May 2024Allow4540NoNo
16989907Integration of modulator and laser in a single chipAugust 2020May 2023Allow3320YesNo
16939108HYBRID LASER SOURCE COMPRISING AN INTEGRATED WAVEGUIDE CONTAINING AN INTERMEDIATE BRAGG GRATINGJuly 2020August 2023Allow3730YesNo
16931541VERTICAL CAVITY SURFACE EMITTING LASER DIODE (VCSEL) HAVING ALGAASP LAYER WITH COMPRESSIVE STRAINJuly 2020September 2022Allow2510NoNo
16963054SEMICONDUCTOR LASER DEVICE AND METHOD FOR MANUFACTURING THE SAMEJuly 2020September 2023Allow3820YesNo
16947086EMITTER ARRAY WITH SHARED VIA TO AN OHMIC METAL SHARED BETWEEN ADJACENT EMITTERSJuly 2020May 2023Allow3420YesNo
16957812Laser Oscillator System Having Optical Element For Injection Seeding and Method of ManufactureJune 2020January 2023Abandon3110NoNo
16957854STRUCTURED LIGHT PROJECTION SYSTEM INCLUDING NARROW BEAM DIVERGENCE SEMICONDUCTOR SOURCESJune 2020March 2025Abandon5740NoNo
16906079QUANTUM CASCADE LASERJune 2020April 2022Abandon2210NoNo
16906067VERTICAL CAVITY SURFACE EMITTING LASER DIODE (VCSEL) WITH MULTIPLE CURRENT CONFINEMENT LAYERSJune 2020October 2025Abandon6050YesYes
16904769Method of Fabricating Laser Devices Having Optical Modes AdjustableJune 2020July 2022Abandon2520NoNo
16901872SEMICONDUCTOR OPTICAL AMPLIFIER INTEGRATED LASERJune 2020September 2022Allow2710YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner HAGAN, SEAN P.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
40
Examiner Affirmed
23
(57.5%)
Examiner Reversed
17
(42.5%)
Reversal Percentile
65.0%
Higher than average

What This Means

With a 42.5% reversal rate, the PTAB reverses the examiner's rejections in a meaningful percentage of cases. This reversal rate is above the USPTO average, indicating that appeals have better success here than typical.

Strategic Value of Filing an Appeal

Total Appeal Filings
79
Allowed After Appeal Filing
24
(30.4%)
Not Allowed After Appeal Filing
55
(69.6%)
Filing Benefit Percentile
46.1%
Lower than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 30.4% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.

Strategic Recommendations

Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.

Examiner HAGAN, SEAN P - Prosecution Strategy Guide

Executive Summary

Examiner HAGAN, SEAN P works in Art Unit 2828 and has examined 648 patent applications in our dataset. With an allowance rate of 40.9%, this examiner allows applications at a lower rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 36 months.

Allowance Patterns

Examiner HAGAN, SEAN P's allowance rate of 40.9% places them in the 7% percentile among all USPTO examiners. This examiner is less likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by HAGAN, SEAN P receive 2.77 office actions before reaching final disposition. This places the examiner in the 81% percentile for office actions issued. This examiner issues more office actions than most examiners, which may indicate thorough examination or difficulty in reaching agreement with applicants.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by HAGAN, SEAN P is 36 months. This places the examiner in the 36% percentile for prosecution speed. Prosecution timelines are slightly slower than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +29.7% benefit to allowance rate for applications examined by HAGAN, SEAN P. This interview benefit is in the 78% percentile among all examiners. Recommendation: Interviews are highly effective with this examiner and should be strongly considered as a prosecution strategy. Per MPEP § 713.10, interviews are available at any time before the Notice of Allowance is mailed or jurisdiction transfers to the PTAB.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 12.8% of applications are subsequently allowed. This success rate is in the 8% percentile among all examiners. Strategic Insight: RCEs show lower effectiveness with this examiner compared to others. Consider whether a continuation application might be more strategic, especially if you need to add new matter or significantly broaden claims.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 21.2% of cases where such amendments are filed. This entry rate is in the 27% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 34.5% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 34% percentile among all examiners. Note: Pre-appeal conferences show below-average success with this examiner. Consider whether your arguments are strong enough to warrant a PAC request.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 44.4% of appeals filed. This is in the 10% percentile among all examiners. Of these withdrawals, 18.8% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner rarely withdraws rejections during the appeal process compared to other examiners. If you file an appeal, be prepared to fully prosecute it to a PTAB decision. Per MPEP § 1207, the examiner will prepare an Examiner's Answer maintaining the rejections.

Petition Practice

When applicants file petitions regarding this examiner's actions, 64.2% are granted (fully or in part). This grant rate is in the 69% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 1.4% of allowed cases (in the 71% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.8% of allowed cases (in the 58% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Prepare for rigorous examination: With a below-average allowance rate, ensure your application has strong written description and enablement support. Consider filing a continuation if you need to add new matter.
  • Expect multiple rounds of prosecution: This examiner issues more office actions than average. Address potential issues proactively in your initial response and consider requesting an interview early in prosecution.
  • Prioritize examiner interviews: Interviews are highly effective with this examiner. Request an interview after the first office action to clarify issues and potentially expedite allowance.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.