Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18639710 | MAGNETIC RESONANCE SCANNING AND IMAGING METHOD AND MAGNETIC RESONANCE IMAGING SYSTEM | April 2024 | March 2026 | Allow | 23 | 1 | 0 | No | No |
| 18635305 | APPARATUS AND METHOD FOR MONITORING STATUS OF RELAY CIRCUIT | April 2024 | February 2026 | Allow | 22 | 0 | 0 | No | No |
| 18616521 | BROADBAND SWITCH FOR 3T AND 7T MAGNETIC RESONANCE IMAGING | March 2024 | December 2025 | Allow | 20 | 0 | 0 | No | No |
| 18693728 | FAIL OPERATIONAL STEERING ANGLE SENSOR | March 2024 | February 2026 | Allow | 23 | 0 | 0 | No | No |
| 18610322 | SWITCHGEAR GROUND AND TEST DEVICE HAVING GROUND SHOE ASSEMBLY WITH CONDUCTIVE CLAMP ASSEMBLY AND ASSOCIATED METHODS | March 2024 | February 2026 | Allow | 23 | 1 | 0 | No | No |
| 18581263 | TEST METHOD | February 2024 | March 2026 | Allow | 25 | 1 | 0 | Yes | No |
| 18431518 | Extended Closure Sensor Design for an Electronic Device | February 2024 | February 2026 | Allow | 25 | 1 | 0 | Yes | No |
| 18427654 | Method and Device for Compensating Electromagnetic Interferences | January 2024 | March 2026 | Allow | 25 | 1 | 0 | No | No |
| 18577426 | Metal Detector | January 2024 | February 2026 | Abandon | 26 | 1 | 0 | No | No |
| 18543676 | DIRECT DIGITAL SYNTHESIZER CIRCUIT, MEASUREMENT SYSTEM, AND METHOD OF OPERATING A DIRECT DIGITAL SYNTHESIZER CIRCUIT | December 2023 | January 2026 | Allow | 25 | 1 | 0 | Yes | No |
| 18539320 | TESTING APPARATUS, TESTING METHOD, AND COMPUTER-READABLE STORAGE MEDIUM | December 2023 | January 2026 | Allow | 25 | 1 | 0 | No | No |
| 18566000 | A System for Determining Identicalness Amongst Wire Harnesses | November 2023 | February 2026 | Allow | 27 | 1 | 0 | Yes | No |
| 18524663 | MONITORING MAGNETIC FIELDS | November 2023 | January 2026 | Allow | 26 | 1 | 0 | No | No |
| 18523731 | MALFUNCTION DETECTION METHOD AND ELECTRONIC CONTROL DEVICE CAPABLE OF DETECTING MALFUNCTION | November 2023 | January 2026 | Allow | 26 | 1 | 0 | Yes | No |
| 18388439 | DEVICE FOR TESTING FUNCTION OF CONTACTORS AND APPARATUS FOR PERFORMING ELEVATOR FUNCTION | November 2023 | February 2026 | Allow | 27 | 1 | 0 | No | No |
| 18499013 | ELECTRONIC DEVICES RELATED TO MONITORING OF INTERNAL NODES | October 2023 | December 2025 | Allow | 26 | 1 | 0 | No | No |
| 18370274 | POSITION DETECTION FOR A ROTATION ANGLE SENSOR | September 2023 | December 2025 | Allow | 27 | 2 | 0 | No | No |
| 18138006 | SYSTEMS, DEVICES, AND METHODS FOR MEASURING DIRECT CURRENT/LOW FREQUENCY SIGNAL COMPONENTS | April 2023 | December 2025 | Allow | 31 | 3 | 0 | Yes | No |
| 17884753 | ULTRA-LOW-POWER FRONT END FOR BEYOND-THE-RAILS VOLTAGE SENSING | August 2022 | March 2026 | Allow | 43 | 3 | 0 | No | Yes |
| 17866385 | CIRCUIT BREAKER STATE DETECTOR, AND LOW-VOLTAGE ELECTRICAL SYSTEM INCLUDING CIRCUIT BREAKER STATE DETECTOR | July 2022 | February 2026 | Allow | 43 | 5 | 0 | Yes | No |
| 16292390 | TEST DEVICE FOR A TO-CAN LASER AND TEST SYSTEM FOR A TO-CAN LASER | March 2019 | January 2021 | Allow | 23 | 0 | 0 | No | No |
