Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18674153 | SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS AND THEIR USE FOR PROCESS MONITORING AND CONTROL | May 2024 | March 2026 | Allow | 22 | 2 | 0 | No | No |
| 18630611 | Integrated Sample Processing System with Multiple Detection Capability | April 2024 | March 2026 | Allow | 23 | 2 | 0 | Yes | No |
| 18216142 | EUV LIGHT UNIFORMITY CONTROL APPARATUS, EUV EXPOSURE EQUIPMENT INCLUDING THE SAME, AND METHOD OF CONTROLLING EUV LIGHT UNIFORMITY BY USING THE CONTROL APPARATUS | June 2023 | March 2026 | Allow | 33 | 1 | 0 | Yes | No |
| 18267837 | ION MICROSCOPE | June 2023 | March 2026 | Allow | 33 | 1 | 0 | No | No |
| 18329325 | SYSTEM AND METHOD FOR GENERATING AND ANALYZING ROUGHNESS MEASUREMENTS | June 2023 | December 2025 | Abandon | 30 | 3 | 0 | No | No |
| 18137226 | ABERRATION CORRECTOR, A CHARGED PARTICLE BEAM APPARATUS, A METHOD OF ALIGNING AN ABERRATION CORRECTOR AND A METHOD OF CORRECTING ABERRATION OF A CHARGED PARTICLE BEAM | April 2023 | February 2026 | Allow | 34 | 1 | 0 | Yes | No |
| 18121289 | Charged Particle Beam Apparatus | March 2023 | February 2026 | Allow | 35 | 1 | 0 | No | No |
| 17320085 | CURRENCY BILL DISPENSER WITH RADIATION STERILIZATION | May 2021 | July 2021 | Allow | 2 | 0 | 0 | No | No |
| 16966758 | SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD | July 2020 | September 2021 | Allow | 14 | 1 | 0 | No | No |
| 16965460 | SAMPLE SUPPORT, IONIZATION METHOD, AND MASS SPECTROMETRY METHOD | July 2020 | September 2021 | Allow | 14 | 1 | 0 | No | No |
| 16706171 | SYSTEM AND METHOD FOR PERFORMING SCANNING TUNNELING MICROSCOPY ON CURRENT-CARRYING SAMPLES | December 2019 | September 2020 | Allow | 9 | 0 | 0 | No | No |
| 16614078 | Maldi Mass Spectrometry Method | November 2019 | November 2020 | Allow | 12 | 0 | 0 | No | No |
| 16611281 | MEMBRANELESS PLATFORM FOR CORRELATED ANALYSIS OF NANOMATERIALS | November 2019 | November 2020 | Allow | 12 | 0 | 0 | No | No |
| 16549603 | METHOD FOR QUANTIFICATION OF PURITY OF SUB-VISIBLE PARTICLE SAMPLES | August 2019 | February 2021 | Abandon | 17 | 1 | 0 | No | No |
| 16536855 | DOUBLE BEND ION GUIDES AND DEVICES USING THEM | August 2019 | October 2020 | Allow | 14 | 1 | 0 | No | No |
| 16465061 | METHOD FOR DETECTING ELECTRICAL CHARACTERISTICS OF INDIVIDUAL SOOT NANOPARTICLES AND APPLICATION THEREOF | May 2019 | August 2020 | Allow | 15 | 0 | 0 | No | No |
| 16411220 | SCANNED PROBE MOUNTING DESIGN | May 2019 | June 2020 | Allow | 13 | 1 | 0 | No | No |
| 16339907 | METHOD FOR MOVING AND TRANSFERRING NANOWIRES USING TAPERED HAIR OF DIAMETER ON MICRON RANGE | April 2019 | June 2020 | Allow | 15 | 0 | 0 | No | No |
| 16295113 | Brush Cleaning Device Using UV Light to Dry, Sanitize, and Disinfect Cosmetic Brushes | March 2019 | October 2020 | Allow | 19 | 1 | 0 | No | No |
| 16294015 | TRANSITION RADIATION LIGHT SOURCES | March 2019 | January 2020 | Allow | 11 | 0 | 0 | No | No |
| 16201421 | Alpha-Cyano-4-Hydroxy-3-Iodocinnamic Acid as a Matrix in Maldi Mass Spectrometry | November 2018 | August 2019 | Allow | 9 | 0 | 0 | No | No |
| 16103751 | NANOPROCESSING AND HETEROSTRUCTURING OF SILK | August 2018 | July 2019 | Allow | 11 | 0 | 0 | No | No |
