USPTO Examiner LE SON T - Art Unit 2863

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19261530METHOD FOR ESTIMATING NOISE OF SOFT MAGNETIC COREJuly 2025August 2025Allow100YesNo
18825962METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICS IN ELECTRONICS TESTERSeptember 2024November 2024Allow210NoNo
18825970METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS TESTERSeptember 2024January 2025Allow410YesNo
18620487INDUCTIVE PROXIMITY SENSOR FOR THE DETECTION OF AN OBJECT AND METHOD OF DETECTING AN OBJECTMarch 2024November 2025Allow2000NoNo
18604369IGBT COLLECTOR CURRENT ONLINE DETECTION DEVICE AND METHOD BASED ON GATE CURRENTMarch 2024November 2025Allow2000YesNo
18596435TEST AND/OR MEASUREMENT SYSTEMMarch 2024September 2025Allow1900NoNo
18684471LOAD TESTING DEVICEFebruary 2024October 2025Allow2000NoNo
18441733SYSTEMS AND METHODS FOR PARALLEL ELECTRICAL ENDURANCE TESTING OF CONTACTSFebruary 2024September 2025Allow1900NoNo
18427064WAFER-LEVEL SEMICONDUCTOR HIGH-VOLTAGE RELIABILITY TEST FIXTUREJanuary 2024October 2024Allow900YesNo
18542710SYSTEM AND METHOD FOR INDUCTION MOTOR INTRA-CORE ROTOR BAR SURFACE MAGNETIC FIELD ANALYSISDecember 2023February 2026Abandon2610NoNo
18533269PIXEL DETECTION DEVICE AND PIXEL DETECTION METHODDecember 2023October 2025Allow2200NoNo
18529262ROTATIONAL ELECTRICAL PROBEDecember 2023April 2025Allow1600YesNo
18387580WAFER TYPE MEASURING APPARATUS AND MAGNETIC FLUX DENSITY MEASURING METHOD USING THE SAMENovember 2023October 2025Allow2310NoNo
18558878SEMICONDUCTOR SWITCH ASSEMBLY HAVING A MONITORING FUNCTION, ENERGY SYSTEM AND VEHICLENovember 2023October 2025Allow2410YesNo
18557489SENSING DEVICEOctober 2023June 2025Allow2000NoNo
18556882SWITCHING CIRCUIT HAVING CONSTANT ON-RESISTANCE AND MATRIX SWITCH COMPRISING SAMEOctober 2023July 2025Allow2000NoNo
18491352POSITION DETECTION DEVICEOctober 2023August 2025Allow2200NoNo
18553598MAGNETIC FIELD MEASURING APPARATUSOctober 2023November 2025Allow2510NoNo
18475458MAGNETIC SENSORSeptember 2023October 2025Allow2510NoNo
18472508PULSED LASER MICRO LED INSPECTIONSeptember 2023November 2025Allow2500NoNo
18464529SYSTEMS AND METHODS FOR ISOLATING FAULTS IN DIE-TO-DIE INTERCONNECTSSeptember 2023July 2025Allow2200NoNo
18280744TEST DEVICESeptember 2023October 2025Allow2610NoNo
18460249DEVICE AND METHOD FOR TESTING CRIMPING STATUS OF HARDWARE FITTING AND CABLE CONDUCTORSSeptember 2023June 2025Allow2100NoNo
18360210MAGNETIC SENSORJuly 2023June 2024Allow1010NoNo
18216724PWM CAPTURE FUNCTION FOR EVENT ANALYSISJune 2023July 2025Allow2510YesNo
18329389Displacement Sensor Arrangement for Determining the Position of a Body Moving Along a Movement Path in a VehicleJune 2023June 2025Allow2500NoNo
18038638125V SWITCH GLITCH MITIGATIONMay 2023September 2025Allow2810NoNo
18133687PROBE UNIT AND HOLDER FOR A PROBE UNITApril 2023May 2025Allow2500NoNo
18248520A MAGNETIC SENSING DEVICEApril 2023October 2025Allow3020NoNo
18131605CASSETTE MAGAZINE FOR THIN WAFERSApril 2023August 2025Allow2910NoNo
18194862IMPEDANCE TUNER, MAGNETIC RESONANCE SYSTEM, TRANSMISSION APPARATUS, AND TRANSMISSION METHODApril 2023September 2025Allow2910NoNo
18246527DIELECTRIC MATERIAL FOR A HIGH VOLTAGE CAPACITORMarch 2023August 2025Allow2910NoNo
18188925METHOD AND APPARATUS WITH IMPEDANCE MEASURINGMarch 2023May 2025Allow2600NoNo
18123512Field Collapse PulserMarch 2023October 2024Allow1910NoNo
18020411DEVICES AND METHODS DIRECTED TO SENSING USING SYNTHETIC MATERIALSFebruary 2023August 2025Allow3010YesNo