| 16216608 | PLANAR ARRAY PIPELINE INSPECTION TOOL | December 2018 | June 2020 | Allow | 18 | 0 | 0 | No | No |
| 16125403 | POWER SUPPLY GENERATING CIRCUIT, CAPACITIVE ARRAY SENSING APPARATUS AND TERMINAL DEVICE | September 2018 | November 2020 | Allow | 26 | 0 | 0 | No | No |
| 16080111 | LARGE-CAPACITANCE INSULATING CORE, HIGH-VOLTAGE ELECTRICAL APPLIANCE AND MULTI-FUNCTIONAL HIGH-VOLTAGE BUSHING | August 2018 | March 2020 | Allow | 19 | 0 | 0 | No | No |
| 16002748 | EQUILIBRIUM-CONDUCTANCE-COMPENSATED ECCENTRIC METHOD FOR OBTAINING POWER TRANSFER COEFFICIENTS OF DIRECT CURRENT POWER NETWORKS | June 2018 | February 2021 | Allow | 32 | 0 | 0 | No | No |
| 15781197 | DIFFUSION MRI METHOD FOR GENERATING A SYNTHETIC DIFFUSION IMAGE AT A HIGH B-VALUE | June 2018 | February 2020 | Allow | 21 | 0 | 0 | No | No |
| 15994935 | METHOD FOR DETERMINING THE OUTPUT VOLTAGE OF A TRANSISTOR | May 2018 | May 2021 | Allow | 35 | 4 | 0 | Yes | No |
| 15993145 | GROUND-FAULT PROTECTION FOR DIRECT CURRENT CIRCUITS | May 2018 | April 2020 | Allow | 23 | 1 | 0 | No | No |
| 15652646 | XMR ANGLE SENSORS | July 2017 | March 2020 | Allow | 32 | 2 | 0 | Yes | No |
| 15599652 | APPARATUS TO DETECT CABLE SEATING OR DISTURBANCE | May 2017 | December 2019 | Allow | 31 | 1 | 0 | No | No |
| 14058961 | VOLTAGE TESTING DEVICE AND VOLTAGE TESTING METHOD FOR CPU | October 2013 | August 2015 | Allow | 21 | 0 | 0 | No | No |
| 13870308 | ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM | April 2013 | May 2015 | Allow | 25 | 1 | 0 | No | No |
| 13844958 | 3D MEMS MAGNETOMETER | March 2013 | March 2015 | Allow | 24 | 0 | 0 | Yes | No |
| 13745941 | Contact Probe with Conductively Coupled Plungers | January 2013 | July 2013 | Allow | 6 | 0 | 0 | Yes | No |
| 13710560 | DLA ROTOR FLUX DENSITY SCAN METHOD AND TOOL | December 2012 | March 2015 | Allow | 28 | 1 | 0 | Yes | No |
| 13711415 | SIGNAL TRANSMISSION LINES WITH TEST PAD | December 2012 | January 2015 | Allow | 26 | 1 | 0 | No | No |
| 13610449 | ELECTRIC MACHINE | September 2012 | December 2014 | Allow | 27 | 0 | 1 | Yes | No |
| 13605554 | SEMICONDUCTOR WAFER AND METHOD FOR AUTO-CALIBRATING INTEGRATED CIRCUIT CHIPS USING PLL AT WAFER LEVEL | September 2012 | February 2015 | Allow | 29 | 1 | 0 | Yes | No |
| 13584233 | AUTO-CALIBRATING PROXIMITY SENSOR FOR RETAIL DISPLAY SECURITY SYSTEM | August 2012 | September 2014 | Allow | 25 | 1 | 0 | No | No |
| 13559033 | MAGNETIC SENSING DEVICE FOR FASTENERS | July 2012 | August 2014 | Allow | 25 | 0 | 0 | No | No |
| 13455384 | Method for Measuring the Electrical Resistance of a Glow Plug | April 2012 | January 2015 | Allow | 32 | 2 | 0 | No | No |
| 13448911 | TEST CARRIER | April 2012 | December 2014 | Allow | 32 | 2 | 0 | Yes | No |
| 13142647 | APPARATUS AND METHOD FOR ANALYZING THE STATE OF OIL-FILLED ELECTRICAL DEVICES | June 2011 | June 2014 | Allow | 36 | 1 | 0 | Yes | No |
| 13165864 | INPUT POWER MEASURING DEVICE | June 2011 | November 2013 | Allow | 29 | 0 | 0 | No | No |
| 13052874 | NON-CONTACT CHARGING SYSTEM | March 2011 | January 2013 | Allow | 22 | 3 | 0 | Yes | No |
