USPTO Examiner HOLLINGTON JERMELE M - Art Unit 2858

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
18996190GENERATOR SET CIRCUIT BREAKER APPARATUS SYNCHRONIZATION TEST METHOD AND APPARATUS, DEVICE, AND MEDIUMJanuary 2025May 2025Allow400NoNo
18734706METHOD FOR SEMICONDUCTOR DEVICE INTERFACE CIRCUITRY FUNCTIONALITY AND COMPLIANCE TESTINGJune 2024May 2025Allow1100NoNo
18663123MEASURING SYSTEM AND MEASURING METHOD FOR CONDUCTIVITY OF SUPERCRITICAL GEOTHERMAL FLUIDMay 2024November 2024Allow610NoNo
18618474MULTIPLE CIRCUIT BOARD TESTERMarch 2024September 2024Allow610NoNo
18602925CONTROLLING ALIGNMENT DURING A THERMAL CYCLEMarch 2024January 2025Allow1010NoNo
18587234BATTERY DIODE FAULT MONITORINGFebruary 2024February 2025Allow1110NoNo
18544649Testing of a Photovoltaic PanelDecember 2023March 2025Allow1510NoNo
18526497TSV TESTINGDecember 2023July 2024Allow800NoNo
18381854MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEMOctober 2023September 2024Allow1110NoNo
18485919CAN TRANSCEIVER AND METHOD FOR THE CAN TRANSCEIVEROctober 2023June 2025Allow2000NoNo
18473316BATTERY CELL SAMPLING VOLTAGE COMPENSATION METHOD AND APPARATUS AND ELECTRIC APPARATUSSeptember 2023January 2025Allow1610NoNo
18464124MEASUREMENT SYSTEM AND METHOD OF DETERMINING A NOISE FIGURE OF A DEVICE UNDER TESTSeptember 2023June 2025Allow2100NoNo
18240957SEMICONDUCTOR TEST DEVICE AND SYSTEM AND TEST METHOD USING THE SAMEAugust 2023March 2025Allow1810YesNo
18235340BATTERY STATUS MEASUREMENT METHODAugust 2023April 2025Allow2000NoNo
18450528PHOTOVOLTAIC SYSTEM, POWER SUPPLY SYSTEM, AND INSULATION FAULT DETECTION METHODAugust 2023April 2025Allow2000NoNo
18274466CIRCUIT AND METHOD FOR POST-BINDING TESTING OF 2.5D CHIPLETJuly 2023November 2024Allow1500NoNo
18224016FAN FAULT DETECTION DEVICEJuly 2023June 2024Allow1110NoNo
18351104MULTIPLE CIRCUIT BOARD TESTERJuly 2023January 2024Allow710NoNo
18267602VOLTAGE DETECTION CIRCUITJune 2023June 2025Allow2410NoNo
18202957METHOD OF DETECTING AND POSITIONING INSULATION FAILURE OF AIRCRAFT GENERATORMay 2023December 2024Allow1800NoNo
18253118A Method and System for Branch Circuit MarkingMay 2023February 2025Allow2100NoNo
18250112METHOD FOR PRODUCING A SET OF CALIBRATION PADS, CALIBRATION PAD AND METHOD FOR CALIBRATING AN ELECTRON PARAMAGNETIC RESONANCE SPECTROMETERApril 2023May 2025Abandon2501NoNo
18297954BATTERY CELL THERMAL FAILURE MITIGATIONApril 2023March 2025Allow2310YesNo
18030780CRYOGEN-FREE SUPERCONDUCTING MAGNET SYSTEMApril 2023May 2025Allow2510NoNo
18129907WAFER INSPECTION SYSTEMApril 2023May 2025Allow2510NoNo
18129351METHOD FOR LOCATING A FAULT POINT ON A HIGH-VOLTAGE THREE-PHASE AC CABLE, AND SYSTEM FOR LOCATING A FAULT POINTMarch 2023February 2025Allow2310NoNo
18128947SOFTWARE DEFINED DEVICE VARIANTSMarch 2023May 2025Allow2610YesNo
18128055DOUBLE-BALANCE ELECTRONIC TEST APPARATUS AND MEASURING INDUCTANCE, CAPACITANCE, AND RESISTANCEMarch 2023October 2024Allow1900NoNo
18246990OIL FILM STATE DETECTION METHOD, STATE DETECTION DEVICE, AND PROGRAMMarch 2023February 2025Allow2310NoNo
18027835Apparatus and Method for Diagnosing State of BatteryMarch 2023April 2025Allow2510YesNo
18185441CHOPPER-STABILIZED AMPLIFIERMarch 2023June 2025Allow2711YesNo
18118878Inspection Device and Inspection Method Using Inspection DeviceMarch 2023October 2024Allow2000NoNo
18115962METHOD OF INSPECTING DISPLAY SUBSTRATEMarch 2023May 2025Allow2610NoNo
18175306CHIP TEST CIRCUIT AND CIRCUIT TEST METHODFebruary 2023October 2024Allow1900NoNo
