Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18594464 | DEFORMATION ANALYSIS DEVICE AND METHOD FOR SECONDARY BATTERY | March 2024 | January 2026 | Allow | 23 | 0 | 0 | No | No |
| 18396032 | FIELD EMISSION X-RAY SOURCE DEVICE | December 2023 | March 2026 | Allow | 26 | 1 | 0 | No | No |
| 18288341 | METHOD AND SYSTEM FOR RECONSTRUCTING A 3D MEDICAL IMAGE | October 2023 | September 2025 | Allow | 23 | 0 | 0 | No | No |
| 18553309 | RAPID X-RAY RADIATION IMAGING SYSTEM AND RELATED METHOD | September 2023 | March 2026 | Allow | 29 | 1 | 0 | Yes | No |
| 18284026 | RADIOGRAPHIC INSPECTION DEVICE AND METHOD OF INSPECTING OBJECT | September 2023 | February 2026 | Allow | 29 | 1 | 0 | No | No |
| 18283011 | RADIATION MEASUREMENT APPARATUS | September 2023 | August 2025 | Abandon | 23 | 1 | 0 | Yes | No |
| 18454971 | FLOATING CRADLE PATIENT TABLE WITH MULTI-MODALITY IMAGING CAPABILITY | August 2023 | October 2025 | Allow | 25 | 1 | 0 | Yes | No |
| 18358572 | 2D POLYMER BASED TARGETS FOR SERIAL X-RAY CRYSTALLOGRAPHY | July 2023 | December 2025 | Allow | 28 | 1 | 1 | No | No |
| 18259662 | Low-Profile X-Ray Scanning Source with Ring Collimator | June 2023 | August 2025 | Abandon | 26 | 1 | 0 | No | No |
| 18341606 | XPS SAMPLE HOLDER, APPARATUS FOR X-RAY PHOTOELECTRON SPECTROSCOPY INCLUDING THE SAME AND METHOD FOR X-RAY PHOTOELECTRON SPECTROSCOPY USING THE SAME | June 2023 | May 2025 | Allow | 23 | 0 | 0 | No | No |
| 18211372 | Sample Container and Measuring Method | June 2023 | August 2025 | Allow | 26 | 2 | 0 | No | No |
| 18322044 | METHOD FOR MANUFACTURING A RADIATION WINDOW WITH AN EDGE STRENGTHENING STRUCTURE AND A RADIATION WINDOW WITH AN EDGE STRENGTHENING STRUCTURE | May 2023 | February 2026 | Abandon | 32 | 1 | 1 | No | No |
| 18318889 | Systems and a Method of Improved Material Classification Using Energy-Integrated Backscatter Detectors | May 2023 | August 2025 | Allow | 27 | 0 | 0 | No | No |
| 18137910 | X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS | April 2023 | January 2026 | Allow | 33 | 2 | 0 | No | No |
| 18299028 | SCANNING METHOD AND APPARATUS, STORAGE MEDIUM, AND COMPUTER DEVICE | April 2023 | July 2025 | Allow | 27 | 1 | 0 | No | No |
| 18187113 | RADIATION IMAGING SYSTEM, RADIATION IMAGING APPARATUS, CONTROL METHOD, AND STORAGE MEDIUM | March 2023 | January 2026 | Abandon | 34 | 1 | 0 | No | No |
| 18026668 | LINE-OF-SIGHT DETECTOR AND COMMUNICATION SYSTEM IN SUB-THZ AND THZ RANGES | March 2023 | September 2025 | Allow | 30 | 1 | 0 | No | No |
| 18122191 | PARALLEL PLATE X-RAY COLLIMATOR HAVING A VARIABLE ACCEPTANCE ANGLE AND AN X-RAY ANALYSIS APPARATUS | March 2023 | September 2025 | Allow | 30 | 2 | 0 | No | No |
| 18024301 | SPECTRAL X-RAY MATERIAL DECOMPOSITION METHOD | March 2023 | January 2026 | Allow | 34 | 1 | 0 | No | No |
| 18175833 | X-RAY INSPECTION APPARATUS AND METHOD | February 2023 | February 2026 | Abandon | 36 | 2 | 0 | No | No |
| 18021498 | DYNAMIC INTENSITY MODULATION METHOD AND APPARATUS BASED ON ORTHOGONAL DOUBLE-LAYER GRATING ROTARY SWEEPING | February 2023 | October 2025 | Abandon | 32 | 2 | 0 | No | No |
| 18018065 | METHODS AND PATTERNING DEVICES AND APPARATUSES FOR MEASURING FOCUS PERFORMANCE OF A LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD | January 2023 | March 2025 | Allow | 25 | 1 | 0 | Yes | No |