| 12957306 | THERMAL CONTROL UNIT USED TO MAINTAIN THE TEMPERATURE OF IC DEVICES UNDER TEST | November 2010 | May 2013 | Allow | 30 | 1 | 0 | Yes | No |
| 12956544 | MAGNETIC SENSOR DEVICE | November 2010 | April 2013 | Allow | 28 | 0 | 0 | Yes | No |
| 12888617 | TEST METHOD OF MICROSTRUCTURE BODY AND MICROMACHINE | September 2010 | July 2013 | Allow | 33 | 1 | 0 | No | No |
| 12924105 | CAPACITIVE OCCUPANT SENSOR AND CAPACITIVE OCCUPANT DETECTION APPARATUS | September 2010 | July 2012 | Allow | 22 | 2 | 0 | No | No |
| 12884211 | MANIPULATOR OF ROBOT | September 2010 | June 2013 | Allow | 33 | 1 | 0 | No | No |
| 12884210 | MANIPULATOR OF ROBOT | September 2010 | June 2013 | Allow | 33 | 1 | 0 | No | No |
| 12863995 | ANALYZING METHOD USING A PROCESSING STRUCTURE AS A PROBE | September 2010 | June 2013 | Abandon | 35 | 1 | 0 | No | No |
| 12883611 | Conductivity Detector For Fluids | September 2010 | April 2013 | Allow | 31 | 1 | 0 | No | No |
| 12882615 | STACKED SEMICONDUCTOR DEVICE AND METHOD OF CONNECTION TEST IN THE SAME | September 2010 | January 2013 | Allow | 28 | 1 | 0 | Yes | No |
| 12882727 | TIMING DETECTION DEVICE | September 2010 | June 2013 | Allow | 33 | 2 | 0 | No | No |
| 12160815 | METHOD AND MONITORING SYSTEM FOR CLOSING COVERS | September 2010 | June 2013 | Allow | 59 | 1 | 0 | Yes | No |
| 12802541 | CAPACITIVE OCCUPANT SENSOR | June 2010 | January 2012 | Allow | 20 | 0 | 0 | No | No |
| 12802562 | CAPACITIVE OCCUPANT SENSOR | June 2010 | August 2012 | Allow | 26 | 0 | 0 | No | No |
| 12674426 | SIGNAL STATUS DIAGNOSING DEVICE FOR EXTERNAL CONTROL MEANS TO BE ACTIVATED WHEN FED WITH DRIVING ELECTRIC POWER BY ON/OFF SIGNAL TRANSMITTED THROUGH INSULATING MEANS | June 2010 | January 2013 | Allow | 35 | 1 | 0 | No | No |
| 12774786 | MAGNETIC DETECTION DEVICE | May 2010 | September 2012 | Allow | 28 | 0 | 0 | No | No |
| 12741374 | RAILWAY POSITIONING SYSTEM | May 2010 | April 2013 | Allow | 36 | 2 | 0 | Yes | No |
| 12772034 | SHUNT SENSOR AND SHUNT SENSOR ASSEMBLY | April 2010 | March 2013 | Allow | 35 | 2 | 0 | No | No |
| 12771138 | METHODOLOGIES AND TEST CONFIGURATIONS FOR TESTING THERMAL INTERFACE MATERIALS | April 2010 | February 2013 | Allow | 33 | 1 | 1 | No | No |
| 12771427 | MAGNETIC STUD FINDER | April 2010 | April 2013 | Abandon | 36 | 1 | 0 | No | No |
| 12771642 | APPARATUS AND METHOD FOR DETERMINING THE TYPE OF ELECTROMAGNETIC WAVE GENERATING SOURCE | April 2010 | April 2013 | Allow | 35 | 2 | 0 | Yes | No |
| 12771118 | TESTING SYSTEM FOR POWER SUPPLY UNIT | April 2010 | November 2012 | Allow | 30 | 1 | 0 | No | No |
| 12377130 | ROCK ANALYSIS APPARATUS AND METHOD | April 2010 | January 2013 | Allow | 47 | 2 | 0 | No | No |
| 12731483 | ELECTROMAGNETIC WAVE MEASURING APPARATUS, MEASURING METHOD, PROGRAM, AND RECORDING MEDIUM | March 2010 | May 2013 | Allow | 38 | 1 | 0 | Yes | No |
| 12661794 | Sensor having integrated electrodes and method for detecting analytes in fluids | March 2010 | April 2013 | Allow | 37 | 0 | 0 | No | No |