| 15909601 | CONTROL METHOD AND CONTROL PROGRAM FOR FOCUSED ION BEAM DEVICE | March 2018 | December 2018 | Allow | 10 | 0 | 0 | No | No |
| 15905593 | ULTRAVIOLET DISINFECTION SYSTEM | February 2018 | December 2018 | Allow | 9 | 0 | 0 | No | No |
| 15558482 | CHARGED PARTICLE BEAM DEVICE AND SAMPLE OBSERVATION METHOD IN CHARGED PARTICLE BEAM DEVICE | September 2017 | June 2018 | Allow | 9 | 0 | 0 | No | No |
| 15632959 | IMAGING SPECTROMETER | June 2017 | September 2018 | Allow | 15 | 0 | 0 | Yes | No |
| 15515842 | DUEL MODE ION MOBILITY SPECTROMETER | March 2017 | March 2018 | Allow | 11 | 0 | 0 | No | No |
| 15515345 | PARTICLE BEAM IRRADIATION EQUIPMENT | March 2017 | September 2018 | Allow | 18 | 2 | 0 | No | No |
| 15368265 | SYSTEMS AND METHODS FOR FORMULATING RADIOACTIVE LIQUIDS | December 2016 | April 2019 | Allow | 28 | 1 | 0 | No | No |
| 15127895 | ELECTRON BEAM GENERATOR AND ELECTRON BEAM STERILIZING DEVICE | September 2016 | April 2018 | Allow | 19 | 2 | 0 | No | No |
| 15024737 | SYNCHROTRON INJECTOR SYSTEM, AND SYNCHROTRON SYSTEM OPERATION METHOD | March 2016 | March 2017 | Allow | 11 | 0 | 0 | No | No |
| 15024104 | QUANTITATION OF STRUCTURAL ISOMERS USING MALDI MS/MS | March 2016 | February 2017 | Allow | 11 | 0 | 0 | No | No |
| 14950798 | ACCELERATED PARTICLE IRRADIATION EQUIPMENT | November 2015 | April 2017 | Allow | 17 | 1 | 0 | No | No |
| 14879645 | APPARATUS AND METHOD FOR ATOMIC FORCE PROBING/SEM NANO-PROBING/SCANNING PROBE MICROSCOPY AND COLLIMATED ION MILLING | October 2015 | July 2016 | Allow | 9 | 0 | 0 | No | No |
| 14875764 | Information Processing Device and Information Processing Method | October 2015 | March 2017 | Allow | 17 | 2 | 0 | No | No |
| 14876263 | MASS ANALYZING ELECTROMAGNET AND ION BEAM IRRADIATION APPARATUS | October 2015 | April 2017 | Allow | 18 | 2 | 0 | Yes | No |
| 14874088 | SCANNING PROBE MICROSCOPE AND SCANNING PROBE MICROSCOPY | October 2015 | June 2016 | Allow | 9 | 0 | 0 | No | No |
| 14846844 | STERILIZATION APPARATUS HAVING ULTRAVIOLET LIGHT | September 2015 | February 2017 | Allow | 17 | 2 | 0 | No | No |
| 14833583 | Apparatus of Plural Charged Particle Beams with Multi-axis Magnetic Lenses | August 2015 | April 2016 | Allow | 8 | 0 | 0 | No | No |
| 14810320 | DIRECT SAMPLE ANALYSIS DEVICE ADAPTERS AND METHODS OF USING THEM | July 2015 | April 2017 | Allow | 21 | 2 | 0 | No | No |
| 14754896 | EQUIPMENT FOR PRODUCING ULTRAVIOLET LIGHT | June 2015 | January 2017 | Allow | 18 | 1 | 0 | No | No |
| 14751308 | MULTI-LINEAR X-RAY SCANNING SYSTEMS AND METHODS FOR X-RAY SCANNING | June 2015 | February 2017 | Allow | 20 | 2 | 0 | No | No |
| 14728751 | Mineral Identification Using Sequential Decomposition into Elements from Mineral Definitions | June 2015 | April 2017 | Allow | 22 | 2 | 0 | No | Yes |
| 14720565 | Remote Detection and Identification of Nuclear Materials Using Multiple Ion-Chambers | May 2015 | March 2016 | Allow | 10 | 0 | 0 | No | No |
| 14438731 | AIR PURIFIER | April 2015 | July 2016 | Allow | 15 | 1 | 0 | No | No |
| 14433600 | ION TRAP-BASED APPARATUS AND METHOD FOR ANALYZING AND DETECTING BIPOLAR ION | April 2015 | February 2016 | Allow | 10 | 0 | 0 | No | No |