18174003TRANSMIT MODULATION TESTINGFebruary 2023April 2025Allow2511NoNo
18171373CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP STRUCTURESFebruary 2023March 2025Allow2510YesNo
18040998DIELECTRIC-CONSTANT MEASURING DEVICEFebruary 2023January 2025Allow2310NoNo
18040554MAGNETIC SENSOR AND ITS MANUFACTURING METHODFebruary 2023December 2024Allow2210NoNo
18164095METHOD, DEVICE AND SYSTEM FOR MEASURING FREQUENCY DOMAIN CHARACTERISTICS, AND STORAGE MEDIUMFebruary 2023March 2025Allow2520NoNo
18159794SYSTEM FOR TESTING AN INTEGRATED CIRCUIT OF A DEVICE AND ITS METHOD OF USEJanuary 2023December 2023Allow1100NoNo
18082381SYSTEM AND METHOD OF TESTING A SEMICONDUCTOR DEVICEDecember 2022October 2023Allow1010NoNo
18066217Integrated Modular System for High Density, High Amperage Testing of Batteries within an Environmental Test ChamberDecember 2022December 2024Allow2410NoNo
18080232SIGNAL PROCESSING APPARATUSDecember 2022August 2024Allow2000NoNo
17991546MODULAR WIRELESS COMMUNICATION DEVICE TESTING SYSTEMNovember 2022September 2023Allow910NoNo
17990607INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP TESTING INTERFACENovember 2022January 2024Allow1420YesNo
18056490SENSOR DEVICES, ASSOCIATED PRODUCTION METHODS AND METHODS FOR DETERMINING A MEASUREMENT CURRENTNovember 2022September 2024Allow2200NoNo
17984127CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP STRUCTURESNovember 2022April 2023Allow510NoNo
18053411SYSTEM FOR SCAN MODE EXIT AND METHODS FOR SCAN MODE EXITNovember 2022September 2024Allow2320NoNo
17980332CAPACITANCE DETECTION DEVICE AND INPUT DEVICENovember 2022August 2024Allow2110NoNo
17979142MODELLING AND PREDICTION OF VIRTUAL INLINE QUALITY CONTROL IN THE PRODUCTION OF MEMORY DEVICESNovember 2022September 2024Allow2200NoNo
17976644REVERSE RECOVERY MEASUREMENTS AND PLOTSOctober 2022March 2025Allow2810NoNo
18048833TEST SYSTEM WITH A THERMAL HEAD COMPRISING A PLURALITY OF ADAPTERS FOR INDEPENDENT THERMAL CONTROL OF ZONESOctober 2022May 2023Allow710YesNo
17970853SYSTEMS AND METHODS FOR ON-CHIP NOISE MEASUREMENTSOctober 2022December 2024Allow2600NoNo
17957187REPAIR METHOD FOR SEALING THE BACK OF PHOTOVOLTAIC MODULESSeptember 2022July 2024Allow2210NoNo
17802969ANALYZING AN OPERATION OF A POWER SEMICONDUCTOR DEVICEAugust 2022January 2025Allow2810NoNo
17896336Method for Locating Open Circuit Failure Point of Test StructureAugust 2022November 2023Allow1400NoNo
17892622LITHIUM-ION BATTERY IMPENDING FAILURE DETECTIONAugust 2022February 2023Allow620YesNo
17815840METHODS AND APPARATUSES FOR ACOUSTICALLY TESTING MEMS DEVICESJuly 2022January 2025Allow3010NoNo
17870034FUSE LIFE EXPECTANCY PREDICTION DEVICE FOR ELECTRIC VEHICLE BATTERY AND PREDICTION METHOD THEREOFJuly 2022June 2024Allow2310NoNo
17862142INTEGRATED CIRCUIT MARGIN MEASUREMENT AND FAILURE PREDICTION DEVICEJuly 2022September 2023Allow1420NoNo
17850958IN-SITU MONITORING METHOD AND APPARATUS FOR POWER ELECTRONIC DEVICE EXPLOSIONJune 2022January 2023Allow710YesNo
17840542PROGRAM BURNING DEVICE AND CURRENT-PROTECTION DETECTION METHOD THEREOFJune 2022May 2024Allow2300NoNo
17833449METHOD FOR CONTROLLING DROP TEST EQUIPMENTJune 2022January 2025Abandon3110NoNo
17832557CONTACTOR WITH ANGLED DEPRESSIBLE PROBES IN SHIFTED BORESJune 2022June 2023Abandon1210NoNo
17777636SOCKET AND TOOLMay 2022April 2024Allow2310NoNo
17747859METHOD, DEVICE AND ELECTRONIC DEVICE FOR DETERMINING INTERNAL SHORT CIRCUIT WITHIN BATTERYMay 2022February 2025Abandon3310NoNo
