Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 17137034 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, METHOD OF PROCESSING SUBSTRATE, SUBSTRATE PROCESSING APPARATUS, AND RECORDING MEDIUM | December 2020 | October 2022 | Allow | 22 | 0 | 0 | No | No |
| 17134627 | Methods for Manufacturing a MOSFET | December 2020 | August 2022 | Allow | 20 | 0 | 0 | No | No |
| 17130960 | GATE ALL AROUND FIN FIELD EFFECT TRANSISTOR | December 2020 | April 2023 | Allow | 27 | 1 | 0 | Yes | No |
| 17127807 | METHOD FOR FABRICATING A THROUGHPUT-SCALABLE ANALYTICAL SYSTEM FOR MOLECULE DETECTION AND SENSING | December 2020 | June 2021 | Allow | 6 | 1 | 1 | No | No |
| 17116504 | METHOD OF MATERIAL DEPOSITION | December 2020 | September 2022 | Allow | 21 | 0 | 0 | No | No |
| 17114466 | Array Imaging Module and Molded Photosensitive Assembly and Manufacturing Method Thereof for Electronic Device | December 2020 | June 2023 | Allow | 31 | 3 | 1 | No | No |
| 17105102 | SEMICONDUCTOR DEVICE HAVING WELL CONTACT DIFFUSION REGION SUPPLYING WELL POTENTIAL | November 2020 | March 2023 | Allow | 28 | 1 | 0 | No | No |
| 17104568 | Method for Manufacturing a Sensor Device with a Buried Deep Trench Structure and Sensor Device | November 2020 | August 2023 | Allow | 33 | 2 | 1 | No | No |
| 17101578 | Method For Fabrication Of NIR CMOS Image Sensor | November 2020 | November 2022 | Allow | 24 | 0 | 1 | No | No |
| 16949927 | PIXEL ARRAY INCLUDING AIR GAP REFLECTION STRUCTURES | November 2020 | June 2023 | Allow | 31 | 1 | 1 | Yes | No |
| 17083909 | FILM FOR MANUFACTURING SEMICONDUCTOR PARTS | October 2020 | August 2022 | Allow | 22 | 0 | 0 | No | No |
| 17073553 | ENHANCED TRENCH ISOLATION STRUCTURE | October 2020 | June 2023 | Allow | 32 | 1 | 1 | No | No |
| 17038062 | METHOD AND APPARATUS FOR COMPENSATING FOR HIGH THERMAL EXPANSION COEFFICIENT MISMATCH OF A STACKED DEVICE | September 2020 | January 2023 | Allow | 27 | 0 | 1 | No | No |
| 17029475 | INTEGRATED CIRCUIT INCLUDING INTEGRATED STANDARD CELL STRUCTURE | September 2020 | March 2023 | Allow | 30 | 1 | 1 | Yes | No |
| 17027211 | INTEGRATED CIRCUITS INCLUDING INTEGRATED STANDARD CELL STRUCTURE | September 2020 | June 2023 | Allow | 33 | 1 | 1 | Yes | No |
| 17025983 | INTEGRATED CIRCUIT | September 2020 | March 2023 | Allow | 30 | 2 | 1 | No | No |
| 17016024 | SEMICONDUCTOR DEVICE | September 2020 | March 2023 | Allow | 31 | 2 | 0 | No | No |
| 17010717 | IMAGE SENSOR DEVICE AND FABRICATION METHOD THEREOF | September 2020 | June 2023 | Allow | 34 | 2 | 1 | No | No |
| 16976829 | SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | August 2020 | June 2023 | Allow | 33 | 2 | 1 | No | No |
| 16969293 | INTEGRATED PHOTOSENSITIVE MODULE, PHOTOSENSITIVE ASSEMBLY, CAMERA MODULE AND PREPARATION METHOD THEREFOR | August 2020 | September 2023 | Abandon | 37 | 2 | 1 | No | No |
| 16987745 | IMAGING DEVICE AND SIGNAL PROCESSING DEVICE | August 2020 | April 2022 | Allow | 20 | 0 | 0 | No | No |
| 16966166 | IMAGE SENSOR AND METHOD FOR MANUFACTURING DEEP TRENCH AND THROUGH-SILICON VIA OF THE IMAGE SENSOR | July 2020 | June 2022 | Allow | 22 | 0 | 0 | No | No |
| 16937752 | WAFER-LEVEL PROCESS FOR CURVING A SET OF ELECTRONIC CHIPS | July 2020 | April 2022 | Allow | 21 | 0 | 0 | No | No |
