USPTO Examiner FORTICH ALVARO E - Art Unit 2858

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19338667SYSTEM AND METHOD FOR SENSING PLANT ELECTRICAL SIGNALSSeptember 2025December 2025Allow200NoNo
19260452OPTICAL-PATH FOLDING-ELEMENT WITH AN EXTENDED TWO DEGREE OF FREEDOM ROTATION RANGEJuly 2025August 2025Allow100NoNo
19252698MAGNETIC MOMENT MEASUREMENT SYSTEM AND METHODJune 2025August 2025Allow200NoNo
19231983VEHICLE MAGNETOMETER CALIBRATION SYSTEMJune 2025July 2025Allow200NoNo
18850693MAGNETOSTRICTIVE DISPLACEMENT SENSOR CALIBRATION METHOD, SYSTEM, DEVICE, AND STORAGE MEDIUMJanuary 2025March 2025Allow600NoNo
19001271SYSTEMS AND METHODS FOR SENSING ENVIRONMENTAL CONDITIONS SURROUNDING PHOTOVOLTAIC SYSTEMSDecember 2024March 2025Allow300NoNo
18838852METHOD AND APPARATUS FOR MEASURING MAGNETIC FIELD INTENSITY IN HIGH-TEMPERATURE SUPERCONDUCTING MAGLEV TRANSPORTATION SYSTEMSAugust 2024January 2025Allow500NoNo
18794103OPTICAL-PATH FOLDING-ELEMENT WITH AN EXTENDED TWO DEGREE OF FREEDOM ROTATION RANGEAugust 2024April 2025Allow820NoNo
18780499APPARATUS FOR TESTING ELECTRONIC DEVICESJuly 2024March 2026Allow2000NoNo
18772855INDUCTIVE SENSOR INTERFACE FOR ON-WAFER PLATING THICKNESS MEASUREMENTSJuly 2024March 2026Allow2000NoNo
18753845LEAD DETECTION SYSTEM FOR UNDERGROUND PIPESJune 2024June 2025Allow1210NoNo
18737185SENSORJune 2024December 2024Allow600NoNo
18732659Multifunctional Line Finder for Miniature Circuit BreakerJune 2024February 2026Allow2110NoNo
18712086MONITORING AND CONTROL IN A WIND PARKMay 2024January 2026Allow2000NoNo
18664960MAGNETIC SYSTEM INCLUDING A MAGNETORESISTIVE ELEMENT DISPOSED ON AN INCLINED SURFACEMay 2024February 2026Allow2100YesNo
18660584TECHNOLOGIES FOR SOLAR PHOTOVOLTAIC CELL DIAGNOSTIC INTEGRATED CIRCUITMay 2024February 2026Allow2100NoNo
18653770SENSOR POSITIONING RELATIVE TO A MAGNETIC FIELD SOURCE AND A PASSENGER CABIN OF A VEHICLEMay 2024October 2024Allow610YesNo
18640358Spare part system for maintaining availability of spare parts for an electric power supply systemApril 2024December 2025Allow2000NoNo
18638163TESTING DEVICE AND ITS ADAPTER HOLDERApril 2024January 2026Allow2101NoNo
18700759COMPENSATION CIRCUIT AND COMPENSATION METHOD FOR MAGNETIC FIELD SENSING ELEMENTApril 2024November 2025Allow1900YesNo
18630100OPTICAL-PATH FOLDING-ELEMENT WITH AN EXTENDED TWO DEGREE OF FREEDOM ROTATION RANGEApril 2024May 2024Allow100NoNo
18551379LOW-MAGNETIC-FIELD MAGNETORESISTIVE ANGLE SENSORApril 2024November 2025Allow2600NoNo
18620102SENSOR HAVING PROTRUDING SURFACEMarch 2024January 2025Allow1010NoNo
18606125TMR VORTEX LAYOUT FOR BACK BIAS SENSORSMarch 2024November 2025Allow2000NoNo
18604991MEASUREMENT INSTRUMENT FOR MEASURING RADIO FREQUENCY SIGNALS AND A MEASUREMENT METHODMarch 2024January 2026Allow2301NoNo
18602911Radio Frequency Signals Detection SystemsMarch 2024September 2024Allow700NoNo
18591026MAGNETIC SENSOR DEVICEFebruary 2024November 2025Allow2000NoNo
18569074Sensor Device and Method for Determination of Properties of a LiquidFebruary 2024September 2025Allow2100NoNo
18444214CMOS INTEGRATED HUMIDITY SENSOR WITH BUILT-IN HEATERFebruary 2024September 2025Allow1900NoNo
18443303ESTIMATION APPARATUS, APPARATUS, ESTIMATION METHOD AND COMPUTER READABLE STORAGE MEDIUMFebruary 2024August 2025Allow1800NoNo
18442537CLOSED LOOP MAGNETIC FIELD SENSOR WITH CURRENT CONTROLFebruary 2024November 2025Allow2100NoNo
18294283MAGNETORESISTIVE ELEMENT HAVING COMPENSATED TEMPERATURE COEFFICIENT OF TMRFebruary 2024August 2025Allow1900NoNo
18293029UWB ANTENNA AND BLE ANTENNA PERFORMANCE TEST SYSTEMJanuary 2024October 2025Allow2000NoNo
18423290MAGNETIC SENSORJanuary 2024August 2025Allow1800NoNo
18421269MAGNETISM DETECTION DEVICEJanuary 2024August 2025Allow1800NoNo