| 18099668 | GRADIENT OPTIMIZED RADIAL TREATMENT (GORT) | January 2023 | September 2025 | Allow | 32 | 1 | 1 | Yes | No |
| 18011617 | SYSTEMS AND METHODS FOR REAL-TIME CONFIGURABLE BACKSCATTER SCANNERS | December 2022 | February 2025 | Allow | 26 | 1 | 0 | No | No |
| 18078930 | SAMPLE HOLDER FOR X-RAY DIFFRACTION ANALYSIS AND X-RAY DIFFRACTION ANALYSIS METHOD USING THE SAME | December 2022 | April 2025 | Allow | 28 | 1 | 0 | No | No |
| 18008747 | CABLE INSPECTION DEVICE AND CABLE INSPECTION METHOD | December 2022 | February 2025 | Allow | 27 | 1 | 0 | Yes | No |
| 18055538 | PRODUCTION OF ADDITIVELY MANUFACTURED PARTS IN BATCHES ADAPTED FOR EFFICIENT METROLOGY | November 2022 | June 2025 | Allow | 31 | 2 | 0 | No | No |
| 17881860 | COMPUTER-IMPLEMENTED METHOD FOR PROVIDING AN OUTLINE OF A LESION IN DIGITAL BREAST TOMOSYNTHESIS | August 2022 | March 2025 | Allow | 31 | 1 | 0 | No | No |
| 17881416 | IRRADIATION DEVICES, SYSTEMS AND METHODS | August 2022 | January 2025 | Allow | 29 | 1 | 0 | No | No |
| 17881593 | SETUP FOR SCOUT SCANS IN A RADIATION THERAPY SYSTEM | August 2022 | November 2025 | Allow | 40 | 3 | 0 | No | No |
| 17881592 | SETUP FOR TREATMENT PLANNING SCANS IN A RADIATION THERAPY SYSTEM | August 2022 | January 2026 | Allow | 42 | 3 | 0 | No | No |
| 17876807 | METHOD TO DETERMINE A PATIENT DOSE DISTRIBUTION AND CORRESPONDING RADIATION DOSIMETRY APPARATUS | July 2022 | October 2025 | Allow | 38 | 3 | 1 | No | No |
| 17873713 | PORTABLE MODULAR UNIT FOR INSPECTING IN A TIMEPIECE THE PRESENCE OF A LUBRICATING AGENT OR OF AN EPILAME | July 2022 | March 2025 | Allow | 32 | 3 | 0 | Yes | No |
| 17868919 | SILICON PHOTONIC SMOKE DETECTOR | July 2022 | August 2025 | Abandon | 37 | 2 | 1 | No | No |
| 17833936 | IDENTIFICATION METHOD OF PLASTIC MICROPARTICLES | June 2022 | November 2024 | Allow | 29 | 3 | 0 | No | No |
| 17834496 | SYSTEM AND METHODS OF CHARGED PARTICLE DETECTORS FOR BLAST FURNACE IMAGING | June 2022 | January 2025 | Allow | 32 | 2 | 1 | Yes | No |
| 17346537 | METHOD AND MECHANICAL DESIGN OF A FLEXURE INTERFACE FOR ULTRA-HIGH-VACUUM NANOPOSITIONING INVAR BASE NEAR-ZERO-LENGTH FEEDTHROUGH | June 2021 | April 2025 | Allow | 46 | 0 | 0 | No | No |
No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.
Examiner DOWNING, SAVANNAH STARR works in Art Unit 2884 and has examined 1 patent applications in our dataset. With an allowance rate of 100.0%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 46 months.
Examiner DOWNING, SAVANNAH STARR's allowance rate of 100.0% places them in the 97% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by DOWNING, SAVANNAH STARR receive 0.00 office actions before reaching final disposition. This places the examiner in the 0% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by DOWNING, SAVANNAH STARR is 46 months. This places the examiner in the 11% percentile for prosecution speed. Applications take longer to reach final disposition with this examiner compared to most others.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 27% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 33% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.