USPTO Examiner MILLER JR JOSEPH ALBERT - Art Unit 1712

Recent Applications

Detailed information about the 100 most recent patent applications.

Application NumberTitleFiling DateDisposal DateDispositionTime (months)Office ActionsRestrictionsInterviewAppeal
19290642METHODS AND APPARATUS FOR COMPRESSING MATERIAL DURING ADDITIVE MANUFACTURINGAugust 2025December 2025Allow400YesNo
19059174METHODS OF FORMING TRANSISTOR INTERCONNECTS ON TOP OF A SEMICONDUCTOR DEVICE SUBSTRATEFebruary 2025February 2026Abandon1220NoNo
18942000METHODS OF FORMING TRANSISTOR INTERCONNECTS ON TOP OF A SEMICONDUCTOR DEVICE SUBSTRATENovember 2024January 2025Allow230NoNo
18615744MULTI-REGION DIFFUSION BARRIER CONTAINING TITANIUM, SILICON AND NITROGENMarch 2024February 2026Allow2220NoNo
18595053THIN FILM DEPOSITION APPARATUSMarch 2024September 2025Abandon1810NoNo
18482560ARC REDUCTION AND RF CONTROL FOR ELECTROSTATIC CHUCKS IN SEMICONDUCTOR PROCESSINGOctober 2023March 2026Allow2911NoNo
18238573METHOD, ASSEMBLY AND SYSTEM FOR GAS INJECTION AND CONTROLAugust 2023January 2026Allow2900YesNo
18456229Semiconductor Processing System, and Control Assembly and Method ThereofAugust 2023January 2026Allow2920NoNo
18217885PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING METHODJuly 2023January 2026Allow3010NoNo
18324623MASK STICK AND MASK ASSEMBLY INCLUDING THE SAMEMay 2023December 2025Allow3110YesNo
18314988MASK FRAME ASSEMBLY AND METHOD OF MANUFACTURING THE SAMEMay 2023December 2025Allow3110YesNo
18141909SEMICONDUCTOR PROCESS EQUIPMENTMay 2023November 2025Allow3111YesNo
18141428Batch Mode Silicon Carbide Epitaxial ReactorApril 2023February 2026Allow3310YesNo
18193897METHOD OF CONTROLLING PLASMA PROCESSING APPARATUS AND PLASMA PROCESSING APPARATUSMarch 2023January 2026Allow3420YesNo
18125322PLASMA PROCESSING APPARATUSMarch 2023February 2026Allow3510NoNo
18178664Ultra High Purity Conditions for Atomic Scale ProcessingMarch 2023December 2025Allow3441YesNo
18116270MPCVD DEVICE CAPABLE OF REALIZING EFFECTIVE DOPINGMarch 2023October 2025Allow3210NoNo
18109178ALD DEVICE FOR METALLIC FILMFebruary 2023November 2025Allow3310NoNo
18107558FLOW VELOCITY INCREASING DEVICE AND APPARATUS FOR DEPOSITING THIN FILM INCLUDING THE SAMEFebruary 2023January 2026Allow3620YesNo
18164032PLASMA PROCESSING APPARATUSFebruary 2023October 2025Allow3210YesNo
18163587APPARATUS FOR PROCESSING A SUBSTRATEFebruary 2023December 2025Allow3410YesNo
18156102SYSTEM AND METHOD FOR AUTO CORRECTION OF SUBSTRATE MISALIGNMENTJanuary 2023March 2026Allow3711NoNo
18095657IGNITION CONTROL METHOD, FILM FORMING METHOD, AND FILM FORMING APPARATUSJanuary 2023November 2025Allow3410YesNo
18091949THIN FILM DEPOSITION APPARATUS HAVING MULTI-STAGE HEATERS AND THIN FILM DEPOSITION METHOD USING THE SAMEDecember 2022January 2026Allow3611YesNo
18089388COATING INTERIOR SURFACES OF COMPLEX BODIES BY ATOMIC LAYER DEPOSITIONDecember 2022March 2026Allow3920YesNo