| 14424604 | SYSTEM FOR THE RADIATION TREATMENT OF SUBSTRATES | February 2015 | January 2016 | Allow | 11 | 0 | 0 | No | No |
| 14615118 | Multi-Linear X-Ray Scanning Systems and Methods for X-Ray Scanning | February 2015 | July 2016 | Allow | 18 | 1 | 0 | No | No |
| 14405544 | METHODS AND APPARATUS FOR PERFORMING MASS SPECTROMETRY | December 2014 | December 2016 | Allow | 25 | 3 | 0 | No | No |
| 14326997 | CHARGED PARTICLE BEAM DRAWING APPARATUS AND DRAWING CHAMBER | July 2014 | July 2015 | Allow | 12 | 0 | 0 | No | No |
| 14205905 | IONIZATION WITHIN ION TRAP USING PHOTOIONIZATION AND ELECTRON IONIZATION | March 2014 | October 2016 | Allow | 31 | 4 | 0 | Yes | No |
| 14033723 | APPARATUS AND METHOD FOR POSITIONING A MEDICAL DEVICE | September 2013 | January 2016 | Allow | 28 | 2 | 0 | No | No |
| 14022571 | AUTOMATIC FILTERING OF SEM IMAGES | September 2013 | February 2015 | Allow | 17 | 2 | 0 | No | No |
| 14001588 | ATOMIC FORCE MICROSCOPY CONTROLLER AND METHOD | August 2013 | April 2015 | Allow | 20 | 2 | 0 | No | Yes |
| 14000895 | INTEGRATED MICROSCOPE AND RELATED METHODS AND DEVICES | August 2013 | December 2014 | Allow | 15 | 2 | 1 | Yes | No |
| 13576483 | SYSTEMS AND METHODS FOR SAMPLE ANALYSIS | February 2013 | July 2014 | Allow | 23 | 1 | 0 | No | No |
| 13756178 | Charged Particle Lithography System With a Long Shape Illumination Beam | January 2013 | July 2015 | Allow | 30 | 1 | 1 | Yes | No |
| 13679787 | IMAGE RECONSTRUCTION SYSTEM, APPARATUS, AND METHOD EMPLOYING NON-SEQUENTIAL SCANNING SCHEME USING REAL-TIME FEEDBACK | November 2012 | February 2015 | Allow | 27 | 1 | 0 | No | No |
| 13679949 | RADIOGRAPHIC APPARATUS | November 2012 | August 2015 | Allow | 33 | 2 | 0 | No | No |
| 13679695 | MULTI-LINEAR X-RAY SCANNING SYSTEMS AND METHODS FOR X-RAY SCANNING | November 2012 | January 2015 | Allow | 26 | 1 | 0 | No | No |
| 13677693 | PANORAMIC DENTAL X-RAY UNIT | November 2012 | February 2015 | Allow | 27 | 1 | 0 | No | No |
| 13663684 | SCANNING ELECTRON MICROSCOPE, AN INTERFACE AND A METHOD FOR OBSERVING AN OBJECT WITHIN A NON-VACUUM ENVIRONMENT | October 2012 | November 2014 | Allow | 24 | 2 | 0 | No | No |
| 13502171 | MOUNT FOR A SCANNING PROBE SENSOR PACKAGE, SCANNING PROBE SENSOR PACKAGE, SCANNING PROBE MICROSCOPE AND METHOD OF MOUNTING OR DISMOUNTING A SCANNING PROBE SENSOR PACKAGE | August 2012 | July 2014 | Allow | 27 | 2 | 0 | No | No |
| 13386540 | PATTERN EVALUATION METHOD, DEVICE THEREFOR, AND ELECTRON BEAM DEVICE | August 2012 | April 2014 | Allow | 27 | 1 | 0 | No | No |
| 13379180 | Functional Check and Variance Compensation in Mass Spectrometry | April 2012 | July 2014 | Allow | 31 | 0 | 0 | No | No |
| 13438543 | APPARATUS AND METHODS FOR HIGH-RESOLUTION ELECTRON BEAM IMAGING | April 2012 | February 2015 | Allow | 35 | 4 | 0 | No | Yes |
| 13287499 | SILVER AND SILVER NANOPARTICLE MALDI MATRIX UTILIZING ONLINE SOFT LANDING ION MOBILITY | November 2011 | July 2013 | Allow | 21 | 0 | 0 | No | No |
| 13182219 | Electron-Beam Image Reconstruction | July 2011 | October 2013 | Allow | 27 | 1 | 0 | No | No |
| 13176689 | METHOD FOR POSITIONING AN ATOMIC FORCE MICROSCOPY TIP IN A CELL | July 2011 | May 2013 | Allow | 22 | 0 | 0 | No | No |