| 12665686 | APPARATUS AND METHOD FOR MONITORING A PHASE LINE OF A SECTION OF AN ELECTRICAL ENERGY TRANSMISSION LINE | March 2010 | April 2013 | Allow | 39 | 1 | 0 | No | No |
| 12733778 | ULTRASOUND PROBE, METHOD FOR MANUFACTURING THE SAME, AND ULTRASOUND DIAGNOSTIC APPARATUS | March 2010 | May 2013 | Allow | 38 | 2 | 0 | No | No |
| 12643428 | HANDLER AND METHOD FOR TESTING THE SAME | December 2009 | July 2012 | Allow | 31 | 0 | 0 | No | No |
| 12642935 | INSPECTION MODE SWITCHING CIRCUIT | December 2009 | May 2012 | Allow | 28 | 1 | 0 | No | No |
| 12641918 | METHOD OF INSPECTING A SUBSTRATE | December 2009 | February 2013 | Abandon | 38 | 2 | 0 | No | No |
| 12642278 | METHOD AND DEVICE FOR MEASURING INTER-CHIP SIGNALS | December 2009 | July 2012 | Allow | 31 | 1 | 0 | No | No |
| 12601120 | INDICATOR ARRANGEMENT | December 2009 | May 2013 | Abandon | 42 | 2 | 0 | No | No |
| 12637198 | TEST MODE SIGNAL GENERATING DEVICE | December 2009 | April 2012 | Allow | 28 | 1 | 0 | No | No |
| 12632126 | CIRCUIT FOR DETECTING FAULTY DIODE | December 2009 | August 2012 | Abandon | 33 | 1 | 0 | No | No |
| 12602860 | MAGNETIC DETECTION ELEMENT AND DETECTING METHOD | December 2009 | October 2012 | Allow | 35 | 1 | 0 | Yes | No |
| 12602262 | DEVICE FOR DETERMINING THE ROTATIONAL SPEED OF A TRANSMISSION SHAFT | November 2009 | September 2012 | Allow | 33 | 2 | 0 | Yes | No |
| 12601818 | MAGNETIC FIELD SENSOR FOR MEASURING A DIRECTION OF A MAGNETIC FIELD IN A PLANE | November 2009 | August 2012 | Allow | 32 | 0 | 0 | No | No |
| 12601385 | NONCONTACT POSITION SENSOR | November 2009 | December 2012 | Allow | 36 | 2 | 0 | Yes | No |
| 12601098 | MAGNETIC FIELD DETECTION DEVICE | November 2009 | October 2012 | Allow | 35 | 2 | 0 | No | No |
| 12600501 | HIGH RESOLUTION VOLTAGE SENSING ARRAY | November 2009 | July 2012 | Allow | 32 | 1 | 0 | Yes | No |
| 12599948 | MAGNETIC ANCHORAGE EQUIPMENT WITH A SELF-TEST UNIT | November 2009 | November 2012 | Allow | 36 | 1 | 0 | No | No |
| 12599689 | MAGNETIC DETECTION ELEMENT AND DETECTION METHOD | November 2009 | April 2013 | Abandon | 41 | 2 | 0 | Yes | No |
| 12609766 | DETECTION CIRCUIT AND PHYSICAL QUANTITY SENSOR DEVICE | October 2009 | November 2012 | Abandon | 36 | 1 | 0 | No | No |
| 12597625 | METHOD FOR DETERMINATION OF A PARAMETER SET WHICH DESCRIBES ELECTRICAL PARAMETERS OF A TRACK SECTION OF A MAGNETIC LEVITATION RAILROAD | October 2009 | February 2012 | Allow | 27 | 0 | 0 | No | No |
| 12603053 | ELECTROMAGNETIC LOGGING BETWEEN BOREHOLE AND SURFACE | October 2009 | September 2013 | Allow | 47 | 2 | 0 | Yes | No |
| 12594212 | ELECTROMIGRATION TESTING AND EVALUATION APPARATUS AND METHODS | October 2009 | June 2012 | Allow | 32 | 1 | 0 | Yes | No |
| 12523214 | DISPLACEMENT SENSING DEVICE | September 2009 | March 2012 | Allow | 32 | 2 | 0 | Yes | No |
| 12525175 | WIRE ROPE FLAW DETECTOR | September 2009 | June 2013 | Allow | 46 | 4 | 0 | No | Yes |
| 12449721 | CAPACITANCE VARIATION DETECTION CIRCUIT AND SEMICONDUCTOR DEVICE | August 2009 | September 2012 | Abandon | 37 | 1 | 0 | No | No |