18003098CONFORMAL THERMAL CVD WITH CONTROLLED FILM PROPERTIES AND HIGH DEPOSITION RATEDecember 2022December 2025Allow3610NoNo
18068692SUBSTRATE RETAINER, SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICEDecember 2022March 2026Abandon3911NoNo
18076788ENDPOINT DETECTION METHOD FOR CHAMBER COMPONENT REFURBISHMENTDecember 2022November 2025Allow3611NoNo
17991379BATCH PROCESSING CHAMBERS FOR PLASMA-ENHANCED DEPOSITIONNovember 2022October 2025Allow3511NoNo
17991316SOURCE GAS SUPPLY METHOD, SOURCE GAS SUPPLY MECHANISM, AND FILM FORMING SYSTEMNovember 2022November 2025Allow3620YesNo
17968056DEUTERIUM-CONTAINING FILMSOctober 2022January 2026Allow3920NoNo
17968561INJECTION MODULE FOR A PROCESS CHAMBEROctober 2022February 2026Allow4021YesNo
17995292SEAM MITIGATION AND INTEGRATED LINER FOR GAP FILLSeptember 2022February 2026Allow4021YesNo
17954960SUBSTRATE PROCESSING APPARATUS AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE USING THE SAMESeptember 2022February 2026Allow4111YesNo
17951111DEPOSITION APPARATUS AND DEPOSITION METHOD USING THE SAMESeptember 2022January 2026Abandon4040NoNo
17801485ATOMIZING APPARATUS FOR FILM FORMATION AND FILM FORMING APPARATUS USING THE SAMEAugust 2022January 2026Allow4120NoNo
17875379ROLL-TO-ROLL ATOMIC LAYER DEPOSITION APPARATUSJuly 2022December 2025Allow4120NoNo
17587871SUBSTRATE PROCESSING APPARATUS, METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, AND RECORDING MEDIUMJanuary 2022March 2026Allow4941YesNo
17296321METHOD FOR AIDING THE MASKING OF WORKPIECE SURFACES TO BE PAINTED OR TREATEDMay 2021October 2025Allow5340YesNo
16067799DRAWING DEVICE AND DRAWING METHODJuly 2018November 2020Allow2811NoNo
16067461BIOPRINTER SPRAY HEAD ASSEMBLY AND BIOPRINTERJune 2018October 2020Allow2710NoNo
16021367METHODS FOR PRINTING CONDUCTIVE OBJECTSJune 2018August 2020Allow2510NoNo
16066820COATING PART PRECURSORSJune 2018November 2020Allow2920YesNo
15841306PRODUCTION METHOD FOR CARBON NANOTUBESDecember 2017March 2019Allow1510YesNo
15836920PRODUCTION METHOD FOR CARBON NANOTUBESDecember 2017August 2019Allow2020YesNo
15518506MULTI-MASK ALIGNMENT SYSTEM AND METHODApril 2017April 2019Allow2421YesNo
15467541METHODS OF ADDITIVE MANUFACTURING FOR CERAMICS USING MICROWAVESMarch 2017August 2019Allow2910YesNo
15461493METHOD FOR MEASURING HEIGHT DIFFERENCE BETWEEN NOZZLE HEADS AND 3D PRINTING APPARATUS USING THE METHODMarch 2017October 2019Allow3120YesNo
15457443FILM FORMATION APPARATUS AND FILM FORMATION METHODMarch 2017May 2019Allow2641YesNo
15118810APPARATUS AND METHOD FOR THIN-FILM PROCESSING APPLICATIONSAugust 2016April 2018Allow2010YesNo
15114242FORMING FACSIMILE FORMATION CORE SAMPLES USING THREE-DIMENSIONAL PRINTINGJuly 2016February 2019Allow3010YesNo
15188154PLASMA CHEMICAL VAPOR DEPOSITION DEVICEJune 2016September 2018Allow2710YesNo
