Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 13536238 | INTEGRATED CAPACITANCE MODEL CIRCUIT | June 2012 | December 2012 | Allow | 6 | 1 | 1 | No | No |
| 13291053 | TEST DEVICE HAVING A PLURALITY OF TIPS OF DIFFERENT HEIGHTS | November 2011 | September 2012 | Allow | 11 | 1 | 0 | No | No |
| 13218914 | INSPECTION METHOD FOR INSPECTING ELECTRIC CHARACTERISTICS OF DEVICES FORMED ON TARGET OBJECT | August 2011 | June 2013 | Allow | 22 | 0 | 0 | Yes | No |
| 13185895 | LOGIC APPLYING SERIAL TEST BITS TO SCAN PATHS IN PARALLEL | July 2011 | July 2012 | Allow | 12 | 1 | 0 | No | No |
| 13149100 | SIMULTANEOUS QE SCANNING SYSTEM AND METHODS FOR PHOTOVOLTAIC DEVICES | May 2011 | October 2012 | Allow | 16 | 2 | 0 | No | No |
| 13131171 | APPARATUS AND METHOD FOR INSPECTING HOMOGENEITY OF SOLAR CELL QUANTUM EFFICIENCY USING IMAGING DEVICE | May 2011 | November 2012 | Allow | 18 | 1 | 0 | No | No |
| 13107317 | PROBE CARD AND METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE | May 2011 | August 2013 | Abandon | 27 | 0 | 1 | No | No |
| 13097105 | TEST APPARATUS FOR PCI CARD | April 2011 | August 2013 | Abandon | 27 | 1 | 0 | No | No |
| 13093869 | TEST APPARATUS | April 2011 | August 2013 | Abandon | 27 | 1 | 0 | No | No |
| 13088150 | METHOD AND APPARATUS FOR AMPLIFYING A SIGNAL AND TEST DEVICE USING SAME | April 2011 | May 2012 | Allow | 13 | 1 | 0 | Yes | No |
| 13083829 | OPENER FOR TEST HANDLER | April 2011 | August 2013 | Allow | 28 | 2 | 0 | No | No |
| 13080242 | CURRENT MEASUREMENT FOR WATER-BASED MUD GALVANIC ELECTRICAL IMAGING AND LATEROLOG TOOLS | April 2011 | September 2013 | Abandon | 30 | 1 | 0 | No | No |
| 13039612 | HIGH-VOLTAGE TRANSFORMER | March 2011 | May 2013 | Allow | 26 | 1 | 0 | Yes | No |
| 13030134 | DISTANCE ADJUSTMENT SYSTEM FOR USE IN SOLAR WAFER INSPECTION MACHINE AND INSPECTION MACHINE PROVIDED WITH SAME | February 2011 | February 2013 | Allow | 24 | 0 | 0 | No | No |
| 12987106 | APPARATUS AND METHOD FOR HARDENING LATCHES IN SOI CMOS DEVICES | January 2011 | September 2012 | Allow | 20 | 2 | 1 | Yes | No |
| 12985848 | DIGITAL COMMUNICATIONS TEST SYSTEM FOR MULTIPLE INPUT, MULTIPLE OUTPUT (MIMO) SYSTEMS | January 2011 | June 2012 | Allow | 29 | 1 | 1 | No | No |
| 12984981 | IC WITH FIRST AND SECOND DISTRIBUTORS COLLECTORS AND SCAN PATHS | January 2011 | June 2011 | Allow | 5 | 1 | 0 | No | No |
| 12979216 | CLAMP JAW ASSEMBLY | December 2010 | October 2011 | Allow | 9 | 1 | 0 | Yes | No |
| 12974950 | APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A PLURALITY OF DEVICES UNDER TEST | December 2010 | August 2012 | Abandon | 20 | 2 | 0 | No | No |
| 12957545 | HALL SENSOR WITH TEMPERATURE DRIFT CONTROL | December 2010 | July 2012 | Allow | 19 | 3 | 0 | No | No |
| 12952773 | LOGIC APPLYING DIFFERENT BIT POSITIONS TO RESPECTIVE SCAN PATHS | November 2010 | April 2011 | Allow | 5 | 1 | 0 | No | No |
| 12953362 | WAFER UNIT FOR TESTING SEMICONDUCTOR CHIPS AND TEST SYSTEM | November 2010 | October 2012 | Allow | 23 | 1 | 0 | No | No |
| 12517899 | TIME DIVISION MULTIPLEXED DETECTOR FOR A MAGNETO-OPTICAL CURRENT TRANSDUCER | November 2010 | May 2013 | Allow | 48 | 1 | 0 | No | No |
| 12911880 | METHOD AND APPARATUS FOR DETECTING ABNORMALITY OF CURRENT SENSOR IN BATTERY PACK | October 2010 | December 2012 | Allow | 26 | 1 | 0 | Yes | No |
