USPTO Examiner CHANG HANWAY - Art Unit 2878

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18674153SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS AND THEIR USE FOR PROCESS MONITORING AND CONTROLMay 2024March 2026Allow2220NoNo
18630611Integrated Sample Processing System with Multiple Detection CapabilityApril 2024March 2026Allow2320YesNo
18216142EUV LIGHT UNIFORMITY CONTROL APPARATUS, EUV EXPOSURE EQUIPMENT INCLUDING THE SAME, AND METHOD OF CONTROLLING EUV LIGHT UNIFORMITY BY USING THE CONTROL APPARATUSJune 2023March 2026Allow3310YesNo
18267837ION MICROSCOPEJune 2023March 2026Allow3310NoNo
18329325SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTSJune 2023December 2025Abandon3030NoNo
18137226ABERRATION CORRECTOR, A CHARGED PARTICLE BEAM APPARATUS, A METHOD OF ALIGNING AN ABERRATION CORRECTOR AND A METHOD OF CORRECTING ABERRATION OF A CHARGED PARTICLE BEAMApril 2023February 2026Allow3410YesNo
18121289Charged Particle Beam ApparatusMarch 2023February 2026Allow3510NoNo
17320085CURRENCY BILL DISPENSER WITH RADIATION STERILIZATIONMay 2021July 2021Allow200NoNo
16966758SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHODJuly 2020September 2021Allow1410NoNo
16965460SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHODJuly 2020September 2021Allow1410NoNo
16706171SYSTEM AND METHOD FOR PERFORMING SCANNING TUNNELING MICROSCOPY ON CURRENT-CARRYING SAMPLESDecember 2019September 2020Allow900NoNo
16614078Maldi Mass Spectrometry MethodNovember 2019November 2020Allow1200NoNo
16611281MEMBRANELESS PLATFORM FOR CORRELATED ANALYSIS OF NANOMATERIALSNovember 2019November 2020Allow1200NoNo
16549603METHOD FOR QUANTIFICATION OF PURITY OF SUB-VISIBLE PARTICLE SAMPLESAugust 2019February 2021Abandon1710NoNo
16536855DOUBLE BEND ION GUIDES AND DEVICES USING THEMAugust 2019October 2020Allow1410NoNo
16465061METHOD FOR DETECTING ELECTRICAL CHARACTERISTICS OF INDIVIDUAL SOOT NANOPARTICLES AND APPLICATION THEREOFMay 2019August 2020Allow1500NoNo
16411220SCANNED PROBE MOUNTING DESIGNMay 2019June 2020Allow1310NoNo
16339907METHOD FOR MOVING AND TRANSFERRING NANOWIRES USING TAPERED HAIR OF DIAMETER ON MICRON RANGEApril 2019June 2020Allow1500NoNo
16295113Brush Cleaning Device Using UV Light to Dry, Sanitize, and Disinfect Cosmetic BrushesMarch 2019October 2020Allow1910NoNo
16294015TRANSITION RADIATION LIGHT SOURCESMarch 2019January 2020Allow1100NoNo
16201421Alpha-Cyano-4-Hydroxy-3-Iodocinnamic Acid as a Matrix in Maldi Mass SpectrometryNovember 2018August 2019Allow900NoNo
16103751NANOPROCESSING AND HETEROSTRUCTURING OF SILKAugust 2018July 2019Allow1100NoNo
15909601CONTROL METHOD AND CONTROL PROGRAM FOR FOCUSED ION BEAM DEVICEMarch 2018December 2018Allow1000NoNo
15905593ULTRAVIOLET DISINFECTION SYSTEMFebruary 2018December 2018Allow900NoNo
15558482CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD IN CHARGED PARTICLE BEAM DEVICESeptember 2017June 2018Allow900NoNo
15632959IMAGING SPECTROMETERJune 2017September 2018Allow1500YesNo
15515842DUEL MODE ION MOBILITY SPECTROMETERMarch 2017March 2018Allow1100NoNo
15515345PARTICLE BEAM IRRADIATION EQUIPMENTMarch 2017September 2018Allow1820NoNo
15368265SYSTEMS AND METHODS FOR FORMULATING RADIOACTIVE LIQUIDSDecember 2016April 2019Allow2810NoNo
15127895ELECTRON BEAM GENERATOR AND ELECTRON BEAM STERILIZING DEVICESeptember 2016April 2018Allow1920NoNo
15024737SYNCHROTRON INJECTOR SYSTEM, AND SYNCHROTRON SYSTEM OPERATION METHODMarch 2016March 2017Allow1100NoNo
15024104QUANTITATION OF STRUCTURAL ISOMERS USING MALDI MS/MSMarch 2016February 2017Allow1100NoNo
14950798ACCELERATED PARTICLE IRRADIATION EQUIPMENTNovember 2015April 2017Allow1710NoNo
