USPTO Examiner ISLA RICHARD - Art Unit 2858

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19123280RADIO ASSEMBLY COMPRISING REMOVABLE COMPONENTS AND METHOD FOR ASSEMBLYApril 2025February 2026Allow1000NoNo
18744263Abnormality Locating SystemJune 2024January 2026Allow1900NoNo
18646840SECONDARY BATTERY LIFE EVALUATION APPARATUS AND METHODApril 2024March 2026Allow2210NoNo
18632315CANTILEVER PROBE CARD DEVICE AND LIGHT SCATTERING PROBEApril 2024February 2026Allow2210NoNo
18616860TEST AND/OR MEASUREMENT INSTRUMENT AND CALIBRATION METHODMarch 2024January 2026Allow2210NoNo
18610355MONITORING SYSTEM FOR THE CURRENT FLOW TO DUAL RESONANT 1H/31P MRI COILSMarch 2024January 2026Allow2220NoNo
18683675DEVICE FOR DETECTING AN APPROACHFebruary 2024February 2026Allow2420YesNo
18435029POGO PIN WITH ADJUSTABLE ELASTIC FORCEFebruary 2024December 2025Allow2210NoNo
18433489TEST DEVICE FOR OPTOELECTRONIC INTEGRATED CIRCUITFebruary 2024October 2025Allow2110NoNo
18427138CHIP TESTING DEVICE AND PACKAGE TESTING MACHINEJanuary 2024January 2026Allow2310NoNo
18578025PROBE CARDJanuary 2024January 2026Abandon2410NoNo
18406668CIRCUIT BOARD DETECTION DEVICEJanuary 2024November 2025Allow2210NoNo
18396736COMMUTATOR ON-OFF DETECTION MECHANISM WITH SELF-CHECKING FUNCTION AND DETECTION METHOD THEREOFDecember 2023November 2025Allow2210NoNo
18395276SOURCE MEASURE DEVICEDecember 2023December 2025Allow2410NoNo
18392317CURRENT-BASED BUILT-IN SELF-TEST FOR CIRCUIT COMPONENTS ARRANGED IN VARIED CONFIGURATIONSDecember 2023February 2026Allow2610YesNo
18541195SELF-CORRECTING INDUCTIVE SENSORDecember 2023December 2025Allow2410NoNo
18533207MULTI-ORDER OPTICAL MODULATOR AND MODULATION METHOD FOR ON-CHIP OPTICAL MATRIX CALCULATIONDecember 2023July 2025Allow1900NoNo
18567394MEASURING DEVICEDecember 2023December 2025Allow2420NoNo
18520656POWER SUPPLY CIRCUIT, SENSING DEVICE AND APPLICATION THEREOFNovember 2023October 2025Allow2210NoNo
18519147PROBE CARD STRUCTURE INCLUDING PROBE SETS WITH DIFFERENT LENGTHSNovember 2023November 2025Allow2310YesNo
18518775BATTERY TEST APPARATUSNovember 2023February 2026Allow2720YesNo
18516990TEST APPARATUS AND BATTERY PRODUCTION LINENovember 2023November 2025Allow2320YesNo
18512782MEASUREMENT DEVICE FOR PERFORMING MEASUREMENTS WITH RESPECT TO A DUTNovember 2023March 2026Allow2810YesNo
18510844TERMINAL BLOCK TEST ADAPTERNovember 2023August 2025Allow2110NoNo
18511448DEVICE AND METHOD FOR DETERMINING WAFER BOWNovember 2023December 2025Allow2520NoNo
18560694INSPECTION DEVICENovember 2023June 2025Allow1900NoNo
18509059PROBE HEAD STRUCTURES FOR CIRCUIT PROBE TEST SYSTEMS AND METHODS OF FORMING THE SAMENovember 2023December 2025Allow2511NoNo
18290187Method and System for Guiding Electrode Placement on the ScalpNovember 2023January 2026Allow2700NoNo
18506602VEHICLE, FAULT MONITORING DEVICE FOR A VEHICLE AND SEMICONDUCTOR DEVICE FOR DETECTING AN OVERVOLTAGE AND/OR AN OVERCURRENTNovember 2023October 2025Allow2310YesNo
18286371K-Space Sampling for Accelerated Stack-of-Stars Magnetic Resonance Imaging Using Compressed Sense and AIOctober 2023December 2025Allow2610YesNo
18554764MAGNETIC FIELD SENSOR AND SENSOR ASSEMBLYOctober 2023October 2025Allow2410YesNo
18286294SELF-TUNING LIQUID METAL RF COIL AND COIL ARRAY FOR MRIOctober 2023February 2026Allow2920NoNo
18484179FAULT DETECTION CIRCUITOctober 2023September 2025Allow2310NoNo
18482293METHOD FOR DETERMINING AT LEAST ONE PROPERTY OF A ROTATIONAL MOVEMENT OF A THREE-PHASE ROTARY CURRENT MACHINE IN GENERATOR OPERATION AND ELECTROMECHANICAL DRIVEOctober 2023October 2025Allow2510NoNo
18481992ADJUSTABLE SUPPORTING DEVICEOctober 2023August 2025Allow2210NoNo