| 12922700 | CURRENT DETECTOR AND WATTMETER USING THE SAME | September 2010 | March 2012 | Allow | 18 | 1 | 0 | No | No |
| 12881363 | METHOD AND SYSTEM FOR LOCATING A PERSON AND MEDIUM COMPRISING INSTRUCTIONS FOR PERFORMING THE METHOD | September 2010 | March 2013 | Allow | 30 | 2 | 0 | Yes | No |
| 12881346 | METHOD AND SYSTEM FOR DETERMINING THE ACTIVITY OF A PERSON, RECORDING MEDIUM FOR THIS METHOD | September 2010 | November 2012 | Allow | 26 | 0 | 0 | Yes | No |
| 12865137 | VEHICLE SEAT WITH CAPACITIVE OCCUPANT DETECTION SYSTEM | September 2010 | March 2013 | Allow | 32 | 1 | 0 | Yes | No |
| 12882051 | BURN-IN TESTING SYSTEM | September 2010 | March 2011 | Allow | 6 | 1 | 0 | Yes | No |
| 12881137 | WAFER TRAY AND TEST APPARATUS | September 2010 | April 2013 | Allow | 31 | 2 | 0 | No | No |
| 12880561 | METHODS AND APPARATUS TO DETECT VOLTAGE CONDITIONS OF POWER SUPPLIES | September 2010 | April 2012 | Allow | 19 | 0 | 0 | Yes | No |
| 12880468 | SYSTEM FOR MEASURING OPPOSITE SIDES OF A WIRELESS COMMUNICATION APPARATUS | September 2010 | December 2010 | Allow | 3 | 0 | 0 | Yes | No |
| 12877510 | CHIP TESTING CIRCUIT | September 2010 | February 2012 | Allow | 17 | 1 | 0 | No | No |
| 12875151 | ACTIVE DEVICE ARRAY AND TESTING METHOD | September 2010 | February 2012 | Allow | 18 | 1 | 0 | Yes | No |
| 12874650 | DIE STACKING, TESTING AND PACKAGING FOR YIELD | September 2010 | January 2013 | Allow | 29 | 4 | 0 | Yes | No |
| 12873236 | HIGH SPEED FULL DUPLEX TEST INTERFACE | August 2010 | September 2012 | Allow | 25 | 2 | 1 | No | No |
| 12871858 | MEASURING APPARATUS FOR ELECTROMAGNETIC INTERFERENCE | August 2010 | June 2011 | Allow | 10 | 1 | 0 | No | No |
| 12871589 | SCHMITT TRIGGER WITH TEST CIRCUIT AND METHOD FOR TESTING | August 2010 | May 2012 | Allow | 21 | 1 | 0 | No | No |
| 12735929 | WIRING SUBSTRATE AND PROBE CARD | August 2010 | October 2012 | Allow | 25 | 4 | 0 | Yes | No |
| 12868387 | NON-CONTACT MAGNETIC CURRENT SENSING AND DISTRIBUTION SYSTEM FOR DETERMINING INDIVIDUAL POWER READINGS FROM A PLURALITY OF POWER SOURCES | August 2010 | June 2013 | Abandon | 34 | 1 | 0 | No | No |
| 12808198 | GEARBOX POSITION SENSOR AND CORRESPONDING GEARBOX | August 2010 | May 2013 | Allow | 35 | 2 | 0 | Yes | No |
| 12859100 | ELECTRONIC DEVICE IDENTIFYING METHOD AND ELECTRONIC DEVICE COMPRISING IDENTIFICATION MEANS | August 2010 | May 2011 | Allow | 9 | 2 | 0 | Yes | No |
| 12866397 | PROBE PIN AND METHOD OF MANUFACTURING THE SAME | August 2010 | October 2012 | Abandon | 26 | 2 | 1 | No | No |
| 12848937 | INTEGRATED POWER DETECTOR WITH TEMPERATURE COMPENSATION FOR FULLY-CLOSED LOOP CONTROL | August 2010 | November 2010 | Allow | 3 | 0 | 0 | Yes | No |
| 12733712 | CIRCUIT AND METHOD FOR TESTING ELECTRICALLY CONTROLLABLE POWER SWITCHES FOR ACTIVATING OCCUPANT PROTECTION MEANS | July 2010 | June 2013 | Abandon | 39 | 1 | 0 | No | No |
| 12832563 | HALL DEVICE AND MAGNETIC SENSOR CIRCUIT | July 2010 | November 2012 | Abandon | 29 | 0 | 0 | No | No |
| 12830938 | PROBE CIRCUIT, MULTI-PROBE CIRCUIT, TEST APPARATUS, AND ELECTRIC DEVICE | July 2010 | May 2013 | Allow | 34 | 1 | 1 | No | No |
| 12827687 | SUBSEA ELECTRONIC MODULES | June 2010 | November 2012 | Allow | 28 | 1 | 0 | No | No |
