Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18864780 | SUPER-SEMICONDUCTORS BASED ON NANOSTRUCTURED ARRAYS | November 2024 | February 2025 | Allow | 3 | 0 | 0 | No | No |
| 18846211 | MANUFACTURING METHOD FOR POWER SEMICONDUCTOR DEVICE USING LOW-ENERGY ELECTRON RADIATION TO PRODUCE SILICON-ENRICHED LAYER | September 2024 | June 2025 | Allow | 9 | 1 | 0 | No | No |
| 18631091 | SEMICONDUCTOR DEVICE AND FABRICATING METHOD THEREOF | April 2024 | April 2025 | Allow | 12 | 2 | 0 | No | No |
| 18624167 | SEMICONDUCTOR DEVICE WITH CONTACT PLUGS | April 2024 | August 2025 | Allow | 17 | 2 | 0 | Yes | No |
| 18622615 | SELF-ALIGNED GATE ENDCAP (SAGE) ARCHITECTURES WITH VERTICAL SIDEWALLS | March 2024 | October 2024 | Allow | 6 | 0 | 0 | No | No |
| 18609778 | LATERALLY-GATED TRANSISTORS AND LATERAL SCHOTTKY DIODES WITH INTEGRATED LATERAL FIELD PLATE STRUCTURES | March 2024 | January 2025 | Allow | 10 | 1 | 0 | No | No |
| 18601289 | DIAMOND-LIKE CARBON COATING FOR PASSIVE AND ACTIVE ELECTRONICS | March 2024 | June 2025 | Allow | 15 | 1 | 0 | No | No |
| 18582153 | LAYOUT TECHNIQUES AND OPTIMIZATION FOR POWER TRANSISTORS | February 2024 | March 2025 | Allow | 13 | 1 | 0 | No | No |
| 18409424 | SEMICONDUCTOR DEVICE HAVING BASE REGION BENEATH TRENCH GATE | January 2024 | December 2024 | Allow | 11 | 1 | 0 | No | No |
| 18395174 | MANUFACTURING METHOD OF AN ELEMENT OF AN ELECTRONIC DEVICE HAVING IMPROVED RELIABILITY, AND RELATED ELEMENT, ELECTRONIC DEVICE AND ELECTRONIC APPARATUS | December 2023 | November 2024 | Allow | 11 | 1 | 0 | Yes | No |
| 18527151 | SEMICONDUCTOR DEVICE HAVING METAL GATE AND POLY GATE | December 2023 | September 2024 | Allow | 10 | 1 | 0 | No | No |
| 18524417 | CONFORMAL TRANSFER DOPING METHOD FOR FIN-LIKE FIELD EFFECT TRANSISTOR | November 2023 | November 2024 | Allow | 11 | 1 | 0 | No | No |
| 18512506 | CHANNEL STOP AND WELL DOPANT MIGRATION CONTROL IMPLANT FOR REDUCED MOS THRESHOLD VOLTAGE MISMATCH | November 2023 | June 2025 | Allow | 19 | 2 | 1 | No | No |
| 18497427 | SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE | October 2023 | February 2026 | Allow | 27 | 0 | 0 | No | No |
| 18490965 | NITRIDE SEMICONDUCTOR DEVICE WITH ELEMENT ISOLATION AREA | October 2023 | August 2024 | Allow | 10 | 1 | 0 | No | No |
| 18474842 | SEMICONDUCTOR DEVICE COMPRISING CHANNEL LAYERS WITH DIFFERENT THICKNESSES | September 2023 | March 2025 | Allow | 18 | 2 | 0 | No | No |
| 18549016 | CAPACITOR COMPRISING A STACK OF LAYERS MADE OF A SEMICONDUCTOR MATERIAL HAVING A WIDE BANDGAP | September 2023 | February 2026 | Allow | 30 | 0 | 0 | No | No |
| 18458627 | SEMICONDUCTOR DEVICE | August 2023 | February 2026 | Allow | 29 | 0 | 0 | No | No |
| 18454147 | SILICON CARBIDE SEMICONDUCTOR DEVICE AND SILICON CARBIDE SEMICONDUCTOR SUBSTRATE | August 2023 | November 2025 | Allow | 26 | 0 | 0 | No | No |
| 18450211 | RADIO FREQUENCY DEVICE AND RADIO FREQUENCY FRONT-END APPARATUS | August 2023 | March 2026 | Allow | 31 | 1 | 0 | No | No |
| 18364011 | METHOD AND RELATED APPARATUS FOR INTEGRATING ELECTRONIC MEMORY IN AN INTEGRATED CHIP | August 2023 | February 2025 | Allow | 18 | 2 | 0 | No | No |
| 18358265 | SEMICONDUCTOR DEVICE | July 2023 | September 2025 | Allow | 26 | 0 | 0 | No | No |
