USPTO Examiner AYUB HINA F - Art Unit 2896

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
17047278Interferometer and Method for Producing an InterferometerMarch 2021March 2022Allow1810YesNo
17137700SPECTROMETER MODULEDecember 2020May 2023Allow2820NoNo
17137654SPECTROMETER MODULEDecember 2020September 2022Allow2110NoNo
17134798MEASUREMENT DEVICE AND MEASUREMENT METHODDecember 2020June 2022Allow1810NoNo
17255820SPECTRAL FILTER COMPRISING AT LEAST TWO COUPLED FABRY-PEROT STRUCTURESDecember 2020January 2022Allow1300NoNo
17253008PROJECTION SYSTEM, PROJECTION ADJUSTMENT PROGRAM, AND PROJECTION METHODDecember 2020December 2023Allow3610NoNo
15733806MULTI-MODE THERMAL IMAGING DEVICE AND OPERATION METHOD THEREOFNovember 2020December 2021Allow1200NoNo
17102594Methods and Systems for Spectroscopic AnalysisNovember 2020June 2022Abandon1910NoNo
16950720OPTICAL DENSITY TESTING SYSTEM AND OPTICAL DENSITY TESTING DEVICENovember 2020November 2021Allow1200YesNo
17053093HYBRID LASER-INDUCED BREAKDOWN SPECTROSCOPY SYSTEMNovember 2020March 2022Allow1710NoNo
17048565SENSOR ASSEMBLY, ACTUATOR, CONTROL SYSTEM, ELECTRICALLY ADJUSTABLE PIECE OF FURNITURE AND METHOD FOR OPERATING AN ELECTRICALLY ADJUSTABLE PIECE OF FURNITUREOctober 2020January 2023Allow2730NoNo
17048081SPARK EMISSION SPECTROMETER WITH SEPARABLE SPARK CHAMBEROctober 2020January 2022Allow1510NoNo
17037675MULTI-CHANNEL ARRAY TYPE OPTICAL SENSING DEVICE AND MANUFACTURING METHOD THEREOFSeptember 2020September 2022Abandon2320NoNo
17043851FINE RATIO MEASURING DEVICE, FINE RATIO MEASURING SYSTEM, AND BLAST FURNACE OPERATING METHODSeptember 2020November 2022Allow2510NoNo
17030520DETERIORATION DETECTING SYSTEM AND METHOD FOR SEMICONDUCTOR PROCESS KITSSeptember 2020February 2022Allow1710NoNo
17019612Spectrometers and Instruments Including ThemSeptember 2020October 2021Allow1300NoNo
16980326IMAGE SENSOR COMPRISING A COLOR SPLITTER WITH TWO DIFFERENT REFRACTIVE INDEXESSeptember 2020October 2022Allow2530NoNo
17014005AUTOMATED DELAY LINE ALIGNMENTSeptember 2020April 2022Allow2020NoNo
16978307MULTISPECTRAL SENSOR AND METHOD FOR MULTISPECTRAL LIGHT SENSINGSeptember 2020March 2022Allow1810NoNo
17002939DEVICES, SYSTEMS, AND METHODS FOR AGROCHEMICAL DETECTION AND AGROCHEMICAL COMPOSITIONSAugust 2020July 2022Allow2321YesNo
16970377WAVELENGTH DETECTION DEVICE AND CONFOCAL MEASUREMENT DEVICEAugust 2020December 2021Allow1610NoNo
16989741FABRY-PEROT FOURIER TRANSFORM SPECTROMETERAugust 2020March 2022Allow2010NoNo
16988564HYPERSPECTRAL SENSING SYSTEMAugust 2020September 2021Allow1400NoNo
16988562HYPERSPECTRAL SENSING SYSTEMAugust 2020January 2022Allow1810NoNo
16986884METHOD OF CALIBRATING SPECTRAL APPARATUS AND METHOD OF PRODUCING CALIBRATED SPECTRAL APPARATUSAugust 2020January 2022Allow1710NoNo
16941248SPECTROMETRY SYSTEM APPLICATIONSJuly 2020December 2021Allow1710NoNo
16956785METHOD AND DEVICE FOR DETECTING A FOCAL POSITION OF A LASER BEAMJuly 2020September 2022Allow2711YesNo
16958110METHOD FOR DETERMINING A DEGREE OF POLYMERISATION OF A POLYMERJune 2020December 2021Allow1710YesNo
16957327THREE-DIMENSIONAL SHAPE DETECTION APPARATUS, THREE-DIMENSIONAL SHAPE DETECTION METHOD AND PLASMA PROCESSING APPARATUSJune 2020September 2022Allow2710NoNo
16769699RAMAN SCATTERED LIGHT ACQUISITION DEVICE, COMPOSITION ANALYSIS DEVICE COMPRISING SAME, AND GAS TURBINE PLANTJune 2020March 2022Allow2110YesNo
16882784OPTICAL PHASE MEASUREMENT SYSTEM AND METHODMay 2020May 2022Allow2420NoNo