| 12824896 | INTERCONNECTION CARD FOR INSPECTION, MANUFACTURE METHOD FOR INTERCONNECTION CARD, AND INSPECTION METHOD USING INTERCONNECTION CARD | June 2010 | August 2012 | Allow | 25 | 4 | 1 | No | No |
| 12801790 | PROBE CARD FOR SEMICONDUCTOR WAFER | June 2010 | September 2011 | Allow | 15 | 2 | 0 | No | No |
| 12819193 | Micro-Magnetic Sensor for Acceleration, Position, Tilt, and Vibration | June 2010 | July 2013 | Abandon | 37 | 1 | 0 | No | No |
| 12815233 | COMPENSATION FOR VOLTAGE DROP IN AUTOMATIC TEST EQUIPMENT | June 2010 | January 2012 | Allow | 19 | 2 | 0 | Yes | No |
| 12796457 | APPARATUS AND METHOD OF TESTING SINGULATED DIES | June 2010 | April 2013 | Allow | 34 | 6 | 0 | Yes | No |
| 12760164 | INDIVIDUALLY HEATING STORAGE DEVICES IN A TESTING SYSTEM | April 2010 | February 2011 | Allow | 10 | 1 | 0 | Yes | No |
| 12724046 | VERTICAL PROBE COMPRISING SLOTS AND PROBE CARD FOR INTEGRATED CIRCUIT DEVICES USING THE SAME | March 2010 | December 2010 | Allow | 9 | 1 | 0 | Yes | No |
| 12676751 | DEVICE FOR MEASURING THE INTENSITY OF AN ELECTRIC CURRENT AND ELECTRIC APPLIANCE INCLUDING SUCH DEVICE | March 2010 | July 2012 | Allow | 28 | 2 | 0 | Yes | No |
| 12675178 | POWER SENSOR FOR A CURRENT CARRYING CONDUCTOR | February 2010 | November 2012 | Allow | 33 | 3 | 0 | Yes | No |
| 12659033 | TEST SECTION UNIT, TEST HEAD AND ELECTRONIC DEVICE TESTING APPARATUS | February 2010 | July 2012 | Allow | 29 | 1 | 0 | No | No |
| 12674588 | MALFUNCTION DETERMINING APPARATUS AND MALFUNCTION DETERMINING METHOD FOR CHARGING SYSTEM | February 2010 | April 2013 | Allow | 38 | 0 | 0 | No | No |
| 12660042 | INTERFACE TEST DEVICE AND METHOD FOR USING THE INTERFACE | February 2010 | February 2013 | Allow | 36 | 2 | 0 | Yes | No |
| 12674277 | PROBE CARD HAVING A PLURALITY OF SPACE TRANSFORMERS | February 2010 | May 2012 | Allow | 26 | 1 | 1 | No | No |
| 12656726 | Probe card, semiconductor testing device including the same, and fuse checking method for probe card | February 2010 | June 2012 | Abandon | 28 | 1 | 0 | No | No |
| 12704717 | INTEGRATED CIRCUIT WITH IMPROVED TEST CAPABILITY VIA REDUCED PIN COUNT | February 2010 | December 2010 | Allow | 10 | 1 | 0 | No | No |
| 12656604 | SEMICONDUCTOR DEVICE AND DEFECT ANALYSIS METHOD FOR A SEMICONDUCTOR DEVICE | February 2010 | November 2012 | Allow | 33 | 2 | 0 | Yes | No |
| 12656588 | APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE | February 2010 | April 2012 | Allow | 26 | 1 | 0 | Yes | No |
| 12699383 | STRAY FIELD COLLECTOR PAD, AND BIO-MOLECULE SENSING MODULE OR BIOCHIP USING THE SAME | February 2010 | December 2012 | Allow | 34 | 2 | 0 | Yes | No |
| 12656520 | METHOD OF CORRECTING A POSITION OF A PROBER | February 2010 | November 2012 | Allow | 33 | 2 | 0 | No | No |
| 12670939 | LEAK DETECTOR COMPRISING A POSITION DETERMINING SYSTEM FOR THE HAND-OPERATED PROBE | January 2010 | June 2012 | Allow | 29 | 1 | 0 | No | No |
| 12692917 | PROBE CARD, METHOD FOR MANUFACTURING PROBE CARD, AND PROBER APPARATUS | January 2010 | August 2012 | Allow | 30 | 1 | 1 | Yes | No |
| 12670247 | CONTACTOR, PROBE CARD, AND METHOD OF MOUNTING CONTACTOR | January 2010 | April 2012 | Allow | 26 | 1 | 0 | No | No |
