Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 17131142 | MAGNETIC SENSOR AND ITS MANUFACTURING METHOD | December 2020 | October 2022 | Allow | 21 | 0 | 0 | No | No |
| 17124417 | Pin-Type Probes for Contacting Electronic Circuits and Methods for Making Such Probes | December 2020 | June 2023 | Abandon | 30 | 2 | 0 | No | No |
| 17111036 | PROBE DEVICE AND METHOD OF ASSEMBLING THE SAME | December 2020 | April 2023 | Abandon | 29 | 3 | 0 | No | No |
| 17078778 | PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATORS, AND RELATED METHODS | October 2020 | October 2023 | Allow | 35 | 1 | 0 | No | No |
| 17062954 | ELECTRO-OPTICAL CIRCUIT BOARD FOR CONTACTING PHOTONIC INTEGRATED CIRCUITS | October 2020 | November 2023 | Allow | 38 | 1 | 1 | Yes | No |
| 17038642 | MULTILAYER WIRING SUBSTRATE, METHOD OF MANUFACTURING SAME, AND PROBE CARD HAVING SAME | September 2020 | August 2023 | Allow | 35 | 1 | 1 | No | No |
| 17029979 | PROBE CARD FOR TESTING A PATTERN FORMED ON A WAFER | September 2020 | January 2023 | Allow | 28 | 2 | 0 | No | No |
| 16981073 | METHOD FOR ELECTRICALLY CONNECTING A TEST PIECE TO AN ELECTRICAL TEST DEVICE | September 2020 | April 2023 | Abandon | 31 | 2 | 0 | No | No |
| 17007423 | Self Flattening Test Socket With Anti-Bowing And Elastomer Retention | August 2020 | February 2023 | Allow | 30 | 0 | 0 | Yes | No |
| 16967280 | Evaluation Apparatus for Semiconductor Device | August 2020 | March 2023 | Allow | 32 | 4 | 0 | No | No |
| 16646139 | DYNAMIC MAGNETIC FIELD DETECTION PROBE AND ARRAY CONTROL METHOD | July 2020 | April 2023 | Abandon | 37 | 1 | 0 | No | No |
| 16960434 | Capacitive Test Needle for Measuring Electrically Conductive Layers in Printed Circuit Board Holes | July 2020 | May 2023 | Allow | 35 | 2 | 0 | No | No |
| 16912021 | SHORT-CIRCUIT PROBE CARD, WAFER TEST SYSTEM, AND FAULT DETECTION METHOD FOR THE WAFER TEST SYSTEM | June 2020 | September 2023 | Allow | 39 | 1 | 1 | No | No |
| 16907450 | Method for determining sheet resistance | June 2020 | February 2023 | Allow | 32 | 1 | 0 | No | No |
| 16765843 | DEVICE FOR DETERMINING THE MOISTURE AND/OR THE CONDUCTIVITY OF A MEDIUM | May 2020 | September 2022 | Allow | 28 | 1 | 0 | No | No |
| 16868587 | Inductive Position Sensing Apparatus Including A Screening Layer And Method For The Same | May 2020 | March 2023 | Allow | 34 | 3 | 0 | Yes | No |
| 16864700 | MEASUREMENT SYSTEM AND METHOD FOR OPERATING A MEASUREMENT SYSTEM | May 2020 | January 2023 | Allow | 33 | 4 | 0 | Yes | No |
| 16858369 | PROBE TEST CARD AND METHOD OF MANUFACTURING THE SAME | April 2020 | September 2022 | Allow | 29 | 2 | 0 | Yes | No |
| 16757168 | CERAMIC, PROBE GUIDING MEMBER, PROBE CARD, AND SOCKET FOR PACKAGE INSPECTION | April 2020 | January 2024 | Allow | 45 | 5 | 0 | No | No |
| 16754142 | SPRING PROBE | April 2020 | May 2022 | Abandon | 25 | 1 | 0 | No | No |
| 16841042 | BUS-COMPATIBLE SENSOR ELEMENT AND COMMUNICATION SYSTEM | April 2020 | July 2023 | Allow | 40 | 2 | 0 | No | No |
| 16837614 | AMR (XMR) SENSOR WITH INCREASED LINEAR RANGE | April 2020 | March 2023 | Allow | 35 | 2 | 0 | No | No |
| 16743540 | Method and Device for Testing Adaptor, and Storage Medium | January 2020 | October 2022 | Allow | 33 | 1 | 0 | No | No |
| 16732342 | INDUCTOR WITH AN ELECTRODE STRUCTURE | January 2020 | May 2023 | Allow | 40 | 2 | 0 | No | No |
| 16689619 | MAGNETIC CORE FOR A CURRENT MEASUREMENT SENSOR | November 2019 | April 2023 | Abandon | 41 | 2 | 0 | No | No |
| 16612417 | MAGNETIC SENSOR | November 2019 | August 2023 | Abandon | 45 | 3 | 0 | No | No |
| 16677502 | CALIBRATION OF A HUMIDITY SENSOR DEVICE | November 2019 | October 2022 | Allow | 36 | 2 | 0 | No | No |
| 16578586 | FLUX GATE SENSOR CIRCUIT | September 2019 | October 2022 | Allow | 36 | 2 | 1 | Yes | No |
| 16550071 | TESTING HEAD WITH IMPROVED FREQUENCY PROPERTY | August 2019 | March 2023 | Allow | 42 | 5 | 0 | Yes | No |
| 15836534 | SEMICONDUCTOR INTEGRATED FLUXGATE DEVICE SHIELDED BY DISCRETE MAGNETIC PLATE | December 2017 | December 2022 | Allow | 60 | 2 | 1 | No | Yes |
| 14890652 | Closure for Measuring Voltage on Power-Carrying Conductors | November 2015 | April 2017 | Allow | 17 | 1 | 0 | Yes | No |
| 14890261 | INSPECTION CIRCUIT FOR MAGNETIC FIELD DETECTOR, AND INSPECTION METHOD FOR THE SAME | November 2015 | July 2017 | Allow | 20 | 0 | 0 | No | No |