18421424METHOD FOR MEASURING CONDENSATION AND/OR ADVANCE OF CORROSIONJanuary 2024November 2025Allow2201NoNo
18414833VEHICLE ACTIVATION SYSTEMS AND METHODS FOR ELECTRIC VEHICLESJanuary 2024December 2024Allow1100NoNo
18409434MEASUREMENT DEVICE AND METHOD FOR ANALYZING A DEVICE-UNDER-TESTJanuary 2024November 2025Allow2210NoNo
18396476MAGNETIC DETECTION DEVICEDecember 2023July 2025Allow1900NoNo
18391819MAGNETIC SENSOR INCLUDING MAGNETIC DETECTION ELEMENT DISPOSED ON INCLINED SURFACEDecember 2023November 2024Allow1110YesNo
18545847Magnetic Sensor Half-Bridge Based on Inverse Spin Hall Effect with Reduced Thermal DriftDecember 2023July 2025Allow1900NoNo
18545805MAGNETIC DETECTION DEVICEDecember 2023July 2025Allow1900NoNo
18532179CAPACITIVE SOIL MOISTURE DETECTION DEVICE AND SYSTEMDecember 2023July 2025Allow1900NoNo
18531008Sensor Readout System and Sensor Readout MethodDecember 2023January 2026Allow2510NoNo
18524172MAGNETIC SENSOR INCLUDING MAGNETIC DETECTION ELEMENT INCLUDING BOTTOM SURFACE FACING INCLINED SURFACENovember 2023November 2024Allow1110YesNo
18524904SENSOR INCLUDING AT LEAST ONE INCLINED SURFACENovember 2023November 2024Allow1110YesNo
18518590CALIBRATION METHOD OF MAGNETIC FIELD MODEL AND CONTROLLER FOR ELECTROMAGNETIC POSITIONINGNovember 2023March 2026Allow2810NoNo
18509353OPTICAL-PATH FOLDING-ELEMENT WITH AN EXTENDED TWO DEGREE OF FREEDOM ROTATION RANGENovember 2023January 2024Allow200NoNo
18508897IN-LINE QUALITY INSPECTION OF METAL FOILS DURING PRODUCTIONNovember 2023October 2025Allow2300NoNo
18508421MOISTURE SENSOR USING ELECTRICAL CONDUCTIVITY MEASUREMENTNovember 2023October 2025Allow2310YesNo
18503333TMR SENSOR HAVING MAGNETIC FIELD GENERATION FOR PILLAR STIMULATIONNovember 2023November 2025Allow2410NoNo
18289691DAMAGE DETECTION SYSTEMNovember 2023August 2025Allow2200NoNo
18386351SENSOR DEVICENovember 2023June 2025Allow1900NoNo
18499261CURRENT SENSOR THAT INCLUDES A CURRENT RAIL AND A MAGNETIC FIELD SENSOR WITH GALVANIC ISOLATIONNovember 2023March 2025Allow1710YesNo
18557964Humidity Sensor, Manufacturing Method Therefor and Electronic DeviceOctober 2023June 2025Allow2000NoNo
18495835APPARATUS, SYSTEMS, AND METHODS FOR MEASUREMENT USING MAGNETO-OPTICAL KERR EFFECTOctober 2023August 2024Allow1010NoNo
18493535DEVICE AND PROCEDURE FOR CURRENT MEASUREMENT WITH TEMPERATURE-BASED FREQUENCY RESPONSE CORRECTION IN AN ANALOG SIGNAL PATHOctober 2023October 2025Allow2410YesNo
18382402HIGH-THROUGHPUT ELECTROCHEMICAL CHARACTERIZATION APPARATUS AND SYSTEM AND METHODS FOR USING THE SAMEOctober 2023July 2025Allow2000NoNo
18380091NANODEVICE, METHOD OF MAKING THE SAME, AND METHOD OF USING THE SAMEOctober 2023September 2025Allow2310NoNo
18480573AUTO-CALIBRATION FOR CORELESS CURRENT SENSORSOctober 2023February 2025Allow1620NoNo
18478015ELECTRONICLESS ACCESSORY RECOGNITION USING DIELECTRIC PROPERTIESSeptember 2023August 2025Allow2310NoNo
18553000MAGNETIC SENSOR DEVICE HAVING AN IMPROVED MEASUREMENT RANGESeptember 2023August 2025Allow2310NoNo
18284556Drift-Free Humidity Sensor And Calibration Method ThereofSeptember 2023September 2025Allow2410YesNo
18551098MAGNETORESISTIVE ELEMENT AND MAGNETIC SENSOR DEVICE HAVING A HIGH SENSITIVITY AND LOW ZERO-FIELD OFFSET-SHIFTSeptember 2023May 2025Allow2010NoNo
18367044CLOSED LOOP, HIGH ACCURACY HALL EFFECT SENSOR AFE WITH AUTOZEROED SWITCHED-CAPACITOR ANALOG ACCUMULATORSeptember 2023April 2025Allow1900NoNo
18463316PUF-BASED MAGNETOMETER WITH SAFETY PROTECTION CIRCUITSeptember 2023April 2025Allow1900NoNo
18242624WIDE-RANGE PERPENDICULAR SENSITIVE MAGNETIC SENSOR AND METHOD FOR MANUFACTURING THE SAMESeptember 2023December 2023Allow300NoNo
18461186DEVICE FOR THE DETECTION OF WETNESS IN WHEEL ARCHESSeptember 2023April 2025Allow2000NoNo