| 12670080 | METHOD AND APPARATUS FOR MEASURING A LIFETIME OF CHARGE CARRIERS | January 2010 | June 2011 | Allow | 17 | 0 | 0 | Yes | No |
| 12691329 | DEGRADATION AND INTEGRITY MEASURING DEVICE FOR ABSORBABLE METAL IMPLANTS | January 2010 | November 2012 | Allow | 34 | 2 | 0 | Yes | No |
| 12690238 | FORK ASSEMBLY FOR PROTECTION CIRCUIT OF TEST SYSTEM | January 2010 | May 2012 | Allow | 27 | 0 | 0 | No | No |
| 12688903 | SYSTEM FOR TESTING ELECTRONIC COMPONENTS | January 2010 | February 2012 | Allow | 25 | 0 | 0 | No | No |
| 12688639 | RELAY CIRCUIT TESTER DEVICE | January 2010 | September 2012 | Allow | 32 | 1 | 0 | No | No |
| 12688025 | SYSTEM AND METHOD FOR OBSERVING THRESHOLD VOLTAGE VARIATIONS | January 2010 | May 2013 | Allow | 40 | 1 | 1 | No | No |
| 12688678 | SIGNAL TESTING APPARATUS FOR LOAD CONTROL SYSTEM | January 2010 | April 2012 | Allow | 27 | 1 | 0 | Yes | No |
| 12686196 | PROBE ELEMENT HAVING A SUBSTANTIALLY ZERO STIFFNESS AND APPLICATIONS THEREOF | January 2010 | December 2012 | Allow | 36 | 2 | 0 | Yes | No |
| 12684734 | METHOD AND APPARATUS FOR AMPLIFYING A SIGNAL AND TEST DEVICE USING SAME | January 2010 | January 2011 | Allow | 12 | 1 | 0 | Yes | No |
| 12683788 | CONTROL CIRCUIT FOR CURRENT DETECTION | January 2010 | April 2013 | Abandon | 39 | 1 | 0 | No | No |
| 12642190 | PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING INTEGRATED CIRCUITS | December 2009 | November 2010 | Allow | 11 | 0 | 0 | Yes | No |
| 12642139 | PARALLEL SCAN DISTRIBUTORS AND COLLECTORS AND PROCESS OF TESTING INTEGRATED CIRCUITS | December 2009 | November 2010 | Allow | 11 | 0 | 0 | No | No |
| 12631992 | CIRCUIT AND METHOD FOR DETECTING FAULTY DIODE | December 2009 | February 2011 | Allow | 15 | 1 | 0 | Yes | No |
| 12631794 | TESTING APPARATUS HAVING TIPS OF DIFFERENT HEIGHTS | December 2009 | December 2011 | Allow | 24 | 3 | 0 | Yes | No |
| 12592798 | System and method for characterizing solar cell conversion performance and detecting defects in a solar cell | December 2009 | August 2013 | Abandon | 44 | 1 | 0 | No | No |
| 12441127 | ALTERNATING CURRENT SWITCH DEVICE AND METHOD FOR THE MONITORING OR DIAGNOSIS OF THE OPERABILITY OF AN ALTERNATING CURRENT SWITCH DEVICE | November 2009 | September 2013 | Abandon | 54 | 3 | 0 | Yes | No |
| 12627788 | HELICAL SENSOR FOR TESTING A COMPOSITE MEDIUM | November 2009 | May 2013 | Allow | 42 | 4 | 0 | No | Yes |
| 12599957 | SEMICONDUCTOR TEST APPARATUS AND TEST METHOD | November 2009 | October 2012 | Allow | 35 | 0 | 0 | No | No |
| 12617619 | PROBE TIP TO DEVICE PAD ALIGNMENT IN OBSCURED VIEW PROBING APPLICATIONS | November 2009 | September 2011 | Allow | 22 | 0 | 0 | Yes | No |
| 12612894 | METHOD FOR MEASURING CURRENT IN AN ELECTRIC POWER DISTRIBUTION SYSTEM | November 2009 | November 2012 | Allow | 36 | 2 | 0 | Yes | No |
| 12588901 | Semiconductor device test apparatus including a test handler | November 2009 | September 2012 | Abandon | 34 | 2 | 0 | No | No |
| 12605859 | DEVICE, METHOD AND PROBE FOR INSPECTING SUBSTRATE | October 2009 | February 2013 | Abandon | 40 | 3 | 0 | No | No |
| 12597444 | LIQUID CRYSTAL DISPLAY PANEL AND ITS INSPECTING METHOD | October 2009 | August 2013 | Abandon | 46 | 2 | 0 | No | No |
| 12579326 | CMOS IMAGE SENSOR TEST PROBE CARD | October 2009 | October 2012 | Allow | 36 | 3 | 1 | No | No |