17756091PROXIMITY AND PRESSURE DETECTION DEVICE, DETECTION LAYER AND ITEM OF EQUIPMENT EQUIPPED WITH SUCH DEVICESMay 2022June 2024Abandon2510NoNo
17663561SYSTEM AND METHOD FOR PARALLEL TESTING OF ELECTRONIC DEVICEMay 2022October 2024Allow2910NoNo
17602950METHOD FOR DETERMINING THE GEOMETRY OF AN OBJECT BASED ON DATA FROM NON-DESTRUCTIVE MEASURING METHODSMay 2022July 2024Allow3310NoNo
17744282METHOD FOR CHARACTERIZING FLUCTUATION INDUCED BY SINGLE PARTICLE IRRADIATION IN A DEVICE AND APPLICATION THEREOFMay 2022September 2022Allow400NoNo
17662368TEST BOARD FOR TESTING MEMORY SIGNALMay 2022October 2024Allow3010NoNo
17607259METHOD FOR MONITORING AN ENGINE CONTROL UNITMay 2022July 2024Allow3210NoNo
17730412BOND WIRE PAYOFF SYSTEM AND METHODApril 2022October 2024Allow3010NoNo
17725695VIRTUAL METROLOGY FOR FEATURE PROFILE PREDICTION IN THE PRODUCTION OF MEMORY DEVICESApril 2022April 2024Allow2400NoNo
17723241CALIBRATING ELECTROMAGNETIC CORROSION DETECTION TOOLS VIA CORE SATURATIONApril 2022April 2025Allow3620NoNo
17716356High Speed Arc SuppressorApril 2022April 2023Allow1310NoNo
17712698DIE-TO-DIE CONNECTIVITY MONITORINGApril 2022April 2024Allow2400NoNo
17710315FREQUENCY DETECTION CIRCUIT AND RECEPTION DEVICEMarch 2022October 2023Allow1900NoNo
17765630VOLTAGE SENSING CIRCUIT, BATTERY PACK, AND BATTERY SYSTEMMarch 2022May 2024Allow2510YesNo
17639530METHOD AND APPARATUS FOR DETERMINING A SATURATION CHARACTERISTIC OF A SYNCHRONOUS RELUCTANCE MACHINEMarch 2022September 2024Allow3110NoNo
17682506RESONANT FREQUENCY CHANGE DETECTIONFebruary 2022January 2025Allow3410NoNo
17667297CONVERTER SYSTEM, METHOD AND APPARATUS FOR DETECTING INSULATION RESISTANCE OF SYSTEM, AND MEDIUMFebruary 2022January 2024Allow2310NoNo
17583461Testing of a Photovoltaic PanelJanuary 2022September 2023Allow2000NoNo
17570076MULTIPLE CIRCUIT BOARD TESTERJanuary 2022March 2023Allow1410NoNo
17565284SECURE TESTING MODEDecember 2021May 2024Allow2910NoNo
17559111FAST DROOP DETECTION CIRCUITDecember 2021March 2024Allow2701NoNo
17559957RESISTIVE ELECTROMAGNET SYSTEMS AND METHODSDecember 2021January 2024Allow2510NoNo
17557512TSV TESTING METHOD AND APPARATUSDecember 2021July 2023Allow1910NoNo
17542931SEMICONDUCTOR CIRCUIT AND SEMICONDUCTOR DEVICE FOR DETERMINING A STATUS OF A FUSE ELEMENTDecember 2021December 2023Allow2510NoNo
17531486CARRIER BASED HIGH VOLUME SYSTEM LEVEL TESTING OF DEVICES WITH POP STRUCTURESNovember 2021May 2022Allow611YesNo
17595573APPARATUS FOR MEASURING DROPLET LENGTH USING CAPACITIVE ELECTRODENovember 2021March 2024Allow2810NoNo
17526761DEVICE AND METHOD FOR CONTACTLESSLY DETERMINING A POSITION OF A PEDALNovember 2021January 2024Allow2610NoNo
17522188TEST DEVICES, TEST SYSTEMS, AND OPERATING METHODS OF TEST SYSTEMSNovember 2021June 2024Allow3111YesNo
17607866APPARATUS FOR SENSING DISPLACEMENT OF BRAKE PEDALOctober 2021July 2024Allow3320NoNo
17509491Testing of a Photovoltaic PanelOctober 2021September 2023Allow2300NoNo
17606048SEMICONDUCTOR DEVICE AND POWER CONVERSION DEVICEOctober 2021February 2024Allow2700NoNo
17602947PROCESS CORNER DETECTION CIRCUIT AND PROCESS CORNER DETECTION METHODOctober 2021December 2022Allow1420NoNo
17602604PROTECTIVE RELAY INSPECTION DEVICEOctober 2021December 2023Allow2601NoNo
17489559FIXTURESeptember 2021October 2023Allow2410NoNo
17599828PULSE WIDTH MODULATION AND VOLTAGE TEST SIGNALS FOR FAN TYPE DETECTIONSeptember 2021June 2024Abandon3301NoNo