18481583ELECTRIC FENCING WIRE TESTEROctober 2023January 2026Allow2811NoNo
18553994METHOD FOR INITIALIZING AN ANGLE-OF-ROTATION MEASUREMENT SYSTEM, AND ANGLE-OF-ROTATION MEASUREMENT SYSTEMOctober 2023December 2025Allow2620YesNo
18481409MENDING METHOD FOR DISPLAYOctober 2023September 2025Allow2310NoNo
18285526INTEGRATED SYSTEM FOR DRIVING AND LOCATION RECOGNITION OF MOBILE MAGNETIC SUBSTANCESOctober 2023October 2025Allow2410NoNo
18376142REMOTE FIELD EDDY CURRENT BASED SYSTEM AND METHOD FOR CORROSION INSPECTIONOctober 2023January 2026Allow2820NoNo
18156354ION MOVEMENT MEASURING DEVICE AND ION MOVEMENT MEASURING METHODJanuary 2023March 2026Allow3810NoNo
17959635OVER-TEMPERATURE MANAGEMENT OF DC LINK CAPACITOR IN ELECTRIC VEHICLE PROPULSION DRIVE CONVERTEROctober 2022March 2026Allow4120NoNo
17937987APPLICATION OF MODULAR GEOTHERMAL POWER PLANT FOR DISTRIBUTED NETWORK OF ELECTRICAL VEHICLE CHARGING STATIONS, DECENTRALIZED POWER GRIDS, AND EXHAUSTED OIL OR GAS WELLSOctober 2022December 2025Abandon3810NoNo
16523969LIGHT ELECTRIC VEHICLE PARKING AND CHARGING STATIONS AND SMART CHARGING SYSTEMS FOR THE VEHICLE BATTERIESJuly 2019September 2020Allow1421YesNo
14268073PARALLEL SCAN PATHS WITH THREE BOND PADS, DISTRIBUTORS AND COLLECTORSMay 2014September 2014Allow510YesNo
14112506CONTROL DEVICE FOR VEHICLEOctober 2013July 2015Allow2100NoNo
13536238INTEGRATED CAPACITANCE MODEL CIRCUITJune 2012December 2012Allow611NoNo
13291053TEST DEVICE HAVING A PLURALITY OF TIPS OF DIFFERENT HEIGHTSNovember 2011September 2012Allow1110NoNo
13222306ANALYZING EM PERFORMANCE DURING IC MANUFACTURINGAugust 2011August 2014Allow3510NoNo
13218914INSPECTION METHOD FOR INSPECTING ELECTRIC CHARACTERISTICS OF DEVICES FORMED ON TARGET OBJECTAugust 2011June 2013Allow2200YesNo
13212585TEST-USE INDIVIDUAL SUBSTRATE, PROBE, AND SEMICONDUCTOR WAFER TESTING APPARATUSAugust 2011September 2014Allow3741NoNo
13185895LOGIC APPLYING SERIAL TEST BITS TO SCAN PATHS IN PARALLELJuly 2011July 2012Allow1210NoNo
13149100SIMULTANEOUS QE SCANNING SYSTEM AND METHODS FOR PHOTOVOLTAIC DEVICESMay 2011October 2012Allow1620NoNo
13131171APPARATUS AND METHOD FOR INSPECTING HOMOGENEITY OF SOLAR CELL QUANTUM EFFICIENCY USING IMAGING DEVICEMay 2011November 2012Allow1810NoNo
13107317PROBE CARD AND METHOD OF MANUFACTURING SEMICONDUCTOR INTEGRATED CIRCUIT DEVICEMay 2011August 2013Abandon2701NoNo
13097105TEST APPARATUS FOR PCI CARDApril 2011August 2013Abandon2710NoNo
13093869TEST APPARATUSApril 2011August 2013Abandon2710NoNo
13088150METHOD AND APPARATUS FOR AMPLIFYING A SIGNAL AND TEST DEVICE USING SAMEApril 2011May 2012Allow1310YesNo
13083829OPENER FOR TEST HANDLERApril 2011August 2013Allow2820NoNo
13080242CURRENT MEASUREMENT FOR WATER-BASED MUD GALVANIC ELECTRICAL IMAGING AND LATEROLOG TOOLSApril 2011September 2013Abandon3010NoNo
13039612HIGH-VOLTAGE TRANSFORMERMarch 2011May 2013Allow2610YesNo
13030134DISTANCE ADJUSTMENT SYSTEM FOR USE IN SOLAR WAFER INSPECTION MACHINE AND INSPECTION MACHINE PROVIDED WITH SAMEFebruary 2011February 2013Allow2400NoNo
12987106APPARATUS AND METHOD FOR HARDENING LATCHES IN SOI CMOS DEVICESJanuary 2011September 2012Allow2021YesNo
12985848DIGITAL COMMUNICATIONS TEST SYSTEM FOR MULTIPLE INPUT, MULTIPLE OUTPUT (MIMO) SYSTEMSJanuary 2011June 2012Allow2911NoNo
12984981IC WITH FIRST AND SECOND DISTRIBUTORS COLLECTORS AND SCAN PATHSJanuary 2011June 2011Allow510NoNo
12979216CLAMP JAW ASSEMBLYDecember 2010October 2011Allow910YesNo
12974950APPARATUS AND SYSTEMS FOR PROCESSING SIGNALS BETWEEN A TESTER AND A PLURALITY OF DEVICES UNDER TESTDecember 2010August 2012Abandon2020NoNo