17271236DETECTION DEVICE CONFIGURED TO DETECT ABNORMALITY OF LIGHT-EMITTING PANEL AND DETECTION METHOD THEREOFAugust 2023October 2025Allow5510NoNo
18458441MAGNETORESISTANCE SIGNAL PATH COMPENSATIONAugust 2023September 2025Allow2501NoNo
18457413SENSOR WITH ADJUSTABLE DIGITAL OUTPUT SIGNAL RESOLUTIONAugust 2023April 2025Allow2000NoNo
18456750APPARATUS AND METHOD FOR COMPENSATING FOR SENSITIVITY FLUCTUATIONS OF A MAGNETIC FIELD SENSOR CIRCUITAugust 2023December 2025Allow2720YesNo
18233665RESISTIVITY LOGGING IN SLIDING MODEAugust 2023July 2025Allow2310NoNo
18449414METHOD FOR IDENTIFYING AN ATTACHED STATE OR A DETACHED STATE OF AN ACCESSORY DEVICE AND ELECTRONIC DEVICE SUPPORTING THE SAMEAugust 2023July 2025Allow2310NoNo
18448444MAGNETIC SENSOR DEVICE AND METHOD OF MANUFACTURING THE SAMEAugust 2023December 2025Allow2811NoNo
18447988GROUND TRANSMITTING SYSTEM AND METHOD FOR ELECTROMAGNETIC TRANSMISSION BETWEEN WELL AND GROUND FOR INTELLIGENT DRILL GUIDINGAugust 2023February 2024Allow600YesNo
18231994SPIN HALL MAGNETIC SENSOR AND METHOD OF MEASURING MAGNETORESISTANCE USING THE SAMEAugust 2023April 2025Allow2000NoNo
18366737INTERLEAVING SUB-ARRAYS OF MAGNETORESISTANCE ELEMENTS BASED ON REFERENCE DIRECTIONS TO COMPENSATE FOR BRIDGE OFFSETAugust 2023January 2025Allow1800NoNo
18228556WIDE BANDWIDTH HALL SENSING CIRCUITRY WITH OFFSET COMPENSATION AND GAIN CALIBRATIONJuly 2023March 2025Allow2000NoNo
18263374Additively Fabricated Capacitive Soil Moisture SensorJuly 2023November 2025Allow2710YesNo
18360772DETECTION DEVICE FOR EVALUATING INTERNAL ELECTRONIC ELEMENTS OF A TEST OBJECTJuly 2023December 2025Allow2911NoNo
18354909MAGNETIC SENSOR, POSITION DETECTION APPARATUS AND ELECTRONIC DEVICEJuly 2023June 2024Allow1110NoNo
18350166SYSTEMS AND METHODS FOR AUTOMATIC MAGNETIC VARIATION DETECTIONJuly 2023June 2025Allow2320NoNo
18350584SPIN ORBIT TORQUE BASED THERMAL SENSOR FOR INSITU MONITORING OF MAGNETIC RECORDING HEADJuly 2023July 2025Allow2511YesNo
18347768MAGNETIC SENSOR DEVICE AND MAGNETIC ENCODERJuly 2023March 2025Allow2000NoNo
182155012D MICROFLUIDIC STRUCTUREJune 2023December 2024Allow1800NoNo
18342041DYNAMIC OFFSET AND AMPLITUDE TRACKERJune 2023March 2024Allow910NoNo
18214702MAGNETIC DETECTION SYSTEMJune 2023January 2025Allow1800NoNo
18341765MAGNETIC DETECTION DEVICE, MAGNETIC DETECTION UNIT, MAGNETIC DETECTION SYSTEM, AND METHOD FOR MANUFACTURING MAGNETIC DETECTION UNITJune 2023March 2025Allow2000NoNo
18214962INSULATION INSPECTION METHOD AND INSULATION INSPECTION APPARATUSJune 2023February 2025Allow2000NoNo
18215087COMPACT CURRENT SENSING FOR PROTECTION AND WIRING DEVICESJune 2023February 2026Allow3111NoNo
18337005OPTICAL-PATH FOLDING-ELEMENT WITH AN EXTENDED TWO DEGREE OF FREEDOM ROTATION RANGEJune 2023August 2023Allow200YesNo
18336483POSITION TRANSMITTER, LINEAR ACTUATOR AND POSITION DETERMINATION METHODJune 2023February 2025Allow2000NoNo
18258116MAGNETIC SENSOR AND BIOMAGNETIC MEASUREMENT DEVICEJune 2023December 2024Allow1800NoNo
18335408MAGNETIC FIELD SENSOR SYSTEM WITH MAGNETIC VORTEX USED FOR B-FIELD REDIRECTION FOR OUT-OF-PLANE MAGNETIC FIELDJune 2023January 2025Allow1900NoNo
18333680MAGNETORESISTANCE ELEMENT INCLUDING A SKYRMION LAYER AND A VORTEX LAYER THAT ARE MAGNETICALLY COUPLED TO EACH OTHERJune 2023May 2025Allow2300NoNo
18208294Transmission Line Monitoring Using an Optical Blowout AnemometerJune 2023October 2025Allow2910NoNo
18332248MAGNETIC SENSING OPTICAL FIBER WITH INSCRIBED FIBER OPTIC SENSORSJune 2023November 2025Allow2911NoNo
18256494MAGNETORESISTIVE ELEMENT FOR SENSING A MAGNETIC FIELD IN A Z-AXISJune 2023April 2025Allow2200NoNo
18328715ADDRESSABLE TEST CHIP TEST SYSTEMJune 2023February 2024Allow800NoNo