14879645APPARATUS AND METHOD FOR ATOMIC FORCE PROBING/SEM NANO-PROBING/SCANNING PROBE MICROSCOPY AND COLLIMATED ION MILLINGOctober 2015July 2016Allow900NoNo
14875764Information Processing Device and Information Processing MethodOctober 2015March 2017Allow1720NoNo
14876263MASS ANALYZING ELECTROMAGNET AND ION BEAM IRRADIATION APPARATUSOctober 2015April 2017Allow1820YesNo
14874088SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPYOctober 2015June 2016Allow900NoNo
14846844STERILIZATION APPARATUS HAVING ULTRAVIOLET LIGHTSeptember 2015February 2017Allow1720NoNo
14833583Apparatus of Plural Charged Particle Beams with Multi-axis Magnetic LensesAugust 2015April 2016Allow800NoNo
14810320DIRECT SAMPLE ANALYSIS DEVICE ADAPTERS AND METHODS OF USING THEMJuly 2015April 2017Allow2120NoNo
14754896EQUIPMENT FOR PRODUCING ULTRAVIOLET LIGHTJune 2015January 2017Allow1810NoNo
14751308MULTI-LINEAR X-RAY SCANNING SYSTEMS AND METHODS FOR X-RAY SCANNINGJune 2015February 2017Allow2020NoNo
14728751Mineral Identification Using Sequential Decomposition into Elements from Mineral DefinitionsJune 2015April 2017Allow2220NoYes
14720565Remote Detection and Identification of Nuclear Materials Using Multiple Ion-ChambersMay 2015March 2016Allow1000NoNo
14438731AIR PURIFIERApril 2015July 2016Allow1510NoNo
14433600ION TRAP-BASED APPARATUS AND METHOD FOR ANALYZING AND DETECTING BIPOLAR IONApril 2015February 2016Allow1000NoNo
14424604SYSTEM FOR THE RADIATION TREATMENT OF SUBSTRATESFebruary 2015January 2016Allow1100NoNo
14615118Multi-Linear X-Ray Scanning Systems and Methods for X-Ray ScanningFebruary 2015July 2016Allow1810NoNo
14405544METHODS AND APPARATUS FOR PERFORMING MASS SPECTROMETRYDecember 2014December 2016Allow2530NoNo
14326997CHARGED PARTICLE BEAM DRAWING APPARATUS AND DRAWING CHAMBERJuly 2014July 2015Allow1200NoNo
14205905IONIZATION WITHIN ION TRAP USING PHOTOIONIZATION AND ELECTRON IONIZATIONMarch 2014October 2016Allow3140YesNo
14033723APPARATUS AND METHOD FOR POSITIONING A MEDICAL DEVICESeptember 2013January 2016Allow2820NoNo
14022571AUTOMATIC FILTERING OF SEM IMAGESSeptember 2013February 2015Allow1720NoNo
14001588ATOMIC FORCE MICROSCOPY CONTROLLER AND METHODAugust 2013April 2015Allow2020NoYes
14000895INTEGRATED MICROSCOPE AND RELATED METHODS AND DEVICESAugust 2013December 2014Allow1521YesNo
13576483SYSTEMS AND METHODS FOR SAMPLE ANALYSISFebruary 2013July 2014Allow2310NoNo
13756178Charged Particle Lithography System With a Long Shape Illumination BeamJanuary 2013July 2015Allow3011YesNo
13679787IMAGE RECONSTRUCTION SYSTEM, APPARATUS, AND METHOD EMPLOYING NON-SEQUENTIAL SCANNING SCHEME USING REAL-TIME FEEDBACKNovember 2012February 2015Allow2710NoNo
13679949RADIOGRAPHIC APPARATUSNovember 2012August 2015Allow3320NoNo
13679695MULTI-LINEAR X-RAY SCANNING SYSTEMS AND METHODS FOR X-RAY SCANNINGNovember 2012January 2015Allow2610NoNo
13677693PANORAMIC DENTAL X-RAY UNITNovember 2012February 2015Allow2710NoNo
13663684SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENVIRONMENTOctober 2012November 2014Allow2420NoNo
13502171MOUNT FOR A SCANNING PROBE SENSOR PACKAGE, SCANNING PROBE SENSOR PACKAGE, SCANNING PROBE MICROSCOPE AND METHOD OF MOUNTING OR DISMOUNTING A SCANNING PROBE SENSOR PACKAGEAugust 2012July 2014Allow2720NoNo
13386540PATTERN EVALUATION METHOD, DEVICE THEREFOR, AND ELECTRON BEAM DEVICEAugust 2012April 2014Allow2710NoNo
13379180Functional Check and Variance Compensation in Mass SpectrometryApril 2012July 2014Allow3100NoNo
13438543APPARATUS AND METHODS FOR HIGH-RESOLUTION ELECTRON BEAM IMAGINGApril 2012February 2015Allow3540NoYes
13287499SILVER AND SILVER NANOPARTICLE MALDI MATRIX UTILIZING ONLINE SOFT LANDING ION MOBILITYNovember 2011July 2013Allow2100NoNo
