USPTO Examiner VANORE DAVID A - Art Unit 2878

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18292897MASS SPECTROMETERJanuary 2024March 2026Allow2500NoNo
18569038ELECTROMAGNETIC PUMPDecember 2023February 2026Allow2700NoNo
18557170A BROADBAND MICROWAVE WINDOW ASSEMBLYOctober 2023February 2026Allow2700NoNo
18556743SYSTEMS AND METHODS FOR ASSEMBLING ELECTRON SPIN AND CHARGE TO POSSESS PROPERTIES OF A MAGNETIC MONOPOLEOctober 2023March 2026Allow2800NoNo
18488617MULTI-BEAM PARTICLE BEAM SYSTEMOctober 2023February 2026Allow2800NoNo
18481792LUMINESCENCE METHOD FOR THE IN-LINE DETECTION OF ATOMIC SCALE DEFECTS DURING FABRICATION OF 4H-SIC DIODESOctober 2023February 2026Allow2910NoNo
18478966ABERRATION CORRECTION SYSTEMS AND CHARGED PARTICLE MICROSCOPE SYSTEMS INCLUDING THE SAMESeptember 2023January 2026Allow2800NoNo
18372361PROXIMITY-ELECTRODE, CHARGED PARTICLE BEAM DEVICE AND METHOD FOR INSPECTING AND/OR IMAGING A SAMPLESeptember 2023March 2026Allow3010NoNo
18367916DATA PROCESSING DEVICE FOR CHROMATOGRAPH, DATA PROCESSING METHOD, AND CHROMATOGRAPHSeptember 2023November 2025Allow2630YesNo
18465699PARTICLE BEAM THERAPY DEVICESeptember 2023February 2026Allow2910NoNo
18281437ELECTRON MICROSCOPE, DEVICE FOR MEASURING ELECTRON-PHOTON CORRELATION, AND METHOD FOR MEASURING ELECTRON-PHOTON CORRELATIONSeptember 2023February 2026Allow3010YesNo
18456048SHIELDED DETECTOR FOR CHARGED PARTICLE MICROSCOPYAugust 2023January 2026Allow2910NoNo
18220549Creating Ion Energy Distribution Functions (IEDF)July 2023September 2025Allow2600NoNo
18257736DUAL-USE READ-OUT CIRCUITRY IN CHARGED PARTICLE DETECTION SYSTEMJune 2023February 2026Allow3210NoNo
18332969CHARGED PARTICLE BEAM DEVICES AND MEMBRANE ASSEMBLIES USEFUL THEREINJune 2023March 2026Allow3310NoNo
18121755APPARATUS FOR ANALYZING AND/OR PROCESSING A SAMPLE WITH A PARTICLE BEAM AND METHODMarch 2023December 2025Allow3310NoNo
18014975MATERIAL ANALYSIS WITH MULTIPLE DETECTORSJanuary 2023December 2025Allow3510NoNo
18088499ALIGNMENT DETERMINATION METHOD AND COMPUTER PROGRAMDecember 2022February 2026Allow3820NoNo
18078828SYSTEM AND METHOD FOR MULTI-BEAM ELECTRON MICROSCOPY USING A DETECTOR ARRAYDecember 2022December 2025Allow3610NoNo
17917973Transfer Device and Analysis SystemOctober 2022December 2025Allow3820NoNo
17958838PARTICLE BEAM SYSTEMOctober 2022December 2025Allow3930YesNo
17949586DETECTION AND IDENTIFICATION OF CHEMICAL DERIVATIVES FORMED FROM PYROTECHNIC SMOKE REACTIONSSeptember 2022November 2025Allow3820YesNo
17208311Payment Terminal Sanitizing DeviceMarch 2021May 2021Allow210NoNo
17192690ORAL DEVICE CONTAINER AND ORAL DEVICE SANITATION SYSTEMMarch 2021April 2021Allow200NoNo
17170208CHARGED PARTICLE IRRADIATION APPARATUSFebruary 2021April 2021Allow200NoNo
16755332MACHINE FOR CHEMICAL ANALYSIS COMPRISING THE COMBINATION OF ELECTRON IONIZATION MASS SPECTROMETRY WITH LIQUID CHROMATOGRAPHYApril 2020April 2021Allow1200NoNo
16715327MEDICAL DEVICE DISINFECTING SYSTEM AND METHODDecember 2019July 2020Allow720NoNo
16583229SCANNING PROBE HAVING MICRO-TIP, METHOD AND APPARATUS FOR MANUFACTURING THE SAMESeptember 2019July 2021Allow2111NoNo
16497738HOLOGRAPHY RECONSTRUCTION METHOD AND PROGRAMSeptember 2019February 2021Allow1610NoNo
16401024APPARATUS FOR COMBINED STEM AND EDS TOMOGRAPHYMay 2019September 2020Allow1610NoNo
16390456METHOD AND APPARATUS FOR STERILIZING A SURFACEApril 2019September 2019Allow510NoNo
16343192METHOD OF DETERMINING PRESENCE OF ISOTOPESApril 2019December 2019Allow800YesNo