18163056TEMPERATURE ADJUSTING DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS, AND ELECTRONIC COMPONENT TEST APPARATUSFebruary 2023July 2025Allow3010NoNo
18161744ELECTRICAL POWER CABLE MONITORING DEVICE INCLUDING PARTIAL DISCHARGE SENSORJanuary 2023April 2024Allow1410NoNo
18156646ANGLE SENSOR APPARATUS AND METHODJanuary 2023July 2025Allow3010NoNo
18155380METHOD AND DEVICE FOR ADAPTING TEMPERATURES OF SEMICONDUCTOR COMPONENTSJanuary 2023March 2025Allow2600NoNo
18149322SENSOR ARCHITECTURE FOR CORRECTING THERMALLY-INDUCED LINEARITY ERRORJanuary 2023March 2025Allow2700NoNo
18060698TESTING DEVICEDecember 2022April 2024Allow1610NoNo
18072690PACKAGING DEVICE CAPABLE OF DETECTING RISK OF IMPACT OF ELECTROSTATIC CHARGESNovember 2022December 2025Abandon3620NoNo
18000277OMNIDIRECTIONAL ROTATIONAL SPEED AND ROTATIONAL DIRECTION SENSORNovember 2022April 2025Allow2810NoNo
17991190ULTRA-LOW LEAKAGE TEST VERIFICATION CIRCUITNovember 2022September 2023Allow910NoNo
18055555Fault Diagnosis Apparatus and MethodNovember 2022March 2025Allow2810NoNo
17923328ELECTRICAL SENSING OF GASES IN PACKAGED PRODUCTS AND MONITORING FRESHNESS OR CONDITION OF PERISHABLE PRODUCTSNovember 2022February 2025Allow2810NoNo
17980424METHOD AND APPARATUS FOR MEASURING EROSION AND CALIBRATING POSITION FOR A MOVING PROCESS KITNovember 2022August 2023Allow910YesNo
17920487PHOTOIONIZATION DETECTOR AND METHOD FOR GAS SAMPLE ANALYSISOctober 2022March 2025Allow2920NoNo
18047155TILT CALIBRATION FOR PROBE SYSTEMSOctober 2022September 2024Allow2300NoNo
17996319METHOD FOR DETECTING AN ELECTRICAL INSULATION FAULT BETWEEN AN ELECTRIC POWER SOURCE AND AN ELECTRICAL GROUNDOctober 2022September 2024Allow2310YesNo
17962969CURRENT SENSOROctober 2022March 2025Allow2920YesNo
17917569ELECTROMAGNETIC FIELD SENSOROctober 2022December 2023Allow1420YesNo
17995831TEST SOCKET FOR SEMICONDUCTOR INTEGRATED CIRCUITSOctober 2022September 2024Allow2310NoNo
17959545ELECTRONIC CIRCUIT PERFORMING ANALOG BUILT-IN SELF TEST AND OPERATING METHOD THEREOFOctober 2022September 2024Allow2400NoNo
17953929DETECTING FAULTY CLAMPINGSeptember 2022July 2024Allow2200NoNo
17949364SYSTEMS AND METHODS FOR DETECTING AND REMOVING RESIDUE FROM LOW CURRENT ELECTRICAL CONTACTSSeptember 2022September 2024Allow2410NoNo
17931912INTERACTIVE TEST EQUIPMENT FOR QUALITY EVALUATION OF INSULATIVE ELECTRIC RESISTANCE VALUE OF ELECTRIC POWER CABLESeptember 2022January 2025Allow2810NoNo
17910600COUPLING PROBE FOR MICRO DEVICE INSPECTIONSeptember 2022December 2024Allow2710NoNo
17910111CIRCUIT FOR OPERATING A CAPACITIVE SENSOR AND ASSOCIATED SENSOR DEVICESeptember 2022August 2024Allow2300NoNo
17874877SYSTEM FOR DETERMINING AT LEAST ONE ROTATION PARAMETER OF A ROTATING MEMBERJuly 2022September 2023Abandon1310NoNo
17874517PHASE DISTORTION MEASUREMENTJuly 2022July 2024Allow2400NoNo
17793965DEVICE AND TESTING APPARATUS FOR LIQUID AND VAPOR WIRE EXPOSURE TESTINGJuly 2022July 2024Allow2300YesNo
17867689TESTING METHOD AND MANUFACTURING METHODJuly 2022March 2025Allow3220NoNo
17863989CONTACTLESS WIDEBAND MAGNETO-RESISTIVE CURRENT SENSOR WITH LOW ELECTROMAGNETIC INTERFERENCEJuly 2022July 2023Allow1220NoNo
17811953STRUCTURE FOR DETECTING CRACK AND SEMICONDUCTOR DEVICEJuly 2022March 2025Abandon3220NoNo
17791418CURRENT MEASUREMENT SYSTEMJuly 2022July 2024Allow2410NoNo
17857046SWITCH CONTROL UNIT AND OPTICAL CONTROL UNITJuly 2022March 2024Allow2100NoNo
17841796Testing Device for a Medium Voltage StarterJune 2022March 2025Abandon3320NoNo