13182219Electron-Beam Image ReconstructionJuly 2011October 2013Allow2710NoNo
13176689METHOD FOR POSITIONING AN ATOMIC FORCE MICROSCOPY TIP IN A CELLJuly 2011May 2013Allow2200NoNo
13096378ULTRA-LOW DAMPING IMAGING MODE RELATED TO SCANNING PROBE MICROSCOPY IN LIQUIDApril 2011February 2013Allow2200NoNo
13038853ACCELERATED PARTICLE IRRADIATION EQUIPMENTMarch 2011August 2015Allow5460YesNo
12917510ION SOURCE AND A METHOD OF GENERATING AN ION BEAM USING AN ION SOURCENovember 2010August 2012Allow2100NoNo
12916600TEMPERATURE CONTROL OF A SUBSTRATE DURING A PLASMA ION IMPLANTATION PROCESS FOR PATTERNED DISC MEDIA APPLICATIONSOctober 2010September 2013Allow3420YesYes
12914796CYCLING ELECTROSPRAY IONIZATION DEVICEOctober 2010May 2012Allow1900NoNo
12923477QUANTUM ENTANGLED PHOTON PAIR GENERATING DEVICESeptember 2010April 2012Allow1900NoNo
12923444SELECTIVE MOLECULAR EXCITATION METHOD AND ISOTOPE SEPARATION METHOD USING THE SAME, ISOTOPE ANALYSIS METHOD, SELECTIVE MOLECULAR EXCITATION APPARATUS AND ISOTOPE SEPARATION APPARATUSSeptember 2010April 2012Allow1900NoNo
12922263METHOD FOR MEASURING GASES AND CORRESPONDING ION MOBILITY SPECTROMETERSeptember 2010April 2012Allow1900NoNo
12921832SCANNING PROBE MICROSCOPESeptember 2010October 2012Allow2520NoNo
12920306MASS SPECTROMETERAugust 2010October 2013Allow3730NoNo
12918421METHOD AND APPARATUS FOR IRRADIATION OF A TARGET VOLUMEAugust 2010July 2013Allow3530YesNo
12712745SCANNING PROBE MICROSCOPE AND METHOD OF OBSERVING SAMPLE USING THE SAMEFebruary 2010July 2012Allow2910NoNo
12712816ION IMPLANTATION THROUGH LASER FIELDSFebruary 2010February 2012Allow2400NoNo
12711267VARIABLE SPATIAL BEAM MODULATORFebruary 2010January 2012Allow2300NoNo
12710679SAMPLE ELECTRIFICATION MEASUREMENT METHOD AND CHARGED PARTICLE BEAM APPARATUSFebruary 2010December 2013Allow4640YesNo
12709264PATTERN OBSERVATION METHODFebruary 2010May 2013Allow3930YesNo
12449141METHODS, SYSTEMS, AND APPARATUS FOR STORAGE, TRANSFER AND/OR CONTROL OF INFORMATION VIA MATTER WAVE DYNAMICSSeptember 2009July 2012Allow3520YesNo
12540559RADIATION SOURCE, LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHODAugust 2009August 2012Allow3620NoNo
12540542RADIATION SOURCE, LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHODAugust 2009March 2012Allow3120YesNo
12536974POLARIZATION-MODULATED TIP ENHANCED OPTICAL MICROSCOPEAugust 2009July 2012Allow3520YesNo
12453058EXREME ULTRAVIOLET LIGHT SOURCE APPARATUSApril 2009February 2013Allow4630NoNo
12277623LASER HEATED DISCHARGE PLASMA EUV SOURCENovember 2008May 2012Allow4240NoNo
12065784APPARATUS AND METHOD FOR ABSORPTION OF INCIDENT GAMMA RADIATION AND ITS CONVERSION TO OUTGOING RADIATION AT LESS PENETRATING, LOWER ENERGIES AND FREQUENCIESAugust 2008December 2010Allow3301NoNo
11917771MASS-SPECTROMETER INTERFACE HOUSINGJune 2008September 2010Allow3300NoNo
12092692PARTICLE THERAPY SYSTEMMay 2008August 2010Allow2700NoNo
12092357MICROCHIP, METHOD FOR USING SUCH MICROCHIP AND MASS SPECTROMETRY SYSTEMMay 2008June 2010Allow2600NoNo
11972754AMBIENT PRESSURE PYROELECTRIC ION SOURCE FOR MASS SPECTROMETRYJanuary 2008April 2010Allow2800NoNo
11970755ION IMPLANTING APPARATUS AND METHOD FOR IMPLANTING IONSJanuary 2008April 2010Allow2700NoNo
11920362METHOD AND APPARATUS FOR FLATTENING SOLID SURFACEDecember 2007February 2012Allow5150YesNo
11952148SPECIMEN KIT AND FABRICATING METHOD THEREOFDecember 2007June 2010Allow3110NoNo
11916396NEBULIZER WITH NANOMETRIC FLOW RATE OF A LIQUID EFFLUENT AND NEBULIZING INSTALLATION COMPRISING SAMEDecember 2007September 2010Allow3420NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner CHANG, HANWAY.

