Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18751610 | MAGNETIC SENSOR INCLUDING MAGNETIC DETECTION ELEMENT DISPOSED ON INCLINED SURFACE | June 2024 | May 2025 | Allow | 11 | 1 | 0 | Yes | No |
| 18748409 | DEVICE AND METHOD FOR MONITORING A TURN-OFF CAPABILITY | June 2024 | August 2024 | Allow | 2 | 0 | 0 | No | No |
| 18617002 | SOLENOID SYSTEM WITH POSITION AND TEMPERATURE DETECTION | March 2024 | April 2025 | Allow | 12 | 1 | 0 | Yes | No |
| 18444745 | PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO DEVICE UNDER TEST | February 2024 | December 2024 | Allow | 9 | 1 | 0 | No | No |
| 18442662 | SYSTEM FOR DETERMINING LEAKAGE CURRENT OF A FIELD EFFECT TRANSISTOR OVER TEMPERATURE | February 2024 | June 2025 | Allow | 16 | 3 | 0 | No | No |
| 18420736 | INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICS | January 2024 | June 2025 | Abandon | 17 | 1 | 0 | No | No |
| 18536029 | INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PARALLEL SOCKET ACTUATION | December 2023 | February 2025 | Allow | 14 | 1 | 0 | No | No |
| 18521585 | Enclosure Detection for Reliable Optical Failsafe | November 2023 | February 2025 | Allow | 15 | 1 | 0 | No | No |
| 18517012 | METHOD AND SYSTEM FOR OPTICAL CALCULATION IN RELAY PROTECTION BASED ON THE FARADAY MAGNETO-OPTICAL ROTATION EFFECT | November 2023 | September 2024 | Allow | 10 | 1 | 0 | No | No |
| 18559570 | CONTACT MONITORING APPARATUS FOR A THREE-POLE CHANGEOVER CONTACT | November 2023 | January 2025 | Allow | 14 | 2 | 0 | No | No |
| 18500127 | AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AND AN AUTOMATED TEST SYSTEM WITH AN AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK | November 2023 | February 2025 | Allow | 15 | 1 | 0 | Yes | No |
| 18485863 | RUBBER SOCKET WITH BUILT-IN COMPONENT | October 2023 | July 2025 | Allow | 21 | 0 | 0 | No | No |
| 18456010 | DEVICE FOR AND METHOD OF FREQUENCY TESTING PRINTED CIRCUIT BOARD UNDER THERMAL STRESS | August 2023 | May 2025 | Allow | 21 | 0 | 0 | Yes | No |
| 18455070 | THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THERMAL CONTROL OF ZONES | August 2023 | April 2024 | Allow | 8 | 3 | 0 | Yes | No |
| 18237886 | Voltage meter for measuring signal inside integrated circuit | August 2023 | April 2025 | Allow | 19 | 0 | 0 | No | No |
| 18454404 | TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUIT | August 2023 | April 2025 | Allow | 20 | 0 | 0 | No | No |
| 18259816 | INSPECTION DEVICE FOR ROTARY ELECTRIC MACHINE, INSPECTION SYSTEM FOR ROTARY ELECTRIC MACHINE, INSPECTION METHOD FOR ROTARY ELECTRIC MACHINE, AND ROTARY ELECTRIC MACHINE TO BE INSPECTED USING INSPECTION DEVICE | June 2023 | June 2025 | Allow | 24 | 1 | 0 | No | No |
| 18341860 | SYSTEM FOR TESTING PERFORMANCE OF DEVICE IN TEMPERATURE LOAD TEST | June 2023 | May 2025 | Allow | 23 | 1 | 0 | No | No |
| 18337973 | SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A SENSOR AND HUB | June 2023 | January 2024 | Allow | 7 | 1 | 1 | No | No |
| 18332344 | Improved Thermal and Electrical Conductivity Between Metal Contacts Utilizing Spring Pin Connectors | June 2023 | May 2025 | Allow | 23 | 1 | 0 | Yes | No |
| 18207916 | SYSTEM FOR MEASURING A THICKNESS OF A LAYER COATED ON A BODY | June 2023 | June 2025 | Allow | 24 | 1 | 0 | No | No |
