USPTO Examiner NGUYEN VINH P - Art Unit 2858

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18751610MAGNETIC SENSOR INCLUDING MAGNETIC DETECTION ELEMENT DISPOSED ON INCLINED SURFACEJune 2024May 2025Allow1110YesNo
18748409DEVICE AND METHOD FOR MONITORING A TURN-OFF CAPABILITYJune 2024August 2024Allow200NoNo
18617002SOLENOID SYSTEM WITH POSITION AND TEMPERATURE DETECTIONMarch 2024April 2025Allow1210YesNo
18444745PROBE STATION CAPABLE OF MAINTAINING STABLE AND ACCURATE CONTACT TO DEVICE UNDER TESTFebruary 2024December 2024Allow910NoNo
18442662SYSTEM FOR DETERMINING LEAKAGE CURRENT OF A FIELD EFFECT TRANSISTOR OVER TEMPERATUREFebruary 2024June 2025Allow1630NoNo
18420736INTEGRATED CIRCUIT PACKAGE WITH INTERNAL CIRCUITRY TO DETECT EXTERNAL COMPONENT PARAMETERS AND PARASITICSJanuary 2024June 2025Abandon1710NoNo
18536029INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PARALLEL SOCKET ACTUATIONDecember 2023February 2025Allow1410NoNo
18521585Enclosure Detection for Reliable Optical FailsafeNovember 2023February 2025Allow1510NoNo
18517012METHOD AND SYSTEM FOR OPTICAL CALCULATION IN RELAY PROTECTION BASED ON THE FARADAY MAGNETO-OPTICAL ROTATION EFFECTNovember 2023September 2024Allow1010NoNo
18559570CONTACT MONITORING APPARATUS FOR A THREE-POLE CHANGEOVER CONTACTNovember 2023January 2025Allow1420NoNo
18500127AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACK AND AN AUTOMATED TEST SYSTEM WITH AN AUTOMATED TEST EQUIPMENT COMPRISING A DEVICE UNDER TEST LOOPBACKNovember 2023February 2025Allow1510YesNo
18485863RUBBER SOCKET WITH BUILT-IN COMPONENTOctober 2023July 2025Allow2100NoNo
18456010DEVICE FOR AND METHOD OF FREQUENCY TESTING PRINTED CIRCUIT BOARD UNDER THERMAL STRESSAugust 2023May 2025Allow2100YesNo
18455070THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THERMAL CONTROL OF ZONESAugust 2023April 2024Allow830YesNo
18237886Voltage meter for measuring signal inside integrated circuitAugust 2023April 2025Allow1900NoNo
18454404TEG CIRCUIT, SEMICONDUCTOR DEVICE, AND TEST METHOD OF THE TEG CIRCUITAugust 2023April 2025Allow2000NoNo
18259816INSPECTION DEVICE FOR ROTARY ELECTRIC MACHINE, INSPECTION SYSTEM FOR ROTARY ELECTRIC MACHINE, INSPECTION METHOD FOR ROTARY ELECTRIC MACHINE, AND ROTARY ELECTRIC MACHINE TO BE INSPECTED USING INSPECTION DEVICEJune 2023June 2025Allow2410NoNo
18341860SYSTEM FOR TESTING PERFORMANCE OF DEVICE IN TEMPERATURE LOAD TESTJune 2023May 2025Allow2310NoNo
18337973SYSTEMS AND METHODS FOR TESTING FUNCTIONALITY AND PERFORMANCE OF A SENSOR AND HUBJune 2023January 2024Allow711NoNo
18332344Improved Thermal and Electrical Conductivity Between Metal Contacts Utilizing Spring Pin ConnectorsJune 2023May 2025Allow2310YesNo
18207916SYSTEM FOR MEASURING A THICKNESS OF A LAYER COATED ON A BODYJune 2023June 2025Allow2410NoNo
18331472ELECTRICAL TESTING METHOD FOR SEMICONDUCTOR DEVICEJune 2023March 2025Allow2100NoNo
18330222PASSIVE CARRIER-BASED DEVICE DELIVERY FOR SLOT-BASED HIGH-VOLUME SEMICONDUCTOR TEST SYSTEMJune 2023February 2025Allow2010NoNo
18327148DIRECT LIQUID COOLING SYSTEM FOR ELECTRONIC DEVICES IN SOCKETS, METHOD, AND ELECTRONIC DEVICE TESTING APPARATUS COMPRISING THE SAMEJune 2023May 2025Allow2410NoNo
18255145ENERGIZATION INSPECTION APPARATUS, METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND ENERGIZATION METHODMay 2023April 2025Allow2301NoNo
18326030ELECTRONIC DEVICEMay 2023November 2024Allow1710NoNo
18038986DEVICE AND METHOD FOR MEASURING VOLTAGE BY USING OPTICAL ELEMENTMay 2023March 2025Allow2210NoNo
18317100TESTING DEVICE AND TESTING METHOD THEREOFMay 2023May 2025Allow2410NoNo
18306616POWER DETECTORApril 2023July 2024Allow1500NoNo
18303852INTEGRATED CURRENT MONITOR USING VARIABLE DRAIN-TO-SOURCE VOLTAGESApril 2023April 2025Allow2311NoNo
18299088CAPACITANCE MEASUREMENT CIRCUITApril 2023March 2025Allow2300NoNo
18130714LIMITING CIRCUITRY WITH CONTROLLED PARALLEL DIRECT CURRENT-DIRECT CURRENT-CONVERTERSApril 2023February 2025Allow2310NoNo
18193114CALIBRATING A BATTERY OF AN INFORMATION HANDLING SYSTEMMarch 2023December 2024Allow2000NoNo