| 18358442 | SILICON CARBIDE SEMICONDUCTOR DEVICE | July 2023 | October 2025 | Allow | 26 | 0 | 0 | No | No |
| 18357240 | FeRAM MFM STRUCTURE WITH SELECTIVE ELECTRODE ETCH | July 2023 | August 2024 | Allow | 12 | 1 | 0 | No | No |
| 18224185 | SEMICONDUCTOR DEVICE WITH PROGRAMMABLE INSULATING LAYER AND METHOD FOR FABRICATING THE SAME | July 2023 | January 2026 | Allow | 30 | 2 | 1 | No | No |
| 18353469 | HIGH ELECTRON MOBILITY TRANSISTOR DEVICE AND METHOD OF MAKING THE SAME | July 2023 | October 2025 | Allow | 27 | 0 | 0 | No | No |
| 18038652 | BIDIRECTIONAL THYRISTOR DEVICE | May 2023 | September 2025 | Allow | 28 | 0 | 0 | No | No |
| 18314394 | SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | May 2023 | October 2025 | Allow | 30 | 0 | 0 | No | No |
| 18295236 | POWER SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF | April 2023 | August 2025 | Allow | 29 | 1 | 0 | No | No |
| 18029990 | P-TYPE GATE HEMT DEVICE | April 2023 | January 2026 | Allow | 34 | 1 | 0 | No | No |
| 18191538 | SEMICONDUCTOR DEVICE WITH CONTACT PLUGS | March 2023 | January 2024 | Allow | 9 | 1 | 0 | No | No |
| 18185946 | HIGH ELECTRON MOBILITY TRANSISTOR AND HIGH ELECTRON MOBILITY TRANSISTOR FORMING METHOD | March 2023 | March 2026 | Abandon | 36 | 2 | 0 | No | No |
| 17598306 | P-CHANNEL ENHANCEMENT MODE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME | March 2023 | November 2025 | Allow | 50 | 1 | 0 | No | No |
| 18179739 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME | March 2023 | June 2025 | Allow | 27 | 0 | 0 | No | No |
| 18022988 | SELF-ALIGNING PROCESS METHOD AND SELF-ALIGNING PROCESS APPARATUS FOR REDUCING CRITICAL DIMENSION VARIATION OF SIC TRENCH GATE MOSFET STRUCTURE | February 2023 | January 2026 | Allow | 35 | 1 | 0 | No | No |
| 18042914 | A DIE SEAL RING INCLUDING A TWO DIMENSIONAL ELECTRON GAS REGION | February 2023 | December 2025 | Abandon | 34 | 1 | 0 | No | No |
| 18170477 | LOW-TEMPERATURE PROCESSING METHOD FOR IMPROVING 4H-SIC/SIO2 INTERFACE BASED ON SUPERCRITICAL OXYNITRIDE AND USE THEREOF | February 2023 | February 2026 | Allow | 36 | 1 | 0 | No | No |
| 18106768 | TRENCH JUNCTION FIELD EFFECT TRANSISTOR HAVING A MESA REGION | February 2023 | October 2025 | Allow | 32 | 1 | 0 | No | No |
| 18100144 | SILICON CARBIDE DEVICE WITH METALLIC INTERFACE LAYERS AND METHOD OF MANUFACTURING | January 2023 | December 2025 | Allow | 34 | 1 | 1 | No | No |
| 18004832 | TRANSISTOR | January 2023 | January 2026 | Allow | 36 | 1 | 0 | Yes | No |
| 18076679 | DISHING PREVENTION STRUCTURE EMBEDDED IN A GATE ELECTRODE | December 2022 | July 2024 | Allow | 19 | 2 | 0 | No | No |
| 18073361 | SINGLE SIDED CHANNEL MESA POWER JUNCTION FIELD EFFECT TRANSISTOR | December 2022 | November 2024 | Allow | 24 | 0 | 0 | No | No |
| 18056954 | SEMICONDUCTOR DEVICE INCLUDING OXIDE SEMICONDUCTOR LAYER | November 2022 | March 2024 | Allow | 16 | 1 | 0 | Yes | No |
| 17988720 | HEMT AND METHOD OF FABRICATING THE SAME | November 2022 | January 2024 | Allow | 14 | 1 | 0 | No | No |
| 18054568 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE | November 2022 | January 2025 | Allow | 26 | 0 | 0 | No | No |
| 17981138 | SiC EPITAXIAL WAFER, AND METHOD OF MANUFACTURING THE SAME | November 2022 | January 2025 | Allow | 26 | 2 | 0 | Yes | No |
