Detailed information about the 100 most recent patent applications.
| Application Number | Title | Filing Date | Disposal Date | Disposition | Time (months) | Office Actions | Restrictions | Interview | Appeal |
|---|---|---|---|---|---|---|---|---|---|
| 18791601 | METHOD AND DEVICE FOR INSULATION MONITORING OF A WATER-ELECTROLYSIS INSTALLATION | August 2024 | May 2025 | Allow | 10 | 0 | 0 | No | No |
| 18749527 | METHOD AND ELECTRIC CIRCUIT ARRANGEMENT FOR SELECTIVE INSULATION MONITORING IN A POWER SUPPLY SYSTEM HAVING ISOLABLE SUBSYSTEMS | June 2024 | March 2025 | Allow | 9 | 0 | 0 | No | No |
| 18672591 | BRIDGE-BASED IMPEDANCE SENSOR SYSTEM | May 2024 | January 2025 | Allow | 8 | 0 | 0 | No | No |
| 18657902 | INTERFERENCE COMPENSATED AXIAL MAGNETOMETER MEASUREMENTS | May 2024 | May 2025 | Allow | 13 | 1 | 0 | No | No |
| 18656550 | FLEXIBLE CAPACITIVE TOUCH SENSING DEVICE AND HOD DEVICE | May 2024 | April 2025 | Allow | 12 | 1 | 0 | No | No |
| 18650064 | ELECTRONIC PANEL AND ELECTRONIC APPARATUS INCLUDING THE SAME | April 2024 | January 2025 | Allow | 9 | 0 | 0 | No | No |
| 18643636 | TEST STRUCTURE AND TEST METHOD THEREOF | April 2024 | May 2025 | Allow | 12 | 1 | 0 | No | No |
| 18426339 | MONITORING CIRCUIT AND SEMICONDUCTOR DEVICE | January 2024 | August 2024 | Allow | 7 | 0 | 0 | No | No |
| 18419860 | ACCURATE AND MODEL-BASED MEASUREMENT AND MANAGEMENT SYSTEMS AND METHODS | January 2024 | January 2025 | Allow | 12 | 0 | 0 | No | No |
| 18400347 | ELECTRONIC APPARATUS | December 2023 | December 2024 | Allow | 12 | 0 | 0 | No | No |
| 18519883 | ENCODER DEVICE, DRIVE DEVICE, STAGE DEVICE, AND ROBOT DEVICE | November 2023 | August 2024 | Allow | 8 | 1 | 0 | No | No |
| 18518470 | CIRCUIT, SEMICONDUCTOR DEVICE AND METHOD FOR PARAMETER PSRR MEASUREMENT | November 2023 | January 2025 | Allow | 13 | 1 | 0 | No | No |
| 18516106 | GALLIUM NITRIDE-BASED DEVICES AND METHODS OF TESTING THEREOF | November 2023 | September 2024 | Allow | 10 | 0 | 0 | No | No |
| 18560972 | AD CONVERTER, POWER MEASUREMENT DEVICE FOR WIDEBAND NOISE USING SAME, AND POWER SPECTRUM MEASUREMENT DEVICE | November 2023 | May 2024 | Allow | 6 | 0 | 0 | No | No |
| 18289252 | DEVICE AND METHOD FOR DETECTING INTER-TURN ELECTROMAGNETIC PULSE VIBRATION WAVE CHARACTERISTIC OF TURBOGENERATOR ROTOR WINDING | November 2023 | June 2024 | Allow | 8 | 0 | 0 | No | No |
| 18481586 | RADIO FREQUENCY PERFORMANCE CHARACTERIZATION OF MULTI-CARRIER BROADBAND DEVICES | October 2023 | November 2024 | Allow | 13 | 1 | 0 | No | No |
| 18464752 | Testing Device For Electronic Devices With In-Band Virtualized Wired Communications | September 2023 | April 2024 | Allow | 7 | 0 | 0 | No | No |
| 18462639 | SEMICONDUCTOR INTEGRATED CIRCUIT | September 2023 | April 2024 | Allow | 8 | 0 | 0 | No | No |