16338785ELECTRON BEAM IRRADIATION DEVICEApril 2019May 2021Allow2500NoNo
16291494CHAMBER WITH FLOW-THROUGH SOURCEMarch 2019September 2019Allow710NoNo
16251253INNER GANTRYJanuary 2019September 2019Allow810NoNo
16313693CHARGED PARTICLE BEAM DEVICEDecember 2018December 2019Allow1210NoNo
16216270WEARABLE ARTICLES FOR REPELLING DECAY PRODUCTS GENERATED FROM RADONDecember 2018April 2019Allow410YesNo
16092832MEDICAL RADIATION PROTECTOR AND PRODUCTION THEREOFOctober 2018May 2020Allow1910YesNo
16156139INFRARED RADIATION SOURCEOctober 2018January 2020Allow1510NoNo
16116479Frequency Comb Feedback Control for Scanning Probe MicroscopyAugust 2018July 2019Allow1010NoNo
15947388POLISH CURING ASSEMBLYApril 2018July 2019Allow1610NoNo
15943208CHAMBER WITH FLOW-THROUGH SOURCEApril 2018October 2018Allow610NoNo
15940431ION TRANSFER FROM ELECTRON IONIZATION SOURCESMarch 2018August 2019Allow1730YesNo
15940868Charged Particle Beam ApparatusMarch 2018April 2020Allow2520YesNo
15752386ELECTROSPRAY IMAGING AND DEPOSITIONFebruary 2018May 2019Allow1510NoNo
15736098CHARGED PARTICLE DEVICE, CHARGED PARTICLE IRRADIATION METHOD, AND ANALYSIS DEVICEDecember 2017April 2019Allow1620NoNo
15727596CHARGED PARTICLE CANCER THERAPY INSTALLATION SYSTEMOctober 2017May 2018Allow800NoNo
15472985PROCESSING MATERIALSMarch 2017September 2017Allow510NoNo
15382127DEVICES AND METHODS FOR CURING NAIL GELSDecember 2016November 2017Allow1110NoNo
15374362DISTRIBUTION SYSTEM FOR A WETTING LIQUID FOR SPINNING NOZZLES OF AN AIR-JET SPINNING MACHINEDecember 2016October 2017Allow1000NoNo
15374969SAMPLE HOLDER FOR SCANNING ELECTRON MICROSCOPY (SEM) AND ATOMIC FORCE MICROSCOPY (AFM)December 2016March 2018Allow1510NoNo
15371002RADIATION THERAPY TREATMENT PLANNING USING REGRESSIONDecember 2016January 2018Allow1410NoNo
15312866ELECTRON MICROSCOPE DEVICE AND IMAGING METHOD USING SAMENovember 2016July 2017Allow800NoNo
15356580METHOD FOR ANALYZING EVOLVED GAS AND EVOLVED GAS ANALYZERNovember 2016July 2017Allow800NoNo
15346146SANITIZING MATNovember 2016August 2017Allow910NoNo
15334345RADIOGRAPHIC IMAGING APPARATUS AND METHODOctober 2016March 2017Allow500NoNo
15285567PARTICLE BEAM IRRADIATION APPARATUS FOR IRRADIATING A SUBJECT WITH AN ARBITRARY NUMBER OF PARTICLESOctober 2016October 2017Allow1210NoNo
15285176CHAMBER WITH FLOW-THROUGH SOURCEOctober 2016October 2017Allow1310NoNo
15233176THIN-ICE GRID ASSEMBLY FOR CRYO-ELECTRON MICROSCOPYAugust 2016July 2017Allow1101NoNo
15221855INNER GANTRYJuly 2016November 2017Allow1510NoNo
15179330ION TRANSFER TUBE WITH INTERMITTENT INLETJune 2016August 2017Allow1410NoNo
15172390EUV LIGHT GENERATOR INCLUDING COLLECTING MIRROR HAVING DRIP HOLEJune 2016April 2019Allow3400NoNo
15073296Transmission Electron Microscopy Supports and Methods of MakingMarch 2016March 2017Allow1200NoNo
15067832DEVICE MANUFACTURING APPARATUS AND MANUFACTURING METHOD OF MAGNETIC DEVICE USING STRUCTURE TO PASS ION BEAMMarch 2016June 2017Allow1500NoNo
14906129MASS SPECTROMETER INLET WITH REDUCED AVERAGE FLOWJanuary 2016January 2017Allow1200NoNo
14903177PARTICLE BEAM THERAPY SYSTEMJanuary 2016April 2017Allow1510NoNo
14977584MULTI-ELEMENT ISOTOPIC MEASUREMENT BY DIRECT COUPLING OF A MULTI-CYCLE ISOTACHOPHORESIS TECHNIQUE AND A MASS SPECTROMETRY TECHNIQUEDecember 2015July 2016Allow700NoNo
14934114ULTRAVIOLET-C PHOTOCHEMISTRY FOR CUSTOMIZING AN APPEARANCE OF A WOOD PRODUCTNovember 2015July 2016Allow810NoNo