Appeals Overview

This analysis examines appeal outcomes and the strategic value of filing appeals for examiner HOLLINGTON, JERMELE M.

Patent Trial and Appeal Board (PTAB) Decisions

Total PTAB Decisions
1
Examiner Affirmed
1
(100.0%)
Examiner Reversed
0
(0.0%)
Reversal Percentile
12.1%
Lower than average

What This Means

With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.

Strategic Value of Filing an Appeal

Total Appeal Filings
17
Allowed After Appeal Filing
7
(41.2%)
Not Allowed After Appeal Filing
10
(58.8%)
Filing Benefit Percentile
66.1%
Higher than average

Understanding Appeal Filing Strategy

Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.

In this dataset, 41.2% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is above the USPTO average, suggesting that filing an appeal can be an effective strategy for prompting reconsideration.

Strategic Recommendations

Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.

Filing a Notice of Appeal is strategically valuable. The act of filing often prompts favorable reconsideration during the mandatory appeal conference.

Examiner HOLLINGTON, JERMELE M - Prosecution Strategy Guide

Executive Summary

Examiner HOLLINGTON, JERMELE M works in Art Unit 2858 and has examined 856 patent applications in our dataset. With an allowance rate of 89.7%, this examiner has an above-average tendency to allow applications. Applications typically reach final disposition in approximately 29 months.

Allowance Patterns

Examiner HOLLINGTON, JERMELE M's allowance rate of 89.7% places them in the 70% percentile among all USPTO examiners. This examiner has an above-average tendency to allow applications.

Office Action Patterns

On average, applications examined by HOLLINGTON, JERMELE M receive 1.23 office actions before reaching final disposition. This places the examiner in the 22% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by HOLLINGTON, JERMELE M is 29 months. This places the examiner in the 47% percentile for prosecution speed. Prosecution timelines are slightly slower than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a -16.1% benefit to allowance rate for applications examined by HOLLINGTON, JERMELE M. This interview benefit is in the 1% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 42.5% of applications are subsequently allowed. This success rate is in the 93% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 65.2% of cases where such amendments are filed. This entry rate is in the 87% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.

Pre-Appeal Conference Effectiveness

When applicants request a pre-appeal conference (PAC) with this examiner, 142.9% result in withdrawal of the rejection or reopening of prosecution. This success rate is in the 88% percentile among all examiners. Strategic Recommendation: Pre-appeal conferences are highly effective with this examiner compared to others. Before filing a full appeal brief, strongly consider requesting a PAC. The PAC provides an opportunity for the examiner and supervisory personnel to reconsider the rejection before the case proceeds to the PTAB.

Appeal Withdrawal and Reconsideration

This examiner withdraws rejections or reopens prosecution in 93.3% of appeals filed. This is in the 83% percentile among all examiners. Of these withdrawals, 50.0% occur early in the appeal process (after Notice of Appeal but before Appeal Brief). Strategic Insight: This examiner frequently reconsiders rejections during the appeal process compared to other examiners. Per MPEP § 1207.01, all appeals must go through a mandatory appeal conference. Filing a Notice of Appeal may prompt favorable reconsideration even before you file an Appeal Brief.

Petition Practice

When applicants file petitions regarding this examiner's actions, 42.9% are granted (fully or in part). This grant rate is in the 45% percentile among all examiners. Strategic Note: Petitions show below-average success regarding this examiner's actions. Ensure you have a strong procedural basis before filing.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 2.5% of allowed cases (in the 80% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 4.4% of allowed cases (in the 77% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Consider after-final amendments: This examiner frequently enters after-final amendments. If you can clearly overcome rejections with claim amendments, file an after-final amendment before resorting to an RCE.
  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.
  • Request pre-appeal conferences: PACs are highly effective with this examiner. Before filing a full appeal brief, request a PAC to potentially resolve issues without full PTAB review.
  • Appeal filing as negotiation tool: This examiner frequently reconsiders rejections during the appeal process. Filing a Notice of Appeal may prompt favorable reconsideration during the mandatory appeal conference.
  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.