18028788APPARATUS FOR OPTIMISING A SEQUENCE OF MAGNETIC RESONANCE (MR) SCANS OF A MR EXAMMarch 2023February 2025Allow2200YesNo
18191601CAPACITIVE NON-CONTACT VOLTAGE SENSING METHOD AND APPARATUSMarch 2023November 2024Allow2010NoNo
18028734DEEP ELECTROMAGNETIC REBAR PROBEMarch 2023April 2025Allow2410NoNo
18125537Monitoring Semiconductor Reliability and Predicting Device Failure During Device LifeMarch 2023December 2024Allow2030YesNo
18186520CURRENT SENSOR SYSTEMMarch 2023June 2025Allow2720YesNo
18172418CAVITY ENHANCED COUPLING LASER FOR INCREASED ATOMIC RECEIVER SENSITIVITYFebruary 2023January 2025Allow2310NoNo
18171796METHOD AND APPARATUS FOR HOMOGENIZING MAGNETOSTATIC FIELD GENERATED FROM SUPERCONDUCTING MAGNETFebruary 2023January 2025Allow2310NoNo
18171951Low-Frequency Oscillator Monitoring CircuitFebruary 2023September 2024Allow1900NoNo
18166572MAGNETIC SENSOR AND INSPECTION DEVICEFebruary 2023April 2025Allow2611YesNo
18019286MAGNETIC GRADIOMETER BASED ON MAGNETIC TUNNEL JUNCTIONS IN MAGNETIC VORTEX STATE (VORTEX MTJ)February 2023October 2024Allow2100NoNo
18105103WAFER INSPECTION SYSTEM AND ANNULAR SEAT THEREOFFebruary 2023September 2024Allow2000NoNo
18101655VEHICLE POWER SUPPLY CIRCUIT MONITORING SYSTEM AND VEHICLE POWER SUPPLY CIRCUIT MONITORING METHODJanuary 2023September 2024Allow2010NoNo
18101224Method and apparatus for monitoring operational integrity of a sensor and processing chainJanuary 2023August 2024Allow1910YesNo
18158895Electrometry by Optical Charge Conversion of Defects in the Solid-StateJanuary 2023May 2024Allow1500NoNo
18100535THERMAL MANAGEMENT SYSTEM FOR A TEST-AND-MEASUREMENT PROBEJanuary 2023February 2025Allow2410NoNo
18100406ELECTRIC POWER CIRCUIT TESTING DEVICE, SYSTEM, AND METHODJanuary 2023November 2023Allow911NoNo
18017251CURRENT TRANSDUCERJanuary 2023September 2024Allow2010YesNo
18005880CONTACT PROBE FOR A PROBE HEADJanuary 2023April 2025Abandon2701NoNo
18155550ALTERNATING-CURRENT ENERGY DETECTION APPARATUSJanuary 2023June 2025Abandon2920NoNo
18152189SELF-CALIBRATING MAGNETORESISTANCE-BASED MAGNETIC FIELD SENSORSJanuary 2023December 2024Allow2311NoNo
18093669TWO-DOMAIN TWO-STAGE SENSING FRONT-END CIRCUITS AND SYSTEMSJanuary 2023August 2024Allow1920YesNo
18149575END LAUNCH TERMINATION DEVICESJanuary 2023August 2024Allow2000NoNo
18091814TEMPERATURE CONTROL DEVICE, ELECTRONIC COMPONENT HANDLING APPARATUS, ELECTRONIC COMPONENT TEST APPARATUS, AND DUT TEMPERATURE CONTROL METHODDecember 2022July 2025Allow3030NoNo
18148439Current Sampling System and Method for Magnetic Component, Magnetic Component, and Power ConverterDecember 2022November 2024Allow2210NoNo
18147878APPARATUS AND METHOD FOR TIN WHISKER ISOLATION AND DETECTIONDecember 2022September 2024Allow2110YesNo
18089516AUTONOMOUS DETECTION OF MEMORY INSERTION INTO TEST EQUIPMENT WITHOUT REQUIRING POWER TO THE TESTER UNITDecember 2022September 2024Allow2020YesNo
18067351POSITION MEASURING DEVICE FOR A ROTARY ELECTRIC MACHINE STATOR UNITDecember 2022January 2025Abandon2510NoNo
18081917Maximizing Information Gain From Pipe Inspection InversionDecember 2022November 2024Allow2310YesNo
18081489CURRENT SENSOR HAVING SHIELDING ARRANGEMENTDecember 2022November 2024Allow2310NoNo
18001795DETERMINING RESISTANCE IN AN ELECTRIC CIRCUITDecember 2022June 2025Allow3030YesNo
18001706DEVICE AND METHOD FOR DETERMINING CONNECTION DEFECTS OF HIGH-VOLTAGE CABLE CROSS-BONDED GROUNDING SYSTEMDecember 2022November 2024Allow2310NoNo
18079489TEST CIRCUIT MONITORING PBTI AND OPERATING METHOD THEREOFDecember 2022June 2024Allow1800NoNo
18000058METHOD OF DETERMINING LINE FAULT OF POWER SYSTEMNovember 2022October 2024Allow2310YesNo
18058858CURRENT MEASUREMENT CIRCUIT WITH MULTIPLE OPERATION MODESNovember 2022May 2024Allow1710YesNo
17992112LINEAR DISCRETE RDSON TEMPERATURE VGS COMPENSATIONNovember 2022April 2024Allow1600NoNo
17990036GUIDE PLATE STRUCTURE HAVING GUIDE PLATES WITH THROUGH HOLES AND PROBE ARRAY HAVING GUIDE PLATE STRUCTURENovember 2022March 2025Allow2721NoNo