15131062SYSTEM FOR GLASS SHEET SEMICONDUCTOR COATING AND RESULTANT PRODUCTApril 2016July 2017Allow1510NoNo
15130675VANADIUM-CONTAINING FILM FORMING COMPOSITIONS AND VAPOR DEPOSITION OF VANADIUM-CONTAINING FILMSApril 2016February 2017Allow1000NoNo
15130576TANTALUM-CONTAINING FILM FORMING COMPOSITIONS AND VAPOR DEPOSITION OF TANTALUM-CONTAINING FILMSApril 2016May 2017Allow1310NoNo
15094902VAPOR DEPOSITION METHOD AND METHOD FOR PRODUCING AN ORGANIC ELECTROLUMINESCENCE DISPLAY DEVICEApril 2016June 2017Allow1410NoNo
14842343SURFACING OF ADDITIVELY MANUFACTURED COMPONENTS AND CORRESPONDING MANUFACTURED COMPONENTS OF A TURBOMACHINESeptember 2015October 2017Allow2640YesNo
14764052METHOD FOR THE PRODUCTION OF A CURVED CERAMIC SOUND ATTENUATION PANELJuly 2015December 2016Allow1710NoNo
14705563PRODUCTION OF FIBRE COMPOSITE COMPONENT PART BASED ON ALUMINIUM AND POLYURETHANEMay 2015November 2017Allow3120YesNo
14689447Apparatus For Susceptor Temperature Verification And Methods Of UseApril 2015May 2017Allow2521NoNo
14402244FILM-FORMING APPARATUS AND FILM-FORMING METHODNovember 2014April 2017Allow2931NoNo
14398898RADICAL REACTOR WITH INVERTED ORIENTATIONNovember 2014June 2016Allow1910YesNo
14457700METHODS FOR APPLYING A FOAMABLE REACTION MIXTURE, HIGH PRESSURE DEVICE AND DEVICE FOR PRODUCING SANDWICH COMPOSITE ELEMENTSAugust 2014March 2016Allow1901NoNo
14453314METHOD FOR FORMING MONOLAYER GRAPHENE-BORON NITRIDE HETEROSTRUCTURESAugust 2014April 2016Allow2010NoNo
14281242VAPORIZING UNIT, FILM FORMING APPARATUS, FILM FORMING METHOD, COMPUTER PROGRAM AND STORAGE MEDIUMMay 2014February 2016Allow2010NoNo
14217055METHODS OF MANUFACTURE OF ENGINEERED MATERIALS AND DEVICESMarch 2014August 2016Allow2930YesNo
14187685METHOD AND SYSTEM FOR MANUFACTURING A TARGET FOR THE EMISSION OF PHOTON RADIATION, PARTICULARLY X RAYS, OR OF PARTICLES, PARTICULARLY PROTONS OR ELECTRONS, BY LASER FIRINGFebruary 2014June 2015Allow1601NoNo
14124014PLASMA DEPOSITION APPARATUS AND PLASMA DEPOSITION METHODDecember 2013November 2015Allow2421NoNo
14081464GROWTH REACTOR SYSTEMS AND METHODS FOR LOW-TEMPERATURE SYNTHESIS OF NANOWIRESNovember 2013May 2015Allow1810NoNo
14004894VAPOR DEPOSITION PARTICLE EMITTING DEVICE, VAPOR DEPOSITION APPARATUS, VAPOR DEPOSITION METHODSeptember 2013November 2014Allow1400NoNo
14012424MANUFACTURING METHOD OF FUNCTIONAL FILMAugust 2013January 2015Allow1710NoNo
13666575METHOD FOR THE PLASMA-ENHANCED TREATMENT OF INTERNAL SURFACES OF A HOLLOW BODY, FLUID SEPARATOR, AND USE THEREOFNovember 2012November 2014Allow2411NoNo
13586525MANUFACTURING OF DIFFRACTIVE PIGMENTS BY FLUIDIZED BED CHEMICAL VAPOR DEPOSITIONAugust 2012April 2017Allow5681YesNo
13584644METHODS FOR MANUFACTURING ARCHITECTURAL CONSTRUCTSAugust 2012May 2014Allow2111YesNo
13453321METHOD OF FORMING A PROTECTIVE FILM FOR A MAGNETIC RECORDING MEDIUM, A PROTECTIVE FILM FORMED BY THE METHOD AND A MAGNETIC RECORDING MEDIUM HAVING THE PROTECTIVE FILMApril 2012June 2014Allow2650NoNo