| 16937306 | IMAGE SENSORS WITH STRESS ADJUSTING LAYERS | July 2020 | May 2023 | Allow | 34 | 1 | 1 | Yes | No |
| 16963817 | IMAGING DEVICE AND MANUFACTURING METHOD THEREOF | July 2020 | March 2023 | Allow | 32 | 2 | 1 | No | No |
| 16931585 | SEMICONDUCTOR DEVICE | July 2020 | December 2022 | Allow | 29 | 1 | 0 | No | No |
| 16923717 | SYSTEM AND METHOD FOR THERMALLY CALIBRATING SEMICONDUCTOR PROCESS CHAMBERS | July 2020 | May 2023 | Allow | 34 | 3 | 0 | Yes | No |
| 16919886 | FORMATION OF RELIEFS ON THE SURFACE OF A SUBSTRATE | July 2020 | June 2022 | Allow | 24 | 1 | 0 | No | No |
| 16946620 | SEMICONDUCTOR DEVICES AND METHODS OF MANUFACTURING THE SAME | June 2020 | December 2022 | Allow | 30 | 1 | 0 | Yes | No |
| 16916091 | SYSTEM AND METHOD FOR DETERMINING CAUSE OF ABNORMALITY IN SEMICONDUCTOR MANUFACTURING PROCESSES | June 2020 | June 2022 | Allow | 23 | 0 | 0 | No | No |
| 16904080 | MAGNETIC MEMORY DEVICE | June 2020 | January 2022 | Allow | 19 | 0 | 0 | No | No |
| 16900854 | CELL OF TRANSMISSION GATE FREE CIRCUIT AND INTEGRATED CIRCUIT LAYOUT INCLUDING THE SAME | June 2020 | November 2022 | Allow | 30 | 1 | 0 | No | No |
| 16894901 | IMAGE SENSOR AND MANUFACTURING METHOD THEREOF | June 2020 | January 2023 | Allow | 31 | 1 | 1 | No | No |
| 16894647 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | June 2020 | January 2023 | Allow | 32 | 2 | 1 | No | No |
| 16893035 | CMOS Image Sensors with Per-Pixel Micro-Lens Arrays | June 2020 | November 2021 | Allow | 17 | 2 | 1 | Yes | No |
| 15929722 | EPITAXIAL GROWTH METHODS AND STRUCTURES THEREOF | May 2020 | June 2022 | Allow | 25 | 1 | 0 | No | No |
| 16865049 | Wrap-Around Contact on FinFET | May 2020 | February 2022 | Allow | 21 | 0 | 0 | No | No |
| 16856011 | SEMICONDUCTOR PACKAGE STRUCTURE AND MANUFACTURING METHOD THEREOF | April 2020 | October 2022 | Allow | 29 | 1 | 1 | No | No |
| 16851643 | IMAGE SENSOR DEVICE AND METHODS OF FORMING THE SAME | April 2020 | January 2023 | Allow | 33 | 1 | 1 | No | No |
| 16830298 | MOUNTING OF SEMICONDUCTOR-ON-DIAMOND WAFERS FOR DEVICE PROCESSING | March 2020 | June 2022 | Allow | 26 | 1 | 0 | No | No |
| 16808336 | VERTICAL POWER GRID STANDARD CELL ARCHITECTURE | March 2020 | April 2023 | Allow | 38 | 2 | 1 | Yes | No |
| 16741644 | HYDROPHOBIC COATINGS FOR METALS INCORPORATING ANODIC AND RARE-EARTH OXIDES AND METHODS OF APPLYING SAME | January 2020 | June 2023 | Abandon | 42 | 1 | 0 | No | No |
| 16740463 | MANUFACTURING METHOD OF PACKAGE ON PACKAGE STRUCTURE | January 2020 | January 2022 | Allow | 24 | 0 | 0 | No | No |
| 16728018 | Back Side Illuminated Image Sensor with Reduced Sidewall-Induced Leakage | December 2019 | June 2022 | Allow | 29 | 1 | 0 | No | No |
| 16728099 | MULTIPLY SPIN-COATED ULTRA-THICK HYBRID HARD MASK FOR SUB 60NM MRAM DEVICES | December 2019 | January 2022 | Allow | 24 | 0 | 0 | No | No |
| 16720261 | MULTIFUNCTION SINGLE VIA PATTERNING | December 2019 | February 2023 | Allow | 38 | 3 | 0 | Yes | No |
| 16719261 | MULTIFUNCTION SINGLE VIA PATTERNING | December 2019 | April 2022 | Allow | 28 | 1 | 0 | No | No |
| 16718239 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | December 2019 | November 2021 | Allow | 23 | 0 | 0 | No | No |