18055700DEVICE FOR TESTING A GROUP OF RADIO-FREQUENCY (RF) CHIP MODULES AND METHOD FOR USING THE SAMENovember 2022February 2024Allow1500NoNo
18055417TESTING BOARD HAVING RF CONNECTOR SETSNovember 2022October 2024Allow2320NoNo
17985617METHOD FOR TESTING AN INTEGRATED CIRCUIT (IC) DEVICE AT A TESTING TEMPERATURENovember 2022April 2024Allow1700NoNo
18053535INTEGRATED PHOTONICS MAGNETOMETER BASED ON A NONLINEAR DIAMOND-CONTAINING RESONATORNovember 2022September 2024Allow2200NoNo
18050928STATE DETECTION CIRCUIT FOR DETECTING TRI-STATE AND STATE DETECTION METHOD THEREOFOctober 2022August 2024Allow2110NoNo
18048836TEST SYSTEM WITH A THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS AND ONE OR MORE COLD PLATES FOR INDEPENDENT CONTROL OF ZONESOctober 2022April 2023Allow510YesNo
18047174REDUCED OFFSET ERROR CONFIGURATION FOR A ROTARY INDUCTIVE SENSOROctober 2022December 2024Allow2620NoNo
17966456METHOD AND APPARATUS FOR DIAGNOSING ELECTRONIC APPARATUSOctober 2022July 2024Allow2210NoNo
18046808REDUCING ERROR IN ESTIMATED ANGULAR POSITION OF A ROTOR OF A MOTOROctober 2022October 2024Allow2410NoNo
17964628DISPLAY METHODS, TECHNIQUES, AND APPARATUS FOR INDICATING A CENTERLINE OF AN OBSCURED FEATUREOctober 2022August 2024Allow2210YesNo
17961607MAGNETIC SENSOR UNIT FOR ACCURATELY DETECTING CHANGE OF MAGNETIC FIELDOctober 2022August 2024Allow2210YesNo
17995603METHOD FOR THE DETECTION OF CABLE SPACING IN GREEN TIREOctober 2022June 2024Allow2000NoNo
17995574DETECTION DEVICE AND DETECTION METHODOctober 2022May 2024Allow2000NoNo
17954143WEAR MEASUREMENT DEVICE AND WEAR MEASUREMENT METHOD FOR TIRESeptember 2022June 2024Allow2110YesNo
17934016MEASUREMENT SYSTEM AND MEASUREMENT METHODSeptember 2022March 2024Allow1700YesNo
17949363METHOD OF DETECTING FAILURE OF ANTIPARALLEL THYRISTOR, AND POWER CONTROL DEVICESeptember 2022May 2024Allow1910NoNo
17947770MAGNETIC SENSORSeptember 2022March 2024Allow1800NoNo
17947461TEMPERATURE DETECTION DEVICE AND METHOD USING SETS OF DC VOLTAGESSeptember 2022October 2024Allow2541YesNo
17906292ABSOLUTE ENCODERSeptember 2022April 2024Allow1900NoNo
17931171SPARK DISCHARGE DETECTION DEVICE HAVING WAVEFORM EXTENSION CIRCUIT AND SPARK DISCHARGE DETECTION METHODSeptember 2022February 2024Allow1710YesNo
17931148TEMPERATURE CONTROL AND METHOD FOR DEVICES UNDER TEST AND IMAGE SENSOR-TESTING APPARATUS HAVING THE SYSTEMSeptember 2022January 2024Allow1610NoNo
17910353INSPECTION JIG AND BOARD INSPECTION APPARATUS INCLUDING THE SAMESeptember 2022January 2024Allow1600NoNo
17896094MEASUREMENT CIRCUIT AND MEASUREMENT METHOD FOR MEASURING AND UPDATING A VOLTAGE RESOLUTION OF AN ELECTRONIC ATOMIZER CIRCUITAugust 2022March 2023Allow600NoNo
17895438DETECTORAugust 2022June 2024Allow2210YesNo
17894837ENVIRONMENTAL SENSOR CIRCUIT HAVING A CAPACITIVE PROXIMITY SENSOR AND MAGNETIC FIELD PROBEAugust 2022June 2024Allow2210YesNo
17893039DISPLAY DEVICE INCLUDING CRACK DETECTION PATTERNSAugust 2022July 2024Allow2310YesNo
17885492BATTERY INFORMATION PROCESSING SYSTEM AND BATTERY INFORMATION PROCESSING METHOD TO IDENTIFY BATTERIES IN ACCORDANCE WITH A SPECIFICATIONAugust 2022July 2024Allow2410NoNo
17797430DEVICE HOUSING, IMAGE READING DEVICE, AND ELECTROSTATIC CAPACITANCE DETECTION DEVICE INCLUDING A GROUND AUXILIARY CONDUCTOR DISPOSED OVER A LEVEL DIFFERENCE EXISTING BETWEEN A PLANE INCLUDING AN ELECTRICALLY CONDUCTIVE SURFACE AND A PLANE INCLUDING A GROUND CONDUCTORAugust 2022May 2025Allow3310YesNo
17880182A CIRCUIT FOR TEMPERATURE STRESS TEST FOR MEMORY CHIPSAugust 2022September 2023Allow1410YesNo
17866729METHOD FOR MONITORING A PROTECTIVE DEVICE THAT INCLUDES A SERIES CIRCUIT OF THYRISTORS CONNECTED IN PARALLEL WITH AN ELECTRICAL DEVICE TO BE PROTECTEDJuly 2022January 2024Allow1820NoNo
17813203ENHANCED DIRECT CURRENT (DC) BUILT-IN-SELF-TEST (BIST) COVERAGE FOR OPTICAL ENGINES AND ADVANCED PACKAGINGJuly 2022February 2024Allow1911YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner NGUYEN, VINH P.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
1
Examiner Affirmed
0
(0.0%)
Examiner Reversed
1
(100.0%)
Reversal Percentile
95.8%
Higher than average