| 18461463 | SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE TESTING METHOD | September 2023 | April 2025 | Allow | 20 | 0 | 0 | No | No |
| 18241148 | SYSTEM AND METHOD FOR DETECTING FAULTS IN POWER TRANSMISSION SYSTEMS USING OSCILLOGRAPHY | August 2023 | May 2025 | Allow | 20 | 0 | 0 | No | No |
| 18236315 | TEST SYSTEM FOR AN INTELLIGENT ELECTRONIC DEVICE IN AN ELECTRIC SUB-STATION | August 2023 | April 2024 | Allow | 8 | 0 | 0 | No | No |
| 18235156 | VOLTAGE GLITCH DETECTORS | August 2023 | May 2025 | Allow | 21 | 0 | 0 | No | No |
| 18448411 | POWER SENSOR ARRANGEMENT FOR ON-WAFER POWER CALIBRATION | August 2023 | April 2025 | Allow | 20 | 0 | 0 | No | No |
| 18546004 | SELF-DETECTION CIRCUIT BASED ON POWER DETECTOR | August 2023 | April 2025 | Allow | 20 | 1 | 0 | No | No |
| 18447206 | ELECTRICAL FAULT DETECTION AND INTERRUPTION DEVICE AND RELATED ELECTRICAL CONNECTORS AND ELECTRICAL APPLIANCES | August 2023 | April 2025 | Allow | 20 | 0 | 0 | No | No |
| 18230918 | TEST STRUCTURE AND INTEGRATED CIRCUIT TEST USING SAME | August 2023 | April 2025 | Allow | 20 | 0 | 0 | No | No |
| 18363143 | TEST CIRCUIT AND METHOD | August 2023 | February 2024 | Allow | 6 | 0 | 0 | No | No |
| 18227149 | METHODS AND APPARATUS TO DETECT AND DIAGNOSE FAULTS IN BUCK REGULATORS | July 2023 | February 2025 | Allow | 19 | 0 | 0 | No | No |
| 18354808 | INTERFACE BUILT IN TEST FAILURE DETECTION APPARATUS | July 2023 | June 2025 | Allow | 23 | 0 | 0 | No | No |
| 18221824 | SEMICONDUCTOR WAFER CONFIGURED FOR SINGLE TOUCH-DOWN TESTING | July 2023 | February 2025 | Allow | 19 | 0 | 0 | No | No |
| 18349780 | WAFER TESTING FOR CURRENT PROPERTY OF A POWER TRANSISTOR | July 2023 | March 2025 | Allow | 20 | 0 | 0 | No | No |
| 18347137 | SEMICONDUCTOR DEVICE | July 2023 | January 2025 | Allow | 19 | 0 | 0 | No | No |
| 18347012 | LEAKAGE CURRENT DETECTION AND INTERRUPTION DEVICE FOR POWER CORD AND RELATED ELECTRICAL CONNECTORS AND ELECTRICAL APPLIANCES | July 2023 | March 2025 | Allow | 21 | 0 | 0 | No | No |
| 18215828 | INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAKAGE SENSOR | June 2023 | May 2024 | Allow | 11 | 0 | 0 | No | No |
| 18344558 | Remote Analyte Testing System | June 2023 | June 2024 | Allow | 12 | 0 | 0 | No | No |
| 18342919 | TEST STRUCTURE AND TEST METHOD THEREOF | June 2023 | January 2024 | Allow | 7 | 0 | 0 | No | No |
| 18337690 | RADIO-FREQUENCY ELEMENT GROUP TESTING SYSTEM AND METHOD | June 2023 | January 2025 | Allow | 19 | 0 | 0 | No | No |
| 18335790 | Diagnostic Circuit | June 2023 | May 2025 | Allow | 23 | 1 | 0 | Yes | No |
| 18334225 | STRAY FIELD REJECTION IN MAGNETIC SENSORS | June 2023 | May 2024 | Allow | 11 | 1 | 0 | No | No |
| 18256744 | AMPLIFIER CIRCUIT AND MEASUREMENT APPARATUS | June 2023 | February 2025 | Allow | 21 | 0 | 0 | No | No |