| 16687346 | PROCESS MODULE FOR INCREASING THE RESPONSE OF BACKSIDE ILLUMINATED PHOTOSENSITIVE IMAGERS AND ASSOCIATED METHODS | November 2019 | June 2022 | Abandon | 31 | 0 | 1 | No | No |
| 16684616 | SINGLE METALLIZATION SCHEME FOR GATE, SOURCE, AND DRAIN CONTACT INTEGRATION | November 2019 | February 2022 | Allow | 27 | 2 | 0 | Yes | No |
| 16587335 | PATTERN TRANSFER TECHNIQUE AND METHOD OF MANUFACTURING THE SAME | September 2019 | November 2021 | Allow | 26 | 0 | 1 | No | No |
| 16582447 | HIGH RESISTIVITY SILICON-ON-INSULATOR STRUCTURE AND METHOD OF MANUFACTURE THEREOF | September 2019 | June 2021 | Allow | 21 | 0 | 0 | No | No |
| 16539911 | SOLID SOURCE SUBLIMATOR | August 2019 | January 2023 | Allow | 41 | 2 | 1 | Yes | No |
| 16519225 | FIELD EFFECT TRANSISTORS HAVING A FIN | July 2019 | May 2022 | Allow | 34 | 2 | 1 | No | No |
| 16502310 | Substrate Processing Apparatus, Substrate Processing Method, and Storage Medium | July 2019 | April 2022 | Allow | 34 | 1 | 1 | No | No |
| 16449837 | METHOD FOR MANUFACTURING HORIZONTAL-GATE-ALL-AROUND DEVICES WITH DIFFERENT NUMBER OF NANOWIRES | June 2019 | March 2021 | Allow | 20 | 1 | 1 | No | No |
| 16423500 | THREE-DIMENSIONAL FLAT NAND MEMORY DEVICE INCLUDING WAVY WORD LINES AND METHOD OF MAKING THE SAME | May 2019 | January 2021 | Allow | 20 | 1 | 1 | No | No |
| 16349095 | VERTICAL BOND-WIRE STACKED CHIP-SCALE PACKAGE WITH APPLICATION-SPECIFIC INTEGRATED CIRCUIT DIE ON STACK, AND METHODS OF MAKING SAME | May 2019 | August 2022 | Allow | 39 | 2 | 1 | No | No |
| 16407249 | HIGH-FREQUENCY MODULE | May 2019 | September 2021 | Allow | 28 | 2 | 1 | Yes | No |
| 16407623 | ELECTRONIC COMPONENT PACKAGE | May 2019 | September 2022 | Allow | 41 | 4 | 1 | Yes | No |
| 16407429 | SEMICONDUCTOR PACKAGE | May 2019 | September 2021 | Allow | 28 | 2 | 1 | No | No |
| 16407720 | HEAT-CURABLE MALEIMIDE RESIN COMPOSITION FOR SEMICONDUCTOR ENCAPSULATION AND SEMICONDUCTOR DEVICE | May 2019 | March 2022 | Abandon | 34 | 2 | 1 | No | No |
| 16394724 | Methods For Self-Aligned Patterning | April 2019 | December 2019 | Allow | 8 | 1 | 0 | No | No |
| 16391540 | PROCESS MODULE FOR INCREASING THE RESPONSE OF BACKSIDE ILLUMINATED PHOTOSENSITIVE IMAGERS AND ASSOCIATED METHODS | April 2019 | July 2019 | Allow | 3 | 0 | 0 | No | No |
| 16390874 | Wrap-Around Contact on FinFET | April 2019 | January 2020 | Allow | 9 | 1 | 0 | No | No |
| 16282607 | PROTECTION OF HIGH-K DIELECTRIC DURING RELIABILITY ANNEAL ON NANOSHEET STRUCTURES | February 2019 | June 2019 | Allow | 4 | 1 | 0 | Yes | No |
| 16230162 | PYROELECTRIC SENSOR WITH IMPROVED ELECTROMAGNETIC SHIELDING | December 2018 | September 2020 | Allow | 20 | 0 | 1 | No | No |
| 16230528 | HIGH LUMINANCE LIGHT EMITTING DEVICE AND METHOD FOR CREATING A HIGH LUMINANCE LIGHT EMITTING DEVICE | December 2018 | September 2021 | Allow | 33 | 2 | 1 | No | Yes |
| 16230137 | SEMICONDUCTOR TRIODE | December 2018 | May 2022 | Allow | 41 | 3 | 1 | Yes | No |
| 16230048 | METHODS OF ERASING SEMICONDUCTOR NON-VOLATILE MEMORIES | December 2018 | August 2021 | Allow | 31 | 3 | 1 | Yes | No |
| 16230072 | LIGHT EMITTING DEVICE AND METHOD OF MANUFACTURING SAME | December 2018 | January 2022 | Allow | 37 | 3 | 1 | No | No |