16874554NANOSTRUCTURE BASED ARTICLE, OPTICAL SENSOR AND ANALYTICAL INSTRUMENT AND METHOD OF FORMING SAMEMay 2020October 2021Allow1710NoNo
15931015THIN-FILM FILTER BASED HYPERSPECTRAL IMAGER SPANNING AN OCTAVE OF LONG WAVELENGTH INFRARED REGIMEMay 2020November 2022Allow3011YesNo
15930379Variable Aperture MaskMay 2020November 2021Allow1820YesNo
16856785REAL TIME CRUDE OIL VALIDATION SWEPT SOURCE SPECTROSCOPYApril 2020September 2021Allow1610YesNo
16851356DUAL-BAND SPECTRAL IMAGING SYSTEM BASED ON DIGITAL MICROMIRROR DEVICE AND IMPLEMENTATION METHOD THEREOFApril 2020April 2022Abandon2420NoNo
16844908COMPACT LIGHT SENSORApril 2020June 2021Allow1400NoNo
16841324PUMP AND PROBE TYPE SECOND HARMONIC GENERATION METROLOGYApril 2020June 2021Allow1400NoNo
16839039Non-Contact Reflectometer Vision SystemApril 2020December 2020Allow800NoNo
16651608MOBILE BIOSENSING INSTRUMENT CAPABLE OF MULTIPLE DETECTION MODALITIESMarch 2020February 2021Allow1110NoNo
16829165Spectroscopic Camera And Inspection SystemMarch 2020August 2021Allow1710NoNo
16822929MULTISPECTRAL FILTERMarch 2020August 2021Allow1710YesNo
16819618APPARATUS AND METHOD FOR MEASURING PARTICULATE MATTERMarch 2020May 2021Allow1400NoNo
16819708WEAR AMOUNT MEASURING DEVICE AND WEAR AMOUNT MEASURING METHODMarch 2020September 2021Allow1810YesNo
16815585OPTICAL TEST PLATFORMMarch 2020August 2021Allow1720YesNo
16639475COMPACT FREEFORM ECHELLE SPECTROMETERFebruary 2020July 2021Allow1710NoNo
16638638Far-Infrared Spectroscopic Device and Far-Infrared Spectroscopic MethodFebruary 2020March 2021Allow1300NoNo
16773693WAFER METROLOGY TECHNOLOGIESJanuary 2020November 2021Allow2110NoNo
16747888OPTICAL TIME DOMAIN REFLECTOMETER AND TESTING METHOD OF OPTICAL TIME DOMAIN REFLECTOMETERJanuary 2020April 2021Allow1500NoNo
16697164APPARATUS AND METHOD FOR ASSESSING OPTICAL QUALITY OF GEMSTONESNovember 2019November 2021Allow2320NoNo
16688728INTEGRATED DEVICE WITH EXTERNAL LIGHT SOURCE FOR PROBING DETECTING AND ANALYZING MOLECULESNovember 2019July 2021Allow2010NoNo
16682616OPTICAL WALL AND PROCESS SENSOR WITH PLASMA FACING SENSORNovember 2019July 2022Allow3210NoNo
16613353OPTICAL SENSOR AND METHOD FOR DETECTING ELECTROMAGNETIC RADIATIONNovember 2019September 2021Allow2220NoNo
16612612INFERENTIAL FLUID CONDITION SENSOR AND METHOD THEREOFNovember 2019August 2021Allow2110NoNo
16653715Plasmonic Non-Dispersive Infrared Gas SensorsOctober 2019June 2021Allow2010YesNo
16597943Spectrometric Measuring Head for Forestry, Agricultural and Food Industry ApplicationsOctober 2019February 2021Allow1610NoNo
16583042HYPERSPECTRAL SENSING SYSTEM AND PROCESSING METHODS FOR HYPERSPECTRAL DATASeptember 2019April 2021Allow1901YesNo
16558763CUVETTE CARRIERSeptember 2019January 2021Allow1600NoNo
16475626DETERMINING A CHARACTERISTIC OF A SUBSTRATEJuly 2019December 2021Allow2910NoNo
16442716SPECTRAL CHARACTERISTIC ACQUISITION DEVICE, IMAGE FORMING APPARATUS, AND IMAGE FORMING APPARATUS MANAGEMENT SYSTEMJune 2019July 2021Allow2520NoNo
16468783DETECTION OF A CONTAMINANT IN A CONDUCTING PATH FOR AN OPERATING MEDIUMJune 2019August 2021Abandon2710NoNo
16465238SYSTEMS AND METHODS FOR COPPER ETCH RATE MONITORING AND CONTROLMay 2019April 2021Allow2310NoNo
16424327HIGH-SENSITIVITY GAS-MAPPING 3D IMAGER AND METHOD OF OPERATIONMay 2019April 2021Allow2310NoNo
16421645LASER DEVICEMay 2019June 2021Allow2510NoNo
16420625ARMORED VEHICLE, METHOD, AND WEAPON MEASUREMENT SYSTEM FOR DETERMINING BARREL ELEVATIONMay 2019March 2021Allow2210NoNo
16462247OPTICAL SYSTEM AND METHOD FOR MEASURING PARAMETERS OF PATTERNED STRUCTURES IN MICRO-ELECTRONIC DEVICESMay 2019August 2022Allow3910NoNo