| 18323421 | DISPLAY PANEL, ELECTRONIC DEVICE AND CRACK DETECTION METHOD | May 2023 | February 2025 | Allow | 20 | 0 | 0 | No | No |
| 18198784 | IDENTIFYING FAULT IN TORQUE SIGNAL / TORQUE SENSOR FOR AIRCRAFT SYSTEM | May 2023 | May 2025 | Allow | 24 | 1 | 0 | No | No |
| 18315432 | SEMICONDUCTOR DEVICE HAVING DEFECT DETECTION CIRCUIT | May 2023 | April 2025 | Allow | 23 | 0 | 0 | No | No |
| 18035761 | SMART GRID SENSOR WITH POWER HARVESTING FROM LOW LINE CURRENTS | May 2023 | June 2025 | Allow | 26 | 0 | 1 | No | No |
| 18312619 | DEVICES AND METHODS FOR TREATMENT OF BODY LUMENS | May 2023 | January 2024 | Allow | 9 | 0 | 0 | No | No |
| 18309841 | Decoupling Cells Testability | May 2023 | November 2024 | Allow | 19 | 0 | 0 | Yes | No |
| 18141137 | ARC DETECTION SYSTEM | April 2023 | August 2024 | Abandon | 15 | 2 | 0 | No | No |
| 18032376 | ELECTRIC CURRENT SENSOR | April 2023 | October 2024 | Allow | 18 | 0 | 0 | No | No |
| 18301481 | COMPOSITE INTERMEDIARY DEVICE USING VERTICAL PROBE FOR WAFER TESTING | April 2023 | December 2024 | Allow | 20 | 0 | 0 | No | No |
| 18249039 | APPARATUS AND METHOD FOR MONITORING A SEMICONDUCTOR COMPONENT | April 2023 | June 2025 | Allow | 27 | 2 | 0 | No | No |
| 18298981 | METHOD AND SYSTEM FOR DISTRIBUTED GROUND DETECTION | April 2023 | June 2025 | Allow | 26 | 1 | 1 | Yes | No |
| 18298265 | ELECTRONIC PANEL AND ELECTRONIC APPARATUS INCLUDING THE SAME | April 2023 | December 2023 | Allow | 9 | 0 | 0 | No | No |
| 18297095 | METHODS AND SYSTEMS FOR DETECTING GUNPOWDER | April 2023 | March 2025 | Allow | 24 | 1 | 0 | Yes | No |
| 18030842 | METHOD FOR DETERMINING THE LINEAR AC ELECTRICAL RESISTANCE OF A STEEL PIPE AND DEVICE FOR IMPLEMENTING SUCH A METHOD | April 2023 | April 2025 | Allow | 25 | 1 | 0 | Yes | No |
| 18030705 | DEVICE UNDER TEST SIMULATION EQUIPMENT | April 2023 | October 2024 | Allow | 18 | 0 | 0 | No | No |
| 18296878 | INTELLIGENT SEMICONDUCTOR SWITCH WITH INTEGRATED CURRENT MEASUREMENT FUNCTION | April 2023 | October 2024 | Allow | 18 | 0 | 0 | No | No |
| 18296519 | PROCESSOR FREQUENCY IMPROVEMENT BASED ON ANTENNA OPTIMIZATION | April 2023 | December 2023 | Allow | 8 | 0 | 0 | No | No |
| 18130442 | SYSTEM FOR MEASURING THE TRANSFER FUNCTION ON A PATH FROM A FEED ANTENNA VIA A REFLECTOR TO A RADAR SENSOR TESTING ZONE | April 2023 | October 2024 | Allow | 18 | 0 | 0 | No | No |
| 18129342 | METHOD FOR LOCATING A FAULT POINT ON A HIGH-VOLTAGE THREE-PHASE AC CABLE, AND SYSTEM FOR LOCATING A FAULT POINT | March 2023 | February 2025 | Allow | 23 | 1 | 0 | No | No |
| 18192745 | Repackaging IC Chip For Fault Identification | March 2023 | November 2024 | Allow | 20 | 0 | 0 | No | No |
| 18189494 | MOISTURE SENSOR HAVING INTEGRATED HEATING ELEMENT | March 2023 | October 2024 | Allow | 19 | 0 | 0 | No | No |