17784889MAGNETIC SENSOR AND METHOD FOR MANUFACTURING MAGNETIC SENSORJune 2022August 2024Allow2610YesNo
17806560DETECTING WEAR OF TRACK LINK PIN BASED ON SENSOR DATA OF A SENSOR DEVICE PROVIDED IN A CAVITY OF THE TRACK LINK PINJune 2022March 2025Abandon3320YesNo
17824324ELECTRICAL PATHWAY INTERMITTENT FAULT DETECTIONMay 2022April 2024Allow2310YesNo
17733147QUASI-ZERO STIFFNESS ABSOLUTE DISPLACEMENT SENSOR BASED ON ELECTROMAGNETIC POSITIVE STIFFNESSApril 2022November 2022Allow600NoNo
17731579BURIED UTILITY MARKER DEVICES, SYSTEMS, AND METHODSApril 2022April 2024Allow2340NoNo
17725877CURRENT SENSORApril 2022March 2025Allow3530NoNo
17769860WELDING QUALITY INSPECTION DEVICEApril 2022August 2024Allow2820YesNo
17719842INSPECTION APPARATUS AND INSPECTION METHOD USING SAMEApril 2022January 2024Allow2100NoNo
17768493DEVICE AND METHOD FOR DETECTING SLOT WEDGE, AIR GAP AND BROKEN ROTOR BAR IN MAGNETIC CIRCUIT OF ELECTRIC MACHINERYApril 2022January 2024Allow2100NoNo
17717770METHOD FOR TESTING LIGHT-EMITTING DEVICESApril 2022August 2024Allow2820NoNo
17761837DETECTION OF A PARTIAL DISCHARGEMarch 2022October 2022Allow700YesNo
17695193MULTIPLE BRANCH BUS BAR FOR CORELESS CURRENT SENSING APPLICATIONMarch 2022March 2024Allow2410NoNo
17689928Device for monitoring deep-sea sediment environment in mining polymetallic nodulesMarch 2022April 2024Allow2600NoNo
17640826ATTENUATOR AND DIFFERENTIAL VOLTAGE PROBEMarch 2022November 2023Allow2000NoNo
17653062MEASURING VOLTAGE LEVEL OF A VOLTAGE NODE UTILIZING A MEASUREMENT INTEGRATED CIRCUITMarch 2022August 2024Allow2910NoNo
17592501Cable Verification System for Telecommunication CablesFebruary 2022May 2022Allow300NoNo
17581092TESTING APPARATUS FOR OPTICAL DEVICESJanuary 2022February 2024Allow2510NoNo
17566715CIRCUIT AND METHOD FOR DETECTING INSULATION RESISTANCEDecember 2021June 2023Allow1700NoNo
17558990MAGNETIC SENSORDecember 2021May 2023Allow1610YesNo
17539170AFE circuit and related gain amplifierNovember 2021January 2024Allow2610YesNo
17532298METHOD AND SYSTEM FOR THERMAL CONTROL OF DEVICES IN AN ELECTRONICS TESTERNovember 2021January 2024Allow2610YesNo
17611843GRID VOLTAGE PHASE DETECTORNovember 2021February 2024Allow2710YesNo
17516271PROBING SYSTEM FOR DISCRETE WAFERNovember 2021March 2023Allow1610NoNo
17606829SEMICONDUCTOR DEVICE EXAMINATION METHOD AND SEMICONDUCTOR DEVICE EXAMINATION DEVICEOctober 2021March 2024Allow2920YesNo
17605576INSPECTION DEVICE FOR ROTATING ELECTRIC MACHINE AND METHOD OF INSPECTING ROTATING ELECTRIC MACHINEOctober 2021November 2023Allow2510YesNo
17507597ON-DIE POWER SUPPLY MONITOR DESIGNOctober 2021July 2025Allow4440YesNo
17602846MEASUREMENT METHOD FOR CONTACT RESISTANCE OF TRANSISTOR TEST DEVICE AND COMPUTER-READABLE MEDIUMOctober 2021May 2022Allow700YesNo
17494847METHOD AND SYSTEM FOR DIAGNOSING OPEN-CIRCUIT FAULT OF POWER SWITCHING DEVICE OF THREE-PHASE THREE-LEVEL RECTIFIEROctober 2021September 2023Allow2320YesNo
17598397A GROUND MOVEMENT MONITORING SYSTEM AND METHODSeptember 2021February 2024Abandon2810NoNo
17437233ABNORMALITY DIAGNOSIS DEVICE AND ABNORMALITY DIAGNOSIS METHODSeptember 2021May 2025Abandon4540NoNo
17468377TEST CIRCUITSeptember 2021July 2023Allow2220YesYes
17465111ROTATIONAL ELECTRICAL PROBESeptember 2021June 2023Allow2100YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner LE, SON T.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
4
Examiner Affirmed
3
(75.0%)
Examiner Reversed
1
(25.0%)
Reversal Percentile
40.5%
Lower than average