| 14574398 | SEQUENTIAL ACCESS ASSEMBLY STRIP TEST ADAPTER | December 2014 | April 2017 | Allow | 28 | 1 | 0 | No | No |
| 14314706 | MAGNETOMETER UNIT FOR ELECTRONIC DEVICES | June 2014 | July 2017 | Allow | 36 | 1 | 0 | Yes | No |
| 14365873 | INDUCTIVE POWER TRANSFER SYSTEM AND METHOD | June 2014 | February 2025 | Allow | 60 | 7 | 1 | No | Yes |
| 14304035 | SYSTEM AND METHOD FOR DETECTING AND LOCALIZING NON-TECHNICAL LOSSES IN AN ELECTRICAL POWER DISTRIBUTION GRID | June 2014 | February 2018 | Allow | 44 | 4 | 0 | No | Yes |
| 14000025 | SYSTEM AND METHOD OF MONITORING THE WAVEFORM OF THE VOLTAGE OF THE ELECTRICAL GRID | November 2013 | February 2016 | Allow | 30 | 1 | 0 | No | No |
| 13834039 | SCREENING METHODOLOGY TO ELIMINATE WIRE SWEEP IN BOND AND ASSEMBLY MODULE PACKAGING | March 2013 | July 2016 | Allow | 40 | 4 | 0 | Yes | No |
| 13786825 | ELECTRICAL RESISTANCE MEASUREMENT APPARATUS AND ELECTRICAL RESISTANCE MEASUREMENT METHOD | March 2013 | March 2016 | Allow | 36 | 4 | 0 | No | No |
| 13767683 | INTEGRATED GALVANICALLY ISOLATED METER DEVICES AND METHODS FOR MAKING INTEGRATED GALVANICALLY ISOLATED METER DEVICES | February 2013 | October 2015 | Allow | 32 | 2 | 1 | No | No |
| 13752668 | MULTI-BRANCH CURRENT/VOLTAGE SENSOR ARRAY | January 2013 | December 2015 | Allow | 34 | 1 | 0 | Yes | No |
| 13653072 | INTEGRATED REAL POWER DETECTOR | October 2012 | October 2017 | Allow | 60 | 6 | 0 | Yes | No |
| 13647719 | RING OSCILLATOR TESTING WITH POWER SENSING RESISTOR | October 2012 | September 2015 | Allow | 35 | 3 | 1 | Yes | No |
| 13524516 | DISPLAY SUBSTRATE, MOTHER SUBSTRATE FOR MANUFACTURING THE SAME AND METHOD OF MANUFACTURING THE DISPLAY SUBSTRATE | June 2012 | October 2015 | Allow | 40 | 3 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner RODAK, LEE E.
With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 0.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner RODAK, LEE E works in Art Unit 2858 and has examined 44 patent applications in our dataset. With an allowance rate of 84.1%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 35 months.
Examiner RODAK, LEE E's allowance rate of 84.1% places them in the 60% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by RODAK, LEE E receive 2.23 office actions before reaching final disposition. This places the examiner in the 58% percentile for office actions issued. This examiner issues a slightly above-average number of office actions.
The median time to disposition (half-life) for applications examined by RODAK, LEE E is 35 months. This places the examiner in the 40% percentile for prosecution speed. Prosecution timelines are slightly slower than average with this examiner.
Conducting an examiner interview provides a +22.6% benefit to allowance rate for applications examined by RODAK, LEE E. This interview benefit is in the 66% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 25.0% of applications are subsequently allowed. This success rate is in the 41% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.
This examiner enters after-final amendments leading to allowance in 32.3% of cases where such amendments are filed. This entry rate is in the 49% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.
When applicants request a pre-appeal conference (PAC) with this examiner, 100.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 75% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences show above-average effectiveness with this examiner. If you have strong arguments, a PAC request may result in favorable reconsideration.
This examiner withdraws rejections or reopens prosecution in 60.0% of appeals filed. This is in the 36% percentile among all examiners. Of these withdrawals, 33.3% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner shows below-average willingness to reconsider rejections during appeals. Be prepared to fully prosecute appeals if filed.
When applicants file petitions regarding this examiner's actions, 50.0% are granted (fully or in part). This grant rate is in the 45% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 27% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 34% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.