14831099LOW ENERGY ELECTRON BEAM LITHOGRAPHYAugust 2015August 2016Allow1200NoNo
14768926PARTICLE ANALYZING DEVICEAugust 2015April 2016Allow800NoNo
14827666HYBRID ELECTRON MICROSCOPEAugust 2015April 2016Allow810NoNo
14762261SURFACE FORCE MEASURING METHOD AND SURFACE FORCE MEASURING APPARATUSJuly 2015April 2016Allow900NoNo
14798646NOVEL SOLUTION FOR EUV POWER INCREMENT AT WAFER LEVELJuly 2015May 2016Allow1000NoNo
14406696METHOD FOR ESTIMATING POROSITY OF A ROCK SAMPLEMay 2015July 2016Allow1900NoNo
14439645APPARATUS FOR SENSING IONIC CURRENTApril 2015October 2016Allow1710NoNo
14683679SCANNING TRANSMISSION ELECTRON MICROSCOPE HAVING MULTIPLE BEAMS AND POST-DETECTION IMAGE CORRECTIONApril 2015September 2016Allow1710NoNo
14434819TILTING COLLIMATOR, IN PARTICULAR FOR SINGLE-PHOTON EMISSION COMPUTED TOMOGRAPHYApril 2015February 2016Allow1000NoNo
14434515Optical Device for Focusing Synchrotron Radiation Light SourceApril 2015November 2016Allow1910NoNo
14434612BAND-SHAPED CHOPPER FOR A PARTICLE BEAMApril 2015March 2016Allow1110NoNo
14434209RADIOGRAPHIC IMAGING APPARATUS AND METHODApril 2015July 2016Allow1600NoNo
14678041Enclosure To Disinfect Lab Coats And Other Textiles And Objects Of Similar Size To Lab CoatsApril 2015June 2015Allow300NoNo
14676460PHOTO-MASKS FOR LITHOGRAPHYApril 2015May 2016Allow1410NoNo
14433008NON-THERMAL PLASMA JET DEVICE AS SOURCE OF SPATIAL IONIZATION FOR AMBIENT MASS SPECTROMETRY AND METHOD OF APPLICATIONApril 2015February 2016Allow1000NoNo
14431606ION GUIDE FOR MASS SPECTROMETRYMarch 2015November 2015Allow700NoNo
14665921MASS SPECTROMETRY WITH SELECTIVE ION FILTRATION BY DIGITAL THRESHOLDINGMarch 2015May 2016Allow1410NoNo
14638536OPTICAL TRAP USING A FOCUSED HOLLOW-BEAM FOR TRAPPING AND HOLDING BOTH ABSORBING AND NON-ABSORBING AIRBORNE PARTICLESMarch 2015May 2016Allow1510NoNo
14621624OPERATING PROCESS FOR AN IRRADIATION DEVICEFebruary 2015November 2015Allow900NoNo
14383306Method and Irradiation Installation for Irradiating a Target VolumeFebruary 2015June 2016Allow2210NoNo
14614948ELECTRON BEAM WRITING APPARATUS AND ELECTRON BEAM WRITING METHODFebruary 2015October 2015Allow800NoNo
14610355ION TRAP MASS SPECTROMETER AND ION TRAP MASS SPECTROMETRY METHODJanuary 2015October 2015Allow910NoNo
14610980APPARATUS AND METHOD FOR DETERMINING MOLECULAR STRUCTUREJanuary 2015November 2015Allow910NoNo
14606495AMBIENT PRESSURE IONIZATION SOURCE USING A LASER WITH HIGH SPATIAL RESOLUTIONJanuary 2015June 2015Allow500NoNo
14606866APPARATUS & METHODS FOR COLLIMATION OF X-RAYSJanuary 2015April 2015Allow200NoNo
14605617Sensitive Method for Measuring Cis-Diol Containing Compounds in Plasma Using 2D-LC-MS/MSJanuary 2015June 2015Allow500NoNo
14592041RADIATION TUBE, RADIATION GENERATING APPARATUS, AND RADIATION IMAGING SYSTEMJanuary 2015July 2016Allow1800NoNo
14571692Door Mounted Sanitizer LightDecember 2014June 2017Abandon3030NoNo
14542966INNER GANTRYNovember 2014March 2015Allow410NoNo
14538332SPECIMEN SAMPLE HOLDER FOR WORKPIECE TRANSPORT APPARATUSNovember 2014November 2016Allow2400NoNo
14499986Highly Efficient NIR Light Distribution for Imaging Based Intrusion DetectionSeptember 2014November 2016Allow2500NoNo
14386053AIR BLOWING DEVICESeptember 2014April 2015Allow700NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner VANORE, DAVID A.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
1
Examiner Affirmed
0
(0.0%)
Examiner Reversed
1
(100.0%)
Reversal Percentile
95.9%
Higher than average