| 18331472 | ELECTRICAL TESTING METHOD FOR SEMICONDUCTOR DEVICE | June 2023 | March 2025 | Allow | 21 | 0 | 0 | No | No |
| 18330222 | PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SEMICONDUCTOR TEST SYSTEM | June 2023 | February 2025 | Allow | 20 | 1 | 0 | No | No |
| 18327148 | DIRECT LIQUID COOLING SYSTEM FOR ELECTRONIC DEVICES IN SOCKETS, METHOD, AND ELECTRONIC DEVICE TESTING APPARATUS COMPRISING THE SAME | June 2023 | May 2025 | Allow | 24 | 1 | 0 | No | No |
| 18255145 | ENERGIZATION INSPECTION APPARATUS, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND ENERGIZATION METHOD | May 2023 | April 2025 | Allow | 23 | 0 | 1 | No | No |
| 18326030 | ELECTRONIC DEVICE | May 2023 | November 2024 | Allow | 17 | 1 | 0 | No | No |
| 18038986 | DEVICE AND METHOD FOR MEASURING VOLTAGE BY USING OPTICAL ELEMENT | May 2023 | March 2025 | Allow | 22 | 1 | 0 | No | No |
| 18317100 | TESTING DEVICE AND TESTING METHOD THEREOF | May 2023 | May 2025 | Allow | 24 | 1 | 0 | No | No |
| 18306616 | POWER DETECTOR | April 2023 | July 2024 | Allow | 15 | 0 | 0 | No | No |
| 18303852 | INTEGRATED CURRENT MONITOR USING VARIABLE DRAIN-TO-SOURCE VOLTAGES | April 2023 | April 2025 | Allow | 23 | 1 | 1 | No | No |
| 18299088 | CAPACITANCE MEASUREMENT CIRCUIT | April 2023 | March 2025 | Allow | 23 | 0 | 0 | No | No |
| 18130714 | LIMITING CIRCUITRY WITH CONTROLLED PARALLEL DIRECT CURRENT-DIRECT CURRENT-CONVERTERS | April 2023 | February 2025 | Allow | 23 | 1 | 0 | No | No |
| 18193114 | CALIBRATING A BATTERY OF AN INFORMATION HANDLING SYSTEM | March 2023 | December 2024 | Allow | 20 | 0 | 0 | No | No |
| 18028788 | APPARATUS FOR OPTIMISING A SEQUENCE OF MAGNETIC RESONANCE (MR) SCANS OF A MR EXAM | March 2023 | February 2025 | Allow | 22 | 0 | 0 | Yes | No |
| 18191601 | CAPACITIVE NON-CONTACT VOLTAGE SENSING METHOD AND APPARATUS | March 2023 | November 2024 | Allow | 20 | 1 | 0 | No | No |
| 18028734 | DEEP ELECTROMAGNETIC REBAR PROBE | March 2023 | April 2025 | Allow | 24 | 1 | 0 | No | No |
| 18125537 | Monitoring Semiconductor Reliability and Predicting Device Failure During Device Life | March 2023 | December 2024 | Allow | 20 | 3 | 0 | Yes | No |
| 18186520 | CURRENT SENSOR SYSTEM | March 2023 | June 2025 | Allow | 27 | 2 | 0 | Yes | No |
| 18172418 | CAVITY ENHANCED COUPLING LASER FOR INCREASED ATOMIC RECEIVER SENSITIVITY | February 2023 | January 2025 | Allow | 23 | 1 | 0 | No | No |
| 18171796 | METHOD AND APPARATUS FOR HOMOGENIZING MAGNETOSTATIC FIELD GENERATED FROM SUPERCONDUCTING MAGNET | February 2023 | January 2025 | Allow | 23 | 1 | 0 | No | No |
| 18171951 | Low-Frequency Oscillator Monitoring Circuit | February 2023 | September 2024 | Allow | 19 | 0 | 0 | No | No |
| 18166572 | MAGNETIC SENSOR AND INSPECTION DEVICE | February 2023 | April 2025 | Allow | 26 | 1 | 1 | Yes | No |
| 18019286 | MAGNETIC GRADIOMETER BASED ON MAGNETIC TUNNEL JUNCTIONS IN MAGNETIC VORTEX STATE (VORTEX MTJ) | February 2023 | October 2024 | Allow | 21 | 0 | 0 | No | No |
| 18105103 | WAFER INSPECTION SYSTEM AND ANNULAR SEAT THEREOF | February 2023 | September 2024 | Allow | 20 | 0 | 0 | No | No |
| 18101655 | VEHICLE POWER SUPPLY CIRCUIT MONITORING SYSTEM AND VEHICLE POWER SUPPLY CIRCUIT MONITORING METHOD | January 2023 | September 2024 | Allow | 20 | 1 | 0 | No | No |