| 18027370 | FCM BASED CHIPLET TEST CIRCUIT | March 2023 | July 2024 | Allow | 16 | 0 | 0 | No | No |
| 18123864 | ELECTRICAL WIRE MANAGEMENT TOOL | March 2023 | December 2024 | Allow | 21 | 0 | 0 | No | No |
| 18120933 | DIGITAL LOOP DUAL-STAGE SOURCE MEASURE UNIT | March 2023 | November 2024 | Allow | 20 | 0 | 0 | No | No |
| 18025439 | Battery Management System, Battery Pack, Electric Vehicle and Battery Management Method | March 2023 | September 2024 | Allow | 19 | 0 | 0 | No | No |
| 18119451 | Gradient Coil Unit Comprising Two Hollow Cylinder Regions | March 2023 | September 2024 | Allow | 19 | 0 | 0 | No | No |
| 18180574 | SENSOR FOR ARC DETECTION | March 2023 | September 2024 | Allow | 19 | 0 | 0 | No | No |
| 18113850 | Harmonic Load Pull Tuner | February 2023 | November 2024 | Allow | 21 | 0 | 0 | No | No |
| 18170684 | SYSTEMS AND METHODS FOR DETECTING MECHANICAL STRAIN ON A BALL OF A BALL GRID ARRAY | February 2023 | October 2024 | Allow | 20 | 1 | 0 | No | No |
| 18167686 | Method and Apparatus for Analyzing Phase Noise in a Signal from an Electronic Device | February 2023 | March 2024 | Abandon | 13 | 1 | 0 | No | No |
| 18107158 | MAGNETIC SENSOR | February 2023 | August 2024 | Allow | 18 | 0 | 0 | No | No |
| 18106777 | Apparatus and Method for Crack Measurement | February 2023 | November 2024 | Allow | 21 | 1 | 0 | Yes | No |
| 18164963 | METHOD OF MANUFACTURING MULTI-LAYER ELECTRODE FOR A CAPACITIVE PRESSURE SENSOR AND MULTI-LAYER ELECTRODES FORMED THEREFROM | February 2023 | June 2023 | Allow | 5 | 0 | 0 | No | No |
| 18105734 | System and Method to Fix Min-Delay Violation Post Fabrication | February 2023 | August 2024 | Allow | 19 | 0 | 0 | No | No |
| 18162507 | CAPACITANCE DETECTION DEVICE AND CAPACITANCE DETECTION METHOD | January 2023 | September 2024 | Allow | 19 | 0 | 0 | No | No |
| 18007086 | METHOD FOR TESTING A SENSOR, AND ELECTRONIC CIRCUIT | January 2023 | September 2024 | Allow | 19 | 0 | 0 | No | No |
| 18097281 | MONITORING CIRCUIT AND SEMICONDUCTOR DEVICE | January 2023 | November 2023 | Allow | 10 | 1 | 0 | No | No |
| 18151959 | TEST CIRCUIT AND METHOD | January 2023 | May 2023 | Allow | 4 | 0 | 0 | No | No |
| 18015056 | ARC DETECTION DEVICE, ARC DETECTION SYSTEM, ARC DETECTION METHOD, AND RECORDING MEDIUM | January 2023 | December 2024 | Allow | 23 | 1 | 0 | No | No |
| 18082385 | DYNAMICAL ISOLATION OF A CRYOGENIC PROCESSOR | December 2022 | April 2023 | Allow | 4 | 0 | 0 | No | No |
| 18066147 | SOLUTIONLESS SENSOR CALIBRATION | December 2022 | November 2024 | Allow | 23 | 1 | 0 | No | No |
| 18074249 | INTEGRATED CIRCUIT, AN APPARATUS FOR TESTING AN INTEGRATED CIRCUIT, A METHOD FOR TESTING AN INTEGRATED CIRCUIT AND A COMPUTER PROGRAM FOR IMPLEMENTING THIS METHOD USING MAGNETIC FIELD | December 2022 | January 2025 | Allow | 25 | 1 | 0 | Yes | No |