| 13096378 | ULTRA-LOW DAMPING IMAGING MODE RELATED TO SCANNING PROBE MICROSCOPY IN LIQUID | April 2011 | February 2013 | Allow | 22 | 0 | 0 | No | No |
| 13038853 | ACCELERATED PARTICLE IRRADIATION EQUIPMENT | March 2011 | August 2015 | Allow | 54 | 6 | 0 | Yes | No |
| 12917510 | ION SOURCE AND A METHOD OF GENERATING AN ION BEAM USING AN ION SOURCE | November 2010 | August 2012 | Allow | 21 | 0 | 0 | No | No |
| 12916600 | TEMPERATURE CONTROL OF A SUBSTRATE DURING A PLASMA ION IMPLANTATION PROCESS FOR PATTERNED DISC MEDIA APPLICATIONS | October 2010 | September 2013 | Allow | 34 | 2 | 0 | Yes | Yes |
| 12914796 | CYCLING ELECTROSPRAY IONIZATION DEVICE | October 2010 | May 2012 | Allow | 19 | 0 | 0 | No | No |
| 12923477 | QUANTUM ENTANGLED PHOTON PAIR GENERATING DEVICE | September 2010 | April 2012 | Allow | 19 | 0 | 0 | No | No |
| 12923444 | SELECTIVE MOLECULAR EXCITATION METHOD AND ISOTOPE SEPARATION METHOD USING THE SAME, ISOTOPE ANALYSIS METHOD, SELECTIVE MOLECULAR EXCITATION APPARATUS AND ISOTOPE SEPARATION APPARATUS | September 2010 | April 2012 | Allow | 19 | 0 | 0 | No | No |
| 12922263 | METHOD FOR MEASURING GASES AND CORRESPONDING ION MOBILITY SPECTROMETER | September 2010 | April 2012 | Allow | 19 | 0 | 0 | No | No |
| 12921832 | SCANNING PROBE MICROSCOPE | September 2010 | October 2012 | Allow | 25 | 2 | 0 | No | No |
| 12920306 | MASS SPECTROMETER | August 2010 | October 2013 | Allow | 37 | 3 | 0 | No | No |
| 12918421 | METHOD AND APPARATUS FOR IRRADIATION OF A TARGET VOLUME | August 2010 | July 2013 | Allow | 35 | 3 | 0 | Yes | No |
| 12712745 | SCANNING PROBE MICROSCOPE AND METHOD OF OBSERVING SAMPLE USING THE SAME | February 2010 | July 2012 | Allow | 29 | 1 | 0 | No | No |
| 12712816 | ION IMPLANTATION THROUGH LASER FIELDS | February 2010 | February 2012 | Allow | 24 | 0 | 0 | No | No |
| 12711267 | VARIABLE SPATIAL BEAM MODULATOR | February 2010 | January 2012 | Allow | 23 | 0 | 0 | No | No |
| 12710679 | SAMPLE ELECTRIFICATION MEASUREMENT METHOD AND CHARGED PARTICLE BEAM APPARATUS | February 2010 | December 2013 | Allow | 46 | 4 | 0 | Yes | No |
| 12709264 | PATTERN OBSERVATION METHOD | February 2010 | May 2013 | Allow | 39 | 3 | 0 | Yes | No |
| 12449141 | METHODS, SYSTEMS, AND APPARATUS FOR STORAGE, TRANSFER AND/OR CONTROL OF INFORMATION VIA MATTER WAVE DYNAMICS | September 2009 | July 2012 | Allow | 35 | 2 | 0 | Yes | No |
| 12540559 | RADIATION SOURCE, LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD | August 2009 | August 2012 | Allow | 36 | 2 | 0 | No | No |
| 12540542 | RADIATION SOURCE, LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD | August 2009 | March 2012 | Allow | 31 | 2 | 0 | Yes | No |
| 12536974 | POLARIZATION-MODULATED TIP ENHANCED OPTICAL MICROSCOPE | August 2009 | July 2012 | Allow | 35 | 2 | 0 | Yes | No |
| 12453058 | EXREME ULTRAVIOLET LIGHT SOURCE APPARATUS | April 2009 | February 2013 | Allow | 46 | 3 | 0 | No | No |
| 12277623 | LASER HEATED DISCHARGE PLASMA EUV SOURCE | November 2008 | May 2012 | Allow | 42 | 4 | 0 | No | No |
| 12065784 | APPARATUS AND METHOD FOR ABSORPTION OF INCIDENT GAMMA RADIATION AND ITS CONVERSION TO OUTGOING RADIATION AT LESS PENETRATING, LOWER ENERGIES AND FREQUENCIES | August 2008 | December 2010 | Allow | 33 | 0 | 1 | No | No |