| 12577195 | TESTBOARD WITH ZIF CONNECTORS, METHOD OF ASSEMBLING, INTEGRATED CIRCUIT TEST SYSTEM AND TEST METHOD INTRODUCED BY THE SAME | October 2009 | January 2012 | Abandon | 28 | 1 | 0 | No | No |
| 12574264 | YIELD ENHANCEMENT FOR STACKED CHIPS THROUGH ROTATIONALLY-CONNECTING-INTERPOSER | October 2009 | November 2011 | Allow | 25 | 0 | 1 | Yes | No |
| 12588095 | METHOD TO PREDICT PHASE CURRENT | October 2009 | October 2012 | Allow | 36 | 1 | 0 | Yes | No |
| 12445209 | METHOD AND DEVICE FOR DETECTING STRUCTURAL ABNORMALITIES IN A SPHERICAL PARTICLE | September 2009 | May 2012 | Allow | 37 | 1 | 0 | Yes | No |
| 12569097 | SYSTEMS AND METHODS FOR SELF-TESTING OF INTEGRATED DEVICES DURING PRODUCTION | September 2009 | March 2012 | Allow | 29 | 1 | 0 | No | No |
| 12568096 | DEVICE AND METHOD FOR READING ELECTRIC CURRENTS RESULTING FROM AN ELECTROMAGNETIC SIGNAL DETECTOR | September 2009 | May 2012 | Allow | 31 | 1 | 0 | Yes | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner ISLA, RICHARD.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 66.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
✓ Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.
Examiner ISLA, RICHARD works in Art Unit 2858 and has examined 189 patent applications in our dataset. With an allowance rate of 85.2%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 32 months.
Examiner ISLA, RICHARD's allowance rate of 85.2% places them in the 62% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.
On average, applications examined by ISLA, RICHARD receive 1.86 office actions before reaching final disposition. This places the examiner in the 40% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.
The median time to disposition (half-life) for applications examined by ISLA, RICHARD is 32 months. This places the examiner in the 52% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.
Conducting an examiner interview provides a +23.1% benefit to allowance rate for applications examined by ISLA, RICHARD. This interview benefit is in the 67% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.
When applicants file an RCE with this examiner, 32.1% of applications are subsequently allowed. This success rate is in the 69% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.
This examiner enters after-final amendments leading to allowance in 45.0% of cases where such amendments are filed. This entry rate is in the 69% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.
When applicants request a pre-appeal conference (PAC) with this examiner, 200.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 96% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.
This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 94% percentile among all examiners. Of these withdrawals, 66.7% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.
When applicants file petitions regarding this examiner's actions, 36.4% are granted (fully or in part). This grant rate is in the 23% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 16.9% of allowed cases (in the 97% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 7.5% of allowed cases (in the 87% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.