12957545HALL SENSOR WITH TEMPERATURE DRIFT CONTROLDecember 2010July 2012Allow1930NoNo
12953362WAFER UNIT FOR TESTING SEMICONDUCTOR CHIPS AND TEST SYSTEMNovember 2010October 2012Allow2310NoNo
12952773LOGIC APPLYING DIFFERENT BIT POSITIONS TO RESPECTIVE SCAN PATHSNovember 2010April 2011Allow510NoNo
12517899TIME DIVISION MULTIPLEXED DETECTOR FOR A MAGNETO-OPTICAL CURRENT TRANSDUCERNovember 2010May 2013Allow4810NoNo
12911880METHOD AND APPARATUS FOR DETECTING ABNORMALITY OF CURRENT SENSOR IN BATTERY PACKOctober 2010December 2012Allow2610YesNo
12922700CURRENT DETECTOR AND WATTMETER USING THE SAMESeptember 2010March 2012Allow1810NoNo
12882051BURN-IN TESTING SYSTEMSeptember 2010March 2011Allow610YesNo
12865137VEHICLE SEAT WITH CAPACITIVE OCCUPANT DETECTION SYSTEMSeptember 2010March 2013Allow3210YesNo
12881346METHOD AND SYSTEM FOR DETERMINING THE ACTIVITY OF A PERSON, RECORDING MEDIUM FOR THIS METHODSeptember 2010November 2012Allow2600YesNo
12881363METHOD AND SYSTEM FOR LOCATING A PERSON AND MEDIUM COMPRISING INSTRUCTIONS FOR PERFORMING THE METHODSeptember 2010March 2013Allow3020YesNo
12881137WAFER TRAY AND TEST APPARATUSSeptember 2010April 2013Allow3120NoNo
12880468SYSTEM FOR MEASURING OPPOSITE SIDES OF A WIRELESS COMMUNICATION APPARATUSSeptember 2010December 2010Allow300YesNo
12880561METHODS AND APPARATUS TO DETECT VOLTAGE CONDITIONS OF POWER SUPPLIESSeptember 2010April 2012Allow1900YesNo
12877510CHIP TESTING CIRCUITSeptember 2010February 2012Allow1710NoNo
12875151ACTIVE DEVICE ARRAY AND TESTING METHODSeptember 2010February 2012Allow1810YesNo
12874650DIE STACKING, TESTING AND PACKAGING FOR YIELDSeptember 2010January 2013Allow2940YesNo
12873236HIGH SPEED FULL DUPLEX TEST INTERFACEAugust 2010September 2012Allow2521NoNo
12871858MEASURING APPARATUS FOR ELECTROMAGNETIC INTERFERENCEAugust 2010June 2011Allow1010NoNo
12871589SCHMITT TRIGGER WITH TEST CIRCUIT AND METHOD FOR TESTINGAugust 2010May 2012Allow2110NoNo
12735929WIRING SUBSTRATE AND PROBE CARDAugust 2010October 2012Allow2540YesNo
12868387NON-CONTACT MAGNETIC CURRENT SENSING AND DISTRIBUTION SYSTEM FOR DETERMINING INDIVIDUAL POWER READINGS FROM A PLURALITY OF POWER SOURCESAugust 2010June 2013Abandon3410NoNo
12808198GEARBOX POSITION SENSOR AND CORRESPONDING GEARBOXAugust 2010May 2013Allow3520YesNo
12859100ELECTRONIC DEVICE IDENTIFYING METHOD AND ELECTRONIC DEVICE COMPRISING IDENTIFICATION MEANSAugust 2010May 2011Allow920YesNo
12866397PROBE PIN AND METHOD OF MANUFACTURING THE SAMEAugust 2010October 2012Abandon2621NoNo
12848937INTEGRATED POWER DETECTOR WITH TEMPERATURE COMPENSATION FOR FULLY-CLOSED LOOP CONTROLAugust 2010November 2010Allow300YesNo
12733712CIRCUIT AND METHOD FOR TESTING ELECTRICALLY CONTROLLABLE POWER SWITCHES FOR ACTIVATING OCCUPANT PROTECTION MEANSJuly 2010June 2013Abandon3910NoNo
12832563HALL DEVICE AND MAGNETIC SENSOR CIRCUITJuly 2010November 2012Abandon2900NoNo
12830938PROBE CIRCUIT, MULTI-PROBE CIRCUIT, TEST APPARATUS, AND ELECTRIC DEVICEJuly 2010May 2013Allow3411NoNo
12827687SUBSEA ELECTRONIC MODULESJune 2010November 2012Allow2810NoNo
12824896INTERCONNECTION CARD FOR INSPECTION, MANUFACTURE METHOD FOR INTERCONNECTION CARD, AND INSPECTION METHOD USING INTERCONNECTION CARDJune 2010August 2012Allow2541NoNo
12801790PROBE CARD FOR SEMICONDUCTOR WAFERJune 2010September 2011Allow1520NoNo
12819193Micro-Magnetic Sensor for Acceleration, Position, Tilt, and VibrationJune 2010July 2013Abandon3710NoNo
12815233COMPENSATION FOR VOLTAGE DROP IN AUTOMATIC TEST EQUIPMENTJune 2010January 2012Allow1920YesNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner ISLA, RICHARD.