Strategic Value of Filing an Appeal

Total Appeal Filings
7
Allowed After Appeal Filing
6
(85.7%)
Not Allowed After Appeal Filing
1
(14.3%)
Filing Benefit Percentile
95.4%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 85.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Strategic Recommendations

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner CHANG, HANWAY - Prosecution Strategy Guide

Executive Summary

Examiner CHANG, HANWAY works in Art Unit 2878 and has examined 120 patent applications in our dataset. With an allowance rate of 99.2%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 26 months.

Allowance Patterns

Examiner CHANG, HANWAY's allowance rate of 99.2% places them in the 93% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by CHANG, HANWAY receive 1.26 office actions before reaching final disposition. This places the examiner in the 17% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by CHANG, HANWAY is 26 months. This places the examiner in the 77% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +1.0% benefit to allowance rate for applications examined by CHANG, HANWAY. This interview benefit is in the 19% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 37.3% of applications are subsequently allowed. This success rate is in the 85% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 58.3% of cases where such amendments are filed. This entry rate is in the 84% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 150.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 90% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 95% percentile among all examiners. Of these withdrawals, 57.1% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 72.7% are granted (fully or in part). This grant rate is in the 79% percentile among all examiners. Strategic Note: Petitions are frequently granted regarding this examiner's actions compared to other examiners. Per MPEP § 1002.02(c), various examiner actions are petitionable to the Technology Center Director, including prematureness of final rejection, refusal to enter amendments, and requirement for information. If you believe an examiner action is improper, consider filing a petition.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 5.8% of allowed cases (in the 87% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 33% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.