| 16223036 | METHOD FOR FORMING A SEMICONDUCTOR STRUCTURE | December 2018 | August 2020 | Allow | 20 | 0 | 1 | No | No |
| 16222263 | TECHNIQUES FOR FABRICATING WAVEGUIDE FACETS AND DIE SEPARATION | December 2018 | October 2020 | Allow | 22 | 1 | 1 | No | No |
| 16221918 | METHOD AND APPARATUS FOR PLASMA PROCESSING | December 2018 | December 2022 | Allow | 48 | 5 | 1 | Yes | No |
| 16221939 | ASSEMBLY FOR 3D CIRCUIT WITH SUPERPOSED TRANSISTOR LEVELS | December 2018 | January 2021 | Allow | 25 | 1 | 1 | No | No |
| 16310057 | ORGANIC SEMICONDUCTOR COMPOSITION AND SEMICONDUCTING LAYER OBTAINED THEREFROM | December 2018 | March 2021 | Abandon | 27 | 1 | 1 | No | No |
| 16206500 | EPITAXIAL GROWTH METHODS AND STRUCTURES THEREOF | November 2018 | January 2020 | Allow | 13 | 2 | 0 | No | No |
| 16305579 | OPTICALLY TRANSPARENT ELECTROMAGNETICALLY SHIELDING ELEMENT COMPRISING A PLURALITY OF ZONES | November 2018 | June 2021 | Allow | 31 | 1 | 1 | No | No |
| 16305680 | THERMAL PROCESSING METHOD FOR SILICON WAFER | November 2018 | June 2021 | Allow | 31 | 2 | 1 | No | No |
| 16099655 | Backside Illumination Image Sensor | November 2018 | August 2021 | Abandon | 33 | 0 | 1 | No | No |
| 16152596 | SEMICONDUCTOR PHOTOMULTIPLIER | October 2018 | October 2021 | Allow | 37 | 5 | 0 | No | No |
| 16142447 | THREE-DIMENSIONAL FLAT NAND MEMORY DEVICE INCLUDING WAVY WORD LINES AND METHOD OF MAKING THE SAME | September 2018 | December 2020 | Allow | 26 | 1 | 1 | No | No |
| 16142208 | VACUUM CHANNEL TRANSISTOR STRUCTURES WITH SUB-10 NANOMETER NANOGAPS AND LAYERED METAL ELECTRODES | September 2018 | October 2020 | Allow | 25 | 1 | 1 | Yes | No |
| 16142565 | HIGH DENSITY NANOTUBES AND NANOTUBE DEVICES | September 2018 | April 2020 | Allow | 19 | 0 | 1 | No | No |
| 16142292 | SEMICONDUCTOR LIGHT EMITTING APPARATUS AND ULTRAVIOLET LIGHT EMITTING MODULE | September 2018 | October 2020 | Allow | 24 | 1 | 1 | No | No |
| 16142247 | PHOSPHOR CONVERTER STRUCTURES FOR THIN FILM PACKAGES AND METHOD OF MANUFACTURE | September 2018 | March 2021 | Allow | 29 | 2 | 1 | No | No |
| 16142309 | INSULATED-GATE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | September 2018 | February 2022 | Allow | 41 | 3 | 1 | No | No |
| 16142432 | INTEGRATED CIRCUITS WITH EMBEDDED MEMORY STRUCTURES AND METHODS FOR FABRICATING THE SAME | September 2018 | October 2021 | Allow | 36 | 2 | 1 | Yes | No |
| 16142404 | HIGH SPEED BUFFER CIRCUIT | September 2018 | November 2022 | Allow | 50 | 5 | 1 | Yes | No |
| 16087276 | METHOD AND TEST SYSTEM FOR PROVIDING ACCURATE ANALOG SIGNALS | September 2018 | June 2020 | Allow | 21 | 1 | 1 | No | No |
| 16136999 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, SUBSTRATE PROCESSING APPARATUS AND RECORDING MEDIUM | September 2018 | September 2020 | Allow | 24 | 1 | 1 | No | No |
| 16128653 | TRANSPORT PACKAGING AND METHOD FOR EXPANDED WAFERS | September 2018 | June 2020 | Allow | 21 | 0 | 1 | Yes | No |
| 16127376 | BONDING APPARATUS AND METHOD FOR USING THE SAME | September 2018 | October 2020 | Allow | 25 | 1 | 1 | No | No |
| 16127443 | ETCHING METHOD AND METHODS OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAME | September 2018 | May 2021 | Allow | 32 | 2 | 1 | No | No |