What This Means

With a 100.0% reversal rate, the PTAB has reversed the examiner's rejections more often than affirming them. This reversal rate is in the top 25% across the USPTO, indicating that appeals are more successful here than in most other areas.

Strategic Value of Filing an Appeal

Total Appeal Filings
8
Allowed After Appeal Filing
5
(62.5%)
Not Allowed After Appeal Filing
3
(37.5%)
Filing Benefit Percentile
89.8%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 62.5% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Strategic Recommendations

Appeals to PTAB show good success rates. If you have a strong case on the merits, consider fully prosecuting the appeal to a Board decision.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner NGUYEN, VINH P - Prosecution Strategy Guide

Executive Summary

Examiner NGUYEN, VINH P works in Art Unit 2858 and has examined 569 patent applications in our dataset. With an allowance rate of 90.2%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 26 months.

Allowance Patterns

Examiner NGUYEN, VINH P's allowance rate of 90.2% places them in the 71% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by NGUYEN, VINH P receive 1.23 office actions before reaching final disposition. This places the examiner in the 21% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by NGUYEN, VINH P is 26 months. This places the examiner in the 63% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +13.1% benefit to allowance rate for applications examined by NGUYEN, VINH P. This interview benefit is in the 54% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 40.5% of applications are subsequently allowed. This success rate is in the 90% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 49.5% of cases where such amendments are filed. This entry rate is in the 69% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 200.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 96% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 87.5% of appeals filed. This is in the 78% percentile among all examiners. Of these withdrawals, 57.1% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 18.5% are granted (fully or in part). This grant rate is in the 10% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 5.3% of allowed cases (in the 90% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 14.8% of allowed cases (in the 91% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.