| 18101224 | Method and apparatus for monitoring operational integrity of a sensor and processing chain | January 2023 | August 2024 | Allow | 19 | 1 | 0 | Yes | No |
| 18158895 | Electrometry by Optical Charge Conversion of Defects in the Solid-State | January 2023 | May 2024 | Allow | 15 | 0 | 0 | No | No |
| 18100535 | THERMAL MANAGEMENT SYSTEM FOR A TEST-AND-MEASUREMENT PROBE | January 2023 | February 2025 | Allow | 24 | 1 | 0 | No | No |
| 18100406 | ELECTRIC POWER CIRCUIT TESTING DEVICE, SYSTEM, AND METHOD | January 2023 | November 2023 | Allow | 9 | 1 | 1 | No | No |
| 18017251 | CURRENT TRANSDUCER | January 2023 | September 2024 | Allow | 20 | 1 | 0 | Yes | No |
| 18005880 | CONTACT PROBE FOR A PROBE HEAD | January 2023 | April 2025 | Abandon | 27 | 0 | 1 | No | No |
| 18155550 | ALTERNATING-CURRENT ENERGY DETECTION APPARATUS | January 2023 | June 2025 | Abandon | 29 | 2 | 0 | No | No |
| 18152189 | SELF-CALIBRATING MAGNETORESISTANCE-BASED MAGNETIC FIELD SENSORS | January 2023 | December 2024 | Allow | 23 | 1 | 1 | No | No |
| 18093669 | TWO-DOMAIN TWO-STAGE SENSING FRONT-END CIRCUITS AND SYSTEMS | January 2023 | August 2024 | Allow | 19 | 2 | 0 | Yes | No |
| 18149575 | END LAUNCH TERMINATION DEVICES | January 2023 | August 2024 | Allow | 20 | 0 | 0 | No | No |
| 18091814 | TEMPERATURE CONTROL DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TEST APPARATUS, AND DUT TEMPERATURE CONTROL METHOD | December 2022 | July 2025 | Allow | 30 | 3 | 0 | No | No |
| 18148439 | Current Sampling System and Method for Magnetic Component, Magnetic Component, and Power Converter | December 2022 | November 2024 | Allow | 22 | 1 | 0 | No | No |
| 18147878 | APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTION | December 2022 | September 2024 | Allow | 21 | 1 | 0 | Yes | No |
| 18089516 | AUTONOMOUS DETECTION OF MEMORY INSERTION INTO TEST EQUIPMENT WITHOUT REQUIRING POWER TO THE TESTER UNIT | December 2022 | September 2024 | Allow | 20 | 2 | 0 | Yes | No |
| 18067351 | POSITION MEASURING DEVICE FOR A ROTARY ELECTRIC MACHINE STATOR UNIT | December 2022 | January 2025 | Abandon | 25 | 1 | 0 | No | No |
| 18081917 | Maximizing Information Gain From Pipe Inspection Inversion | December 2022 | November 2024 | Allow | 23 | 1 | 0 | Yes | No |
| 18081489 | CURRENT SENSOR HAVING SHIELDING ARRANGEMENT | December 2022 | November 2024 | Allow | 23 | 1 | 0 | No | No |
| 18001795 | DETERMINING RESISTANCE IN AN ELECTRIC CIRCUIT | December 2022 | June 2025 | Allow | 30 | 3 | 0 | Yes | No |
| 18001706 | DEVICE AND METHOD FOR DETERMINING CONNECTION DEFECTS OF HIGH-VOLTAGE CABLE CROSS-BONDED GROUNDING SYSTEM | December 2022 | November 2024 | Allow | 23 | 1 | 0 | No | No |
| 18079489 | TEST CIRCUIT MONITORING PBTI AND OPERATING METHOD THEREOF | December 2022 | June 2024 | Allow | 18 | 0 | 0 | No | No |
| 18000058 | METHOD OF DETERMINING LINE FAULT OF POWER SYSTEM | November 2022 | October 2024 | Allow | 23 | 1 | 0 | Yes | No |
| 18058858 | CURRENT MEASUREMENT CIRCUIT WITH MULTIPLE OPERATION MODES | November 2022 | May 2024 | Allow | 17 | 1 | 0 | Yes | No |
| 17992112 | LINEAR DISCRETE RDSON TEMPERATURE VGS COMPENSATION | November 2022 | April 2024 | Allow | 16 | 0 | 0 | No | No |
| 17990036 | GUIDE PLATE STRUCTURE HAVING GUIDE PLATES WITH THROUGH HOLES AND PROBE ARRAY HAVING GUIDE PLATE STRUCTURE | November 2022 | March 2025 | Allow | 27 | 2 | 1 | No | No |