13428445PLASMA VAPOR DEPOSITION SYSTEM AND METHOD FOR MAKING MULTI-JUNCTION SILICON THIN FILM SOLAR CELL MODULES AND PANELSMarch 2012August 2013Allow1710NoNo
13368265COMBINED INJECTION MODULE FOR SEQUENTIALLY INJECTING SOURCE PRECURSOR AND REACTANT PRECURSORFebruary 2012June 2014Allow2831YesNo
13256832METHOD AND COMPOSITION FOR DEPOSITING RUTHENIUM WITH ASSISTIVE METAL SPECIESNovember 2011June 2013Allow2130YesNo
13201210PROCESS TO DEPOSIT DIAMOND LIKE CARBON AS SURFACE OF A SHAPED OBJECTNovember 2011October 2015Allow5041NoNo
13251992METHODS OF FORMING MATERIAL ON A SUBSTRATE, AND A METHOD OF FORMING A FIELD EFFECT TRANSISTOR GATE OXIDE ON A SUBSTRATEOctober 2011August 2012Allow1020NoNo
13189644BISAMINEAZAALLYLIC LIGANDS AND THEIR USE IN ATOMIC LAYER DEPOSITION METHODSJuly 2011March 2013Allow1910YesNo
13188605WAFER PROCESSING METHOD WITH CARRIER HUB REMOVALJuly 2011March 2012Allow800NoNo
13182494Preparation of Epitaxial Graphene Surfaces for Atomic Layer Deposition of DielectricsJuly 2011May 2013Allow2211NoNo
13178005FILM FORMATION METHOD FOR FORMING HAFNIUM OXIDE FILMJuly 2011July 2013Allow2410YesNo
12895678METHOD FOR FORMING DIELECTRIC FILM AND METHOD FOR FORMING CAPACITOR IN SEMICONDUCTOR DEVICE USING THE SAMESeptember 2010August 2011Allow1120NoNo
12880615FILM DEPOSITION METHODSeptember 2010August 2013Allow3510NoNo
12855645PLASMA DEPOSITION OF AMORPHOUS SEMICONDUCTORS AT MICROWAVE FREQUENCIESAugust 2010September 2011Allow1310NoNo
12719594METHOD FOR APPLYING A THERMAL BARRIER COATINGMarch 2010March 2013Allow3640YesNo
12715905METHOD OF PRODUCTION OF FLUORINATED CARBON NANOSTRUCTURESMarch 2010January 2011Allow1110NoNo
12684354ELECTROCONDUCTIVE TIN OXIDE HAVING HIGH MOBILITY AND LOW ELECTRON CONCENTRATIONJanuary 2010November 2011Allow2211NoNo
12608682Synthesis of Higher DiamondoidsOctober 2009October 2012Allow3610NoNo
12572224METHOD AND APPARATUS FOR PRECISION SURFACE MODIFICATION IN NANO-IMPRINT LITHOGRAPHYOctober 2009November 2013Allow5011NoNo
12521604METHOD OF CURING METAL ALKOXIDE-CONTAINING FILMSJune 2009May 2012Allow3520YesNo
12282475SEASONING METHOD FOR FILM-FORMING APPARATUSMay 2009August 2012Allow4830NoNo
12447615METHOD OF FORMING A FILM BY DEPOSITION FROM A PLASMAApril 2009August 2012Allow4030YesNo
12311184VACUUM TREATMENT METHODMarch 2009May 2012Allow3821YesNo
12316417THIN FILM DEPOSITION VIA A SPATIALLY-COORDINATED AND TIME-SYNCHRONIZED PROCESSDecember 2008January 2012Allow3720YesNo
12274984PLASMA GENERATING ELECTRODE ASSEMBLYNovember 2008October 2010Allow2320NoNo
12070389PRECURSOR SELECTION METHOD FOR CHEMICAL VAPOR DEPOSITION TECHNIQUESFebruary 2008February 2012Allow4820YesNo
12070367FABRICATION METHOD OF SIZE-CONTROLLED, SPATIALLY DISTRIBUTED NANOSTRUCTURES BY ATOMIC LAYER DEPOSITIONFebruary 2008September 2011Allow4320NoNo