16349057METHODS AND APPARATUS FOR CHARACTERIZING A SPECIMEN USING PATTERN ILLUMINATIONMay 2019March 2021Allow2220NoNo
16407020Apparatus and Methods for Aligning Photopolymers Using an Asymmetrically Focused BeamMay 2019March 2021Allow2210NoNo
16402445SPECTROMETRY SYSTEM APPLICATIONSMay 2019May 2020Allow1210NoNo
16347364DETECTOR FOR OPTICALLY DETECTING AT LEAST ONE OBJECTMay 2019December 2020Allow2010NoNo
16399036Assay Devices and MethodsApril 2019July 2020Allow1410NoNo
16344665SYSTEM AND METHOD FOR DETECTING INCLUSIONS IN A GEMSTONEApril 2019January 2021Allow2110NoNo
16342087METHOD FOR EVALUATING TANTALUM CARBIDEApril 2019September 2020Allow1700NoNo
16382251ANALYSIS APPARATUS, IMAGING SYSTEM, AND STORAGE MEDIUMApril 2019May 2021Allow2520YesNo
16341133SPECTROSCOPIC DEVICE AND IMAGING DEVICEApril 2019October 2020Allow1800NoNo
16380543SPECTRAL ANALYSIS SYSTEM FOR CAPTURING A SPECTRUMApril 2019April 2021Allow2420YesNo
16378620UV-VIS SPECTROSCOPY INSTRUMENT AND METHODS FOR COLOR APPEARANCE AND DIFFERENCE MEASUREMENTApril 2019January 2021Allow2110NoNo
16340550A SPECTROMETER APPARATUS FOR MEASURING SPECTRA OF A LIQUID SAMPLE USING AN INTEGRATING CAVITYApril 2019September 2020Allow1700NoNo
16378935TEST DEVICE AND METHOD OF MANUFACTURING LIGHT EMITTING DEVICEApril 2019May 2021Abandon2540NoNo
16378271IN-SITU OPTICAL CHAMBER SURFACE AND PROCESS SENSORApril 2019November 2020Allow1930YesNo
16376642RAMAN SPECTROSCOPY AND MACHINE LEARNING FOR QUALITY CONTROLApril 2019November 2020Allow1910NoNo
16339375SYNCHRONOUS MONITORING DEVICE AND METHOD FOR RADIAL AND AXIAL VIBRATION OF SHEARER DRUMApril 2019June 2020Allow1500NoNo
16090947METHOD AND DEVICE FOR OPTICAL IN OVO SEX DETERMINATION OF FERTILIZED AND INCUBATED BIRDS? EGGSMarch 2019July 2020Allow2100NoNo
16368510FLUORESCENCE IMAGING APPARATUSMarch 2019December 2020Allow2111YesNo
16366635HYPERSPECTRAL SENSING SYSTEMMarch 2019August 2020Allow1701NoNo
16366225PLASMA SENSING DEVICE, PLASMA MONITORING SYSTEM AND METHOD OF CONTROLLING PLASMA PROCESSESMarch 2019September 2020Allow1810NoNo
16362922Inspection Apparatus Having Non-Linear OpticsMarch 2019June 2020Allow1510YesNo
16362716TRANSMISSIVE SAMPLING MODULE AND TRANSMISSIVE SPECTROMETERMarch 2019August 2020Allow1710YesNo
16362669DEVICES, SYSTEMS, AND METHODS FOR FLEXIBLE, DEPLOYABLE STRUCTURE WITH OPTICAL FIBERMarch 2019November 2020Allow2010NoNo
16359619ELLIPSOMETERMarch 2019December 2020Allow2020YesNo
16358691METHOD AND APPARATUS FOR DETERMINING AIRCRAFT ENGINE MAINTENANCE STATUS USING FAN BEAM EMISSION TOMOGRAPHYMarch 2019October 2020Abandon1910NoNo
16243215Arrangement and method for analyzing a fluidJanuary 2019October 2020Abandon2210NoNo
16237817MICRO OR NANOMECHANICAL PARTICLE DETECTION DEVICEJanuary 2019May 2020Allow1710NoNo
16309033METHODS AND SYSTEMS FOR SPECTROSCOPIC ANALYSISDecember 2018December 2020Abandon2410NoNo
16215221GAS ANALYSIS SYSTEMDecember 2018July 2020Allow1910YesNo
16215290GAS ANALYSIS SYSTEMDecember 2018July 2020Allow1910NoNo
16215269GAS ANALYSIS SYSTEMDecember 2018April 2020Allow1610NoNo
16308791SPECTROMETRIC PROBE FOR SAMPLING BULK MATERIAL AND AUTOMATIC SAMPLE TAKER FOR SAMPLING INCLUDING THE PROBEDecember 2018July 2020Allow1910NoNo
16212724METHODS FOR NUCLEIC ACID SEQUENCINGDecember 2018January 2021Allow2520NoNo
16211516SPECTROMETRIC SENSOR CONTROL METHOD AND ELECTRONIC DEVICE FOR SUPPORTING SAMEDecember 2018June 2020Allow1820NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner AYUB, HINA F.