| 18055700 | DEVICE FOR TESTING A GROUP OF RADIO-FREQUENCY (RF) CHIP MODULES AND METHOD FOR USING THE SAME | November 2022 | February 2024 | Allow | 15 | 0 | 0 | No | No |
| 18055417 | TESTING BOARD HAVING RF CONNECTOR SETS | November 2022 | October 2024 | Allow | 23 | 2 | 0 | No | No |
| 17985617 | METHOD FOR TESTING AN INTEGRATED CIRCUIT (IC) DEVICE AT A TESTING TEMPERATURE | November 2022 | April 2024 | Allow | 17 | 0 | 0 | No | No |
| 18053535 | INTEGRATED PHOTONICS MAGNETOMETER BASED ON A NONLINEAR DIAMOND-CONTAINING RESONATOR | November 2022 | September 2024 | Allow | 22 | 0 | 0 | No | No |
| 18050928 | STATE DETECTION CIRCUIT FOR DETECTING TRI-STATE AND STATE DETECTION METHOD THEREOF | October 2022 | August 2024 | Allow | 21 | 1 | 0 | No | No |
| 18048836 | TEST SYSTEM WITH A THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS AND ONE OR MORE COLD PLATES FOR INDEPENDENT CONTROL OF ZONES | October 2022 | April 2023 | Allow | 5 | 1 | 0 | Yes | No |
| 18047174 | REDUCED OFFSET ERROR CONFIGURATION FOR A ROTARY INDUCTIVE SENSOR | October 2022 | December 2024 | Allow | 26 | 2 | 0 | No | No |
| 17966456 | METHOD AND APPARATUS FOR DIAGNOSING ELECTRONIC APPARATUS | October 2022 | July 2024 | Allow | 22 | 1 | 0 | No | No |
| 18046808 | REDUCING ERROR IN ESTIMATED ANGULAR POSITION OF A ROTOR OF A MOTOR | October 2022 | October 2024 | Allow | 24 | 1 | 0 | No | No |
| 17964628 | DISPLAY METHODS, TECHNIQUES, AND APPARATUS FOR INDICATING A CENTERLINE OF AN OBSCURED FEATURE | October 2022 | August 2024 | Allow | 22 | 1 | 0 | Yes | No |
| 17961607 | MAGNETIC SENSOR UNIT FOR ACCURATELY DETECTING CHANGE OF MAGNETIC FIELD | October 2022 | August 2024 | Allow | 22 | 1 | 0 | Yes | No |
| 17995603 | METHOD FOR THE DETECTION OF CABLE SPACING IN GREEN TIRE | October 2022 | June 2024 | Allow | 20 | 0 | 0 | No | No |
| 17995574 | DETECTION DEVICE AND DETECTION METHOD | October 2022 | May 2024 | Allow | 20 | 0 | 0 | No | No |
| 17954143 | WEAR MEASUREMENT DEVICE AND WEAR MEASUREMENT METHOD FOR TIRE | September 2022 | June 2024 | Allow | 21 | 1 | 0 | Yes | No |
| 17934016 | MEASUREMENT SYSTEM AND MEASUREMENT METHOD | September 2022 | March 2024 | Allow | 17 | 0 | 0 | Yes | No |
| 17949363 | METHOD OF DETECTING FAILURE OF ANTIPARALLEL THYRISTOR, AND POWER CONTROL DEVICE | September 2022 | May 2024 | Allow | 19 | 1 | 0 | No | No |
| 17947770 | MAGNETIC SENSOR | September 2022 | March 2024 | Allow | 18 | 0 | 0 | No | No |
| 17947461 | TEMPERATURE DETECTION DEVICE AND METHOD USING SETS OF DC VOLTAGES | September 2022 | October 2024 | Allow | 25 | 4 | 1 | Yes | No |
| 17906292 | ABSOLUTE ENCODER | September 2022 | April 2024 | Allow | 19 | 0 | 0 | No | No |
| 17931171 | SPARK DISCHARGE DETECTION DEVICE HAVING WAVEFORM EXTENSION CIRCUIT AND SPARK DISCHARGE DETECTION METHOD | September 2022 | February 2024 | Allow | 17 | 1 | 0 | Yes | No |
| 17931148 | TEMPERATURE CONTROL AND METHOD FOR DEVICES UNDER TEST AND IMAGE SENSOR-TESTING APPARATUS HAVING THE SYSTEM | September 2022 | January 2024 | Allow | 16 | 1 | 0 | No | No |
| 17910353 | INSPECTION JIG AND BOARD INSPECTION APPARATUS INCLUDING THE SAME | September 2022 | January 2024 | Allow | 16 | 0 | 0 | No | No |
| 17896094 | MEASUREMENT CIRCUIT AND MEASUREMENT METHOD FOR MEASURING AND UPDATING A VOLTAGE RESOLUTION OF AN ELECTRONIC ATOMIZER CIRCUIT | August 2022 | March 2023 | Allow | 6 | 0 | 0 | No | No |