Appeals Overview

No appeal data available for this record. This may indicate that no appeals have been filed or decided for applications in this dataset.

Examiner MILLER, JR, JOSEPH ALBERT - Prosecution Strategy Guide

Executive Summary

Examiner MILLER, JR, JOSEPH ALBERT works in Art Unit 1712 and has examined 76 patent applications in our dataset. With an allowance rate of 100.0%, this examiner allows applications at a higher rate than most examiners at the USPTO. Applications typically reach final disposition in approximately 27 months.

Allowance Patterns

Examiner MILLER, JR, JOSEPH ALBERT's allowance rate of 100.0% places them in the 94% percentile among all USPTO examiners. This examiner is more likely to allow applications than most examiners at the USPTO.

Office Action Patterns

On average, applications examined by MILLER, JR, JOSEPH ALBERT receive 1.91 office actions before reaching final disposition. This places the examiner in the 46% percentile for office actions issued. This examiner issues fewer office actions than average, which may indicate efficient prosecution or a more lenient examination style.

Prosecution Timeline

The median time to disposition (half-life) for applications examined by MILLER, JR, JOSEPH ALBERT is 27 months. This places the examiner in the 71% percentile for prosecution speed. Prosecution timelines are slightly faster than average with this examiner.

Interview Effectiveness

Conducting an examiner interview provides a +0.0% benefit to allowance rate for applications examined by MILLER, JR, JOSEPH ALBERT. This interview benefit is in the 13% percentile among all examiners. Note: Interviews show limited statistical benefit with this examiner compared to others, though they may still be valuable for clarifying issues.

Request for Continued Examination (RCE) Effectiveness

When applicants file an RCE with this examiner, 32.9% of applications are subsequently allowed. This success rate is in the 70% percentile among all examiners. Strategic Insight: RCEs show above-average effectiveness with this examiner. Consider whether your amendments or new arguments are strong enough to warrant an RCE versus filing a continuation.

After-Final Amendment Practice

This examiner enters after-final amendments leading to allowance in 42.9% of cases where such amendments are filed. This entry rate is in the 65% percentile among all examiners. Strategic Recommendation: This examiner shows above-average receptiveness to after-final amendments. If your amendments clearly overcome the rejections and do not raise new issues, consider filing after-final amendments before resorting to an RCE.

Petition Practice

When applicants file petitions regarding this examiner's actions, 25.0% are granted (fully or in part). This grant rate is in the 13% percentile among all examiners. Strategic Note: Petitions are rarely granted regarding this examiner's actions compared to other examiners. Ensure you have a strong procedural basis before filing a petition, as the Technology Center Director typically upholds this examiner's decisions.

Examiner Cooperation and Flexibility

Examiner's Amendments: This examiner makes examiner's amendments in 9.2% of allowed cases (in the 93% percentile). Per MPEP § 1302.04, examiner's amendments are used to place applications in condition for allowance when only minor changes are needed. This examiner frequently uses this tool compared to other examiners, indicating a cooperative approach to getting applications allowed. Strategic Insight: If you are close to allowance but minor claim amendments are needed, this examiner may be willing to make an examiner's amendment rather than requiring another round of prosecution.

Quayle Actions: This examiner issues Ex Parte Quayle actions in 5.3% of allowed cases (in the 81% percentile). Per MPEP § 714.14, a Quayle action indicates that all claims are allowable but formal matters remain. This examiner frequently uses Quayle actions compared to other examiners, which is a positive indicator that once substantive issues are resolved, allowance follows quickly.

Prosecution Strategy Recommendations

Based on the statistical analysis of this examiner's prosecution patterns, here are tailored strategic recommendations:

  • Examiner cooperation: This examiner frequently makes examiner's amendments to place applications in condition for allowance. If you are close to allowance, the examiner may help finalize the claims.

Relevant MPEP Sections for Prosecution Strategy

  • MPEP § 713.10: Examiner interviews - available before Notice of Allowance or transfer to PTAB
  • MPEP § 714.12: After-final amendments - may be entered "under justifiable circumstances"
  • MPEP § 1002.02(c): Petitionable matters to Technology Center Director
  • MPEP § 1004: Actions requiring primary examiner signature (allowances, final rejections, examiner's answers)
  • MPEP § 1207.01: Appeal conferences - mandatory for all appeals
  • MPEP § 1214.07: Reopening prosecution after appeal

Important Disclaimer

Not Legal Advice: The information provided in this report is for informational purposes only and does not constitute legal advice. You should consult with a qualified patent attorney or agent for advice specific to your situation.

No Guarantees: We do not provide any guarantees as to the accuracy, completeness, or timeliness of the statistics presented above. Patent prosecution statistics are derived from publicly available USPTO data and are subject to data quality limitations, processing errors, and changes in USPTO practices over time.

Limitation of Liability: Under no circumstances will IronCrow AI be liable for any outcome, decision, or action resulting from your reliance on the statistics, analysis, or recommendations presented in this report. Past prosecution patterns do not guarantee future results.

Use at Your Own Risk: While we strive to provide accurate and useful prosecution statistics, you should independently verify any information that is material to your prosecution strategy and use your professional judgment in all patent prosecution matters.