USPTO Examiner ANYA IGWE U - Art Unit 2891

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18869453TRENCH GATE POWER MOSFET AND MANUFACTURING METHOD THEREFORNovember 2024March 2025Allow400NoNo
18893715SEMICONDUCTOR DEVICESeptember 2024January 2025Allow410NoNo
18830089SEMICONDUCTOR DEVICESeptember 2024August 2025Allow1100NoNo
18827272VERTICAL POWER SEMICONDUCTOR DEVICE INCLUDING SILICON CARBIDE (SIC) SEMICONDUCTOR BODYSeptember 2024December 2024Allow400NoNo
18788160HIGH ELECTRON MOBILITY TRANSISTOR AND METHOD FOR FABRICATING THE SAMEJuly 2024December 2025Allow1610NoNo
18723764POWER SEMICONDUCTOR DEVICE AND MANUFACTURIING METHODJune 2024September 2024Allow200NoNo
18746913DISPLAY APPARATUSJune 2024June 2025Allow1210NoNo
18741602DISPLAY PANEL AND DISPLAY DEVICE INCLUDING DISPLAY PANELJune 2024February 2025Allow900NoNo
18640126METHODS AND STRUCTURES FOR CONTACTING SHIELD CONDUCTOR IN A SEMICONDUCTOR DEVICEApril 2024June 2025Allow1310NoNo
18699821SEMICONDUCTOR DEVICEApril 2024August 2024Allow400NoNo
18622003SOLID-STATE IMAGING ELEMENT AND IMAGING APPARATUSMarch 2024February 2025Allow1110NoNo
18615936NOVEL RESISTIVE RANDOM ACCESS MEMORY DEVICEMarch 2024April 2025Allow1310NoNo
18609645SEMICONDUCTOR DEVICEMarch 2024September 2024Allow600NoNo
18607571SEMICONDUCTOR PACKAGE AND MANUFACTURING METHOD OF SEMICONDUCTOR PACKAGEMarch 2024January 2025Allow1010NoNo
18605438SEMICONDUCTOR DEVICE INCLUDING TRENCH GATE STRUCTURE AND BURIED SHIELDING REGION AND METHOD OF MANUFACTURINGMarch 2024January 2025Allow1010NoNo
18603723POWER SEMICONDUCTOR DEVICE AND METHOD OF FABRICATING THE SAMEMarch 2024October 2024Allow700NoNo
18599205SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICEMarch 2024March 2025Allow1210NoNo
18599051ORGANIC LIGHT EMITTING DIODE AND ORGANIC LIGHT EMITTING DEVICE INCLUDING THE SAMEMarch 2024January 2025Allow1010NoNo
18588783SEMICONDUCTOR DEVICE HAVING WORK FUNCTION METAL STACKFebruary 2024February 2025Allow1210NoNo
18432812SEMICONDUCTOR DEVICEFebruary 2024December 2024Allow1010NoNo
18580161Trench SiC MOSFET Integrated with High-speed Flyback Diode and Preparation Method ThereofJanuary 2024July 2024Allow500NoNo
18398823SILICON CARBIDE DEVICE WITH A STRIPE-SHAPED TRENCH GATE STRUCTUREDecember 2023November 2024Allow1110NoNo
18395756SEMICONDUCTOR DEVICE AND PRODUCTION METHODDecember 2023October 2024Allow1010NoNo
18394688SEMICONDUCTOR DEVICEDecember 2023April 2024Allow410NoNo
18394110DISPLAY DEVICEDecember 2023November 2024Allow1110NoNo
18519831DISPLAY PANEL AND DISPLAY DEVICENovember 2023October 2024Allow1110NoNo
18517260CIRCUIT TEST STRUCTURE AND METHOD OF USINGNovember 2023October 2024Allow1110NoNo
18502113LIGHTING DEVICENovember 2023December 2024Allow1311NoNo
18497588POWER SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOFOctober 2023January 2024Allow300NoNo
18495068RADIATION-EMITTING SEMICONDUCTOR COMPONENT AND METHOD FOR PRODUCING RADIATION-EMITTING SEMICONDUCTOR COMPONENTOctober 2023August 2024Allow910NoNo
18489972SEMICONDUCTOR DEVICE STRUCTURE WITH METAL GATE STACKSOctober 2023August 2024Allow910NoNo
18377872Method For Making Electronic Device Arrays Using A Temporary SubstrateOctober 2023September 2024Allow1110NoNo
18483047AN ELECTROSTATIC DISCHARGE, ESD, PROTECTION SEMICONDUCTOR DEVICE FOR PROVIDING ESD PROTECTION BETWEEN A FIRST AND A SECOND TERMINAL OF ANOTHER SEMICONDUCTOR DEVICE, AS WELL AS A CORRESPONDING METAL OXIDE SEMICONDUCTOR, MOS, FIELD EFFECT TRANSISTOR, FET, AND A RELATED METHODOctober 2023January 2026Allow2700NoNo