| 16126863 | SYSTEM AND METHOD FOR THERMALLY CALIBRATING SEMICONDUCTOR PROCESS CHAMBERS | September 2018 | April 2020 | Allow | 19 | 0 | 1 | No | No |
| 16126878 | Component Carrier With a Photoimageable Dielectric Layer and a Structured Conductive Layer Being Used as a Mask for Selectively Exposing the Photoimageable Dielectric Layer With Electromagnetic Radiation | September 2018 | September 2022 | Abandon | 49 | 4 | 1 | No | Yes |
| 16126677 | METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE | September 2018 | January 2021 | Abandon | 28 | 2 | 0 | No | No |
| 16126823 | MAGNETIC MEMORY DEVICE | September 2018 | November 2020 | Abandon | 27 | 1 | 1 | No | No |
| 16126850 | METHODS FOR MANUFACTURING A MOSFET | September 2018 | September 2020 | Allow | 24 | 2 | 1 | No | No |
| 16126877 | METHOD OF FORMING A SEMICONDUCTOR DEVICE | September 2018 | February 2021 | Allow | 29 | 2 | 1 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner BELOUSOV, ALEXANDER.
With a 100.0% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 33.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner BELOUSOV, ALEXANDER works in Art Unit 2894 and has examined 419 patent applications in our dataset. With an allowance rate of 73.0%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 31 months.
Examiner BELOUSOV, ALEXANDER's allowance rate of 73.0% places them in the 38% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.
On average, applications examined by BELOUSOV, ALEXANDER receive 1.99 office actions before reaching final disposition. This places the examiner in the 46% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by BELOUSOV, ALEXANDER is 31 months. This places the examiner in the 56% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +16.8% benefit to allowance rate for applications examined by BELOUSOV, ALEXANDER. This interview benefit is in the 57% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 29.9% of applications are subsequently allowed. This success rate is in the 60% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 14.7% of cases where such amendments are filed. This entry rate is in the 17% percentile among all examiners. Strategic Recommendation: This examiner rarely enters after-final amendments compared to other examiners. You should generally plan to file an RCE or appeal rather than relying on after-final amendment entry. Per MPEP § 714.12, primary examiners have discretion in entering after-final amendments, and this examiner exercises that discretion conservatively.
When applicants request a pre-appeal conference (PAC) with this examiner, 85.7% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 67% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 91.7% of appeals filed. This is in the 84% percentile among all examiners. Of these withdrawals, 54.5% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 33.3% are granted (fully or in part). This grant rate is in the 20% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 2.4% of allowed cases (in the 77% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.6% of allowed cases (in the 68% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.