| 11917771 | MASS-SPECTROMETER INTERFACE HOUSING | June 2008 | September 2010 | Allow | 33 | 0 | 0 | No | No |
| 12092692 | PARTICLE THERAPY SYSTEM | May 2008 | August 2010 | Allow | 27 | 0 | 0 | No | No |
| 12092357 | MICROCHIP, METHOD FOR USING SUCH MICROCHIP AND MASS SPECTROMETRY SYSTEM | May 2008 | June 2010 | Allow | 26 | 0 | 0 | No | No |
| 11972754 | AMBIENT PRESSURE PYROELECTRIC ION SOURCE FOR MASS SPECTROMETRY | January 2008 | April 2010 | Allow | 28 | 0 | 0 | No | No |
| 11970755 | ION IMPLANTING APPARATUS AND METHOD FOR IMPLANTING IONS | January 2008 | April 2010 | Allow | 27 | 0 | 0 | No | No |
| 11920362 | METHOD AND APPARATUS FOR FLATTENING SOLID SURFACE | December 2007 | February 2012 | Allow | 51 | 5 | 0 | Yes | No |
| 11952148 | SPECIMEN KIT AND FABRICATING METHOD THEREOF | December 2007 | June 2010 | Allow | 31 | 1 | 0 | No | No |
| 11916396 | NEBULIZER WITH NANOMETRIC FLOW RATE OF A LIQUID EFFLUENT AND NEBULIZING INSTALLATION COMPRISING SAME | December 2007 | September 2010 | Allow | 34 | 2 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner CHANG, HANWAY.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 85.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner CHANG, HANWAY works in Art Unit 2878 and has examined 120 patent applications in our dataset. With an allowance rate of 99.2%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 26 months.
Examiner CHANG, HANWAY's allowance rate of 99.2% places them in the 93% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by CHANG, HANWAY receive 1.26 office actions before reaching final disposition. This places the examiner in the 17% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by CHANG, HANWAY is 26 months. This places the examiner in the 77% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +1.0% benefit to allowance rate for applications examined by CHANG, HANWAY. This interview benefit is in the 19% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 37.3% of applications are subsequently allowed. This success rate is in the 85% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 58.3% of cases where such amendments are filed. This entry rate is in the 84% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
When applicants request a pre-appeal conference (PAC) with this examiner, 150.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 90% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 95% percentile among all examiners. Of these withdrawals, 57.1% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 72.7% are granted (fully or in part). This grant rate is in the 79% percentile among all examiners. Strategic Note: Petitions are frequently granted regarding this examiner's actions compared to other examiners. Per MPEP § 1002.02(c), various examiner actions are petitionable to the Technology Center Director, including prematureness of final rejection, refusal to enter amendments, and requirement for information. If you believe an examiner action is improper, consider filing a petition.
Examiner's Amendments: This examiner makes examiner's amendments in 5.8% of allowed cases (in the 87% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 33% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.