18554141SEMICONDUCTOR DEVICEOctober 2023April 2024Allow700NoNo
18481061SOLID-STATE IMAGING ELEMENT AND IMAGING DEVICEOctober 2023March 2025Abandon1720NoNo
18284781CIRCUIT BOARD, DISPLAY APPARATUS, AND METHOD FOR MANUFACTURING CIRCUIT BOARDSeptember 2023January 2026Allow2800NoNo
18477536SEMICONDUCTOR STRUCTURE AND METHOD OF FORMING THE SAMESeptember 2023November 2024Allow1410NoNo
18472259SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MODULESeptember 2023April 2024Allow700NoNo
18466227SEMICONDUCTOR SWITCHING DEVICESeptember 2023March 2025Allow1840YesNo
18242518LIGHT EMITTING DEVICE PACKAGE AND APPLICATION THEREOFSeptember 2023January 2025Allow1720NoNo
18453482SEMICONDUCTOR MODULEAugust 2023October 2025Allow2600NoNo
18234344SEMICONDUCTOR DEVICEAugust 2023October 2025Allow2600NoNo
18232332SYSTEMS AND METHODS FOR SHIELDED INDUCTIVE DEVICESAugust 2023December 2024Allow1620NoNo
18366562Dual Channel Gate All Around Transistor Device and Fabrication Methods ThereofAugust 2023September 2024Allow1310NoNo
18363214SEMICONDUCTOR DEVICE, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, INVERTER CIRCUIT, DRIVE DEVICE, VEHICLE, AND ELEVATORAugust 2023August 2024Allow1310NoNo
18362805THREE-DIMENSIONAL MEMORY DEVICE WITH LATERALLY SEPARATED SOURCE SELECT ELECTRODES AND METHODS OF FORMING THE SAMEJuly 2023October 2025Allow2700NoNo
18355728SOLID-STATE IMAGING ELEMENT AND IMAGING APPARATUSJuly 2023July 2024Allow1210NoNo
18353909PACKAGE STRUCTURE AND METHOD FOR FABRICATING THE SAMEJuly 2023September 2024Allow1410NoNo
18353758SEMICONDUCTOR DEVICEJuly 2023October 2025Allow2700NoNo
18353250SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEJuly 2023October 2025Allow2700NoNo
18351985Dielectric Gap-Filling Process for Semiconductor DeviceJuly 2023September 2024Allow1410NoNo
18347141SEMICONDUCTOR DEVICEJuly 2023March 2026Allow3210NoNo
18342372SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SILICON CARBIDE SEMICONDUCTOR DEVICEJune 2023September 2025Allow2700NoNo
18212906Semiconductor Device Including First Gate Electrode and Second Gate ElectrodeJune 2023November 2024Allow1720NoNo
18336707SEMICONDUCTOR DEVICE WITH ESD PROTECTION STRUCTURE AND METHOD OF MAKING SAMEJune 2023September 2025Allow2700NoNo
18334284SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND POWER CONVERSION DEVICEJune 2023February 2026Allow3200NoNo
18257038SEMICONDUCTOR DEVICEJune 2023October 2025Allow2800NoNo
18331436SEMICONDUCTOR DEVICE STRUCTURE AND METHOD FOR FORMING THE SAMEJune 2023August 2025Allow2600NoNo
18326109SiC SINGLE CRYSTAL SUBSTRATEMay 2023October 2024Allow1620NoNo
182038048-INCH SiC SINGLE CRYSTAL SUBSTRATEMay 2023August 2023Allow300NoNo
18311401IMAGE SENSOR AND METHOD OF MANUFACTURING THE IMAGE SENSORMay 2023February 2026Allow3410NoNo
18138870DISPLAY APPARATUSApril 2023March 2024Allow1100NoNo
18306168SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOFApril 2023September 2024Allow1610NoNo
18302773SEMICONDUCTOR DEVICEApril 2023August 2025Allow2800NoNo
18249282SEMICONDUCTOR DEVICEApril 2023August 2025Allow2800NoNo
18301899SEMICONDUCTOR DEVICEApril 2023April 2024Allow1210NoNo
18299372Trench Type Silicon Carbide MOSFET Structure and Preparation Method ThereofApril 2023October 2025Allow3000NoNo