| 17895438 | DETECTOR | August 2022 | June 2024 | Allow | 22 | 1 | 0 | Yes | No |
| 17894837 | ENVIRONMENTAL SENSOR CIRCUIT HAVING A CAPACITIVE PROXIMITY SENSOR AND MAGNETIC FIELD PROBE | August 2022 | June 2024 | Allow | 22 | 1 | 0 | Yes | No |
| 17893039 | DISPLAY DEVICE INCLUDING CRACK DETECTION PATTERNS | August 2022 | July 2024 | Allow | 23 | 1 | 0 | Yes | No |
| 17885492 | BATTERY INFORMATION PROCESSING SYSTEM AND BATTERY INFORMATION PROCESSING METHOD TO IDENTIFY BATTERIES IN ACCORDANCE WITH A SPECIFICATION | August 2022 | July 2024 | Allow | 24 | 1 | 0 | No | No |
| 17797430 | DEVICE HOUSING, IMAGE READING DEVICE, AND ELECTROSTATIC CAPACITANCE DETECTION DEVICE INCLUDING A GROUND AUXILIARY CONDUCTOR DISPOSED OVER A LEVEL DIFFERENCE EXISTING BETWEEN A PLANE INCLUDING AN ELECTRICALLY CONDUCTIVE SURFACE AND A PLANE INCLUDING A GROUND CONDUCTOR | August 2022 | May 2025 | Allow | 33 | 1 | 0 | Yes | No |
| 17880182 | A CIRCUIT FOR TEMPERATURE STRESS TEST FOR MEMORY CHIPS | August 2022 | September 2023 | Allow | 14 | 1 | 0 | Yes | No |
| 17866729 | METHOD FOR MONITORING A PROTECTIVE DEVICE THAT INCLUDES A SERIES CIRCUIT OF THYRISTORS CONNECTED IN PARALLEL WITH AN ELECTRICAL DEVICE TO BE PROTECTED | July 2022 | January 2024 | Allow | 18 | 2 | 0 | No | No |
| 17813203 | ENHANCED DIRECT CURRENT (DC) BUILT-IN-SELF-TEST (BIST) COVERAGE FOR OPTICAL ENGINES AND ADVANCED PACKAGING | July 2022 | February 2024 | Allow | 19 | 1 | 1 | Yes | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner NGUYEN, VINH P.
With a 100.0% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 62.5% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner NGUYEN, VINH P works in Art Unit 2858 and has examined 569 patent applications in our dataset. With an allowance rate of 90.2%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 26 months.
Examiner NGUYEN, VINH P's allowance rate of 90.2% places them in the 71% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by NGUYEN, VINH P receive 1.23 office actions before reaching final disposition. This places the examiner in the 21% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by NGUYEN, VINH P is 26 months. This places the examiner in the 63% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +13.1% benefit to allowance rate for applications examined by NGUYEN, VINH P. This interview benefit is in the 54% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 40.5% of applications are subsequently allowed. This success rate is in the 90% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 49.5% of cases where such amendments are filed. This entry rate is in the 69% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 200.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 96% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 87.5% of appeals filed. This is in the 78% percentile among all examiners. Of these withdrawals, 57.1% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 18.5% are granted (fully or in part). This grant rate is in the 10% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 5.3% of allowed cases (in the 90% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 14.8% of allowed cases (in the 91% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.