| 18052424 | METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE | November 2022 | December 2024 | Allow | 25 | 0 | 0 | No | No |
| 17975356 | SINGLE SIDED CHANNEL MESA POWER JUNCTION FIELD EFFECT TRANSISTOR | October 2022 | September 2023 | Allow | 10 | 0 | 0 | No | No |
| 17974794 | DEVICE TOPOLOGIES FOR HIGH CURRENT LATERAL POWER SEMICONDUCTOR DEVICES | October 2022 | February 2024 | Allow | 16 | 1 | 0 | No | No |
| 17974880 | DEVICE TOPOLOGY FOR LATERAL POWER TRANSISTORS WITH LOW COMMON SOURCE INDUCTANCE | October 2022 | February 2024 | Allow | 16 | 1 | 0 | No | No |
| 18049778 | DISPLAY DEVICE INCLUDING TEST PART FOR TESTING THIN FILM LAYER | October 2022 | October 2025 | Allow | 35 | 1 | 0 | No | No |
| 17974130 | SEMICONDUCTOR DEVICE | October 2022 | October 2023 | Allow | 12 | 1 | 0 | No | No |
| 17965753 | RF Power Transistor Having Off-Axis Layout | October 2022 | March 2025 | Allow | 29 | 1 | 0 | No | No |
| 17918330 | SEMICONDUCTOR DEVICE HAVING A PLURALITY OF PILLARS AND METHOD OF MANUFACTURING THE SEMICONDUCTOR DEVICE | October 2022 | July 2025 | Allow | 33 | 2 | 0 | Yes | No |
| 17918117 | SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICE | October 2022 | March 2025 | Allow | 30 | 0 | 0 | No | No |
| 17954049 | SEMICONDUCTOR DEVICE WITH SiC SEMICONDUCTOR LAYER AND RAISED PORTION GROUP | September 2022 | July 2024 | Allow | 21 | 2 | 0 | No | No |
| 17951708 | Barrier Structure for Dispersion Reduction in Transistor Devices | September 2022 | February 2026 | Allow | 41 | 2 | 0 | No | No |
| 17945077 | MEMORY STRUCTURE | September 2022 | March 2026 | Abandon | 42 | 2 | 0 | No | No |
| 17939796 | SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THEREOF | September 2022 | July 2024 | Abandon | 22 | 2 | 0 | No | No |
| 17822970 | METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, INVERTER CIRCUIT, DRIVING DEVICE, VEHICLE, AND ELEVATOR | August 2022 | June 2025 | Allow | 34 | 0 | 1 | No | No |
| 17907870 | Voltage Current Conversion Device | August 2022 | December 2025 | Abandon | 39 | 1 | 0 | No | No |
| 17892809 | METHOD FOR MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICE AND SILICON CARBIDE SEMICONDUCTOR DEVICE | August 2022 | February 2026 | Abandon | 41 | 1 | 1 | No | No |
| 17886533 | SEMICONDUCTOR DEVICE AND METHOD OF PRODUCING THEREOF | August 2022 | December 2025 | Allow | 40 | 2 | 0 | No | No |
| 17885166 | INTEGRATED CIRCUIT STRUCTURE FOR LOW POWER SRAM | August 2022 | March 2024 | Allow | 19 | 2 | 0 | No | No |
| 17881736 | SILICON CARBIDE MOSFET DEVICE AND MANUFACTURING METHOD THEREOF | August 2022 | December 2025 | Allow | 40 | 1 | 1 | No | No |
| 17797224 | METAL-OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR DEVICE AND MANUFACTURING METHOD THEREFOR | August 2022 | April 2025 | Allow | 32 | 1 | 0 | No | No |
| 17815857 | Conformal Transfer Doping Method for Fin-Like Field Effect Transistor | July 2022 | September 2023 | Allow | 14 | 1 | 0 | No | No |
| 17874901 | SEMICONDUCTOR ELEMENT WITH RESISTIVE LAYERS HAVING DIFFERENT RESISTANCE VALUES | July 2022 | July 2025 | Allow | 35 | 1 | 0 | No | No |
| 17871659 | METHOD FOR SELECTIVELY FORMING HARD MASK | July 2022 | August 2025 | Allow | 37 | 1 | 0 | No | No |