18248344SEMICONDUCTOR DEVICEApril 2023July 2023Allow300NoNo
18192683POWER MOSFET AND MANUFACTURING METHOD THEREOFMarch 2023November 2025Allow3200NoNo
18125779POWER SEMICONDUCTOR DEVICES INCLUDING A TRENCHED GATE AND METHODS OF FORMING SUCH DEVICESMarch 2023December 2024Allow2140NoNo
18187852SEMICONDUCTOR CELL STRUCTURE, IGBT CELL STRUCTURE, SEMICONDUCTOR STRUCTURE, AND METHOD FOR MANUFACTURING IGBT CELL STRUCTUREMarch 2023June 2025Allow2700NoNo
18188452SEMICONDUCTOR DEVICEMarch 2023June 2025Allow2700NoNo
18027212DISPLAY SUBSTRATE, METHOD FOR REPAIRING SAME, METHOD FOR PREPARING SAME, AND DISPLAY DEVICEMarch 2023June 2025Allow2700NoNo
18122726SEMICONDUCTOR DEVICE AND FABRICATION METHOD THEREOFMarch 2023July 2025Allow2800NoNo
18183903SEMICONDUCTOR DEVICESMarch 2023June 2025Allow2700NoNo
18179294SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICEMarch 2023March 2026Allow3600NoNo
18177883SEMICONDUCTOR DEVICE, INVERTER CIRCUIT, DRIVING DEVICE, VEHICLE, AND ELEVATORMarch 2023June 2025Allow2800NoNo
18177478MANUFACTURING METHOD OF SEMICONDUCTOR DEVICEMarch 2023October 2025Allow3210NoNo
18176547SUPER-JUNCTION DEVICEMarch 2023November 2025Allow3310NoNo
18023752SEMICONDUCTOR DEVICE FOR REDUCING SWITCHING LOSS AND MANUFACTURING METHOD THEREOFFebruary 2023September 2023Allow700NoNo
18175196SEMICONDUCTOR DEVICEFebruary 2023June 2023Allow300NoNo
18172498SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAMEFebruary 2023June 2025Allow2700NoNo
18172348SEMICONDUCTOR DEVICEFebruary 2023June 2025Allow2800NoNo
18171927SOLID-STATE IMAGING ELEMENT AND IMAGING DEVICEFebruary 2023July 2023Allow400NoNo
18109933GATE TRENCH POWER SEMICONDUCTOR DEVICES HAVING IMPROVED DEEP SHIELD CONNECTION PATTERNSFebruary 2023August 2023Allow600NoNo
18164426SEMICONDUCTOR DEVICEFebruary 2023May 2025Allow2800NoNo
18158192Method of Implanting Dopants into a Group III-Nitride Structure and Device FormedJanuary 2023January 2024Allow1210NoNo
18155520SILICON CARBIDE SEMICONDUCTOR DEVICEJanuary 2023May 2025Allow2800NoNo
18152881METAL OXIDE SEMICONDUCTOR FIELD EFFECT TRANSISTOR AND METHOD OF MANUFACTURINGJanuary 2023March 2026Allow3810NoNo
18150611FEEDER DESIGN WITH HIGH CURRENT CAPABILITYJanuary 2023August 2023Allow810NoNo
18091425SEMICONDUCTOR DEVICEDecember 2022September 2025Allow3210NoNo
18147046SEMICONDUCTOR DEVICEDecember 2022August 2025Allow3210YesNo
18089234POWER SEMICONDUCTOR DEVICE, POWER SEMICONDUCTOR CHIP INCLUDING THE SAME, AND METHOD FOR MANUFACTURING THE SAMEDecember 2022May 2025Allow2900NoNo
18146669SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICEDecember 2022July 2023Allow710NoNo
18087054SOLID-STATE IMAGING ELEMENT AND IMAGING APPARATUSDecember 2022April 2023Allow400NoNo
18066203SEMICONDUCTOR DEVICE HAVING WORK FUNCTION METAL STACKDecember 2022November 2023Allow1110NoNo
18076400SEMICONDUCTOR DEVICEDecember 2022August 2025Allow3210NoNo
18062862SEMICONDUCTOR APPARATUSDecember 2022August 2025Allow3210NoNo
18008448SILICON CARBIDE SEMICONDUCTOR DEVICE AND POWER CONVERTERDecember 2022September 2025Allow3410NoNo
18073860METHOD OF PRODUCING A SILICON CARBIDE DEVICE WITH A TRENCH GATEDecember 2022September 2023Allow1010NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner ANYA, IGWE U.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
9
Examiner Affirmed
7
(77.8%)
Examiner Reversed
2
(22.2%)
Reversal Percentile
35.5%
Lower than average