| 18072040 | INTELLIGENT DETECTION SYSTEM | November 2022 | May 2024 | Allow | 18 | 0 | 0 | No | No |
| 18071761 | ACCURATE AND MODEL-BASED MEASUREMENT AND MANAGEMENT SYSTEMS AND METHODS | November 2022 | September 2023 | Allow | 9 | 0 | 0 | No | No |
| 18059430 | ELECTRIC LEAKAGE DETECTION METHOD | November 2022 | April 2024 | Allow | 17 | 1 | 0 | Yes | No |
| 18058644 | VOLTAGE MEASUREMENT AND/OR OVERVOLTAGE PROTECTION CIRCUIT FOR A MEASUREMENT INSTRUMENT | November 2022 | October 2024 | Allow | 23 | 1 | 0 | No | No |
| 18058349 | MOISTURE DETECTION ALONG INPUT/OUTPUT OPENING IN IC STRUCTURE | November 2022 | January 2025 | Allow | 25 | 1 | 0 | No | No |
| 18057859 | PHASE NOISE MEASUREMENT METHOD AND MEASUREMENT SYSTEM | November 2022 | October 2023 | Allow | 10 | 0 | 0 | No | No |
| 17927134 | MAGNETIC FIELD DETECTION DEVICE AND MAGNETIC FIELD DETECTION DEVICE ARRAY | November 2022 | June 2024 | Allow | 18 | 0 | 0 | No | No |
| 17926727 | DEVICE FOR CHECKING THE POSITION OF AN ACTUATOR | November 2022 | August 2024 | Allow | 20 | 0 | 0 | No | No |
| 17989743 | METHOD OF AND SYSTEM FOR DETECTING A SERIAL ARC FAULT IN A POWER CIRCUIT | November 2022 | June 2023 | Allow | 7 | 1 | 0 | No | No |
| 17925214 | LUMINOUS FLUX TEST CIRCUITRY, TEST METHOD AND DISPLAY PANEL | November 2022 | August 2024 | Allow | 21 | 0 | 0 | No | No |
| 17984332 | SEMICONDUCTOR DEVICES COMPRISING FAILURE DETECTORS FOR DETECTING FAILURE OF BIPOLAR JUNCTION TRANSISTORS AND METHODS FOR DETECTING FAILURE OF THE BIPOLAR JUNCTION TRANSISTORS | November 2022 | August 2024 | Allow | 21 | 1 | 0 | No | No |
| 17984697 | MAGNETO-INDUCTIVE POSITION SENSOR ASSEMBLIES | November 2022 | May 2024 | Allow | 18 | 0 | 0 | No | No |
| 17997626 | ELECTROMECHANICAL MODULATION MAGNETORESISTIVE ROTARY MAGNETIC FIELD PROBE | October 2022 | December 2024 | Allow | 25 | 1 | 0 | No | No |
| 17997547 | GAS DENSITY RELAY WITH ONLINE SELF-CHECKING FUNCTION AND CHECKING METHOD THEREFOR | October 2022 | July 2024 | Allow | 21 | 0 | 0 | No | No |
| 17973340 | BATTERY-LESS SENSOR CIRCUIT | October 2022 | April 2024 | Allow | 18 | 0 | 0 | No | No |
| 18047479 | MAGNETIC FIELD SHAPING FOR MAGNETIC FIELD CURRENT SENSOR | October 2022 | October 2023 | Allow | 12 | 0 | 0 | No | No |
| 17967263 | INJECTION DEVICE, SEMICONDUCTOR TESTING SYSTEM AND ITS TESTING METHOD | October 2022 | February 2025 | Allow | 28 | 0 | 0 | No | No |
| 17967134 | MEASUREMENT DEVICE, MEASUREMENT DEVICE CONTROL METHOD, AND MEASUREMENT DEVICE CONTROL PROGRAM | October 2022 | April 2024 | Allow | 18 | 1 | 0 | No | No |
This analysis examines appeal outcomes and the strategic value of filing appeals for examiner ASTACIO-OQUENDO, GIOVANNI.