| 17868806 | SEMICONDUCTOR DEVICE HAVING SEMICONDUCTOR COLUMN PORTIONS | July 2022 | January 2025 | Allow | 30 | 1 | 0 | No | No |
| 17792070 | MOS(METAL OXIDE SILICON) CONTROLLED THYRISTOR DEVICE | July 2022 | May 2023 | Allow | 10 | 0 | 0 | No | No |
| 17850643 | SEMICONDUCTOR DEVICE HAVING METAL GATE AND POLY GATE | June 2022 | September 2023 | Allow | 15 | 1 | 0 | No | No |
| 17848907 | METHODS OF FORMING OHMIC CONTACTS ON SEMICONDUCTOR DEVICES WITH TRENCH/MESA STRUCTURES | June 2022 | June 2025 | Allow | 36 | 1 | 1 | No | No |
| 17834527 | THREE-DIMENSIONAL SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAME | June 2022 | August 2025 | Allow | 38 | 1 | 1 | Yes | No |
| 17833415 | MEMORY DEVICE | June 2022 | January 2023 | Allow | 7 | 0 | 0 | No | No |
| 17832590 | Metal Gate Electrode Formation Of Memory Devices | June 2022 | November 2025 | Allow | 41 | 2 | 1 | Yes | No |
| 17781675 | SOLID-STATE IMAGING DEVICE AND ELECTRONIC APPARATUS | June 2022 | May 2025 | Allow | 35 | 1 | 0 | No | No |
| 17828327 | INTEGRATED CIRCUIT DEVICE INCLUDING INSULATING GUIDE FILM BETWEEN ADJACENT CONDUCTIVE PATTERNS | May 2022 | March 2025 | Allow | 33 | 1 | 0 | No | No |
| 17826174 | SEMICONDUCTOR DEVICE HAVING THIN BOTTOM CHANNEL AND MANUFACTURING METHOD THEREOF | May 2022 | March 2025 | Allow | 34 | 1 | 1 | No | No |
| 17827409 | SEAL RING PATTERNS | May 2022 | February 2025 | Allow | 33 | 2 | 0 | Yes | No |
| 17827107 | SEMICONDUCTOR MEMORY DEVICE | May 2022 | October 2023 | Abandon | 16 | 1 | 0 | No | No |
| 17804290 | LIGHT EMITTING DEVICE | May 2022 | March 2025 | Allow | 34 | 1 | 0 | No | No |
| 17752080 | SEMICONDUCTOR DEVICE STRUCTURE WITH SPACER | May 2022 | March 2024 | Allow | 22 | 2 | 0 | No | No |
| 17750481 | SEMICONDUCTOR DEVICE INCLUDING DUMMY PATTERNS AND PERIPHERAL INTERCONNECTION PATTERNS AT THE SAME LEVEL | May 2022 | July 2023 | Allow | 13 | 1 | 0 | No | No |
| 17750935 | SEMICONDUCTOR PHOTODETECTOR, RECEIVER, AND INTEGRATED OPTICAL DEVICE | May 2022 | April 2025 | Allow | 35 | 2 | 0 | No | No |
| 17750876 | ISOLATION STRUCTURE FOR TRANSISTORS | May 2022 | September 2025 | Allow | 40 | 2 | 1 | No | No |
| 17745423 | SEMICONDUCTOR DEVICE INCLUDING DIFFERENT GATE DIELECTRIC LAYERS AND METHOD FOR MANUFACTURING THE SAME | May 2022 | August 2025 | Allow | 39 | 3 | 1 | Yes | No |
| 17743033 | SEMICONDUCTOR DEVICE ON WIRING BOARD HAVING REFERENCE POTENTIAL PLANES WITH OPENINGS | May 2022 | December 2024 | Allow | 31 | 1 | 0 | No | No |
| 17741649 | MULTI-DEVICE GRADED EMBEDDING PACKAGE SUBSTRATE AND MANUFACTURING METHOD THEREOF | May 2022 | December 2024 | Allow | 31 | 0 | 1 | No | No |
| 17739871 | MEMORY DEVICE AND METHOD FOR FORMING THE SAME | May 2022 | December 2025 | Allow | 43 | 3 | 1 | No | No |
| 17662284 | SPACER STRUCTURES FOR SEMICONDUCTOR DEVICES | May 2022 | August 2025 | Allow | 39 | 2 | 1 | Yes | No |
| 17729777 | MOSFET TRANSISTORS WITH HYBRID CONTACT | April 2022 | February 2023 | Allow | 10 | 1 | 0 | No | No |
| 17723701 | FACILITATING FORMATION OF A VIA IN A SUBSTRATE | April 2022 | December 2024 | Allow | 32 | 1 | 0 | No | No |
| 17721109 | METHOD OF SINGULATING A SEMICONDUCTOR DEVICE | April 2022 | August 2025 | Allow | 40 | 2 | 1 | No | No |