Appeals Overview

No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.

Examiner FORTICH, ALVARO E - Prosecution Strategy Guide

Executive Summary

Examiner FORTICH, ALVARO E works in Art Unit 2858 and has examined 121 patent applications in our dataset. With an allowance rate of 96.7%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 24 months.

Allowance Patterns

Examiner FORTICH, ALVARO E's allowance rate of 96.7% places them in the 87% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by FORTICH, ALVARO E receive 0.95 office actions before reaching final disposition. This places the examiner in the 7% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by FORTICH, ALVARO E is 24 months. This places the examiner in the 83% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +4.8% benefit to allowance rate for applications examined by FORTICH, ALVARO E. This interview benefit is in the 29% percentile among all examiners. Recommendation: Interviews provide a below-average benefit with this examiner.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 38.7% of applications are subsequently allowed. This success rate is in the 88% percentile among all examiners. Strategic Insight: RCEs are highly effective with this examiner compared to others. If you receive a final rejection, filing an RCE with substantive amendments or arguments has a strong likelihood of success.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 21.4% of cases where such amendments are filed. This entry rate is in the 27% percentile among all examiners. Strategic Recommendation: This examiner shows below-average receptiveness to after-final amendments. You may need to file an RCE or appeal rather than relying on after-final amendment entry.

Petition Practice

When applicants file petitions regarding this examiner's actions, 0.0% are granted (fully or in part). This grant rate is in the 4% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 26% percentile). This examiner makes examiner's amendments less often than average. You may need to make most claim amendments yourself.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 0.0% of allowed cases (in the 32% percentile). This examiner issues Quayle actions less often than average. Allowances may come directly without a separate action for formal matters.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • RCEs are effective: This examiner has a high allowance rate after RCE compared to others. If you receive a final rejection and have substantive amendments or arguments, an RCE is likely to be successful.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.