| 12462374 | Diagnostic methods for self-healing cables | August 2009 | July 2012 | Abandon | 35 | 1 | 0 | No | No |
| 12462239 | GUIDED WAVE CUTOFF SPECTROSCOPY USING A CYLINDRICAL MEASUREMENT CELL | July 2009 | May 2012 | Allow | 34 | 2 | 0 | No | No |
| 12462285 | METHOD AND APPARATUS FOR WELL LOGGING RESISTIVITY IMAGE TOMOGRAPHY | July 2009 | June 2012 | Allow | 35 | 2 | 0 | Yes | No |
| 12510472 | DEVICE FOR READING ELECTRONIC CHARGES AND DETECTOR COMPRISING SUCH DEVICES | July 2009 | January 2013 | Abandon | 41 | 2 | 0 | No | No |
| 12523410 | DEVICE FOR DETECTING THE FAILURE OF AN ELECTRICAL POWER SUPPLY FOR A LOGIC UNIT | July 2009 | December 2011 | Allow | 29 | 2 | 0 | No | No |
| 12493573 | EDDY CURRENT SYSTEM AND METHOD FOR CRACK DETECTION | June 2009 | January 2012 | Allow | 31 | 2 | 0 | No | No |
| 12491691 | APPARATUS FOR DISPENSING AND DETECTING SOLID PHARMACEUTICAL ARTICLES AND RELATED METHODS OF OPERATION | June 2009 | August 2011 | Allow | 25 | 1 | 0 | Yes | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner LE, SON T.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 40.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner LE, SON T works in Art Unit 2858 and has examined 128 patent applications in our dataset. With an allowance rate of 86.7%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 34 months.
Examiner LE, SON T's allowance rate of 86.7% places them in the 65% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by LE, SON T receive 1.38 office actions before reaching final disposition. This places the examiner in the 21% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by LE, SON T is 34 months. This places the examiner in the 44% percentile for prosecution speed. Prosecution timelines are slightly slower than average with this examiner.
Conducting an examiner interview provides a +17.3% benefit to allowance rate for applications examined by LE, SON T. This interview benefit is in the 59% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 40.0% of applications are subsequently allowed. This success rate is in the 91% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.
This examiner enters after-final amendments leading to allowance in 66.7% of cases where such amendments are filed. This entry rate is in the 90% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
When applicants request a pre-appeal conference (PAC) with this examiner, 133.3% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 86% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 94% percentile among all examiners. Of these withdrawals, 100.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 44.4% are granted (fully or in part). This grant rate is in the 38% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.
Examiner's Amendments: This examiner makes examiner's amendments in 2.3% of allowed cases (in the 76% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 7.2% of allowed cases (in the 85% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.