What This Means

With a 100.0% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.

Strategic Value of Filing an Appeal

Total Appeal Filings
16
Allowed After Appeal Filing
11
(68.8%)
Not Allowed After Appeal Filing
5
(31.2%)
Filing Benefit Percentile
93.2%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 68.8% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Strategic Recommendations

Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner VANORE, DAVID A - Prosecution Strategy Guide

Executive Summary

Examiner VANORE, DAVID A works in Art Unit 2878 and has examined 508 patent applications in our dataset. With an allowance rate of 99.0%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 21 months.

Allowance Patterns

Examiner VANORE, DAVID A's allowance rate of 99.0% places them in the 93% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by VANORE, DAVID A receive 0.94 office actions before reaching final disposition. This places the examiner in the 7% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by VANORE, DAVID A is 21 months. This places the examiner in the 92% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a -2.3% benefit to allowance rate for applications examined by VANORE, DAVID A. This interview benefit is in the 8% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 43.1% of applications are subsequently allowed. This success rate is in the 94% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 65.6% of cases where such amendments are filed. This entry rate is in the 89% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 100.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 74% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 93.8% of appeals filed. This is in the 85% percentile among all examiners. Of these withdrawals, 73.3% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 42.6% are granted (fully or in part). This grant rate is in the 34% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 5.7% of allowed cases (in the 87% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 12.3% of allowed cases (in the 90% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.