With a 0.0% reversal rate, the PTAB affirms the examiner's rejections in the vast majority of cases. This reversal rate is in the bottom 25% across the USPTO, indicating that appeals face significant challenges here.
Filing a Notice of Appeal can sometimes lead to allowance even before the appeal is fully briefed or decided by the PTAB. This occurs when the examiner or their supervisor reconsiders the rejection during the mandatory appeal conference (MPEP § 1207.01) after the appeal is filed.
In this dataset, 0.0% of applications that filed an appeal were subsequently allowed. This appeal filing benefit rate is in the bottom 25% across the USPTO, indicating that filing appeals is less effective here than in most other areas.
⚠ Appeals to PTAB face challenges. Ensure your case has strong merit before committing to full Board review.
⚠ Filing a Notice of Appeal shows limited benefit. Consider other strategies like interviews or amendments before appealing.
Examiner ASTACIO-OQUENDO, GIOVANNI works in Art Unit 2858 and has examined 318 patent applications in our dataset. With an allowance rate of 97.2%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 20 months.
Examiner ASTACIO-OQUENDO, GIOVANNI's allowance rate of 97.2% places them in the 91% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.
On average, applications examined by ASTACIO-OQUENDO, GIOVANNI receive 0.66 office actions before reaching final disposition. This places the examiner in the 5% percentile for office actions issued. This examiner issues significantly fewer office actions than most examiners.
The median time to disposition (half-life) for applications examined by ASTACIO-OQUENDO, GIOVANNI is 20 months. This places the examiner in the 89% percentile for prosecution speed. Applications move through prosecution relatively quickly with this examiner.
Conducting an examiner interview provides a +3.3% benefit to allowance rate for applications examined by ASTACIO-OQUENDO, GIOVANNI. This interview benefit is in the 23% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.
When applicants file an RCE with this examiner, 27.5% of applications are subsequently allowed. This success rate is in the 38% percentile among all examiners. Strategic Insight: RCEs show below-average effectiveness with this examiner. Carefully evaluate whether an RCE or continuation is the better strategy.
This examiner enters after-final amendments leading to allowance in 72.7% of cases where such amendments are filed. This entry rate is in the 92% percentile among all examiners. Strategic Recommendation: This examiner is highly receptive to after-final amendments compared to other examiners. Per MPEP § 714.12, after-final amendments may be entered "under justifiable circumstances." Consider filing after-final amendments with a clear showing of allowability rather than immediately filing an RCE, as this examiner frequently enters such amendments.
This examiner withdraws rejections or reopens prosecution in 50.0% of appeals filed. This is in the 14% percentile among all examiners. Strategic Insight: This examiner rarely withdraws rejections during the appeal process compared to other examiners. If you file an appeal, be prepared to fully prosecute it to a PTAB decision. Per MPEP § 1207, the examiner will prepare an Examiner's Answer maintaining the rejections.
When applicants file petitions regarding this examiner's actions, 13.8% are granted (fully or in part). This grant rate is in the 7% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.
Examiner's Amendments: This examiner makes examiner's amendments in 0.0% of allowed cases (in the 24% percentile). This examiner rarely makes examiner's amendments compared to other examiners. You should expect to make all necessary claim amendments yourself through formal amendment practice.
Quayle Actions: This examiner issues Ex Parte Quayle actions in 3.2% of allowed cases (in the 72% percentile). This examiner issues Quayle actions more often than average when claims are allowable but formal matters remain (MPEP § 714.14).
Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:
Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.
No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.
Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.
Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.