Strategic Value of Filing an Appeal

Total Appeal Filings
1
Allowed After Appeal Filing
1
(100.0%)
Not Allowed After Appeal Filing
0
(0.0%)
Filing Benefit Percentile
97.8%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 100.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Strategic Recommendations

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner AYUB, HINA F - Prosecution Strategy Guide

Executive Summary

Examiner AYUB, HINA F works in Art Unit 2896 and has examined 157 patent applications in our dataset. With an allowance rate of 91.7%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 22 months.

Allowance Patterns

Examiner AYUB, HINA F's allowance rate of 91.7% places them in the 77% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by AYUB, HINA F receive 1.38 office actions before reaching final disposition. This places the examiner in the 18% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by AYUB, HINA F is 22 months. This places the examiner in the 88% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +9.2% benefit to allowance rate for applications examined by AYUB, HINA F. This interview benefit is in the 41% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 38.8% of applications are subsequently allowed. This success rate is in the 89% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 55.9% of cases where such amendments are filed. This entry rate is in the 83% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 0.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 15% percentile among all examiners. Note: Pre-appeal conferences show limited success with this examiner compared to others. While still worth considering, be prepared to proceed with a full appeal brief if the PAC does not result in favorable action.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 95% percentile among all examiners. Of these withdrawals, 100.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 66.7% are granted (fully or in part). This grant rate is in the 72% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.6% of allowed cases (in the 62% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).

Quayle Actions: This examiner issues Ex Parte Quayle actions in 2.8% of allowed cases (in the 74% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.