What This Means

With a 25.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is below the USPTO average, indicating that appeals face more challenges here than typical.

Strategic Value of Filing an Appeal

Total Appeal Filings
9
Allowed After Appeal Filing
3
(33.3%)
Not Allowed After Appeal Filing
6
(66.7%)
Filing Benefit Percentile
53.5%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 33.3% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner LE, SON T - Prosecution Strategy Guide

Executive Summary

Examiner LE, SON T works in Art Unit 2863 and has examined 233 patent applications in our dataset. With an allowance rate of 88.0%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 25 months.

Allowance Patterns

Examiner LE, SON T's allowance rate of 88.0% places them in the 68% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by LE, SON T receive 1.48 office actions before reaching final disposition. This places the examiner in the 25% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by LE, SON T is 25 months. This places the examiner in the 80% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +6.7% benefit to allowance rate for applications examined by LE, SON T. This interview benefit is in the 34% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 34.5% of applications are subsequently allowed. This success rate is in the 77% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 39.7% of cases where such amendments are filed. This entry rate is in the 61% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 100.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 74% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 63.6% of appeals filed. This is in the 43% percentile among all examiners. Of these withdrawals, 42.9% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.

Petition Practice

When applicants file petitions regarding this examiner's actions, 61.5% are granted (fully or in part). This grant rate is in the 66% percentile among all examiners. Strategic Note: Petitions show above-average success regarding this examiner's actions. Petitionable matters include restriction requirements (MPEP § 1002.02(c)(2)) and various procedural issues.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 27% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 2.9% of allowed cases (in the 73% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.