What This Means

With a 22.2% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.

Strategic Value of Filing an Appeal

Total Appeal Filings
43
Allowed After Appeal Filing
13
(30.2%)
Not Allowed After Appeal Filing
30
(69.8%)
Filing Benefit Percentile
45.9%
Lower than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 30.2% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is below the USPTO average, suggesting that filing an appeal has limited effectiveness in prompting favorable reconsideration.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.

Examiner ANYA, IGWE U - Prosecution Strategy Guide

Executive Summary

Examiner ANYA, IGWE U works in Art Unit 2891 and has examined 1,230 patent applications in our dataset. With an allowance rate of 86.5%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 24 months.

Allowance Patterns

Examiner ANYA, IGWE U's allowance rate of 86.5% places them in the 65% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by ANYA, IGWE U receive 1.59 office actions before reaching final disposition. This places the examiner in the 30% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by ANYA, IGWE U is 24 months. This places the examiner in the 84% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a -9.3% benefit to allowance rate for applications examined by ANYA, IGWE U. This interview benefit is in the 3% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 31.2% of applications are subsequently allowed. This success rate is in the 63% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 48.4% of cases where such amendments are filed. This entry rate is in the 73% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 180.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 92% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 75.0% of appeals filed. This is in the 65% percentile among all examiners. Of these withdrawals, 40.7% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows above-average willingness to reconsider rejections during appeals. The mandatory appeal conference (MPEP § 1207.01) provides an opportunity for reconsideration.

Petition Practice

When applicants file petitions regarding this examiner's actions, 37.7% are granted (fully or in part). This grant rate is in the 26% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 5.6% of allowed cases (in the 87% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 1.1% of allowed cases (in the 62% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.