| 17768796 | DISPLAY DEVICE | April 2022 | August 2024 | Allow | 29 | 0 | 0 | No | No |
| 17719403 | SILICON CARBIDE SEMICONDUCTOR POWER TRANSISTOR AND METHOD OF MANUFACTURING THE SAME | April 2022 | January 2025 | Abandon | 33 | 1 | 1 | No | No |
| 17657894 | GUARD REGION FOR AN INTEGRATED CIRCUIT | April 2022 | September 2024 | Allow | 30 | 0 | 0 | No | No |
| 17763558 | NITRIDE SEMICONDUCTOR DEVICE | March 2022 | April 2024 | Allow | 25 | 0 | 0 | No | No |
| 17701771 | CHIP SEPARATION SUPPORTED BY BACK SIDE TRENCH AND ADHESIVE THEREIN | March 2022 | May 2025 | Allow | 38 | 2 | 1 | No | No |
| 17762939 | DISPLAY PANELS, DISPLAY APPARATUSES AND METHODS OF MANUFACTURING DISPLAY PANELS | March 2022 | August 2025 | Abandon | 41 | 2 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner WARD, ERIC A.
With a 20.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 35.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner WARD, ERIC A works in Art Unit 2891 and has examined 766 patent applications in our dataset. With an allowance rate of 75.6%, this examiner has a below-average tendency to allow applications. Applications typically reach final disposition in approximately 26 months.
Examiner WARD, ERIC A's allowance rate of 75.6% places them in the 41% percentile among all USPTO examiners. This examiner has a below-average tendency to allow applications.
On average, applications examined by WARD, ERIC A receive 2.21 office actions before reaching final disposition. This places the examiner in the 61% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.
The median time to disposition (half-life) for applications examined by WARD, ERIC A is 26 months. This places the examiner in the 77% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +12.2% benefit to allowance rate for applications examined by WARD, ERIC A. This interview benefit is in the 48% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.
When applicants file an RCE with this examiner, 22.6% of applications are subsequently allowed. This success rate is in the 29% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.
This examiner enters after-final amendments leading to allowance in 34.6% of cases where such amendments are filed. This entry rate is in the 52% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 50.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 45% percentile among all examiners. Note: Pre-appeal conferences show below-average success with this examiner. Consider whether your arguments are strong enough to warrant a PAC request.
This examiner withdraws rejections or reopens prosecution in 64.3% of appeals filed. This is in the 44% percentile among all examiners. Of these withdrawals, 44.4% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 51.0% are granted (fully or in part). This grant rate is in the 50% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 1.4% of allowed cases (in the 71% percentile). This examiner makes examiner's amendments more often than average to place applications in condition for allowance (MPEP § 1302.04).
Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.0% of allowed cases (in the 61% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.