Strategic Value of Filing an Appeal

Total Appeal Filings
3
Allowed After Appeal Filing
2
(66.7%)
Not Allowed After Appeal Filing
1
(33.3%)
Filing Benefit Percentile
92.2%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 66.7% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the top 25% across the USPTO, indicating that filing appeals is particularly effective here. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Strategic Recommendations

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner ISLA, RICHARD - Prosecution Strategy Guide

Executive Summary

Examiner ISLA, RICHARD works in Art Unit 2858 and has examined 196 patent applications in our dataset. With an allowance rate of 85.7%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 32 months.

Allowance Patterns

Examiner ISLA, RICHARD's allowance rate of 85.7% places them in the 63% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by ISLA, RICHARD receive 1.87 office actions before reaching final disposition. This places the examiner in the 44% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by ISLA, RICHARD is 32 months. This places the examiner in the 52% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +21.9% benefit to allowance rate for applications examined by ISLA, RICHARD. This interview benefit is in the 67% percentile among all examiners. Recommendation: Interviews provide an above-average benefit with this examiner and are worth considering.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 32.6% of applications are subsequently allowed. This success rate is in the 69% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 42.9% of cases where such amendments are filed. This entry rate is in the 66% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 200.0% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 96% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 100.0% of appeals filed. This is in the 94% percentile among all examiners. Of these withdrawals, 66.7% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 30.8% are granted (fully or in part). This grant rate is in the 18% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 16.3% of allowed cases (in the 97% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 7.1% of allowed cases (in the 85% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.